Patents by Inventor Toru Fujimura
Toru Fujimura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11977099Abstract: A method for manufacturing a semiconductor device in which probes and the layout of the electrode pads of a test element group (TEG) are associated is provided. As a semiconductor device is miniaturized, a scribe area on a wafer also tends to decrease. Accordingly, it is necessary to reduce the size of a TEG arranged in the scribe area, and efficiently arrange an electrode pad for probe contact. Thus, it is necessary to associate the probes and the layout of the electrode pad. According to the method, a layout of a TEG electrode pad corresponding to a plurality of probes arranged in a fan shape or probes manufactured by Micro Electro Mechanical Systems (MEMS) technology is provided.Type: GrantFiled: February 6, 2018Date of Patent: May 7, 2024Assignee: Hitachi High-Tech CorporationInventors: Tomohisa Ohtaki, Takayuki Mizuno, Ryo Hirano, Toru Fujimura, Shigehiko Kato, Yasuhiko Nara, Katsuo Ohki, Akira Kageyama, Masaaki Komori
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Publication number: 20240077712Abstract: Provided is an efficient method for attaching a tissue section. In the invention, one of problems is solved by changing attachment conditions of the tissue section depending on an organ from which the tissue section is derived. A technique of achieving good adhesiveness between a microscope slide and a section by introducing unevenness on a front surface of the microscope slide using reactive ion etching as one of the attachment conditions is provided. Further, a technique of optimizing the attachment of the section using a machine learning technique or the like is provided.Type: ApplicationFiled: October 16, 2019Publication date: March 7, 2024Inventors: Toru FUJIMURA, Takahito HASHIMOTO, Shigehiko KATO, Eiko NAKAZAWA, Masahiko AJIMA, Akira SAWAGUCHI
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Patent number: 11709199Abstract: As a semiconductor device is miniaturized, a scribe area on a wafer also tends to decrease. Accordingly, it is necessary to reduce the size of a TEG arranged in the scribe area, and efficiently arrange an electrode pad for probe contact. Therefore, it is necessary to associate probes and the efficient layout of the electrode pad. The purpose of the present invention is to provide a technique for associating probes and the layout of the electrode pads of a TEG so as to facilitate the evaluation of electrical characteristics. According to an evaluation apparatus for a semiconductor device of the present invention, the above described problems can be solved by providing a plurality of probes arranged in a fan shape or probes manufactured by Micro Electro Mechanical Systems (MEMS) technology.Type: GrantFiled: February 6, 2018Date of Patent: July 25, 2023Assignee: Hitachi High-Tech CorporationInventors: Tomohisa Ohtaki, Takayuki Mizuno, Ryo Hirano, Toru Fujimura, Shigehiko Kato, Yasuhiko Nara, Katsuo Ohki, Akira Kageyama, Masaaki Komori
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Patent number: 11391756Abstract: As a semiconductor device is miniaturized, a scribe area on a wafer also tends to decrease. Accordingly, it is necessary to reduce the size of a TEG arranged in the scribe area, and efficiently arrange an electrode pad for probe contact. Therefore, it is necessary to associate probes and the efficient layout of the electrode pad. The purpose of the present invention is to provide a technique for associating probes and the layout of an electrode pad of a TEG to facilitate the evaluation of electrical characteristics. According to the present invention, the above described problem can be solved by arranging a plurality of probes in a fan shape or manufacturing the probes with micro electro mechanical systems (MEMS) technology.Type: GrantFiled: February 6, 2018Date of Patent: July 19, 2022Assignee: Hitachi High-Tech CorporationInventors: Ryo Hirano, Takayuki Mizuno, Tomohisa Ohtaki, Toru Fujimura, Shigehiko Kato, Yasuhiko Nara, Katsuo Ohki, Akira Kageyama, Masaaki Komori
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Microscope Slide, Method for Manufacturing Microscope Slide, Observation Method, and Analysis Method
Publication number: 20210149172Abstract: It is not preferable to use a material other than materials that are used in the related art in order to prevent a section from peeling from a microscope slide. This is because, even if adhesiveness is improved, it is necessary to eliminate influence on processes such as dyeing. An object of the invention is to provide a technique for preventing a section from peeling off without applying an additional material. In the invention, the above-described problem is solved by etching at least a part of a region of a surface of a substrate with reactive ions.Type: ApplicationFiled: April 17, 2018Publication date: May 20, 2021Inventor: Toru FUJIMURA -
Publication number: 20210048450Abstract: As a semiconductor device is miniaturized, a scribe area on a wafer also tends to decrease. Accordingly, it is necessary to reduce the size of a TEG arranged in the scribe area, and efficiently arrange an electrode pad for probe contact. Therefore, it is necessary to associate probes and the efficient layout of the electrode pad. The purpose of the present invention is to provide a technique for associating probes and the layout of the electrode pads of a TEG so as to facilitate the evaluation of electrical characteristics. According to a method for manufacturing a semiconductor device of the present invention, the above-described problems can be solved by providing a layout of a TEG electrode pad corresponding to a plurality of probes arranged in a fan shape or probes manufactured by Micro Electro Mechanical Systems (MEMS) technology.Type: ApplicationFiled: February 6, 2018Publication date: February 18, 2021Inventors: Tomohisa OHTAKI, Takayuki MIZUNO, Ryo HIRANO, Toru FUJIMURA, Shigehiko KATO, Yasuhiko NARA, Katsuo OHKI, Akira KAGEYAMA, Masaaki KOMORI
