Abstract: One embodiment provides for a data processing system comprising a multi-level system memory including a first memory level of volatile memory and a second memory level that is larger and slower in comparison with the first memory level. The second memory level includes non-volatile memory and can additionally include volatile memory. The multi-level system memory includes a multi-level memory controller including logic to manage a list of faulty addresses within the multi-level system memory. The multi-level memory controller can manage a list of faulty addresses. The multi-level memory controller is configured to satisfy a request for data stored in the first memory level from the second memory level when the data is stored in an address on the list of faulty addresses.

Abstract: Methods and apparatuses relating to a hardware memory test unit to check a section of a data storage device for a transient fault before the data is stored in and/or loaded from the section of the data storage device are described. In one embodiment, an integrated circuit includes a hardware processor to operate on data in a section of a data storage device, and a memory test unit to check the section of the data storage device for a transient fault before the data is stored in the section of the data storage device, wherein the transient fault is to cause a machine check exception if accessed by the hardware processor.

Abstract: In accordance with implementations disclosed herein, there is provided systems and methods for enabling error status and reporting in a machine check environment. A processing device includes an error status register and an error status component communicably coupled to the error status register. The error status component determines that a machine check error (MCE) is a first correctable error (CE) and sets a first error status corresponding to the first CE in the error status register based on a threshold value. The threshold value is based on a type of the first CE.

Abstract: A processor of an aspect includes a decode unit to decode a read from memory instruction. The read from memory instruction is to indicate a source memory operand and a destination storage location. The processor also includes an execution unit coupled with the decode unit. The execution unit, in response to the read from memory instruction, is to read data from the source memory operand, store an indication of defective data in an architecturally visible storage location, when the data is defective, and complete execution of the read from memory instruction without causing an exceptional condition, when the data is defective. Other processors, methods, systems, and instructions are disclosed.

Abstract: An apparatus and method are described for detecting and correcting data fetch errors within a processor core. For example, one embodiment of an instruction processing apparatus for detecting and recovering from data fetch errors comprises: at least one processor core having a plurality of instruction processing stages including a data fetch stage and a retirement stage; and error processing logic in communication with the processing stages to perform the operations of: detecting an error associated with data in response to a data fetch operation performed by the data fetch stage; and responsively performing one or more operations to ensure that the error does not corrupt an architectural state of the processor core within the retirement stage.

Abstract: An apparatus is described that includes memory controller logic circuitry to interface with a memory side cache of a multi-level system memory. The memory controller logic circuitry includes error tracking circuitry to track errors of cache line slots in the memory side cache. The memory controller logic circuitry also comprises faulty list circuitry to store identifiers of faulty cache line slots that are deemed to be excessively error prone. The memory controller logic circuitry is to declare a miss in the memory side cache for requests that map to cache line slots identified in the faulty list.

Abstract: An apparatus and method are described for system physical address to memory module address translation. For example, one embodiment of an apparatus comprises: a fetch circuit of a core to fetch a system physical address (SPA) translate instruction from memory; a decode circuit of the core to decode the SPA translate instruction; a first register to store an SPA associated with the SPA translate instruction; a memory controller comprising one or more channel controllers to initiate a translation using the SPA, the memory controller to transmit a translation request to a first channel controller; the first channel controller to synthesize a response including dual in-line memory module (DIMM) address information; and a second register to store the DIMM address information to be used to identify the DIMM during subsequent memory transactions.

Abstract: Methods, apparatus, systems and articles of manufacture (e.g., physical storage media) to utilize non-volatile random access memory for information storage in response to error conditions are disclosed. Example methods disclosed herein include accessing, with a power control unit associated with a processor, first information describing available capacities of respective reserved regions of a plurality of non-volatile memory modules, the respective reserved regions of the non-volatile memory modules being separate from respective host-visible regions of the non-volatile memory modules. Disclosed example methods also include configuring, with the power control unit, an information storage architecture based on the first information. Disclosed example methods further include storing, with the power control unit, second information in one or more of the respective reserved regions of the non-volatile memory modules in accordance with the information storage architecture.

Abstract: A computing apparatus, including: a hardware platform including a processor and memory; and a system management interrupt (SMI) handler; first logic configured to provide a first container and a second container via the hardware platform; and second logic configured to: detect an uncorrectable error in the first container; responsive to the detecting, generate a degraded system state; provide a degraded state message to the SMI handler; instruct the second container to seek a recoverable state; determine that the second container has entered a recoverable state; and initiate a recovery operation.

Abstract: An apparatus and method are described for system physical address to memory module address translation. For example, one embodiment of an apparatus comprises: a fetch circuit of a core to fetch a system physical address (SPA) translate instruction from memory; a decode circuit of the core to decode the SPA translate instruction; a first register to store an SPA associated with the SPA translate instruction; a memory controller comprising one or more channel controllers to initiate a translation using the SPA, the memory controller to transmit a translation request to a first channel controller; the first channel controller to synthesize a response including dual in-line memory module (DIMM) address information; and a second register to store the DIMM address information to be used to identify the DIMM during subsequent memory transactions.

