Abstract: Systems and methods for delivering a sample to a mass spectrometer are provided. In one aspect, the system can include a sample source for generating a sample plume entrained in a primary gas stream in a first flow direction at a first flow rate, and a gas source for generating a secondary gas stream along a second flow direction different from the first flow direction and at a second flow rate greater than the first flow rate. The sample source and the gas source can be positioned relative to one another such that the primary gas stream intersects the secondary gas stream so as to generate a resultant gas stream propagating along a trajectory different from said first and second direction to bring the sample to proximity of a sampling orifice of the mass spectrometer.

Abstract: Methods and systems for performing mass spectrometry are provided herein. In accordance with various aspects of the applicants' teachings, the methods and systems can utilize an ion mobility spectrometer operating at atmospheric or low-vacuum pressure to remove the major contributors to the contamination and degradation of critical downstream components of a mass spectrometer located within a high-vacuum system (e.g., ion optics, mass filters, detectors), with limited signal loss.

Abstract: Methods and apparatus for processing fluids on a macro- or micro-scale are described. In various aspects, a fluid may have a plurality of elongated (i.e., substantially rod-shaped) magnetic elements disposed therein within a fluid container. An illustrative fluid container is an actuator electrode or a processing vial of a microfluidic device, such as a digital microfluidic device. A magnet component may be configured to generate a magnetic force sufficient to influence the movement of the plurality of elongated magnetic elements within the fluid to be processed. For example, the magnetic force (or magnetic force gradient) may influence the plurality of elongated magnetic elements to rotate, spin, and/or move laterally side-to-side. The shape and movements of the plurality of elongated magnetic elements facilitate the rapid and efficient processing of the fluid, such as fluid mixing and/or fluid separation.

Abstract: Methods and systems for performing mass spectrometry are provided herein. In accordance with various aspects of the applicants' teachings, the methods and systems can utilize an ion mobility spectrometer operating at atmospheric or low-vacuum pressure to remove the major contributors to the contamination and degradation of critical downstream components of a mass spectrometer located within a high-vacuum system (e.g., ion optics, mass filters, detectors), with limited signal loss.

Abstract: Systems and methods for delivering a sample to a mass spectrometer are provided. In one aspect, the systems and methods can provide efficient cooling of an ion source probe to prevent overheating and the resulting degradation in ion sampling. In some aspects, such cooling can result in improved consistency and/or efficiency of ion formation. Moreover, ion source cooling in accordance with various aspects of the present teachings can allow for the use of higher temperatures in the ionization chamber (thereby improving desolvation) and/or can enable the use of lower flow rate sample sources than with conventional techniques.

Abstract: A method and apparatus for performing differential mobility spectrometer (DMS) which includes decreasing the amount of time that ions spend inside fringing fields generated by the DMS. The apparatus includes an entrance electrode plate sealingly engaged to the entrance of the DMS, and is electrically separated from the parallel plate electrodes of the DMS, the entrance electrode plate has an aperture for allowing the traversal of ions into the DMS; wherein the cross-sectional area of the aperture is less than the cross-sectional area of the ion path, the ion path being located between the two parallel plate electrodes of the DMS. The entrance electrode plate may also have a focusing potential applied to it for focusing of ions.

Abstract: Differential mobility spectrometry is performed under vacuum. Ions generated in a high pressure region are received from the inlet orifice of a vacuum chamber using a first ion guide located in the vacuum chamber. The first ion guide focuses the generated ions on a DMS device inlet end using a plurality of tapered electrodes. The DMS device is coaxial and adjacent to the first ion guide. The DMS device separates the focused ions using a plurality of electrodes. The inscribed diameter at the DMS device inlet end is larger than the inscribed diameter at the first ion guide exit end to maximize ion transfer. The separated ions are received from the DMS device using a second ion guide coaxial and adjacent to the DMS device. The second ion guide focuses the separated ions on an exit orifice of the vacuum chamber using a plurality of tapered electrodes.

Abstract: A method and system for performing an ion mobility based analysis that ionizes the components of a sample into ions; provides a field asymmetric waveform ion mobility or differential mobility spectrometry ion mobility based filter that comprises at least two electrodes, the at least two electrodes being spaced apart such that a constant sized gap is formed there between, through which a drift gas flows; introducing said ions into the drift gas, wherein said drift gas also comprises a mixture of liquid modifiers.

Abstract: Methods and systems for performing mass spectrometry are provided herein. In accordance with various aspects of the applicants' teachings, the methods and systems can utilize an ion mobility spectrometer operating at atmospheric or low-vacuum pressure to remove the major contributors to the contamination and degradation of critical downstream components of a mass spectrometer located within a high-vacuum system (e.g., ion optics, mass filters, detectors), with limited signal loss.

Abstract: A mass analysis system including a low pressure dissociation region and a differential mobility spectrometer. The differential mobility spectrometer including at least one pair of filter electrodes defining an ion flow path where the filter electrodes generate an electric field for passing through a selected portion of the sample ions based on the mobility characteristics of the sample ions. The differential mobility spectrometer also includes a voltage source that provides DC and RF voltages to at least one of the filter electrodes to generate the electric field, an ion inlet that receives sample ions that have passed through the low pressure dissociation region, and an ion outlet that outputs the selected portion of the sample ions. A mass spectrometer receives some or all of the selected portion of the sample ions.

Abstract: A system for sampling a surface includes a sampling probe having a housing and a socket, and a rolling sampling sphere within the socket. The housing has a sampling fluid supply conduit and a sampling fluid exhaust conduit. The sampling fluid supply conduit supplies sampling fluid to the sampling sphere. The sampling fluid exhaust conduit has an inlet opening for receiving sampling fluid carried from the surface by the sampling sphere. A surface sampling probe and a method for sampling a surface are also disclosed.

