Patents by Inventor Toshiharu Ishida

Toshiharu Ishida has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20020066583
    Abstract: An electronic equipment is capable of improving falling down shock resistance or impact resistance in an electronic equipment and of improving reliability of a solder joint in a semiconductor device die-bonded Si chip or the like to which thermal shock causing large deformation may act, bump mounting of BGA, CSP, WPP, flip-chip and so forth, a power module acting large stress and so forth. The electronic equipment has a circuit board and an electronic parts to be electrically connected to an electrode of the circuit board. The electrode of the circuit board and an electrode of the electronic part are connected by soldering using a lead free solder consisted of Cu: 0˜2.0 mass %, In: 0.1˜10 mass %, and Sn: remaining amount.
    Type: Application
    Filed: March 7, 2001
    Publication date: June 6, 2002
    Inventors: Tasao Soga, Hanae Shimokawa, Tetsuya Nakatsuka, Masato Nakamura, Yuji Fujita, Toshiharu Ishida, Masahide Okamoto, Koji Serizawa, Toshihiro Hachiya, Hideki Mukuno
  • Publication number: 20020019077
    Abstract: Provided are a bonded structure by a lead-free solder and an electronic article comprising the bonded structure. The bonded structure has a stable bonding interface with respect to a change in process of time, an enough strength and resistance to occurrence of whiskers while keeping good wettability of the solder. In the bonded structure, a lead-free Sn—Ag—Bi alloy solder is applied to an electrode through an Sn—Bi alloy layer. The Sn—Bi alloy, preferably, comprises 1 to 20 wt % Bi in order to obtain good wettability of the solder. In order to obtain desirable bonding characteristics having higher reliability in the invention, a copper layer is provided under the Sn—Bi alloy layer thereby obtaining an enough bonding strength.
    Type: Application
    Filed: October 9, 2001
    Publication date: February 14, 2002
    Inventors: Hanae Shimokawa, Tasao Soga, Hiroaki Okudaira, Toshiharu Ishida, Tetsuya Nakatsuka, Yoshiharu Inaba, Asao Nishimura
  • Publication number: 20020009610
    Abstract: Provided are a bonded structure by a lead-free solder and an electronic article comprising the bonded structure. The bonded structure has a stable bonding interface with respect to a change in process of time, an enough strength and resistance to occurrence of whiskers while keeping good wettability of the solder. In the bonded structure, a lead-free Sn—Ag—Bi alloy solder is applied to an electrode through an Sn—Bi alloy layer. The Sn—Bi alloy, preferably, comprises 1 to 20 wt % Bi in order to obtain good wettability of the solder. In order to obtain desirable bonding characteristics having higher reliability in the invention, a copper layer is provided under the Sn—Bi alloy layer thereby obtaining an enough bonding strength.
    Type: Application
    Filed: October 9, 2001
    Publication date: January 24, 2002
    Inventors: Hanae Shimokawa, Tasao Soga, Hiroaki Okudaira, Toshiharu Ishida, Tetsuya Nakatsuka, Yoshiharu Inaba, Asao Nishimura
  • Patent number: 6204490
    Abstract: Electronic components are bonded to an electronic circuit board with a lead-free solder. The bonded structure is cooled from a temperature close to the liquids temperature of the solder to a temperature close to the solids temperature of the solder at a first cooling rate of about 10 to 20° C./second, followed by cooling the bonded structure to a temperature lower than the solids temperature of the solder at a second cooling rate of about 0.1 to less than 5° C./second.
    Type: Grant
    Filed: June 1, 1999
    Date of Patent: March 20, 2001
    Assignee: Hitachi, Ltd.
    Inventors: Tasao Soga, Toshiharu Ishida, Tetsuya Nakatsuka, Hanae Shimokawa, Koji Serizawa, Yasuo Amano, Suguru Sakaguchi, Hiroshi Yamaguchi
  • Patent number: 5440171
    Abstract: In a tape carrier type semiconductor device with reinforcement wherein tape carrier type semiconductor modules are mounted in holes or depressions enclosed by a frame, and at least one flexible circuit is stacked additionally as required, and the semiconductor modules are electrically connected to electrodes formed on the frame, by mounting chip parts such as capacitors on the frame and/or flexible circuit, the mounting area of the semiconductor device can be reduced and the performance can be hyperfunctioned. By stacking a plurality of such semiconductor devices with reinforcement, much more satisfactory effects can be obtained.
    Type: Grant
    Filed: March 8, 1993
    Date of Patent: August 8, 1995
    Assignee: Hitachi, Ltd.
    Inventors: Ichiro Miyano, Kooji Serizawa, Suguru Sakaguchi, Toshiharu Ishida
  • Patent number: 5421081
    Abstract: A method for producing an electronic part mounting structure in which electronic parts such as IC packages are electrically connected to the surface of a printed circuit board utilizes a low-melting point metal. More particularly, the method provides an electronic part mounting structure capable of sufficiently and assuredly supplying solder to a portion between the terminal of a printed circuit board and the leads of an electric part while maintaining a predetermined thickness required to connect the printed circuit board and the electronic part to each other. By arranging the structure such that a gap, in which a solder layer having a predetermined thickness can be formed between the terminal of the printed circuit board and the lead of the electronic part to be connected to the terminal, is formed, the solder required to solder-connect the two elements can be sufficiently and assuredly supplied to the gap. Therefore, a reliable solder connection can be established.
    Type: Grant
    Filed: May 13, 1993
    Date of Patent: June 6, 1995
    Assignee: Hitachi, Ltd.
    Inventors: Suguru Sakaguchi, Toshiharu Ishida, Kooji Serizawa, Hiroyuki Tanaka, Ichiro Miyano, Hiroshi Nakamura