Patents by Inventor Tomofumi Nishiura
Tomofumi Nishiura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230196580Abstract: A mark that identifies a lesion site is displayed on a tomographic image. A two-dimensional map and a graph are displayed regardless of whether or not the mark is displayed. The two-dimensional map represents lesion site probability distribution. The graph represents temporal change of lesion site probabilities.Type: ApplicationFiled: October 20, 2022Publication date: June 22, 2023Inventors: Kenta Inoue, Takehiro Tsujita, Tomofumi Nishiura, Yoko Horie, Maki Kuwayama
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Patent number: 11657909Abstract: To provide a medical image processing apparatus and a medical image processing method enabling a reduction in burden of re-imaging and re-interpretation of a medical image. The medical image processing apparatus for processing a medical image includes: a detection section that detects, from the medical image, a candidate region which is a region including a lesion candidate or target tissue, and that calculates an identification score for the candidate region; a designated region acquisition section that acquires a designated region which is a region designated by an operator; and a redetection section that calculates an identification score for the designated region based on the designated region and multiple predefined regions which are regions used in a process of detecting the candidate region.Type: GrantFiled: November 6, 2020Date of Patent: May 23, 2023Assignee: FUJIFILM HEALTHCARE CORPORATIONInventors: Yoshimi Noguchi, Tomofumi Nishiura
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Patent number: 11526991Abstract: In medical examination of breast cancer, a lesion computer-aided detection is performed in real time and with high accuracy, and a burden on a medical worker is reduced. A medical image processing apparatus that processes a medical image includes: a detection unit configured to detect a lesion candidate region; a validity evaluation unit configured to evaluate validity of the lesion candidate region by using a normal tissue region corresponding to the detected lesion candidate region; and a display unit configured to determine display content to a user by using an evaluation result.Type: GrantFiled: March 17, 2021Date of Patent: December 13, 2022Assignee: FUJIFILM HEALTHCARE CORPORATIONInventors: Nao Ito, Yoshimi Noguchi, Tomofumi Nishiura, Maki Kuwayama
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Publication number: 20220367038Abstract: A detection unit detects a lesion candidate contained in display frame data (a tomographic image), using a machine learned detection model. An exclusion processing unit collates a feature vector of the detected lesion candidate with feature vectors registered in an exclusion database to determine whether the detected lesion candidate is an exclusion target. When the detected lesion candidate is an exclusion target, a mark display control unit restricts display of a mark for indicating a lesion candidate.Type: ApplicationFiled: April 27, 2022Publication date: November 17, 2022Inventor: Tomofumi Nishiura
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Patent number: 11461938Abstract: An object of the invention is to provide a user with information that serves as a material for determining whether an image generated by processing including a neural network is valid. A reception signal output by an ultrasonic probe that has received an ultrasonic wave from a subject is received, and an ultrasonic image is generated based on the reception signal. A trained neural network receives the reception signal or the ultrasonic image, and outputs an estimated reception signal or an estimated ultrasonic image. A validity information generation unit generates information indicating validity of the estimated reception signal or the estimated ultrasonic image by using one or more of the reception signal, the ultrasonic image, the estimated reception signal, the estimated ultrasonic image, and output of an intermediate layer of the neural network.Type: GrantFiled: February 27, 2020Date of Patent: October 4, 2022Assignee: FUJIFILM HEALTHCARE CORPORATIONInventors: Kazuhiro Yamanaka, Hiroki Tanaka, Junichi Shiokawa, Tomofumi Nishiura
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Publication number: 20210366120Abstract: In medical examination of breast cancer, a lesion computer-aided detection is performed in real time and with high accuracy, and a burden on a medical worker is reduced. A medical image processing apparatus that processes a medical image includes: a detection unit configured to detect a lesion candidate region; a validity evaluation unit configured to evaluate validity of the lesion candidate region by using a normal tissue region corresponding to the detected lesion candidate region; and a display unit configured to determine display content to a user by using an evaluation result.Type: ApplicationFiled: March 17, 2021Publication date: November 25, 2021Inventors: Nao ITO, Yoshimi NOGUCHI, Tomofumi NISHIURA, Maki KUWAYAMA
