Patents by Inventor Toshiyasu Suyama

Toshiyasu Suyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9329301
    Abstract: A radiation detection device 80 according to an embodiment of the present invention is a radiation detection device for a foreign substance inspection using a subtraction method, and includes a first radiation detector 32 that detects radiation in the first energy range transmitted through a specimen; and a second radiation detector that detects radiation in the second energy range higher than the radiation in the first energy range, and the thickness of a first scintillator layer 322 of the first radiation detector 32 is smaller than the thickness of a second scintillator layer 422 of the second radiation detector 42, and a first area S1 of each pixel 326 in a first pixel section 324 of the first radiation detector 32 is smaller than a second area S2 of each pixel 426 in a second pixel section 424 of the second radiation detector 42.
    Type: Grant
    Filed: June 29, 2010
    Date of Patent: May 3, 2016
    Assignee: HAMAMATSU PHOTONICS K. K.
    Inventor: Toshiyasu Suyama
  • Publication number: 20160103231
    Abstract: A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member of a flat plate shape which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member, wherein one of the first imaging means and the second imaging means condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction of a normal thereto, and wherein the other of the first imaging means and the second imaging means condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction inclined with respect to a direct
    Type: Application
    Filed: December 18, 2015
    Publication date: April 14, 2016
    Inventors: Mototsugu SUGIYAMA, Toshiyasu SUYAMA
  • Patent number: 9279890
    Abstract: A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member of a flat plate shape which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member in a direction of a normal to the entrance surface; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member in a direction of a normal to the opposite surface.
    Type: Grant
    Filed: October 21, 2011
    Date of Patent: March 8, 2016
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
  • Patent number: 9268039
    Abstract: A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member of a flat plate shape which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member in a direction inclined with respect to a direction of a normal to the entrance surface; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member in a direction inclined with respect to a direction of a normal to the opposite surface.
    Type: Grant
    Filed: October 21, 2011
    Date of Patent: February 23, 2016
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
  • Patent number: 9255996
    Abstract: A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member, wherein one of the first imaging means and the second imaging means condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction of a normal thereto, and wherein the other condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction inclined with respect to a direction of a normal thereto.
    Type: Grant
    Filed: October 21, 2011
    Date of Patent: February 9, 2016
    Assignee: HAMAMATSU PHOTONICS K.K.
    Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
  • Publication number: 20150185165
    Abstract: A radiation image acquisition system of an aspect of the present invention includes a radiation source emitting radiation toward an object, a holding unit holding the object, a wavelength conversion member generating scintillation light in response to incidence of the radiation emitted from the radiation source and transmitted through the object, a first imaging means condensing and imaging scintillation light emitted from an incidence surface of the radiation of the wavelength conversion member, a second imaging means condensing and imaging scintillation light emitted from a surface opposite to the incidence surface of the wavelength conversion member, a holding unit position adjusting means adjusting the position of the holding unit between the radiation source and the wavelength conversion member, and an imaging position adjusting means adjusting the position of the first imaging means.
    Type: Application
    Filed: June 18, 2013
    Publication date: July 2, 2015
    Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
  • Publication number: 20150139387
    Abstract: A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.
    Type: Application
    Filed: January 23, 2015
    Publication date: May 21, 2015
    Inventors: Toshiyasu SUYAMA, Tadashi MARUNO, Toshihide SASAKI, Junichi SONODA, Shinji TAKIHI
  • Patent number: 8981310
    Abstract: A radiation detection device 80 according to an embodiment is a radiation detection device for a foreign substance inspection using a subtraction method, and includes a first radiation detector 32 that detects radiation in a first energy range transmitted through a specimen S and generates a first image, a second radiation detector 42 that detects radiation in a second energy range higher than the radiation in the first energy range and generates a second image, a first image processing section 34 that applies image processing to the first image, and a second image processing section 44 that applies image processing to the second image, wherein a first pixel width in an image detection direction of each pixel of the first radiation detector 32 is smaller than a second pixel width in the image detection direction of each pixel of the second radiation detector 42, and the first image processing section 34 and the second image processing section 44 carry out pixel change processing to make the number of pixels o
    Type: Grant
    Filed: June 29, 2010
    Date of Patent: March 17, 2015
    Assignee: Hamamatsu Photonics K.K.
