Abstract: The disclosure relates to a detection method for optical signals in a three-dimensional region of a sample, and a detection method for marked antibodies and/or antigens on a biological surface. In the process, signals with a depth of field that is extended in relation to an original depth of field are captured and evaluated. Also, an apparatus includes an optical element in a detection beam path, a depth of field that is extended in relation to an original depth of field being generated by the effect of said optical element.

Abstract: Generating an overview image of an object includes, during a first capture duration, scanning regions of the object along a trajectory with illumination radiation, where the trajectory is chosen individually on the basis of properties of the object. First images of the object which together with position data (x, y, z) of an absolute distance measurement system are stored as an individual overview image are captured during the scanning of the trajectory. During a second capture duration, at least regions of the object are scanned with illumination radiation, and second images are captured; regions of the object which have already been imaged during the first capture duration are not imaged again. The first images captured during the first capture duration and the second images captured during the second capture duration are merged to form a resultant overview image of the object.

Abstract: A method for training an image processing system with a machine learning model to perform a virtual multi-angle reconstruction of image stacks recorded with a light-sheet microscope. The method includes: recording at least one light-sheet fine stack comprising multiple image stacks at different illumination angles; determining target outputs from the fine stack, the model, and a classical multi-angle reconstruction; determining learning inputs from a light-sheet coarse stack comprising one or more image stacks at different illumination angles using the model and the classical reconstruction; creating an annotated dataset of the target outputs and learning inputs; and optimizing the model for the virtual multi-angle reconstruction based on the dataset.

Abstract: A method, an arrangement for microscopy and a microscope for three-dimensional imaging in microscopy, in which aberrations of a specimen detection radiation coming from a specimen are corrected in a detection beam path by means of a correction element and the corrected specimen detection radiation is captured in a spatially resolved form. The inventions are distinguished by the fact that a best-possible correction setting of the correction element, with which aberrations occurring at the time are reduced as much as possible, is determined; and, on the basis of the best-possible correction setting, a flawed correction setting is determined, a setting with which aberrations occurring lead to an asymmetric point spread function of the specimen detection radiation.

Abstract: Techniques an apparatuses for localizing objects of a sample that emit detection radiation are disclosed. At least one light sheet is produced in a light sheet plane and a region of the sample to be imaged is illuminated with the light sheet and detection radiation from the sample is spatially resolved in a detection plane. A light sheet is produced that has, in the light sheet plane, a non-illuminated light sheet section delimited by an illuminated light sheet section or is produced sequentially in the light sheet plane, where a non-illuminated light sheet section remains between the sequentially produced light sheets. An object to be localized is present in the non-illuminated region, and a position of the object is captured if it leaves the non-illuminated region and is excited to emit the detection radiation by one of the light sheets delimiting the non-illuminated region.

Abstract: A method for light sheet microscope examination of a specimen, the specimen being illuminated with a light sheet by an illumination objective, and a light sheet microscope for performing the method. Light emitted by the specimen is imaged onto an area-type detector by a detection objective. An optical axis of the detection objective encloses with an optical axis of the illumination objective an angle that differs from 0° and from 180° and intersects the light sheet in a light sheet plane. The area-type detector records an image. A neural network analyzes the image to determine whether the light sheet plane is located in a focal plane of the detection objective, and/or in which direction along the optical axis the light sheet plane is located from the focal plane, and/or at what distance, measured along the optical axis of the detection objective, the light sheet plane is from the focal plane.

Abstract: A sample chamber encloses a sample space for positioning a sample and includes a wall that delimits the sample space and has an outer side facing away from the sample space. An illumination beam path is directed through the outer side into the sample space. Detection radiation is detected along a detection axis extending from the sample chamber through the wall of the sample chamber. The sample chamber has an outer surface with a shape of a spherical section with a circular disc as the base surface. The sample chamber and the detection axis are rotated and/or pivoted relative to one another about the center point of the circular disc so that different angular positions of the sample chamber relative to the detection axis are adjusted and image data is recorded at different angular positions of the sample chamber relative to the detection axis.

