Patents by Inventor Tim Lesher

Tim Lesher has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe for testing a device under test
    Publication number: 20080042672
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: October 19, 2007
    Publication date: February 21, 2008
    Inventors: K. Gleason, Tim Lesher, Mike Andrews, John Martin
  • Probe for testing a device under test
    Publication number: 20080024149
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: September 27, 2007
    Publication date: January 31, 2008
    Inventors: K. Gleason, Tim Lesher, Eric Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr Safwat
  • Shielded probe for high-frequency testing of a device under test
    Patent number: 7304488
    Abstract: A shielded probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe may include a probe tip that extends through a dielectric substrate that supports on a first surface a signal path to test instrumentation and on a second surface a ground path that shields both the signal path and the probe tip.
    Type: Grant
    Filed: December 1, 2006
    Date of Patent: December 4, 2007
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M. E. Safwat
  • Probe for testing a device under test
    Publication number: 20070273399
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: August 3, 2007
    Publication date: November 29, 2007
    Inventors: K. Gleason, Tim Lesher, Mike Andrews, John Martin
  • Shielded probe for testing a device under test
    Patent number: 7271603
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe measurement system preferably includes a probe having a conductive path extending between the first and second surfaces of a membrane and a probe contact electrically connected to the conductive path.
    Type: Grant
    Filed: March 28, 2006
    Date of Patent: September 18, 2007
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin
  • Probe for testing a device under test
    Publication number: 20070075716
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: December 1, 2006
    Publication date: April 5, 2007
    Inventors: K. Gleason, Tim Lesher, Eric Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr Safwat
  • Probe for testing a device under test
    Patent number: 7161363
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Grant
    Filed: May 18, 2004
    Date of Patent: January 9, 2007
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M. E. Safwat
  • Probe for testing a device under test
    Publication number: 20060170439
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: March 28, 2006
    Publication date: August 3, 2006
    Inventors: K. Gleason, Tim Lesher, Mike Andrews, John Martin
  • Shielded probe for testing a device under test
    Patent number: 7057404
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe measurement system preferably includes a probe having a conductive path between the first and second sides of a substrate and a probe contact electrically connected to the conductive path.
    Type: Grant
    Filed: May 23, 2003
    Date of Patent: June 6, 2006
    Assignee: Sharp Laboratories of America, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Mike Andrews, John Martin
  • Probe for testing a device under test
    Publication number: 20050099191
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: May 23, 2003
    Publication date: May 12, 2005
    Inventors: K. Gleason, Tim Lesher, Mike Andrews, John Martin
  • Chuck for holding a device under test
    Publication number: 20040232935
    Abstract: A chuck includes a conductive element that contacts a device under test in a location on the chuck.
    Type: Application
    Filed: April 21, 2004
    Publication date: November 25, 2004
    Inventors: Craig Stewart, Anthony Lord, Jeff Spencer, Terry Burcham, Peter McCann, Rod Jones, John Dunklee, Tim Lesher, David Newton
  • Probe for testing a device under test
    Publication number: 20040232927
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: May 18, 2004
    Publication date: November 25, 2004
    Inventors: K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M. E. Safwat
  • Probe for testing a device under test
    Patent number: 6815963
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Grant
    Filed: May 23, 2003
    Date of Patent: November 9, 2004
    Assignee: Cascade Microtech, Inc.
    Inventors: K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M. E. Safwat
  • Probe for testing a device under test
    Publication number: 20040004491
    Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
    Type: Application
    Filed: May 23, 2003
    Publication date: January 8, 2004
    Inventors: K. Reed Gleason, Tim Lesher, Eric W. Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M. E. Safwat