    Inventor: Toshiyasu Suyama
  • Patent number: 8964939
    Abstract: A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.
    Type: Grant
    Filed: June 27, 2012
    Date of Patent: February 24, 2015
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
  • Patent number: 8873713
    Abstract: A radiation detection device 80 according to an embodiment is a radiation detection device for a foreign substance inspection using a subtraction method, including a first radiation detector 32 and a second radiation detector 42 that detect radiation transmitted through a specimen S, a timing control section 50 that controls detection timings, and an image correction section 34, wherein a first pixel width Wb1 in an orthogonal direction orthogonal to an image detection direction of each pixel of the first radiation detector 32 is smaller than a second pixel width Wb2 in the orthogonal direction of each pixel of the second radiation detector 42, the timing control section 50 synchronizes detection timings of the second radiation detector 42 to detection timings of the first radiation detector 32, and the image correction section 34 sums Wb2/Wb1 pixel data successive in an image from the first radiation detector 32.
    Type: Grant
    Filed: June 29, 2010
    Date of Patent: October 28, 2014
    Assignee: Hamamatsu Photonics K.K.
    Inventor: Toshiyasu Suyama
  • Publication number: 20140294151
    Abstract: A nondestructive inspection device 1 comprises an X-ray indicator 20, a low-energy detector 32, a high-energy detector 42, a low-energy transmittance calculation unit 72, a high-energy transmittance calculation unit 74, a detection unit 76, and a correction unit 78. The calculation unit 72 calculates a value indicating the transmittance of transmission X-rays in a low energy range. The calculation unit 74 calculates a value indicating the transmittance of transmission X-rays in a high energy range. The detection unit 76 detects a positional deviation detail of the X-ray indicator 20 according to a ratio between the transmittances calculated by both of the calculation units 72, 74. When the positional deviation detail of the X-ray indicator 20 is detected by the detection unit 76, according to the positional deviation detail, the correction unit 78 corrects X-ray luminance data detected by the detectors 32, 42.
    Type: Application
    Filed: August 22, 2012
    Publication date: October 2, 2014
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventor: Toshiyasu Suyama
  • Patent number: 8829449
    Abstract: This scintillator plate 1 is a scintillator plate which is a member of a flat plate shape to emit scintillation light according to incidence of radiation transmitted by an object A and which is used in an image acquisition device to condense and image the scintillation light, the scintillator plate comprising: a partition plate 2 of a planar shape which transmits radiation; a scintillator 3 of a flat plate shape which is arranged on one surface 2a of the partition plate 2 and which converts the radiation into scintillation light; and a scintillator 4 of a flat plate shape which is arranged on the other surface 2b of the partition plate 2 and which converts the radiation into scintillation light.
    Type: Grant
    Filed: March 28, 2014
    Date of Patent: September 9, 2014
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Toshiyasu Suyama, Mototsugu Sugiyama
  • Publication number: 20140211918
    Abstract: This scintillator plate 1 is a scintillator plate which is a member of a flat plate shape to emit scintillation light according to incidence of radiation transmitted by an object A and which is used in an image acquisition device to condense and image the scintillation light, the scintillator plate comprising: a partition plate 2 of a planar shape which transmits radiation; a scintillator 3 of a flat plate shape which is arranged on one surface 2a of the partition plate 2 and which converts the radiation into scintillation light; and a scintillator 4 of a flat plate shape which is arranged on the other surface 2b of the partition plate 2 and which converts the radiation into scintillation light.