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Publication number: 20210033642Abstract: As a semiconductor device is miniaturized, a scribe area on a wafer also tends to decrease. Accordingly, it is necessary to reduce the size of a TEG arranged in the scribe area, and efficiently arrange an electrode pad for probe contact. Therefore, it is necessary to associate probes and the efficient layout of the electrode pad. The purpose of the present invention is to provide a technique for associating probes and the layout of an electrode pad of a TEG to facilitate the evaluation of electrical characteristics. According to the present invention, the above described problem can be solved by arranging a plurality of probes in a fan shape or manufacturing the probes with micro electro mechanical systems (MEMS) technology.Type: ApplicationFiled: February 6, 2018Publication date: February 4, 2021Inventors: Ryo HIRANO, Takayuki MIZUNO, Tomohisa OHTAKI, Toru FUJIMURA, Shigehiko KATO, Yasuhiko NARA, Katsuo OHKI, Akira KAGEYAMA, Masaaki KOMORI
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Publication number: 20210025936Abstract: As a semiconductor device is miniaturized, a scribe area on a wafer also tends to decrease. Accordingly, it is necessary to reduce the size of a TEG arranged in the scribe area, and efficiently arrange an electrode pad for probe contact. Therefore, it is necessary to associate probes and the efficient layout of the electrode pad. The purpose of the present invention is to provide a technique for associating probes and the layout of the electrode pads of a TEG so as to facilitate the evaluation of electrical characteristics. According to an evaluation apparatus for a semiconductor device of the present invention, the above described problems can be solved by providing a plurality of probes arranged in a fan shape or probes manufactured by Micro Electro Mechanical Systems (MEMS) technology.Type: ApplicationFiled: February 6, 2018Publication date: January 28, 2021Inventors: Tomohisa OHTAKI, Takayuki MIZUNO, Ryo HIRANO, Toru FUJIMURA, Shigehiko KATO, Yasuhiko NARA, Katsuo OHKI, Akira KAGEYAMA, Masaaki KOMORI
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Patent number: 9291548Abstract: The invention makes it possible to measure binding of a biochemical substance with a high throughput and with high sensitivity using a small cell capable of being filled with a small amount of chemical solution. A space between a first substrate and a second substrate such that probes are immobilized on their mutually facing planes is used as a cell that houses a specimen solution. Light is irradiated from a first substrate side, and reflected light is subjected to spectroscopy. Binding of the target with the probe is detected by a wavelength shift in the refection spectrum.Type: GrantFiled: December 2, 2014Date of Patent: March 22, 2016Assignee: HITACHI, LTD.Inventors: Toru Fujimura, Kosuke Kuwabara, Tatsuro Ide
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Publication number: 20150086425Abstract: The invention makes it possible to measure binding of a biochemical substance with a high throughput and with high sensitivity using a small cell capable of being filled with a small amount of chemical solution. A space between a first substrate and a second substrate such that probes are immobilized on their mutually facing planes is used as a cell that houses a specimen solution. Light is irradiated from a first substrate side, and reflected light is subjected to spectroscopy. Binding of the target with the probe is detected by a wavelength shift in the refection spectrum.Type: ApplicationFiled: December 2, 2014Publication date: March 26, 2015Inventors: Toru FUJIMURA, Kosuke KUWABARA, Tatsuro IDE
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Patent number: 8922765Abstract: The invention makes it possible to measure binding of a biochemical substance with a high throughput and with high sensitivity using a small cell capable of being filled with a small amount of chemical solution. A space between a first substrate and a second substrate such that probes are immobilized on their mutually facing planes is used as a cell that houses a specimen solution. Light is irradiated from a first substrate side, and reflected light is subjected to spectroscopy. Binding of the target with the probe is detected by a wavelength shift in the refection spectrum.Type: GrantFiled: August 7, 2013Date of Patent: December 30, 2014Assignee: Hitachi, Ltd.Inventors: Toru Fujimura, Kosuke Kuwabara, Tatsuro Ide
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Publication number: 20130315784Abstract: The invention makes it possible to measure binding of a biochemical substance with a high throughput and with high sensitivity using a small cell capable of being filled with a small amount of chemical solution. A space between a first substrate and a second substrate such that probes are immobilized on their mutually facing planes is used as a cell that houses a specimen solution. Light is irradiated from a first substrate side, and reflected light is subjected to spectroscopy. Binding of the target with the probe is detected by a wavelength shift in the refection spectrum.Type: ApplicationFiled: August 7, 2013Publication date: November 28, 2013Applicant: Hitachi, Ltd.Inventors: Toru FUJIMURA, Kosuke Kuwabara, Tatsuro Ide
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Patent number: 8525985Abstract: The invention makes it possible to measure binding of a biochemical substance with a high throughput and with high sensitivity using a small cell capable of being filled with a small amount of chemical solution. A space between a first substrate and a second substrate such that probes are immobilized on their mutually facing planes is used as a cell that houses a specimen solution. Light is irradiated from a first substrate side, and reflected light is subjected to spectroscopy. Binding of the target with the probe is detected by a wavelength shift in the refection spectrum.Type: GrantFiled: October 24, 2012Date of Patent: September 3, 2013Assignee: Hitachi, Ltd.Inventors: Toru Fujimura, Kosuke Kuwabara, Tatsuro Ide