Abstract: Generating an overview image of an object includes, during a first capture duration, scanning regions of the object along a trajectory with illumination radiation, where the trajectory is chosen individually on the basis of properties of the object. First images of the object which together with position data (x, y, z) of an absolute distance measurement system are stored as an individual overview image are captured during the scanning of the trajectory. During a second capture duration, at least regions of the object are scanned with illumination radiation, and second images are captured; regions of the object which have already been imaged during the first capture duration are not imaged again. The first images captured during the first capture duration and the second images captured during the second capture duration are merged to form a resultant overview image of the object.

Abstract: Techniques an apparatuses for localizing objects of a sample that emit detection radiation are disclosed. At least one light sheet is produced in a light sheet plane and a region of the sample to be imaged is illuminated with the light sheet and detection radiation from the sample is spatially resolved in a detection plane. A light sheet is produced that has, in the light sheet plane, a non-illuminated light sheet section delimited by an illuminated light sheet section or is produced sequentially in the light sheet plane, where a non-illuminated light sheet section remains between the sequentially produced light sheets. An object to be localized is present in the non-illuminated region, and a position of the object is captured if it leaves the non-illuminated region and is excited to emit the detection radiation by one of the light sheets delimiting the non-illuminated region.

Abstract: A single plane illumination microscope having an illumination optical system for illuminating a sample located on a sample carrier in a medium, and which is parallel to a planar reference surface. The sample is illuminated by a light sheet via an illumination light path. A detection optical system has a detection beam path. The optical axes of the illumination and detection optical systems each define an angle that is not equal to zero degrees along with the normal to the reference surface. A barrier layer system includes at least one layer of a given material having a given thickness and separates the medium from the illumination and detection optical systems. A base area of the barrier layer system is in contact with the region that is accessible for illumination and detection activities, said base area running parallel to the reference surface.

Abstract: A method, an arrangement for microscopy and a microscope for three-dimensional imaging in microscopy, in which aberrations of a specimen detection radiation coming from a specimen are corrected in a detection beam path by means of a correction element and the corrected specimen detection radiation is captured in a spatially resolved form. The inventions are distinguished by the fact that a best-possible correction setting of the correction element, with which aberrations occurring at the time are reduced as much as possible, is determined; and, on the basis of the best-possible correction setting, a flawed correction setting is determined, a setting with which aberrations occurring lead to an asymmetric point spread function of the specimen detection radiation.

Abstract: An optical lens for use in a media feed device, having a first lens surface and a second lens surface, wherein the first lens is provided to be facing an object to be observed and the second lens surface is provided to be facing away from the object to be observed. At least one channel opening onto the first lens surface is present, wherein the at least one channel runs through the optical lens and at least one section of a media line is formed in the at least one, channel or, if a plurality of channels are formed, at least one of the plurality of channels opens up outside a highest point in alignment with a line that is vertical with respect to the first lens surface and to the surface of the earth.

Abstract: A method for light sheet microscope examination of a specimen, the specimen being illuminated with a light sheet by an illumination objective, and a light sheet microscope for performing the method. Light emitted by the specimen is imaged onto an area-type detector by a detection objective. An optical axis of the detection objective encloses with an optical axis of the illumination objective an angle that differs from 0° and from 180° and intersects the light sheet in a light sheet plane. The area-type detector records an image. A neural network analyzes the image to determine whether the light sheet plane is located in a focal plane of the detection objective, and/or in which direction along the optical axis the light sheet plane is located from the focal plane, and/or at what distance, measured along the optical axis of the detection objective, the light sheet plane is from the focal plane.

Abstract: The invention relates to a localization microscopy method for localizing signal sources. Here, at least once for each pixel of a detector, values of an error parameter are ascertained and stored in a calibration data record in a manner assigned to the relevant pixel. Captured image data are used to identify regions of origin of signal sources and fit a point spread function to the pixel values of the respective regions of origin. The respective signal source is localized on the basis of the point spread function. The pixel-specific error parameter of each pixel can be compared to a threshold. If the threshold is exceeded, these pixels are either ignored or replaced by means of interpolation when fitting the point spread function. In addition or as an alternative thereto, the real noise performance of the pixels is ascertained and corrected on the basis of derived pixel-specific error parameters.