    Type: Application
    Filed: March 28, 2014
    Publication date: July 31, 2014
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Toshiyasu SUYAMA, Mototsugu SUGIYAMA
  • Patent number: 8723129
    Abstract: This scintillator plate 1 is a scintillator plate which is a member of a flat plate shape to emit scintillation light according to incidence of radiation transmitted by an object A and which is used in an image acquisition device to condense and image the scintillation light, the scintillator plate comprising: a partition plate 2 of a planar shape which transmits radiation; a scintillator 3 of a flat plate shape which is arranged on one surface 2a of the partition plate 2 and which converts the radiation into scintillation light; and a scintillator 4 of a flat plate shape which is arranged on the other surface 2b of the partition plate 2 and which converts the radiation into scintillation light.
    Type: Grant
    Filed: October 21, 2011
    Date of Patent: May 13, 2014
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Toshiyasu Suyama, Mototsugu Sugiyama
  • Publication number: 20140021372
    Abstract: This scintillator plate 1 is a scintillator plate which is a member of a flat plate shape to emit scintillation light according to incidence of radiation transmitted by an object A and which is used in an image acquisition device to condense and image the scintillation light, the scintillator plate comprising: a partition plate 2 of a planar shape which transmits radiation; a scintillator 3 of a flat plate shape which is arranged on one surface 2a of the partition plate 2 and which converts the radiation into scintillation light; and a scintillator 4 of a flat plate shape which is arranged on the other surface 2b of the partition plate 2 and which converts the radiation into scintillation light.
    Type: Application
    Filed: October 21, 2011
    Publication date: January 23, 2014
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Toshiyasu Suyama, Mototsugu Sugiyama
  • Publication number: 20140016753
    Abstract: A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member of a flat plate shape which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member in a direction of a normal to the entrance surface; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member in a direction of a normal to the opposite surface.
    Type: Application
    Filed: October 21, 2011
    Publication date: January 16, 2014
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
  • Publication number: 20140016754
    Abstract: A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member of a flat plate shape which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member in a direction inclined with respect to a direction of a normal to the entrance surface; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member in a direction inclined with respect to a direction of a normal to the opposite surface.
    Type: Application
    Filed: October 21, 2011
    Publication date: January 16, 2014
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
  • Publication number: 20140016752
    Abstract: A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member, wherein one of the first imaging means and the second imaging means condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction of a normal thereto, and wherein the other condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction inclined with respect to a direction of a normal thereto.
    Type: Application
    Filed: October 21, 2011
    Publication date: January 16, 2014
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
  • Patent number: 8600005
    Abstract: An X-ray image acquiring system capable of improving the detection accuracy of a foreign substance contained in a subject is provided. An X-ray image acquiring system irradiates X-rays to a subject having a predetermined thickness from an X-ray source, and detects X-rays transmitted through the subject in a plurality of energy ranges. The X-ray image acquiring system includes a low-energy detector for detecting, in a low-energy range, X-rays having been transmitted through a region R1 extending in a thickness direction within the subject, a high-energy detector for detecting, in a high-energy range, X-rays having been transmitted through a region R2 extending in a thickness direction within the subject, and a timing control section for controlling detection timing of X-rays in the low-energy detector and the high-energy detector so that an inspecting region located at a predetermined site within the subject is included in the region R1 and the region R2.
    Type: Grant
    Filed: August 31, 2012
    Date of Patent: December 3, 2013
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
  • Publication number: 20130044862
    Abstract: An X-ray image acquiring system capable of improving the detection accuracy of a foreign substance contained in a subject is provided. An X-ray image acquiring system irradiates X-rays to a subject having a predetermined thickness from an X-ray source, and detects X-rays transmitted through the subject in a plurality of energy ranges. The X-ray image acquiring system includes a low-energy detector for detecting, in a low-energy range, X-rays having been transmitted through a region R1 extending in a thickness direction within the subject, a high-energy detector for detecting, in a high-energy range, X-rays having been transmitted through a region R2 extending in a thickness direction within the subject, and a timing control section for controlling detection timing of X-rays in the low-energy detector and the high-energy detector so that an inspecting region located at a predetermined site within the subject is included in the region R1 and the region R2.
    Type: Application
    Filed: August 31, 2012
    Publication date: February 21, 2013
    Inventors: Toshiyasu SUYAMA, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi