Abstract: A dynamic memory device is described which has multiple column address signal inputs. Data can be stored in the memory and selectively read therefrom. The column address signals are used to control the data communication. During a read operation, any one of the multiple column address signal inputs can be used to output data on all external communication lines. During a write operation, each column address signal input writes data from a portion of the external communication lines to the memory device.

Abstract: For use in a semiconductor circuit device, a uniquely-arranged tri-state output buffer responds to a control signal generated in the semiconductor circuit device and a below-ground voltage level at an output terminal to prevent wasted drain current and substrate current, and reduce capacitance at the pull-up node driving the output terminal. The output buffer includes a power supply signal providing at least one voltage level with respect to common; an output terminal; a pull-up node; a pull-down node; a first circuit responding to the control signal by providing a first control voltage on the pull-up node; and a second circuit responding to the control signal by providing a second control voltage on the pull-down node.

Abstract: An embodiment of the present invention provides a method to reduce a regulated power source voltage spike during operation of a dynamic random access memory by the steps of: providing a voltage spike reducer enabling pulse via a pulse generator circuit responsive to a pulse generator input signal; translating the voltage level of an unregulated power source via a level translation stage during the presence of the voltage spike reducer enabling pulse; amplifying a translated voltage level; and providing a measure of current from the unregulated power supply to the regulated power supply via a current driver stage that is responsive to the amplified translated voltage level translation.

Abstract: A two-phase integrated circuit charge pump is described. The charge pump has two bootable pump capacitors for driving the source of two output transistors. To maximize the pump supply voltage provided by the drain of the output transistors, the gate voltages are driven by a pair of charge sharing capacitors. A delay element is provided which delays the booting of one of the charge sharing capacitors until the other is booted and its charge is shared with the first capacitor. A sufficient output transistor gate voltage, therefore, is provided during one phase to supply the maximum available pump voltage.

Abstract: An integrated circuit memory device is described which can operate at high data speeds. The memory device can either store or retrieve data from the memory in a burst access operation. The burst operations latches a memory address from external address lines and internally generates additioned memory addresses. A clock signed is provided to synchronize the burst operations. The clock signed is independent of an address latch signal used to latch an external address.

Abstract: A voltage level translator is disclosed which translates a CMOS input signal into a CMOS output signal where the low voltage level of the output signal is equal to the high voltage level of the input signal. The voltage level translator is described in an integrated circuit such as memory circuits, including DRAMs. Specifically, the voltage level translator produces an output signal which can be used as a gate voltage on a precharge transistor for a booted circuit where the gate voltage need only drop to the high voltage level of the input signal to shut the transistor off. The voltage level translator described, therefore, reduces the time and power required to translate an input signal by limiting the voltage swing of the output signal.

Abstract: A memory circuit is described which can operate in one of a number of operating modes. The operating mode of the memory circuit can be changed in a non-volatile manner after the memory circuit is packaged to reduce production scrap or meet market demands. Disable circuitry is described which includes an anti-fuse that can be externally selectively blown to disable an operating mode. Control circuitry included in the memory circuit enables a new operating mode after the first operating mode is disable. A method of selectively disabling an operating mode is described. A hierarchical scheme is also described for enabling a new operating mode from a group of operating modes, for example page-mode, extended data output (EDO), or burst EDO.

Abstract: A memory device (10) for use in an electronic system (12). The system (12) includes a processor (16) that produces a plurality of control signals. The memory device (10) includes a memory array (18) coupled to receive control signals from the processor (18). The memory device (10) also includes a pulse generator (22) that receives at least one of the control signals from the processor (16). The pulse generator (22) includes a latch formed from, for example, a cross coupled pair of NAND-gates (32 and 34). A delayed signal from the latch is coupled to control the reset of the latch such that the latch of the pulse generator (22) outputs a modified control signal for the memory device (10) that has a pulse with a width that is at least as long as the delay.

Abstract: An integrated circuit memory device is described which can operate at high data speeds. The memory device can either store or retrieve data from the memory in a burst access operation. The burst operations latches a memory address from external address lines and internally generates additional memory addresses. An external input is used to terminate and change a burst operation. Circuitry is provided to monitor the external input during burst operations and provide an appropriate control signal.

Abstract: A dynamic memory device is described which has multiple column address signal inputs. Data can be stored in the memory and selectively read therefrom. The column address signals are used to control the data communication. During a read operation, any one of the multiple column address signal inputs can be used to output data on all external communication lines. During a write operation, each column address signal input writes data from a portion of the external communication lines to the memory device.

Abstract: A voltage generator is provided for use in a DRAM to generate an appropriate voltage for programming antifuses. This voltage generator is preferably implemented using a charge pump to generate the high voltage necessary for programming antifuses.