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Publication number: 20210241886Abstract: To provide a medical image processing apparatus and a medical image processing method enabling a reduction in burden of re-imaging and re-interpretation of a medical image. The medical image processing apparatus for processing a medical image includes: a detection section that detects, from the medical image, a candidate region which is a region including a lesion candidate or target tissue, and that calculates an identification score for the candidate region; a designated region acquisition section that acquires a designated region which is a region designated by an operator; and a redetection section that calculates an identification score for the designated region based on the designated region and multiple predefined regions which are regions used in a process of detecting the candidate region.Type: ApplicationFiled: November 6, 2020Publication date: August 5, 2021Inventors: Yoshimi NOGUCHI, Tomofumi NISHIURA
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Publication number: 20210212660Abstract: An ultrasound diagnosis apparatus includes a processor for performing grouping processing and representative frame selection processing on a plurality of ultrasound frames that are sequentially generated with the passage of time. The grouping processing is processing that identifies a group of interest that is composed of a plurality of frames that satisfy at least one predetermined condition of interest. The representative frame selection processing is processing that selects a representative frame from among the plurality of frames that constitute the group of interest. The at least one predetermined condition of interest includes a condition that each of the plurality of frames includes data indicating a specific region identified by region recognition processing in which a characteristic region in an image is recognized as the specific region. The representative frame selection processing includes processing that selects the representative frame based on geometrical properties of the specific regions.Type: ApplicationFiled: June 11, 2020Publication date: July 15, 2021Applicant: Hitachi, Ltd.Inventor: Tomofumi Nishiura
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Publication number: 20200320750Abstract: An object of the invention is to provide a user with information that serves as a material for determining whether an image generated by processing including a neural network is valid. A reception signal output by an ultrasonic probe that has received an ultrasonic wave from a subject is received, and an ultrasonic image is generated based on the reception signal. A trained neural network receives the reception signal or the ultrasonic image, and outputs an estimated reception signal or an estimated ultrasonic image. A validity information generation unit generates information indicating validity of the estimated reception signal or the estimated ultrasonic image by using one or more of the reception signal, the ultrasonic image, the estimated reception signal, the estimated ultrasonic image, and output of an intermediate layer of the neural network.Type: ApplicationFiled: February 27, 2020Publication date: October 8, 2020Inventors: Kazuhiro YAMANAKA, Hiroki TANAKA, Junichi SHIOKAWA, Tomofumi NISHIURA
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Patent number: 9913625Abstract: Provided is a medical diagnosis device that further increases the reliability of measurement results on the basis of an image of a subject. The medical diagnosis device is characterized by being provided with: an image generation unit that generates an image of a subject; an auxiliary information generation unit that generates auxiliary information on the basis of input from an operation unit; a measurement computation unit that computes a measurement position using the image generated by the image generation unit, the auxiliary information, and measurement conditions, and computes measurement values using the image generated by the image generation unit and the computed measurement position; and a display unit that displays the image generated by the image generation unit, the input position information, and the measurement value computed by the measurement computation unit.Type: GrantFiled: November 20, 2013Date of Patent: March 13, 2018Assignee: Hitachi, Ltd.Inventors: Tomoaki Chono, Takahiro Kashiyama, Tomofumi Nishiura
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Patent number: 9342922Abstract: Apparatus and method of medical diagnostic imaging. The apparatus includes: an image unit for constructing volume image data by capturing images from a multiplicity of tomographic images of a sampling specimen and for constructing internal three dimensional images of the diagnosing object of the sampling specimen as seen from a viewing point; a display for displaying the three-dimensional images; an input unit for entering parameters for setting up a precutting plane at an inter-voxel image data boundary between voxel image data of the volume image data closer to the viewing point than the diagnosing object and voxel image data associated with the diagnosing object; and a control unit for controlling the structure of the three-dimensional images constructed by the image unit based on the precutting plane set up via the input unit, wherein the control unit extracts a boundary based on one of the parameters inputted to the input unit.Type: GrantFiled: July 25, 2012Date of Patent: May 17, 2016Assignee: HITACHI MEDICAL CORPORATIONInventor: Tomofumi Nishiura
