Abstract: A luminaire assembly (10) using a double-ended, unshielded high intensity discharge (HID) light source (100). In one aspect, the assembly (10) includes a light source mount (22) adapted to manually, without tools, mount and remove the HID light source (100). The light source mount (22) can optionally include structure (106L and R, 134L and R) to automatically position the light source (100) in a desired orientation. In another aspect, the assembly (10) includes a connection (104L and R, 304L and R, 306L and R) adapted to manually, without tools, connect the light source (100) to electrical power, the connection (104L and R, 304L and R, 306L and R) can be configured to have no electrically conducting surfaces directly exposed or accessible to human fingers and can be configured to be positioned relatively away from the light source (100).

Abstract: The invention provides a method of testing a circuit on a substrate. Generally speaking, a substrate is located in a transfer chuck, a surface of a test chuck is moved into contact with a substrate, the substrate is secured to the test chuck, the test chuck is moved relative to the transfer chuck so that the substrate moves off the transfer chuck, terminals on the substrate are moved into contact with contacts to electrically connect the circuit through the terminals and the contacts to an electric tester, signals are relayed through the terminal and the contacts between the electric tester and the circuit, the terminals are disengaged from the contacts, and the substrate is removed from the test chuck.

Abstract: A titanium alkoxide composition is provided, as represented by the chemical formula (OC6H5N)2Ti(OC6H5NH2)2. As prepared, the compound is a crystalline substance with a hexavalent titanium atom bonded to two OC6H5NH2 groups and two OC6H5N groups with a theoretical molecular weight of 480.38, comprising 60.01% C, 5.04% H and 11.66% N.

Abstract: An apparatus and method for checking alignment of a lighting fixture comprising a lighting fixture with a housing, reflective surface in the housing, light source in the housing, and a glass lens over an opening into the housing. A marking or indicia is placed on the glass lens in a known orientation with structure inside the housing that is visible from outside of the housing. By line of sight viewing of the marking or indicia, even from a distance away, an alignment of the marking or indicia with the structure inside the housing, the alignment or aiming orientation of the fixture can be determined. This can be used to check alignment of individual fixture, or can be used to check alignment of an array of fixtures, if the array has a known reference correlation to the fixture with the marking or indicia.

Abstract: A method for making a thin-film electrode, either an anode or a cathode, by preparing a precursor solution using an alkoxide reactant, depositing multiple thin film layers with each layer approximately 500–1000 ? in thickness, and heating the layers to above 600° C. to achieve a material with electrochemical properties suitable for use in a thin film battery. The preparation of the anode precursor solution uses Sn(OCH2C(CH3)3)2 dissolved in a solvent in the presence of HO2CCH3 and the cathode precursor solution is formed by dissolving a mixture of (Li(OCH2C(CH3)3))8 and Co(O2CCH3).H2O in at least one polar solvent.

Abstract: The invention provides a method of testing a circuit on a substrate. Generally speaking, a substrate is located in a transfer chuck, a surface of a test chuck is moved into contact with a substrate, the substrate is secured to the test chuck, the test chuck is moved relative to the transfer chuck so that the substrate moves off the transfer chuck, terminals on the substrate are moved into contact with contacts to electrically connect the circuit through the terminals and the contacts to an electric tester, signals are relayed through the terminal and the contacts between the electric tester and the circuit, the terminals are disengaged from the contacts, and the substrate is removed from the test chuck.

Abstract: A method, apparatus, and system for compensating for lamp lumen depreciation. The method includes operating the lamp under rated wattage for a period towards the first part of operating life of the lamp. Operating wattage is increased at one or more later times. Energy savings are realized. The increases also restore at least some light lost by lamp lumen depreciation. The apparatus uses a timer to track operating time of the lamp. A few wattage changes made at spaced apart times can be made in a number of ways, including changing capacitance to the lamp, or using different taps on the lamp ballast.

Abstract: The invention provides a method of testing a circuit on a substrate. Generally speaking, a substrate is located in a transfer chuck, a surface of a test chuck is moved into contact with a substrate, the substrate is secured to the test chuck, the test chuck is moved relative to the transfer chuck so that the substrate moves off the transfer chuck, terminals on the substrate are moved into contact with contacts to electrically connect the circuit through the terminals and the contacts to an electric tester, signals are relayed through the terminal and the contacts between the electric tester and the circuit, the terminals are disengaged from the contacts, and the substrate is removed from the test chuck.

