Patents by Inventor Toshiyasu Suyama
Toshiyasu Suyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10234406Abstract: A radiation image acquisition system of an aspect of the present invention includes a radiation source emitting radiation toward an object, a holding unit holding the object, a wavelength conversion member generating scintillation light in response to incidence of the radiation emitted from the radiation source and transmitted through the object, a first imaging means condensing and imaging scintillation light emitted from an incidence surface of the radiation of the wavelength conversion member, a second imaging means condensing and imaging scintillation light emitted from a surface opposite to the incidence surface of the wavelength conversion member, a holding unit position adjusting means adjusting the position of the holding unit between the radiation source and the wavelength conversion member, and an imaging position adjusting means adjusting the position of the first imaging means.Type: GrantFiled: October 28, 2016Date of Patent: March 19, 2019Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
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Publication number: 20180306931Abstract: A radiation image acquisition system includes a radiation source that outputs radiation toward an object, a scintillator that has an input surface to which the radiation output from the radiation source and transmitted through the object is input, converts the radiation input to the input surface into scintillation light, and is opaque to the scintillation light, an image capturing means that includes a lens portion focused on the input surface and configured to image the scintillation light output from the input surface and an image capturing unit configured to capture an image of the scintillation light imaged by the lens portion and outputs radiation image data of the object A, and an image generating unit that generates a radiation image of the object based on the radiation image data output from the image capturing means.Type: ApplicationFiled: July 29, 2016Publication date: October 25, 2018Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Mototsugu SUGIYAMA, Tatsuya ONISHI, Toshiyasu SUYAMA
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Patent number: 10101469Abstract: A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member, wherein one of the first imaging means and the second imaging means condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction of a normal thereto, and wherein the other condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction inclined with respect to a direction of a normal thereto.Type: GrantFiled: December 18, 2015Date of Patent: October 16, 2018Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
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Patent number: 9696266Abstract: A nondestructive inspection device 1 comprises an X-ray indicator 20, a low-energy detector 32, a high-energy detector 42, a low-energy transmittance calculation unit 72, a high-energy transmittance calculation unit 74, a detection unit 76, and a correction unit 78. The calculation unit 72 calculates a value indicating the transmittance of transmission X-rays in a low energy range. The calculation unit 74 calculates a value indicating the transmittance of transmission X-rays in a high energy range. The detection unit 76 detects a positional deviation detail of the X-ray indicator 20 according to a ratio between the transmittances calculated by both of the calculation units 72, 74. When the positional deviation detail of the X-ray indicator 20 is detected by the detection unit 76, according to the positional deviation detail, the correction unit 78 corrects X-ray luminance data detected by the detectors 32, 42.Type: GrantFiled: August 22, 2012Date of Patent: July 4, 2017Assignee: HAMAMATSU PHOTONICS K.K.Inventor: Toshiyasu Suyama
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Publication number: 20170184514Abstract: A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.Type: ApplicationFiled: January 17, 2017Publication date: June 29, 2017Inventors: Toshiyasu SUYAMA, Tadashi MARUNO, Toshihide SASAKI, Junichi SONODA, Shinji TAKIHI
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Publication number: 20170122886Abstract: A radiation image acquisition system of an aspect of the present invention includes a radiation source emitting radiation toward an object, a holding unit holding the object, a wavelength conversion member generating scintillation light in response to incidence of the radiation emitted from the radiation source and transmitted through the object, a first imaging means condensing and imaging scintillation light emitted from an incidence surface of the radiation of the wavelength conversion member, a second imaging means condensing and imaging scintillation light emitted from a surface opposite to the incidence surface of the wavelength conversion member, a holding unit position adjusting means adjusting the position of the holding unit between the radiation source and the wavelength conversion member, and an imaging position adjusting means adjusting the position of the first imaging means.Type: ApplicationFiled: October 28, 2016Publication date: May 4, 2017Inventors: Mototsugu SUGIYAMA, Toshiyasu SUYAMA
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Patent number: 9594031Abstract: A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.Type: GrantFiled: January 23, 2015Date of Patent: March 14, 2017Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
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Publication number: 20170038314Abstract: An image acquisition device is an image acquisition device that acquires an X-ray transmission image of an object conveyed in a conveyance direction, and the image acquisition device includes an X-ray irradiator that outputs an X-ray, a belt conveyor that conveys the object in the conveyance direction, an X-ray detection camera having a scintillator that converts an X-ray penetrating the object into scintillation light, a line scan camera that detects the scintillation light and outputs a detection signal, and an amplifier that amplifies the detection signal at a predetermined set amplification factor and outputs a amplified signal, a controller that generates an X-ray transmission image based on the amplified signal, and an amplifier controller that sets one of a first amplification factor or a second amplification factor corresponding to an amplification factor lower than the first amplification factor as the set amplification factor based on a predetermined imaging condition.Type: ApplicationFiled: February 2, 2015Publication date: February 9, 2017Applicant: Hamamatsu Ohotonics K.K.Inventors: Toshiyasu SUYAMA, Tatsuya ONISHI
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Patent number: 9500600Abstract: A radiation image acquisition system of an aspect of the present invention includes a radiation source emitting radiation toward an object, a holding unit holding the object, a wavelength conversion member generating scintillation light in response to incidence of the radiation emitted from the radiation source and transmitted through the object, a first imaging means condensing and imaging scintillation light emitted from an incidence surface of the radiation of the wavelength conversion member, a second imaging means condensing and imaging scintillation light emitted from a surface opposite to the incidence surface of the wavelength conversion member, a holding unit position adjusting means adjusting the position of the holding unit between the radiation source and the wavelength conversion member, and an imaging position adjusting means adjusting the position of the first imaging means.Type: GrantFiled: June 18, 2013Date of Patent: November 22, 2016Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
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Patent number: 9329301Abstract: A radiation detection device 80 according to an embodiment of the present invention is a radiation detection device for a foreign substance inspection using a subtraction method, and includes a first radiation detector 32 that detects radiation in the first energy range transmitted through a specimen; and a second radiation detector that detects radiation in the second energy range higher than the radiation in the first energy range, and the thickness of a first scintillator layer 322 of the first radiation detector 32 is smaller than the thickness of a second scintillator layer 422 of the second radiation detector 42, and a first area S1 of each pixel 326 in a first pixel section 324 of the first radiation detector 32 is smaller than a second area S2 of each pixel 426 in a second pixel section 424 of the second radiation detector 42.Type: GrantFiled: June 29, 2010Date of Patent: May 3, 2016Assignee: HAMAMATSU PHOTONICS K. K.Inventor: Toshiyasu Suyama
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Publication number: 20160103231Abstract: A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member of a flat plate shape which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member, wherein one of the first imaging means and the second imaging means condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction of a normal thereto, and wherein the other of the first imaging means and the second imaging means condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction inclined with respect to a directType: ApplicationFiled: December 18, 2015Publication date: April 14, 2016Inventors: Mototsugu SUGIYAMA, Toshiyasu SUYAMA
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Patent number: 9279890Abstract: A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member of a flat plate shape which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member in a direction of a normal to the entrance surface; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member in a direction of a normal to the opposite surface.Type: GrantFiled: October 21, 2011Date of Patent: March 8, 2016Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
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Patent number: 9268039Abstract: A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member of a flat plate shape which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member in a direction inclined with respect to a direction of a normal to the entrance surface; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member in a direction inclined with respect to a direction of a normal to the opposite surface.Type: GrantFiled: October 21, 2011Date of Patent: February 23, 2016Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
