Patents by Inventor Toshiyasu Suyama
Toshiyasu Suyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 8829449Abstract: This scintillator plate 1 is a scintillator plate which is a member of a flat plate shape to emit scintillation light according to incidence of radiation transmitted by an object A and which is used in an image acquisition device to condense and image the scintillation light, the scintillator plate comprising: a partition plate 2 of a planar shape which transmits radiation; a scintillator 3 of a flat plate shape which is arranged on one surface 2a of the partition plate 2 and which converts the radiation into scintillation light; and a scintillator 4 of a flat plate shape which is arranged on the other surface 2b of the partition plate 2 and which converts the radiation into scintillation light.Type: GrantFiled: March 28, 2014Date of Patent: September 9, 2014Assignee: Hamamatsu Photonics K.K.Inventors: Toshiyasu Suyama, Mototsugu Sugiyama
-
Publication number: 20140211918Abstract: This scintillator plate 1 is a scintillator plate which is a member of a flat plate shape to emit scintillation light according to incidence of radiation transmitted by an object A and which is used in an image acquisition device to condense and image the scintillation light, the scintillator plate comprising: a partition plate 2 of a planar shape which transmits radiation; a scintillator 3 of a flat plate shape which is arranged on one surface 2a of the partition plate 2 and which converts the radiation into scintillation light; and a scintillator 4 of a flat plate shape which is arranged on the other surface 2b of the partition plate 2 and which converts the radiation into scintillation light.Type: ApplicationFiled: March 28, 2014Publication date: July 31, 2014Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Toshiyasu SUYAMA, Mototsugu SUGIYAMA
-
Patent number: 8723129Abstract: This scintillator plate 1 is a scintillator plate which is a member of a flat plate shape to emit scintillation light according to incidence of radiation transmitted by an object A and which is used in an image acquisition device to condense and image the scintillation light, the scintillator plate comprising: a partition plate 2 of a planar shape which transmits radiation; a scintillator 3 of a flat plate shape which is arranged on one surface 2a of the partition plate 2 and which converts the radiation into scintillation light; and a scintillator 4 of a flat plate shape which is arranged on the other surface 2b of the partition plate 2 and which converts the radiation into scintillation light.Type: GrantFiled: October 21, 2011Date of Patent: May 13, 2014Assignee: Hamamatsu Photonics K.K.Inventors: Toshiyasu Suyama, Mototsugu Sugiyama
-
Publication number: 20140021372Abstract: This scintillator plate 1 is a scintillator plate which is a member of a flat plate shape to emit scintillation light according to incidence of radiation transmitted by an object A and which is used in an image acquisition device to condense and image the scintillation light, the scintillator plate comprising: a partition plate 2 of a planar shape which transmits radiation; a scintillator 3 of a flat plate shape which is arranged on one surface 2a of the partition plate 2 and which converts the radiation into scintillation light; and a scintillator 4 of a flat plate shape which is arranged on the other surface 2b of the partition plate 2 and which converts the radiation into scintillation light.Type: ApplicationFiled: October 21, 2011Publication date: January 23, 2014Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Toshiyasu Suyama, Mototsugu Sugiyama
-
Publication number: 20140016752Abstract: A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member, wherein one of the first imaging means and the second imaging means condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction of a normal thereto, and wherein the other condenses the scintillation light emitted from the entrance surface or the opposite surface in a direction inclined with respect to a direction of a normal thereto.Type: ApplicationFiled: October 21, 2011Publication date: January 16, 2014Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
-
Publication number: 20140016753Abstract: A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member of a flat plate shape which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member in a direction of a normal to the entrance surface; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member in a direction of a normal to the opposite surface.Type: ApplicationFiled: October 21, 2011Publication date: January 16, 2014Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
-
