Patents by Inventor Toshiyasu Suyama

Toshiyasu Suyama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20130016809
    Abstract: A radiation image acquiring system is provided. An X-ray image acquiring system irradiates X-rays to a subject from an X-ray source, and detects X-rays transmitted through the subject. The X-ray image acquiring system includes a first detector for detecting X-rays that are transmitted through the subject to generate first image data, a second detector arranged in parallel to the first detector with a dead zone region sandwiched therebetween, for detecting X-rays that are transmitted through the subject to generate second image data, and a timing control section for controlling detection timing of the second detector based on a dead zone width of the dead zone region so that first image data to be generated by the first detector and second image data to be generated by the second detector mutually correspond.
    Type: Application
    Filed: June 27, 2012
    Publication date: January 17, 2013
    Inventors: Toshiyasu SUYAMA, Tadashi MARUNO, Toshihide SASAKI, Junichi SONODA, Shinji TAKIHI
  • Patent number: 8280005
    Abstract: An X-ray image acquiring system capable of improving the detection accuracy of a foreign substance contained in a subject is provided. An X-ray image acquiring system 1 irradiates X-rays to a subject S having a predetermined thickness W from an X-ray source, and detects X-rays transmitted through the subject S in a plurality of energy ranges. The X-ray image acquiring system 1 includes a low-energy detector 32 for detecting, in a low-energy range, X-rays having been transmitted through a region R1 extending in a thickness direction within the subject S, a high-energy detector 42 for detecting, in a high-energy range, X-rays having been transmitted through a region R2 extending in a thickness direction within the subject S, and a timing control section 50 for controlling detection timing of X-rays in the low-energy detector 32 and the high-energy detector 42 so that an inspecting region E located at a predetermined site within the subject S is included in the region R1 and the region R2.
    Type: Grant
    Filed: November 10, 2009
    Date of Patent: October 2, 2012
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
  • Patent number: 8223922
    Abstract: A radiation image acquiring system that improves the detection accuracy of a foreign substance etc., in a subject is provided. An X-ray image acquiring system 1 irradiates X-rays to a subject S from an X-ray source, and detects X-rays in a plurality of energy ranges transmitted through the subject S.
    Type: Grant
    Filed: November 10, 2009
    Date of Patent: July 17, 2012
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
  • Publication number: 20120145911
    Abstract: A radiation detection device 80 according to an embodiment of the present invention is a radiation detection device for a foreign substance inspection using a subtraction method, and includes a first radiation detector 32 that detects radiation in the first energy range transmitted through a specimen; and a second radiation detector that detects radiation in the second energy range higher than the radiation in the first energy range, and the thickness of a first scintillator layer 322 of the first radiation detector 32 is smaller than the thickness of a second scintillator layer 422 of the second radiation detector 42, and a first area S1 of each pixel 326 in a first pixel section 324 of the first radiation detector 32 is smaller than a second area S2 of each pixel 426 in a second pixel section 424 of the second radiation detector 42.
    Type: Application
    Filed: June 29, 2010
    Publication date: June 14, 2012
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventor: Toshiyasu Suyama
  • Publication number: 20120145910
    Abstract: A radiation detection device 80 according to an embodiment is a radiation detection device for a foreign substance inspection using a subtraction method, and includes a first radiation detector 32 that detects radiation in a first energy range transmitted through a specimen S and generates a first image, a second radiation detector 42 that detects radiation in a second energy range higher than the radiation in the first energy range and generates a second image, a first image processing section 34 that applies image processing to the first image, and a second image processing section 44 that applies image processing to the second image, wherein a first pixel width in an image detection direction of each pixel of the first radiation detector 32 is smaller than a second pixel width in the image detection direction of each pixel of the second radiation detector 42, and the first image processing section 34 and the second image processing section 44 carry out pixel change processing to make the number of pixels o
    Type: Application
    Filed: June 29, 2010
    Publication date: June 14, 2012
    Applicant: Hamamatsu Photonics K.K.
    Inventor: Toshiyasu Suyama
  • Publication number: 20120148024
    Abstract: A radiation detection device 80 according to an embodiment is a radiation detection device for a foreign substance inspection using a subtraction method, including a first radiation detector 32 and a second radiation detector 42 that detect radiation transmitted through a specimen S, a timing control section 50 that controls detection timings, and an image correction section 34, wherein a first pixel width Wb1 in an orthogonal direction orthogonal to an image detection direction of each pixel of the first radiation detector 32 is smaller than a second pixel width Wb2 in the orthogonal direction of each pixel of the second radiation detector 42, the timing control section 50 synchronizes detection timings of the second radiation detector 42 to detection timings of the first radiation detector 32, and the image correction section 34 sums Wb2/Wb1 pixel data successive in an image from the first radiation detector 32.
    Type: Application
    Filed: June 29, 2010
    Publication date: June 14, 2012
    Applicant: Hamamatsu Photonics K.k.
    Inventor: Toshiyasu Suyama
  • Publication number: 20100119040
    Abstract: An X-ray image acquiring system capable of improving the detection accuracy of a foreign substance contained in a subject is provided. An X-ray image acquiring system 1 irradiates X-rays to a subject S having a predetermined thickness W from an X-ray source, and detects X-rays transmitted through the subject S in a plurality of energy ranges. The X-ray image acquiring system 1 includes a low-energy detector 32 for detecting, in a low-energy range, X-rays having been transmitted through a region R1 extending in a thickness direction within the subject S, a high-energy detector 42 for detecting, in a high-energy range, X-rays having been transmitted through a region R2 extending in a thickness direction within the subject S, and a timing control section 50 for controlling detection timing of X-rays in the low-energy detector 32 and the high-energy detector 42 so that an inspecting region E located at a predetermined site within the subject S is included in the region R1 and the region R2.
    Type: Application
    Filed: November 10, 2009
    Publication date: May 13, 2010
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi
  • Publication number: 20100119038
    Abstract: A radiation image acquiring system that improves the detection accuracy of a foreign substance etc., in a subject is provided. An X-ray image acquiring system 1 irradiates X-rays to a subject S from an X-ray source, and detects X-rays in a plurality of energy ranges transmitted through the subject S.
    Type: Application
    Filed: November 10, 2009
    Publication date: May 13, 2010
    Applicant: HAMAMATSU PHOTONICS K.K.
    Inventors: Toshiyasu Suyama, Tadashi Maruno, Toshihide Sasaki, Junichi Sonoda, Shinji Takihi