Abstract: An integrated circuit memory device is designed to perform high speed data write cycles. An address strobe signal is used to latch a first address. During a burst access cycle the address is incremented internal to the device with additional address strobe transitions. A new memory address is only required at the beginning of each burst access. Read/Write commands are issued once per burst access eliminating the need to toggle the Read/Write control line at the device cycle frequency. A transition of the Read/Write control line during a burst access is used to terminate the burst access and initialize the device for another burst access. Write cycle times are maximized to allow for increases in burst mode operating frequencies. Local logic gates near array sense amplifiers are used to control write data drivers to provide for maximum write times without crossing current during input/output line equilibration periods.

Abstract: A dynamic integrated circuit memory is described which has memory cells arranged in rows. The memory rows are selectively accessible using an addressing circuit and local phase lines. Distributed local phase driver circuits are used to drive the local phase lines to a pumped voltage which are coupled to the gate of a memory cell access transistor. Addressing circuitry is provided to selectively address the distributed local phase driver circuits.

Abstract: A row address detection circuit includes a fuse bank, including a plurality of fuses connected to a common node. A precharge circuit is connected to bias the common node at a supply voltage. The fuse bank is also coupled through an isolation circuit to a buffer circuit. Selected ones of the fuses are blown in a pattern corresponding to an address of a defective circuit to enable a redundant circuit to be substituted for the defective circuit. The isolation circuit allows the buffer circuit to measure the node voltage to determine if an input to a group of address select lines corresponds to the address of the defective circuit, yet isolates the buffer circuit from the common node to prevent partially blown fuses from placing an excessive load on the buffer circuit. In one embodiment, the isolation circuit is realized with a pair of transistors of opposite channel type coupled for synchronous switching to provide substantial isolation while minimizing voltage drop.

Abstract: A voltage level translator is disclosed which translates a CMOS input signal into a CMOS output signal where the low voltage level of the output signal is equal to the high voltage level of the input signal. The voltage level translator is described in an integrated circuit such as memory circuits, including DRAMs. Specifically, the voltage level translator produces an output signal which can be used as a gate voltage on a pre-charge transistor for a booted circuit where the gate voltage need only drop to the high voltage level of the input signal to shut the transistor off. The voltage level translator described, therefore, reduces the time and power required to translate an input signal by limiting the voltage swing of the output signal.

Abstract: An embodiment of the present invention provides a method to reduce a regulated power source voltage spike during operation of a dynamic random access memory by the steps of: providing a voltage spike reducer enabling pulse via a pulse generator circuit responsive to a pulse generator input signal; translating the voltage level of an unregulated power source via a level translation stage during the presence of the voltage spike reducer enabling pulse; amplifying a translated voltage level; and providing a measure of current from the unregulated power supply to the regulated power supply via a current driver stage that is responsive to the amplified translated voltage level translation.

Abstract: For use in a semiconductor circuit device, a tri-state output buffer responds to a control signal generated in the semiconductor circuit device and a below-ground voltage level at an output terminal to prevent wasted drain and substrate current, and to reduce capacitance at the pull-up node driving the output terminal. The output buffer includes a power supply signal providing at least one voltage level with respect to common, an output terminal, a pull-up node, a pull-down node, a first circuit responding to the control signal by providing a first control voltage on the pull-up node, and a second circuit responding to the control signal by providing a second control voltage on the pull-down The output buffer is designed to respond to a voltage level on the output terminal being at a level substantially below common by preventing current flow from the power supply to the output terminal.

Abstract: A method and circuit for generating a self-refresh mode signal and a self-refresh cycle signal. The circuit is a dynamic random access memory (DRAM) device having a control array of control cells charged to a potential by a current source and having a monitor circuit for monitoring the potential of the control array. The DRAM comprises a discharge circuit which discharges the potential of the control array in response to the monitor circuit detecting when the potential of the control array has reached a trip point. A counter circuit counts the number of cycles of charge and discharge and generates the self-refresh mode signal after a desired count is reached. The counter circuit continues to count the number of cycles of charge and discharge while in the refresh mode and generates a self-refresh cycle signal each time the counter circuit counts a desired number of counts.

Abstract: An embodiment of the present invention provides a method to reduce a regulated power source voltage spike during operation of a dynamic random access memory by the steps of: providing a voltage spike reducer enabling pulse via a pulse generator circuit responsive to a pulse generator input signal; translating the voltage level of an unregulated power source via a level translation stage during the presence of the voltage spike reducer enabling pulse; amplifying a translated voltage level; and providing a measure of current from the unregulated power supply to the regulated power supply via a current driver stage that is responsive to the amplified translated voltage level translation.

Abstract: A memory device includes an output buffer for temporarily storing first and second data that are sequentially retrieved from a memory array during a read cycle. The output buffer holds the first data until it is replaced by the second data. A pulse circuit is connected to the memory array and output buffer, and is designed to generate a pulse signal as soon as data becomes valid. The pulse signal causes the output buffer to replace the first data with the second data and to latch the second data therein until receipt of the next data. The pulse circuit generates the data valid signal upon receipt of the column address strobe and the presence of data on the data I/O lines. A method for outputting data from the memory device is also described.