Abstract: One embodiment provides for a data processing system comprising a multi-level system memory including a first memory level of volatile memory and a second memory level that is larger and slower in comparison with the first memory level. The second memory level includes non-volatile memory and can additionally include volatile memory. The multi-level system memory includes a multi-level memory controller including logic to manage a list of faulty addresses within the multi-level system memory. The multi-level memory controller can manage a list of faulty addresses. The multi-level memory controller is configured to satisfy a request for data stored in the first memory level from the second memory level when the data is stored in an address on the list of faulty addresses.

Abstract: Methods, apparatus, systems and articles of manufacture (e.g., physical storage media) to utilize non-volatile random access memory for information storage in response to error conditions are disclosed. Example methods disclosed herein include accessing, with a power control unit associated with a processor, first information describing available capacities of respective reserved regions of a plurality of non-volatile memory modules, the respective reserved regions of the non-volatile memory modules being separate from respective host-visible regions of the non-volatile memory modules. Disclosed example methods also include configuring, with the power control unit, an information storage architecture based on the first information. Disclosed example methods further include storing, with the power control unit, second information in one or more of the respective reserved regions of the non-volatile memory modules in accordance with the information storage architecture.

Abstract: In one embodiment, a processor includes a core having a fetch unit to fetch instructions, a decode unit to decode the instructions, and one or more execution units to execute the instructions. The core may further include: a first pair of block address range registers to store a start location and an end location of a block range within a non-volatile block storage coupled to the processor; and a block status storage to store an error indicator responsive to an occurrence of an error within the block range during a block operation. Other embodiments are described and claimed.

Abstract: A processor of an aspect includes a decode unit to decode a read from memory instruction. The read from memory instruction is to indicate a source memory operand and a destination storage location. The processor also includes an execution unit coupled with the decode unit. The execution unit, in response to the read from memory instruction, is to read data from the source memory operand, store an indication of defective data in an architecturally visible storage location, when the data is defective, and complete execution of the read from memory instruction without causing an exceptional condition, when the data is defective. Other processors, methods, systems, and instructions are disclosed.

Abstract: A processor includes a logic to determine an error condition reported in an error bank. The error bank is communicatively coupled to the processor and is associated with logical processors of the processor. The processor includes another logic to generate an interrupt indicating the error condition. The processor includes yet another logic to selectively send the interrupt to a single one of the logical processors associated with the error bank.

Abstract: In accordance with implementations disclosed herein, there is provided systems and methods for enabling error status and reporting in a machine check environment. A processing device includes an error status register and an error status component communicably coupled to the error status register. The error status component determines that a machine check error (MCE) is a first correctable error (CE) and sets a first error status corresponding to the first CE in the error status register based on a threshold value. The threshold value is based on a type of the first CE.

Abstract: Systems and methods may provide for detecting that a read operation is directed to a memory region while the memory region is in a poisoned state and clearing the poisoned state if volatile data stored in the memory region does not correspond to a known data pattern. Additionally, the memory region may be maintained in the poisoned state if the volatile data stored in the memory region corresponds to the known data pattern. In one example, an error may be detected, wherein the error is associated with a write operation directed to the memory region. In such a case, the poisoned state may be set for the volatile data in response to the error and the known data pattern may be written to the memory region.

Abstract: Methods and apparatus to increase cloud availability and silicon isolation using secure enclaves. A compute platform is configured to host a compute domain in which a plurality of secure enclaves are implemented. In conjunction with creating and deploying secure enclaves, mapping information is generated that maps the secure enclaves to platform/CPU resources, such as Intellectual Property blocks (IP) belong to the secure enclaves. In response to platform error events caused by errant platform/CPU resources, the secure enclave(s) belonging to the errant platform/CPU are identified via the mapping information, and an interrupt is directed to that/those secure enclave(s). In response to the interrupt, a secure enclave may be configured to one or more of handle the error, pass information to another secure enclave, and teardown the enclave. The secure enclave may execute an interrupt service routine that causes the errant platform/CPU resource to reset without resetting the entire platform or CPU, as applicable.

Abstract: An apparatus is described that includes memory controller logic circuitry to interface with a memory side cache of a multi-level system memory. The memory controller logic circuitry includes error tracking circuitry to track errors of cache line slots in the memory side cache. The memory controller logic circuitry also comprises faulty list circuitry to store identifiers of faulty cache line slots that are deemed to be excessively error prone. The memory controller logic circuitry is to declare a miss in the memory side cache for requests that map to cache line slots identified in the faulty list.

Abstract: Methods and apparatuses relating to a hardware memory test unit to check a section of a data storage device for a transient fault before the data is stored in and/or loaded from the section of the data storage device are described. In one embodiment, an integrated circuit includes a hardware processor to operate on data in a section of a data storage device, and a memory test unit to check the section of the data storage device for a transient fault before the data is stored in the section of the data storage device, wherein the transient fault is to cause a machine check exception if accessed by the hardware processor.