Abstract: A mass spectrometer system and method of operating same are provided. The system comprises an ion conduit for receiving ions; a boundary member defining a curtain gas chamber containing the ion conduit; a curtain gas supply for providing a curtain gas to an inlet of the ion conduit to provide a gas flow into the conduit, and a curtain gas outflow out of a curtain gas chamber inlet; a mass spectrometer at least partially sealed to, and in fluid communication with, the conduit for receiving the ions from the conduit; a vacuum chamber surrounding the mass spectrometer operable to draw the gas flow including the ions through the conduit and into the vacuum chamber; and, a gas outlet for drawing a gas outflow from the gas flow located between the conduit and the mass spectrometer to increase the gas flow rate through the conduit.

Abstract: A system and method for mass spectrometry including a curtain gas chamber defined by a curtain plate having an aperture for receiving ions from an ion source and an orifice plate having an inlet into a mass spectrometer. At least one barrier separates the curtain chamber into a first curtain gas chamber region and a second curtain gas chamber region. At least one gas source provides a gas inflow into the second curtain gas chamber region and a gas outflow into the first curtain gas chamber region, a portion of the gas outflow directed out of the aperture. A heating element heats the gas inflow, a portion of the heated gas inflow directed into the inlet of the mass spectrometer wherein the portion of the heated gas inflow can be at a substantially higher temperature than the portion of the gas outflow.

Abstract: A mass spectrometer system and method of operating same are provided. The system comprises an ion conduit for receiving ions; a boundary member defining a curtain gas chamber containing the ion conduit; a curtain gas supply for providing a curtain gas to an inlet of the ion conduit to provide a gas flow into the conduit, and a curtain gas outflow out of a curtain gas chamber inlet; a mass spectrometer at least partially sealed to, and in fluid communication with, the conduit for receiving the ions from the conduit; a vacuum chamber surrounding the mass spectrometer operable to draw the gas flow including the ions through the conduit and into the vacuum chamber; and, a gas outlet for drawing a gas outflow from the gas flow located between the conduit and the mass spectrometer to increase the gas flow rate through the conduit.

Abstract: A system for sampling a surface includes a sampling probe having a housing and a socket, and a rolling sampling sphere within the socket. The housing has a sampling fluid supply conduit and a sampling fluid exhaust conduit. The sampling fluid supply conduit supplies sampling fluid to the sampling sphere. The sampling fluid exhaust conduit has an inlet opening for receiving sampling fluid carried from the surface by the sampling sphere. A surface sampling probe and a method for sampling a surface are also disclosed.

Abstract: A system and method for mass spectrometry including a curtain gas chamber defined by a curtain plate having an aperture for receiving ions from an ion source and an orifice plate having an inlet into a mass spectrometer. At least one barrier separates the curtain chamber into a first curtain gas chamber region and a second curtain gas chamber region. At least one gas source provides a gas inflow into the second curtain gas chamber region and a gas outflow into the first curtain gas chamber region, a portion of the gas outflow directed out of the aperture. A heating element heats the gas inflow, a portion of the heated gas inflow directed into the inlet of the mass spectrometer wherein the portion of the heated gas inflow can be at a substantially higher temperature than the portion of the gas outflow.

Abstract: Systems and methods for delivering a sample to a mass spectrometer are provided. In one aspect, the system can include a sample source for generating a sample plume entrained in a primary gas stream in a first flow direction at a first flow rate, and a gas source for generating a secondary gas stream along a second flow direction different from the first orifice plate flow direction and at a second flow rate greater than the first flow rate. The sample source and the gas source can be positioned relative to one another such that the primary gas stream intersects the secondary gas stream so as to generate a resultant gas stream propagating along a trajectory different from said first and second direction to bring the sample to proximity of a sampling orifice of the mass spectrometer.

Abstract: A mass spectrometer system and method of operating same are provided. The system comprises an ion conduit for receiving ions; a boundary member defining a curtain gas chamber containing the ion conduit; a curtain gas supply for providing a curtain gas to an inlet of the ion conduit to provide a gas flow into the conduit, and a curtain gas outflow out of a curtain gas chamber inlet; a mass spectrometer at least partially sealed to, and in fluid communication with, the conduit for receiving the ions from the conduit; a vacuum chamber surrounding the mass spectrometer operable to draw the gas flow including the ions through the conduit and into the vacuum chamber; and, a gas outlet for drawing a gas outflow from the gas flow located between the conduit and the mass spectrometer to increase the gas flow rate through the conduit.

Abstract: A sample analysis system incorporates an ion removal mechanism for removing residual ions from the sample analysis system. The ion removal mechanism can be included in an ion optics assembly, which connects an ion mobility filter to a mass analyzer. A sample to be analyzed by the sample analysis system may be entered into an ion mobility filter. The ion mobility filter filters the ions of the sample and passes the filtered group of ions to the ion optics assembly. The ion optics assembly transports the filtered group of ions to a mass analyzer where some or all of the ions in the group are detected. The ion removal mechanism then removes all or substantially all residual ions from the ion optics that were left over from the first filtered group before a second filtered group is passed through.

Abstract: A mass analysis system including a low pressure dissociation region and a differential mobility spectrometer. The differential mobility spectrometer including at least one pair of filter electrodes defining an ion flow path where the filter electrodes generate an electric field for passing through a selected portion of the sample ions based on the mobility characteristics of the sample ions. The differential mobility spectrometer also includes a voltage source that provides DC and RF voltages to at least one of the filter electrodes to generate the electric field, an ion inlet that receives sample ions that have passed through the low pressure dissociation region, and an ion outlet that outputs the selected portion of the sample ions. A mass spectrometer receives some or all of the selected portion of the sample ions.