Abstract: A processing device in a memory system connects a first data block of the memory device to a second data block of the memory device to generate a combined data block comprising a first plurality of sub-blocks of the first data block and a second plurality of sub-blocks of the second data block, wherein the connecting includes: for each wordline of a first plurality of wordlines of the first data block, creating a wordline connection short between the respective wordline of the first data block and a corresponding wordline of a second plurality of wordlines of the second data block, wherein the first plurality of wordlines and the second plurality of wordlines comprise data wordlines; and driving a first data wordline of the first data block and a second wordline of the second data block using a single string driver of the memory device.

Abstract: Control logic in a memory device identifies memory cells of a memory array configured as single-level cell (SLC) memory, where the memory cells include two or more memory cells programmed during a program phase and associated with a selected wordline of the memory array. The control logic further causes a program verify voltage to be applied to the selected wordline during a ganged SLC verify operation to be performed concurrently on the memory cells. In response to the memory cells failing to pass ganged SLC verify operation, the control logic further: copies first data, which is associated with a first memory cell, into the data recovery latch; causes a program verify operation to be performed separately on the first memory cell; and in response to the first memory cell reaching a program verify voltage, causes an inhibit of the first memory cell from further programming.

Abstract: Apparatus might include an array of memory cells and a controller for access of the array of memory cells. The controller might be configured to cause the apparatus to apply a sense voltage level to a control gate of a memory cell of the array of memory cells, generate N determinations whether the memory cell is deemed to activate or deactivate while applying the sense voltage level, wherein N is an integer value greater than or equal to three, deem the memory cell to have a threshold voltage in a first range of threshold voltages lower than the sense voltage level in response to a majority of the N determinations indicating activation of the memory cell, and deem the memory cell to have a threshold voltage in a second range of threshold voltages higher than the sense voltage level in response to a majority of the N determinations indicating activation of the memory cell.

Abstract: Described are systems and methods for all level coarse/fine programming of memory cells.

Abstract: Systems and methods for read operations and management are disclosed. More specifically, this disclosure is directed to receiving a first read command directed to a first logical address and receiving, after the first read command, a second read command directed to a second logic address. The method also includes receiving, after the second read command, a third read command directed to a third logical address and determining that the first logical address and the third logical address correspond to a first physical address and a third physical address, respectively. The first physical address and the third physical address can be associated with a first word line of a memory component while the second logical address corresponds to a second physical address associated with a second word line of the memory component. The method includes executing the first read command and the third read command sequentially.

Abstract: Described are systems and methods for concurrent slow-fast memory cell programming.

Abstract: A search pattern is generated based on an input search word comprising a first sequence of bits. The search pattern comprises a first set of signals representing the input search word and a second set of signals representing a second sequence of bits comprising an inverse of the first sequence of bits. The search pattern is provided as input to search lines of a content addressable memory (CAM) block. The search pattern causes at least one string in the CAM block to be conductive and provide a signal to a page buffer connected to the string in response to the input search word matching a data entry stored on the string. A location of the data entry is determined based on data read from the page buffer and the location is output.

Abstract: A memory system includes a memory device comprising a content addressable memory (CAM) block comprising a plurality of key tables each storing a respective plurality of stored search keys. The memory system further includes a processing device that receives, from a requestor, an input search key and an indication of one of the plurality of key tables and identifies a match between the input search key and one of the plurality of stored search keys in the one of the plurality of key tables. The one of the plurality of stored search keys has an associated offset value indicating a location in a sorted string table (SSTable) corresponding to the one of the plurality of key tables. The processing device further reads the offset value from the one of the plurality of key tables and returns, to the requestor, the offset value read from the one of the plurality of key tables. The requestor can retrieve, from the location in the SSTable, data representing a value associated with the input search key.

Abstract: A processing device in a memory system receives an erase request to erase data stored at a data block of a memory device, the erase request identifying a selected sub-block of a plurality of sub-blocks of the data block for erase, each of the plurality of sub-blocks comprising select gate devices (SGDs) and data storage devices. For each sub-block of the plurality of sub-blocks not selected for erase, the processing device applies an input voltage at a bitline of the respective sub-block and applies a plurality of gate voltages to a plurality of wordlines of the respective sub-block, the plurality of wordlines are coupled to the SGDs and to the data storage devices, each voltage of the plurality of voltages applied to a successive wordline of the plurality of wordlines is less than a previous voltage applied to a previous wordline.

Abstract: Described are systems and methods for performing memory programming operations in the overwrite mode. An example memory device includes: a memory array comprising a plurality of memory cells electrically coupled to a plurality of wordlines and a plurality of bitlines; and a controller coupled to the memory array, the controller to perform operations comprising: responsive to identifying a first data item to be stored by a portion of the memory array, causing a first memory programming operation to be performed to program, to a first target threshold voltage, a set of memory cells included by the portion of the memory array; and responsive to identifying a second data item to be stored by the portion of the memory array, causing a second memory programming operation to be performed to program the set of memory cells to a second target threshold voltage exceeding the first target threshold voltage.