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Publication number: 20160007972Abstract: To provide an ultrasonic imaging apparatus and an ultrasound image display method capable of preventing a three-dimensional ultrasound image from flickering due to an inappropriate ROI being calculated and improving the image quality of the ultrasound image. An ultrasonic imaging apparatus of the present invention is provided with: an ROI calculating section configured to calculate an ROI from ultrasound image data; a judgment section configured to judge whether the calculation of the ROI is successful or not on the basis of at least one of a position with a predetermined brightness difference and the number of positions with the brightness difference in the ultrasound image data; and a compensation section configured to compensate a failed ultrasound image based on the ROI judged to be failed by the judgment section with a successful ultrasound image based on the ROI judged to be successful by the judgment section.Type: ApplicationFiled: January 28, 2014Publication date: January 14, 2016Inventor: Tomofumi NISHIURA
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Publication number: 20150320399Abstract: Provided is a medical diagnosis device that further increases the reliability of measurement results on the basis of an image of a subject. The medical diagnosis device is characterized by being provided with: an image generation unit that generates an image of a subject; an auxiliary information generation unit that generates auxiliary information on the basis of input from an operation unit; a measurement computation unit that computes a measurement position using the image generated by the image generation unit, the auxiliary information, and measurement conditions, and computes measurement values using the image generated by the image generation unit and the computed measurement position; and a display unit that displays the image generated by the image generation unit, the input position information, and the measurement value computed by the measurement computation unit.Type: ApplicationFiled: November 20, 2013Publication date: November 12, 2015Applicant: HITACHI ALOKA MEDICAL, LTD.Inventors: Tomoaki Chono, Takahiro Kashiyama, Tomofumi Nishiura
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Publication number: 20140152661Abstract: Apparatus and method of medical diagnostic imaging. The apparatus includes: an image unit for constructing volume image data by capturing images from a multiplicity of tomographic images of a sampling specimen and for constructing internal three dimensional images of the diagnosing object of the sampling specimen as seen from a viewing point; a display for displaying the three-dimensional images; an input unit for entering parameters for setting up a precutting plane at an inter-voxel image data boundary between voxel image data of the volume image data closer to the viewing point than the diagnosing object and voxel image data associated with the diagnosing object; and a control unit for controlling the structure of the three-dimensional images constructed by the image unit based on the precutting plane set up via the input unit, wherein the control unit extracts a boundary based on one of the parameters inputted to the input unit.Type: ApplicationFiled: July 25, 2012Publication date: June 5, 2014Applicant: HITACHI MEDICAL CORPORATIONInventor: Tomofumi Nishiura
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Patent number: 8357897Abstract: A charged particle beam device enabling prevention of degradation of reproducibility of measurement caused by an increase of the beam diameter attributed to an image shift and having a function of dealing with device-to-device variation. The charged particle beam device is used for measuring the dimensions of a pattern on a specimen using a line profile obtained by detecting secondary charged particles emitted from the specimen when the specimen is scanned with a primary charged particle beam converged on the specimen. A lookup table in which the position of image shift and the variation of the beam diameter are associated is prepared in advance by actual measurement or calculation and registered. When the dimensions are measured, image processing is carried out so as to correct the line profile for the variation of the beam diameter while the lookup table is referenced, and thereby the situation where the beam diameter is effectively equal is produced irrespective of the position of the image shift.Type: GrantFiled: January 26, 2010Date of Patent: January 22, 2013Assignee: Hitachi High-Technologies CorporationInventors: Chie Shishido, Atsushi Miyamoto, Mayuka Iwasaki, Tomofumi Nishiura, Go Kotaki