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Patent number: 8325335Abstract: The invention makes it possible to measure binding of a biochemical substance with a high throughput and with high sensitivity using a small cell capable of being filled with a small amount of chemical solution. A space between a first substrate and a second substrate such that probes are immobilized on their mutually facing planes is used as a cell that houses a specimen solution. Light is irradiated from a first substrate side, and reflected light is subjected to spectroscopy. Binding of the target with the probe is detected by a wavelength shift in the refection spectrum.Type: GrantFiled: November 23, 2011Date of Patent: December 4, 2012Assignee: Hitachi, Ltd.Inventors: Toru Fujimura, Kosuke Kuwabara, Tatsuro Ide
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Publication number: 20120069333Abstract: The invention makes it possible to measure binding of a biochemical substance with a high throughput and with high sensitivity using a small cell capable of being filled with a small amount of chemical solution. A space between a first substrate and a second substrate such that probes are immobilized on their mutually facing planes is used as a cell that houses a specimen solution. Light is irradiated from a first substrate side, and reflected light is subjected to spectroscopy. Binding of the target with the probe is detected by a wavelength shift in the refection spectrum.Type: ApplicationFiled: November 23, 2011Publication date: March 22, 2012Applicant: Hitachi, Ltd.Inventors: Toru Fujimura, Kosuke Kuwabara, Tatsuro Ide
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Patent number: 8089624Abstract: The invention makes it possible to measure binding of a biochemical substance with a high throughput and with high sensitivity using a small cell capable of being filled with a small amount of chemical solution. A space between a first substrate and a second substrate such that probes are immobilized on their mutually facing planes is used as a cell that houses a specimen solution. Light is irradiated from a first substrate side, and reflected light is subjected to spectroscopy. Binding of the target with the probe is detected by a wavelength shift in the refection spectrum.Type: GrantFiled: October 12, 2010Date of Patent: January 3, 2012Assignee: Hitachi, Ltd.Inventors: Toru Fujimura, Kosuke Kuwabara, Tatsuro Ide
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Publication number: 20110058162Abstract: The invention makes it possible to measure binding of a biochemical substance with a high throughput and with high sensitivity using a small cell capable of being filled with a small amount of chemical solution. A space between a first substrate and a second substrate such that probes are immobilized on their mutually facing planes is used as a cell that houses a specimen solution. Light is irradiated from a first substrate side, and reflected light is subjected to spectroscopy. Binding of the target with the probe is detected by a wavelength shift in the refection spectrum.Type: ApplicationFiled: October 12, 2010Publication date: March 10, 2011Inventors: Toru Fujimura, Kosuke Kuwabara, Tatsuro Ide
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Publication number: 20110012108Abstract: A semiconductor device includes a cell array and a plurality of process failure detection circuits each having a layout pattern substantially identical to that of a cell of the cell array in a dummy region arranged around the cell array. Each of the process failure detection circuits includes a dummy pattern that equalizes a degree of density/sparsity of a peripheral part of the cell array with that of a central part of the cell array. The process failure detection circuits include a process failure detection circuit having a layout pattern formed with a stricter pattern margin in at least one manufacturing process, compared with the layout pattern of the cell of the cell array.Type: ApplicationFiled: June 29, 2010Publication date: January 20, 2011Applicant: NEC Electronics CorporationInventor: Toru Fujimura
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Patent number: 7834998Abstract: The invention makes it possible to measure binding of a biochemical substance with a high throughput and with high sensitivity using a small cell capable of being filled with a small amount of chemical solution. A space between a first substrate and a second substrate such that probes are immobilized on their mutually facing planes is used as a cell that houses a specimen solution. Light is irradiated from a first substrate side, and reflected light is subjected to spectroscopy. Binding of the target with the probe is detected by a wavelength shift in the refection spectrum.Type: GrantFiled: May 12, 2010Date of Patent: November 16, 2010Assignee: Hitachi, Ltd.Inventors: Toru Fujimura, Kosuke Kuwabara, Tatsuro Ide
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Publication number: 20100220322Abstract: The invention makes it possible to measure binding of a biochemical substance with a high throughput and with high sensitivity using a small cell capable of being filled with a small amount of chemical solution. A space between a first substrate and a second substrate such that probes are immobilized on their mutually facing planes is used as a cell that houses a specimen solution. Light is irradiated from a first substrate side, and reflected light is subjected to spectroscopy. Binding of the target with the probe is detected by a wavelength shift in the refection spectrum.Type: ApplicationFiled: May 12, 2010Publication date: September 2, 2010Inventors: Toru Fujimura, Kosuke Kuwabara, Tatsuro Ide