Abstract: A method for optically examining a plurality of microscopic samples. The samples are channeled one after the other by means of a flow into at least one flow channel in which the samples advance along a flow direction. The samples are illuminated, and light emitted from the samples is detected and analyzed. A device for carrying out the method in which samples are illuminated in that at least one light sheet with a light sheet plane is directed onto the at least one flow channel, wherein the light sheet is oriented so as to intersect the at least one flow channel in an intersection region, and the normal of the light sheet plane forms an angle differing from null together with the flow direction in the intersection region. The light emitted from the sample is registered by an imaging optical detection unit, and the focal plane of said optical detection unit lies in the intersection region.

Abstract: The invention relates to an illumination apparatus for a microscope, a microscope and a method for operating the illumination apparatus. The illumination apparatus has a sample space for holding a sample that is to be illuminated, and at least one laser light source. An objective for the directional emission of laser radiation of a first wavelength along a first optical axis that is directed into the sample space, and with a cover of the sample space by which the sample space is delimited at least on one of its sides. The cover further has a layer that is either impenetrable for the laser radiation over a blocking angle range of the illumination angle and is transmissive for radiation of a second wavelength over a transmitted light angle range, or has a controllable layer that, in a first control state, is transparent for radiation of the second wavelength and, in a second control state, is impenetrable for the laser radiation of the first wavelength.

Abstract: A localization microscope including an imaging device emitting sample light from a focal plane into an image plane, including an optical-manipulation device for depth-dependent influencing of a point-spread function of the imaging and influencing the point-spread function of the imaging such that a point emitter is imaged in the image plane into an image that is rotationally asymmetrically distorted. A form of the distortion depends on the location of the point emitter with respect to the focal plane and a wavelength of the sample light. The optical manipulation device includes first and second anisotropy elements that anisotropically influence the point spread function to produce rotational asymmetry of the point emitter image. The elements are arranged one behind the other in the imaging direction, with anisotropy axes at an angle to one another. Both elements have differing neutral wavelength at which they do not anisotropically influence the point spread.

Abstract: A method for operating a microscopy arrangement, and a microscopy arrangement, having a first microscope and at least one further microscope, wherein each of the microscopes have a respective optical axis. The respective optical axes do not coincide. The method provides a three-dimensional reference coordinate system being set; a carrier apparatus, that is embodied in the arrangement to receive and hold a specimen carrier is introduced into a specimen plane of the first microscope that is intersected by the optical axis and onto the optical axis of the first microscope; a reference point is set on the optical axis of the first microscope; the carrier apparatus is delivered to the further microscope, wherein the current coordinates of the reference point are continuously captured and compared to the coordinates of the optical axis of the at least one further microscope; and the reference point is brought onto the optical axis of the at least one further microscope.

Abstract: A method for adjusting a specimen holder in the beam path of a microscope, in which at least one beam of an illumination radiation is directed onto the specimen holder; a component of the illumination radiation reflected by the specimen holder is captured by means of a detector and measurement values of the captured illumination radiation are ascertained. A current actual manner of positioning of the specimen holder in relation to the beam path is established depending on the measurement values; the established actual manner of positioning is compared to an intended manner of positioning, and control commands for modifying the actual manner of positioning are produced, the execution of which causes the specimen holder to be moved into the intended manner of positioning.

Abstract: Specimen delimiting element which, at least in one region, has a nano-porous material which is transparent to at least one observation radiation which is capturable by means of a microscope. The nano-porous material has pores, the mean pore diameter of which is smaller than the wavelength of the observation radiation, and a proportion of at least 5% of the volume of the nano-porous material is taken up by the pores at least in portions of said nano-porous material.