Publication number: 20140016754Abstract: A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member of a flat plate shape which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member in a direction inclined with respect to a direction of a normal to the entrance surface; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member in a direction inclined with respect to a direction of a normal to the opposite surface.Type: ApplicationFiled: October 21, 2011Publication date: January 16, 2014Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Mototsugu Sugiyama, Toshiyasu Suyama
-
Patent number: 8600005Abstract: An X-ray image acquiring system capable of improving the detection accuracy of a foreign substance contained in a subject is provided. An X-ray image acquiring system irradiates X-rays to a subject having a predetermined thickness from an X-ray source, and detects X-rays transmitted through the subject in a plurality of energy ranges. The X-ray image acquiring system includes a low-energy detector for detecting, in a low-energy range, X-rays having been transmitted through a region R1 extending in a thickness direction within the subject, a high-energy detector for detecting, in a high-energy range, X-rays having been transmitted through a region R2 extending in a thickness direction within the subject, and a timing control section for controlling detection timing of X-rays in the low-energy detector and the high-energy detector so that an inspecting region located at a predetermined site within the subject is included in the region R1 and the region R2.Type: GrantFiled: August 31, 2012Date of Patent: December 3, 2013Assignee: Hamamatsu Photonics K.K.Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
-
Publication number: 20130044862Abstract: An X-ray image acquiring system capable of improving the detection accuracy of a foreign substance contained in a subject is provided. An X-ray image acquiring system irradiates X-rays to a subject having a predetermined thickness from an X-ray source, and detects X-rays transmitted through the subject in a plurality of energy ranges. The X-ray image acquiring system includes a low-energy detector for detecting, in a low-energy range, X-rays having been transmitted through a region R1 extending in a thickness direction within the subject, a high-energy detector for detecting, in a high-energy range, X-rays having been transmitted through a region R2 extending in a thickness direction within the subject, and a timing control section for controlling detection timing of X-rays in the low-energy detector and the high-energy detector so that an inspecting region located at a predetermined site within the subject is included in the region R1 and the region R2.Type: ApplicationFiled: August 31, 2012Publication date: February 21, 2013Inventors: Toshiyasu SUYAMA, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
-
Publication number: 20130016809Abstract: A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.Type: ApplicationFiled: June 27, 2012Publication date: January 17, 2013Inventors: Toshiyasu SUYAMA, Tadashi MARUNO, Toshihide SASAKI, Junichi SONODA, Shinji TAKIHI
-
Patent number: 8280005Abstract: An X-ray image acquiring system capable of improving the detection accuracy of a foreign substance contained in a subject is provided. An X-ray image acquiring system 1 irradiates X-rays to a subject S having a predetermined thickness W from an X-ray source, and detects X-rays transmitted through the subject S in a plurality of energy ranges. The X-ray image acquiring system 1 includes a low-energy detector 32 for detecting, in a low-energy range, X-rays having been transmitted through a region R1 extending in a thickness direction within the subject S, a high-energy detector 42 for detecting, in a high-energy range, X-rays having been transmitted through a region R2 extending in a thickness direction within the subject S, and a timing control section 50 for controlling detection timing of X-rays in the low-energy detector 32 and the high-energy detector 42 so that an inspecting region E located at a predetermined site within the subject S is included in the region R1 and the region R2.Type: GrantFiled: November 10, 2009Date of Patent: October 2, 2012Assignee: Hamamatsu Photonics K.K.Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
-
Patent number: 8223922Abstract: A radiation image acquiring system that improves the detection accuracy of a foreign substance etc., in a subject is provided. An X-ray image acquiring system 1 irradiates X-rays to a subject S from an X-ray source, and detects X-rays in a plurality of energy ranges transmitted through the subject S.Type: GrantFiled: November 10, 2009Date of Patent: July 17, 2012Assignee: Hamamatsu Photonics K.K.Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
-
