Patents by Inventor Tim Lesher

Tim Lesher has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Abbreviated Loopback Attenuation
    Publication number: 20230393174
    Abstract: Improved performance for attenuated testing when probing a device under test with a probe array is provided. By moving the attenuation components from their conventional location on the printed circuit board of the probe head to the space transformer of the probe head, electrical path lengths can be decreased, thereby improving performance. This is particularly helpful in connection with loopback testing.
    Type: Application
    Filed: June 5, 2023
    Publication date: December 7, 2023
    Inventors: Ernest Gammon McReynolds, Jerry Martyniuk, Tim Lesher, Tomoe Yokoyama, David Raschko, Uyen Nguyen, Pratik Bakul Ghate
  • Multi-conductor transmission line probe
    Patent number: 11486898
    Abstract: Vertical transmission line probes having alternating capacitive and inductive sections are provided. These alternating sections can be designed to provide a desired transmission line impedance (e.g., between 10 and 100 Ohms, preferably 50 Ohms). Probe flexure in operation is mainly in the inductive sections, advantageously reducing flexure stresses on the dielectrics in the capacitive sections.
    Type: Grant
    Filed: June 11, 2021
    Date of Patent: November 1, 2022
    Assignee: FormFactor, Inc.
    Inventors: Tim Lesher, Jason William Cosman
  • Multi-Conductor Transmission Line Probe
    Publication number: 20210389348
    Abstract: Vertical transmission line probes having alternating capacitive and inductive sections are provided. These alternating sections can be designed to provide a desired transmission line impedance (e.g., between 10 and 100 Ohms, preferably 50 Ohms). Probe flexure in operation is mainly in the inductive sections, advantageously reducing flexure stresses on the dielectrics in the capacitive sections.
    Type: Application
    Filed: June 11, 2021
    Publication date: December 16, 2021
    Inventors: Tim Lesher, Jason William Cosman
  • COOPERATIVE VOICE DIALOG AND BUSINESS LOGIC INTERPRETERS FOR A VOICE-ENABLED SOFTWARE APPLICATION
    Publication number: 20120121108
    Abstract: Embodiments of the invention address the deficiencies of the prior art by providing a method, apparatus, and program product to cooperatively mediate between voice-enabled operations and business logic. The method comprises receiving XML data and generating at least one object from the XML data. The method further comprises, in response to determining that the at least one object has been called, implementing an operation defined by a portion of the object.
    Type: Application
    Filed: November 16, 2010
    Publication date: May 17, 2012
    Inventors: Dennis Doubleday, Eric Stark, Arthur McNair, TIm Lesher, Mark Koenig, Ed Stoll, Mike Ressler, Swathi Voruganti
  • Probe for testing a device under test
    Patent number: 7898273
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Grant
    Filed: February 17, 2009
    Date of Patent: March 1, 2011
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin
  • Chuck for holding a device under test
    Patent number: 7876115
    Abstract: A chuck includes a conductive element that contacts a device under test in a location on the chuck. The chuck includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is electrically isolated from the upper surface of the chuck, and makes electrical contact with any device under test supported by the chuck.
    Type: Grant
    Filed: February 17, 2009
    Date of Patent: January 25, 2011
    Assignee: Cascade Microtech, Inc.
    Inventors: Craig Stewart, Anthony Lord, Jeff Spencer, Terry Burcham, Peter McCann, Rod Jones, John Dunklee, Tim Lesher, David Newton
  • Probe for testing a device under test
    Publication number: 20090267625
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: February 17, 2009
    Publication date: October 29, 2009
    Inventors: K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin
  • Chuck for holding a device under test
    Publication number: 20090153167
    Abstract: A chuck includes a conductive element that contacts a device under test in a location on the chuck.
    Type: Application
    Filed: February 17, 2009
    Publication date: June 18, 2009
    Inventors: Craig Stewart, Anthony Lord, Jeff Spencer, Terry Burcham, Peter McCann, Rodd Jones, John Dunklee, Tim Lesher, David Newton
  • Shielded probe for testing a device under test
    Patent number: 7518387
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Grant
    Filed: September 27, 2007
    Date of Patent: April 14, 2009
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M. E. Safwat
  • Shielded probe for testing a device under test
    Patent number: 7501842
    Abstract: A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal path and the probe tip.
    Type: Grant
    Filed: October 19, 2007
    Date of Patent: March 10, 2009
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin
  • Shielded probe for testing a device under test
    Patent number: 7498829
    Abstract: A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal path and the probe tip.
    Type: Grant
    Filed: October 19, 2007
    Date of Patent: March 3, 2009
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin
  • Chuck for holding a device under test
    Patent number: 7492172
    Abstract: A chuck that includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is electrically isolated from the upper surface of the chuck, and makes electrical contact with any device under test supported by the chuck.
    Type: Grant
    Filed: April 21, 2004
    Date of Patent: February 17, 2009
    Assignee: Cascade Microtech, Inc.
    Inventors: Craig Stewart, Anthony Lord, Jeff Spencer, Terry Burcham, Peter McCann, Rod Jones, John Dunklee, Tim Lesher, David Newton
  • Shielded probe for testing a device under test
    Patent number: 7489149
    Abstract: A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal oath and the probe tip.
    Type: Grant
    Filed: October 24, 2007
    Date of Patent: February 10, 2009
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M. E. Safwat
  • Shielded probe for testing a device under test
    Patent number: 7482823
    Abstract: A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal path and the probe tip.
    Type: Grant
    Filed: October 24, 2007
    Date of Patent: January 27, 2009
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M. E. Safwat
  • Shielded probe with low contact resistance for testing a device under test
    Patent number: 7436194
    Abstract: A probe measurement system having low, stable contact resistance for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Grant
    Filed: October 24, 2007
    Date of Patent: October 14, 2008
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M. E. Safwat
  • Probe for testing a device under test
    Patent number: 7394269
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Grant
    Filed: August 3, 2007
    Date of Patent: July 1, 2008
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin
  • Probe for testing a device under test
    Publication number: 20080054923
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: October 24, 2007
    Publication date: March 6, 2008
    Inventors: K. Gleason, Tim Lesher, Eric Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr Safwat
  • Probe for testing a device under test
    Publication number: 20080054929
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: October 24, 2007
    Publication date: March 6, 2008
    Inventors: K. Gleason, Tim Lesher, Eric Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr Safwat
  • Probe for testing a device under test
    Publication number: 20080048692
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: October 24, 2007
    Publication date: February 28, 2008
    Inventors: K. Gleason, Tim Lesher, Eric Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr Safwat
  • Probe for testing a device under test
    Publication number: 20080042671
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: October 19, 2007
    Publication date: February 21, 2008
    Inventors: K. Gleason, Tim Lesher, Mike Andrews, John Martin