Abstract: Apparatus might include an array of memory cells and a controller for access of the array of memory cells. The controller might be configured to cause the apparatus to apply a sense voltage level to a control gate of a memory cell of the array of memory cells, generate N determinations whether the memory cell is deemed to activate or deactivate while applying the sense voltage level, wherein N is an integer value greater than or equal to three, deem the memory cell to have a threshold voltage in a first range of threshold voltages lower than the sense voltage level in response to a majority of the N determinations indicating activation of the memory cell, and deem the memory cell to have a threshold voltage in a second range of threshold voltages higher than the sense voltage level in response to a majority of the N determinations indicating activation of the memory cell.

Abstract: Described are systems and methods for reducing maximum programming voltage in memory programming operations. An example memory device comprises: a memory array comprising a plurality of memory cells electrically coupled to a plurality of wordlines and a plurality of bitlines; and a controller coupled to the memory array, the controller to perform operations comprising: identifying one or more memory cells for performing a memory programming operation, wherein the memory cells are electrically coupled to a target wordline and one or more target bitlines; causing drain-side select gates and source-side select gates of the memory array to be turned off; causing unselected wordlines of the memory array to discharge to a predefined voltage level; and causing one or more programming voltage pulses to be applied to the target wordline.

Abstract: Systems, apparatuses, and methods related to media management, including “garbage collection,” in memory or storage systems or sub-systems, such as solid state drives, are described. For example, a battery state associated with the memory system or sub-system may be used as an indicator or basis for managing a garbage collection operation on a data block. A controller or the system or sub-system may determine that a battery state or condition satisfies a criterion. Based on determining that the criterion is satisfied the, the garbage collection operation may be postponed until the battery state changes to satisfy a different battery condition.

Abstract: Systems, apparatuses, and methods related to media management, including “garbage collection,” in memory or storage systems or sub-systems, such as solid state drives, are described. For example, a signaling can be received that indicates a request from a controller to migrate valid data from a first data block to a second data block. For example, the first data block can be a data block of a plurality of memory cells configured as single-level-cell (SLC) memory. The second data block can be configured as multi-level-cell (MLC) memory. The data migration operation can include an error control operation that is performed using the memory component, the error control operation excluding transferring the data to the controller. The data can be migrated from the first data block configured as SLC memory to the second data block configured as MLC memory after the error control operation is performed using the memory component.

Abstract: Some embodiments include an assembly having channel-material-structures, and having memory cells along the channel-material-structures. The memory cells include charge-storage-material. Linear-conductive-structures are vertically offset from the channel-material-structures and are electrically coupled with the channel-material-structures. Intervening regions are between the linear-conductive-structures. Conductive-shield-structures are within the intervening regions. The conductive-shield-structures are electrically coupled with a reference-voltage-source.

Abstract: Control logic in a memory device causes a pass voltage to be applied to a plurality of wordlines of a block of a memory array of the memory device, the block comprising a plurality of sub-blocks, and the pass voltage to boost a channel potential of each of the plurality of sub-blocks to a boost voltage. The control logic further selectively discharges the boost voltage from one or more of the plurality of sub-blocks according to a data pattern representing a sequence of bits to be programmed to respective memory cells of the plurality of sub-blocks. In addition, the control logic causes a single programming pulse to be applied to a selected wordline of the plurality of wordlines of the block to program the respective memory cells of the plurality of sub-blocks according to the data pattern.

Abstract: Systems, apparatuses, and methods related to media management, including “garbage collection,” in memory or storage systems or sub-systems, such as solid state drives, are described. For example, a criticality value can be determined and used as a basis for managing a garbage collection operation on a data block. A controller or the system or sub-system may determine that a criticality value associated with performing a garbage collection operation satisfies a condition. Based on determining that the condition is satisfied, a parameter associated with performing the garbage collection operation can be adjusted. The garbage collection operation is performed on the data block stored on the memory component using the adjusted parameter.

Abstract: Memory devices might include an array of memory cells, a plurality of access lines, and a heater. The array of memory cells might include a plurality of strings of series-connected memory cells. Each access line of the plurality of access lines might be connected to a control gate of a respective memory cell of each string of series-connected memory cells of the plurality of strings of series-connected memory cells. The heater might be adjacent to an end of each access line of the plurality of access lines.

Abstract: Control logic in a memory device cause a programming pulse to be applied to a set of wordlines including a first set of even-numbered wordlines corresponding to a first set of memory cells to be erased and a second set of odd-numbered wordlines corresponding to a second set of memory cells to be erased, where a set of electrons are injected into a first set of gate regions, a second set of gate regions, and a set of inter-cell regions of a charge trap (CT) layer of the memory device. The control logic executes a first erase cycle on the first set of even-numbered wordlines to remove a first subset of electrons from the first set of gate regions corresponding to the first set of even-numbered wordlines. The control logic executes a second erase cycle on the second set of odd-numbered wordlines to remove a second subset of electrons from the second set of gate regions corresponding to the second set of even-numbered wordlines.

Abstract: Control logic in a memory device causes a boost voltage to be applied one or more times to a plurality of unselected wordlines of a block of the memory array, the block comprising a plurality of sub-blocks, and the boost voltage to boost a channel potential of each of the plurality of sub-blocks by an amount each time the boost voltage is applied. The control logic further selectively discharges the amount of boost voltage from one or more of the plurality of sub-blocks after each time the boost voltage is applied according to a data pattern representing a sequence of bits to be programmed to respective memory cells of the plurality of sub-blocks. Additionally, the control logic causes a single programming pulse to be applied to one or more selected wordlines of the block to program the respective memory cells of the plurality of sub-blocks according to the data pattern.