Patents by Inventor Toshihisa Anazawa

Toshihisa Anazawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20170316886
    Abstract: A photochemical electrode includes: an electrically conductive layer; and a photoexcitation material layer provided over the electrically conductive layer and including a photoexcitation material, wherein the photoexcitation material layer is one of a first photoexcitation material layer in which a potential of the conduction band minimum decreases from a second surface opposite to a first surface on the side of the electrically conductive layer toward the first surface and a second photoexcitation material layer in which a potential of the valence band maximum decreases from the second surface toward the first surface.
    Type: Application
    Filed: April 14, 2017
    Publication date: November 2, 2017
    Applicant: FUJITSU LIMITED
    Inventors: Yoshihiko Imanaka, Hideyuki AMADA, Toshio MANABE, Toshihisa Anazawa, Sachio IDO, Naoki AWAJI
  • Publication number: 20160074288
    Abstract: An intraoral fixing composition, containing: titanium apatite, which is obtained by substituting part of calcium in calcium hydroxyapatite with titanium, wherein the intraoral fixing composition is fixed at an intraoral site in an unreleasable state.
    Type: Application
    Filed: November 20, 2015
    Publication date: March 17, 2016
    Applicant: FUJITSU LIMITED
    Inventors: MASATO WAKAMURA, Toshihisa Anazawa, Mineharu Tsukada, Florence Nawalage Cooray
  • Publication number: 20150231606
    Abstract: A photocatalyst, represented by the following general formula (1): X(VO4)6(OH)2??General Formula (1) wherein X represents Za1Tib1 or Za2Tib2Agc2 (where Z is Ca or Sr; a1 is 7.0 to 9.5; b1 is 0.5 to 3.0; a2 is 7.0 to 9.5; b2 is 0.4 to 1.5; c2 is 0.1 to 2.0; a1+b1 is 9.0 to 10.0; and a2+b2+c2 is 9.0 to 10.0) in the general formula (1).
    Type: Application
    Filed: May 5, 2015
    Publication date: August 20, 2015
    Applicant: FUJITSU LIMITED
    Inventors: Mineharu Tsukada, Florence Nawalage Cooray, Toshihisa Anazawa, MASATO WAKAMURA
  • Publication number: 20140287913
    Abstract: A photocatalyst, which includes X.titanium hydroxyapatite doped with silver, where the X is an alkaline earth metal having an atomic number equal to or higher than that of calcium. A photocatalyst, which includes calcium.titanium hydroxyapatite, in which at least part of the calcium is substituted with an alkaline earth metal having an atomic number equal to or higher than that of strontium.
    Type: Application
    Filed: June 5, 2014
    Publication date: September 25, 2014
    Applicant: FUJITSU LIMITED
    Inventors: Mineharu TSUKADA, Toshihisa Anazawa, Masato Wakamura
  • Patent number: 7458254
    Abstract: There are provided an apparatus for evaluating a piezoelectric film, which contains: a detection unit containing a pair of probes, each probe containing a cantilever and a probe tip; and an evaluation unit, wherein the detection unit is configured to respectively place the probe tips on both surfaces of a sample comprising a piezoelectric film so as to detect a displacement magnitude of the pair of probes, and the evaluation unit is configured to evaluate either or both a deformation and a displacement of the piezoelectric film based upon the detected displacement magnitude of the pair of probes, and a method for evaluating a piezoelectric film by using the apparatus for evaluating a piezoelectric film.
    Type: Grant
    Filed: August 30, 2006
    Date of Patent: December 2, 2008
    Assignee: Fujitsu Limited
    Inventors: Toshihisa Anazawa, Mineharu Tsukada
  • Publication number: 20070227235
    Abstract: There are provided an apparatus for evaluating a piezoelectric film, which contains: a detection unit containing a pair of probes, each probe containing a cantilever and a probe tip; and an evaluation unit, wherein the detection unit is configured to respectively place the probe tips on both surfaces of a sample comprising a piezoelectric film so as to detect a displacement magnitude of the pair of probes, and the evaluation unit is configured to evaluate either or both a deformation and a displacement of the piezoelectric film based upon the detected displacement magnitude of the pair of probes, and a method for evaluating a piezoelectric film by using the apparatus for evaluating a piezoelectric film.
    Type: Application
    Filed: August 30, 2006
    Publication date: October 4, 2007
    Applicant: FUJITSU LIMITED
    Inventors: Toshihisa Anazawa, Mineharu Tsukada