Abstract: A luminaire assembly (10) using a double-ended, unshielded high intensity discharge (HID) light source (100). In one aspect, the assembly (10) includes a light source mount (22) adapted to manually, without tools, mount and remove the HID light source (100). The light source mount (22) can optionally include structure (106L and R, 134L and R) to automatically position the light source (100) in a desired orientation. In another aspect, the assembly (10) includes a connection (104L and R, 304L and R, 306L and R) adapted to manually, without tools, connect the light source (100) to electrical power, the connection (104L and R, 304L and R, 306L and R) can be configured to have no electrically conducting surfaces directly exposed or accessible to human fingers and can be configured to be positioned relatively away from the light source (100).

Abstract: The invention provides a method of testing a circuit on a substrate. Generally speaking, a substrate is located in a transfer chuck, a surface of a test chuck is moved into contact with a substrate, the substrate is secured to the test chuck, the test chuck is moved relative to the transfer chuck so that the substrate moves off the transfer chuck, terminals on the substrate are moved into contact with contacts to electrically connect the circuit through the terminals and the contacts to an electric tester, signals are relayed through the terminal and the contacts between the electric tester and the circuit, the terminals are disengaged from the contacts, and the substrate is removed from the test chuck.

Abstract: An apparatus and method for increasing operational life and performance of an arc tube or lamp. The method includes operating the arc tube and applying steps to encourage isothermal conditions around the arc tube. In one embodiment of the method, the arc tube (12) is rotated (40/41) during operation. Another embodiment includes directing air (32/34/26) onto the operating arc tube (12). An exemplary embodiment relates to a substantially high wattage HID unjacketed double ended arc lamp (12) operated in a substantially horizontal position, but the invention is not limited to the same.

Abstract: A method for providing an anhydrous route for the synthesis of amine capped coinage-metal (copper, silver, and gold) nanoparticles (NPs) using the coinage-metal mesityl (mesityl=C6H2(CH3)3-2,4,6) derivatives. In this method, a solution of (Cu(C6H2(CH3)3)5, (Ag(C6H2(CH3)3)4, or (Au(C6H2(CH3)3)5 is dissolved in a coordinating solvent, such as a primary, secondary, or tertiary amine; primary, secondary, or tertiary phosphine, or alkyl thiol, to produce a mesityl precursor solution. This solution is subsequently injected into an organic solvent that is heated to a temperature greater than approximately 100° C. After washing with an organic solvent, such as an alcohol (including methanol, ethanol, propanol, and higher molecular-weight alcohols), oxide free coinage NP are prepared that could be extracted with a solvent, such as an aromatic solvent (including, for example, toluene, benzene, and pyridine) or an alkane (including, for example, pentane, hexane, and heptane).

Abstract: The invention provides a method of testing a circuit on a substrate. Generally speaking, a substrate is located in a transfer chuck, a surface of a test chuck is moved into contact with a substrate, the substrate is secured to the test chuck, the test chuck is moved relative to the transfer chuck so that the substrate moves off the transfer chuck, terminals on the substrate are moved into contact with contacts to electrically connect the circuit through the terminals and the contacts to an electric tester, signals are relayed through the terminal and the contacts between the electric tester and the circuit, the terminals are disengaged from the contracts, and the substrate is removed from the test chuck.

Abstract: The invention provides a method of testing a circuit on a substrate. Generally speaking, a substrate is located in a transfer chuck, a surface of a test chuck is moved into contact with a substrate, the substrate is secured to the test chuck, the test chuck is moved relative to the transfer chuck so that the substrate moves off the transfer chuck, terminals on the substrate are moved into contact with contacts to electrically connect the circuit through the terminals and the contacts to an electric tester, signals are relayed through the terminal and the contacts between the electric tester and the circuit, the terminals are disengaged from the contacts, and the substrate is removed from the test chuck.

Abstract: The invention provides a method of testing a circuit on a substrate. Generally speaking, a substrate is located in a transfer chuck, a surface of a test chuck is moved into contact with a substrate, the substrate is secured to the test chuck, the test chuck is moved relative to the transfer chuck so that the substrate moves off the transfer chuck, terminals on the substrate are moved into contact with contacts to electrically connect the circuit through the terminals and the contacts to an electric tester, signals are relayed through the terminal and the contacts between the electric tester and the circuit, the terminals are disengaged from the contacts, and the substrate is removed from the test chuck.

Abstract: The invention provides a method of testing a circuit on a substrate. Generally speaking, a substrate is located in a transfer chuck, a surface of a test chuck is moved into contact with a substrate, the substrate is secured to the test chuck, the test chuck is moved relative to the transfer chuck so that the substrate moves off the transfer chuck, terminals on the substrate are moved into contact with contacts to electrically connect the circuit through the terminals and the contacts to an electric tester, signals are relayed through the terminal and the contacts between the electric tester and the circuit, the terminals are disengaged from the contacts, and the substrate is removed from the test chuck.