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Patent number: 8331651Abstract: An apparatus and method for inspecting a defect of a circuit pattern formed on a semiconductor wafer includes a defect classifier have a comparison shape forming section for forming a plurality of comparison shapes corresponding to an SEM image of an inspection region by deforming the shape of the circuit pattern in accordance with a plurality of shape deformation rules using design data corresponding to the circuit pattern within the inspection region and a shape similar to the SEM image of the inspection region out of the plurality of comparison shapes formed and selected as the comparison shape, and a shape comparing and classifying section for classifying the SEM image using information of the comparison shape selected in the comparison shape forming section and the inspection shape of the circuit pattern of the SEM image of the inspection region.Type: GrantFiled: September 13, 2011Date of Patent: December 11, 2012Assignee: Hitachi High-Technologies CorporatiopnInventors: Tomofumi Nishiura, Atsushi Miyamoto, Chie Shishido, Takumichi Sutani
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Patent number: 8283630Abstract: In the dimension measurement of a circuit pattern using a scanning electron microscope (SEM), in order to make it possible to automatically image desired evaluation points (EPs) on a sample, and automatically measure the circuit pattern formed at the evaluation points, according to the present invention, in the dimension measurement of a circuit pattern using a scanning electron microscope (SEM), it is arranged that coordinate data of the EP and design data of the circuit pattern including the EP are used as an input, creation of a dimension measurement cursor for measuring the pattern existing in the EP and selection or setting of the dimension measurement method are automatically performed based on the EP coordinate data and the design data to automatically create a recipe, and automatic imaging/measurement is performed using the recipe.Type: GrantFiled: February 10, 2011Date of Patent: October 9, 2012Assignee: Hitachi High-Technologies CorporationInventors: Atsushi Miyamoto, Tomofumi Nishiura
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Publication number: 20120104254Abstract: A charged particle beam device enabling prevention of degradation of reproducibility of measurement caused by an increase of the beam diameter attributed to an image shift and having a function of dealing with device-to-device variation. The charged particle beam device is used for measuring the dimensions of a pattern on a specimen using a line profile obtained by detecting secondary charged particles emitted from the specimen when the specimen is scanned with a primary charged particle beam converged on the specimen. A lookup table in which the position of image shift and the variation of the beam diameter are associated is prepared in advance by actual measurement or calculation and registered. When the dimensions are measured, image processing is carried out so as to correct the line profile for the variation of the beam diameter while the lookup table is referenced, and thereby the situation where the beam diameter is effectively equal is produced irrespective of the position of the image shift.Type: ApplicationFiled: January 26, 2010Publication date: May 3, 2012Inventors: Chie Shishido, Atsushi Miyamoto, Mayuka Iwasaki, Tomofumi Nishiura, Go Kotaki
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Publication number: 20120002861Abstract: An apparatus and method for inspecting a defect of a circuit pattern formed on a semiconductor wafer includes a defect classifier have a comparison shape forming section for forming a plurality of comparison shapes corresponding to an SEM image of an inspection region by deforming the shape of the circuit pattern in accordance with a plurality of shape deformation rules using design data corresponding to the circuit pattern within the inspection region and a shape similar to the SEM image of the inspection region out of the plurality of comparison shapes formed and selected as the comparison shape, and a shape comparing and classifying section for classifying the SEM image using information of the comparison shape selected in the comparison shape forming section and the inspection shape of the circuit pattern of the SEM image of the inspection region.Type: ApplicationFiled: September 13, 2011Publication date: January 5, 2012Inventors: Tomofumi Nishiura, Atsushi Miyamoto, Chie Shishido, Takumichi Sutani
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Patent number: 8073242Abstract: This invention relates to a SEM system constructed to create imaging recipes or/and measuring recipes automatically and at high speed, and improve inspection efficiency and an automation ratio, and to a method using the SEM system; a method for creation of imaging recipes and measuring recipes in the SEM system is adapted to include, in a recipe arithmetic unit, the steps of evaluating a tolerance for an imaging position error level at an evaluation point, evaluating a value predicted of the imaging position error level at the evaluation point when any region on circuit pattern design data is defined as an addressing point, and determining an imaging recipe and a measuring recipe on the basis of a relationship between the tolerance for the imaging position error level at the evaluation point and the predicted value of the imaging position error level at the evaluation point.Type: GrantFiled: December 12, 2007Date of Patent: December 6, 2011Assignee: Hitachi High-Technologies CorporationInventors: Atsushi Miyamoto, Tomofumi Nishiura, Ryoichi Matsuoka, Hidetoshi Morokuma