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Patent number: 9255996Abstract: A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member, wherein one of the first imaging means and the second imaging means condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction of a normal thereto, and wherein the other condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction inclined with respect to a direction of a normal thereto.Type: GrantFiled: October 21, 2011Date of Patent: February 9, 2016Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
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Publication number: 20150185165Abstract: A radiation image acquisition system of an aspect of the present invention includes a radiation source emitting radiation toward an object, a holding unit holding the object, a wavelength conversion member generating scintillation light in response to incidence of the radiation emitted from the radiation source and transmitted through the object, a first imaging means condensing and imaging scintillation light emitted from an incidence surface of the radiation of the wavelength conversion member, a second imaging means condensing and imaging scintillation light emitted from a surface opposite to the incidence surface of the wavelength conversion member, a holding unit position adjusting means adjusting the position of the holding unit between the radiation source and the wavelength conversion member, and an imaging position adjusting means adjusting the position of the first imaging means.Type: ApplicationFiled: June 18, 2013Publication date: July 2, 2015Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
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Publication number: 20150139387Abstract: A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.Type: ApplicationFiled: January 23, 2015Publication date: May 21, 2015Inventors: Toshiyasu SUYAMA, Tadashi MARUNO, Toshihide SASAKI, Junichi SONODA, Shinji TAKIHI
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Patent number: 8981310Abstract: A radiation detection device 80 according to an embodiment is a radiation detection device for a foreign substance inspection using a subtraction method, and includes a first radiation detector 32 that detects radiation in a first energy range transmitted through a specimen S and generates a first image, a second radiation detector 42 that detects radiation in a second energy range higher than the radiation in the first energy range and generates a second image, a first image processing section 34 that applies image processing to the first image, and a second image processing section 44 that applies image processing to the second image, wherein a first pixel width in an image detection direction of each pixel of the first radiation detector 32 is smaller than a second pixel width in the image detection direction of each pixel of the second radiation detector 42, and the first image processing section 34 and the second image processing section 44 carry out pixel change processing to make the number of pixels oType: GrantFiled: June 29, 2010Date of Patent: March 17, 2015Assignee: Hamamatsu Photonics K.K.Inventor: Toshiyasu Suyama
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Patent number: 8964939Abstract: A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.Type: GrantFiled: June 27, 2012Date of Patent: February 24, 2015Assignee: Hamamatsu Photonics K.K.Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
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Patent number: 8873713Abstract: A radiation detection device 80 according to an embodiment is a radiation detection device for a foreign substance inspection using a subtraction method, including a first radiation detector 32 and a second radiation detector 42 that detect radiation transmitted through a specimen S, a timing control section 50 that controls detection timings, and an image correction section 34, wherein a first pixel width Wb1 in an orthogonal direction orthogonal to an image detection direction of each pixel of the first radiation detector 32 is smaller than a second pixel width Wb2 in the orthogonal direction of each pixel of the second radiation detector 42, the timing control section 50 synchronizes detection timings of the second radiation detector 42 to detection timings of the first radiation detector 32, and the image correction section 34 sums Wb2/Wb1 pixel data successive in an image from the first radiation detector 32.Type: GrantFiled: June 29, 2010Date of Patent: October 28, 2014Assignee: Hamamatsu Photonics K.K.Inventor: Toshiyasu Suyama
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Publication number: 20140294151Abstract: A nondestructive inspection device 1 comprises an X-ray indicator 20, a low-energy detector 32, a high-energy detector 42, a low-energy transmittance calculation unit 72, a high-energy transmittance calculation unit 74, a detection unit 76, and a correction unit 78. The calculation unit 72 calculates a value indicating the transmittance of transmission X-rays in a low energy range. The calculation unit 74 calculates a value indicating the transmittance of transmission X-rays in a high energy range. The detection unit 76 detects a positional deviation detail of the X-ray indicator 20 according to a ratio between the transmittances calculated by both of the calculation units 72, 74. When the positional deviation detail of the X-ray indicator 20 is detected by the detection unit 76, according to the positional deviation detail, the correction unit 78 corrects X-ray luminance data detected by the detectors 32, 42.Type: ApplicationFiled: August 22, 2012Publication date: October 2, 2014Applicant: HAMAMATSU PHOTONICS K.K.Inventor: Toshiyasu Suyama