Publication number: 20120148024Abstract: A radiation detection device 80 according to an embodiment is a radiation detection device for a foreign substance inspection using a subtraction method, including a first radiation detector 32 and a second radiation detector 42 that detect radiation transmitted through a specimen S, a timing control section 50 that controls detection timings, and an image correction section 34, wherein a first pixel width Wb1 in an orthogonal direction orthogonal to an image detection direction of each pixel of the first radiation detector 32 is smaller than a second pixel width Wb2 in the orthogonal direction of each pixel of the second radiation detector 42, the timing control section 50 synchronizes detection timings of the second radiation detector 42 to detection timings of the first radiation detector 32, and the image correction section 34 sums Wb2/Wb1 pixel data successive in an image from the first radiation detector 32.Type: ApplicationFiled: June 29, 2010Publication date: June 14, 2012Applicant: Hamamatsu Photonics K.k.Inventor: Toshiyasu Suyama
-
Publication number: 20120145911Abstract: A radiation detection device 80 according to an embodiment of the present invention is a radiation detection device for a foreign substance inspection using a subtraction method, and includes a first radiation detector 32 that detects radiation in the first energy range transmitted through a specimen; and a second radiation detector that detects radiation in the second energy range higher than the radiation in the first energy range, and the thickness of a first scintillator layer 322 of the first radiation detector 32 is smaller than the thickness of a second scintillator layer 422 of the second radiation detector 42, and a first area S1 of each pixel 326 in a first pixel section 324 of the first radiation detector 32 is smaller than a second area S2 of each pixel 426 in a second pixel section 424 of the second radiation detector 42.Type: ApplicationFiled: June 29, 2010Publication date: June 14, 2012Applicant: HAMAMATSU PHOTONICS K.K.Inventor: Toshiyasu Suyama
-
Publication number: 20120145910Abstract: A radiation detection device 80 according to an embodiment is a radiation detection device for a foreign substance inspection using a subtraction method, and includes a first radiation detector 32 that detects radiation in a first energy range transmitted through a specimen S and generates a first image, a second radiation detector 42 that detects radiation in a second energy range higher than the radiation in the first energy range and generates a second image, a first image processing section 34 that applies image processing to the first image, and a second image processing section 44 that applies image processing to the second image, wherein a first pixel width in an image detection direction of each pixel of the first radiation detector 32 is smaller than a second pixel width in the image detection direction of each pixel of the second radiation detector 42, and the first image processing section 34 and the second image processing section 44 carry out pixel change processing to make the number of pixels oType: ApplicationFiled: June 29, 2010Publication date: June 14, 2012Applicant: Hamamatsu Photonics K.K.Inventor: Toshiyasu Suyama
-
Publication number: 20100119038Abstract: A radiation image acquiring system that improves the detection accuracy of a foreign substance etc., in a subject is provided. An X-ray image acquiring system 1 irradiates X-rays to a subject S from an X-ray source, and detects X-rays in a plurality of energy ranges transmitted through the subject S.Type: ApplicationFiled: November 10, 2009Publication date: May 13, 2010Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
-
Publication number: 20100119040Abstract: An X-ray image acquiring system capable of improving the detection accuracy of a foreign substance contained in a subject is provided. An X-ray image acquiring system 1 irradiates X-rays to a subject S having a predetermined thickness W from an X-ray source, and detects X-rays transmitted through the subject S in a plurality of energy ranges. The X-ray image acquiring system 1 includes a low-energy detector 32 for detecting, in a low-energy range, X-rays having been transmitted through a region R1 extending in a thickness direction within the subject S, a high-energy detector 42 for detecting, in a high-energy range, X-rays having been transmitted through a region R2 extending in a thickness direction within the subject S, and a timing control section 50 for controlling detection timing of X-rays in the low-energy detector 32 and the high-energy detector 42 so that an inspecting region E located at a predetermined site within the subject S is included in the region R1 and the region R2.Type: ApplicationFiled: November 10, 2009Publication date: May 13, 2010Applicant: HAMAMATSU PHOTONICS K.K.Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi