Patents by Inventor Tsann Lin

Tsann Lin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6876525
    Abstract: A giant magnetoresistance (GMR) magnetic head that includes a GMR read sensor with a stitched longitudinal bias (LB) stack. The GMR read sensor includes seed, pinning, pinned, spacer, sense and cap layers in a read region, and its seed and pinning layers are extended into two side regions. The LB stack is fabricated on the pinning layer in the two side regions and includes separation, seed and LB layers. The separation layer, preferably made of an amorphous film, separates the pinning layer from the seed and LB layers and thereby prevents unwanted crystalline effects of the pinning layer. Monolayer photoresist patterning and chemical mechanical polishing may be incorporated into the fabrication process of the GMR head to attain uniform thicknesses of the separation, seed and LB layers, and to align the midplane of the LB layer at the same horizontal level as the midplane of the sense layer.
    Type: Grant
    Filed: August 27, 2002
    Date of Patent: April 5, 2005
    Assignee: International Business Machines Corporation
    Inventors: Tsann Lin, Daniele Mauri
  • Patent number: 6873499
    Abstract: A read head has a flux guide layer that is immediately adjacent (abuts) the back edge of a read sensor. The flux guide layer is made of a high resistance soft magnetic material that conducts magnetic flux from the back edge of the read sensor so that the magnetic response at the back edge of the read sensor is significantly higher than zero. This increases the efficiency of the read sensor. The material for the flux guide layer is A-B-C where A is selected from the group Fe and Co, B is selected from the group Hf, Y, Ta and Zr and C is selected from the group O and N. In a preferred embodiment A-B-C is Fe—Hf—O and the Ms? of the flux guide layer is greater than 50 times the Ms? of the read sensor layer where the read sensor layer is NiFe, Ms is saturation magnetization and ? is resistivity. Because of the flux guides high resistance current shunting losses are nearly eliminated.
    Type: Grant
    Filed: January 24, 2001
    Date of Patent: March 29, 2005
    Assignee: International Business Machines Corporation
    Inventors: Wen Yaung Lee, Tsann Lin, Daniele Mauri, David John Seagle
  • Publication number: 20050061658
    Abstract: A dual magnetic tunnel junction (MTJ) sensor is provided with a longitudinal bias stack sandwiched between a first MTJ stack and a second MTJ stack. The longitudinal bias stack comprises an antiferromagnetic (AFM) layer sandwiched between first and second ferromagnetic layers. The first and second MTJ stacks comprise antiparallel (AP)-pinned layers pinned by AFM layers made of an AFM material having a higher blocking temperature than the AFM material of the bias stack allowing the AP-pinned layers to be pinned in a transverse direction and the bias stack to be pinned in a longitudinal direction. The demagnetizing fields of the two AP-pinned layers cancel each other and the bias stack provides flux closures for the sense layers of the first and second MTJ stacks.
    Type: Application
    Filed: November 5, 2004
    Publication date: March 24, 2005
    Applicant: International Business Machines Corporation
    Inventors: Tsann Lin, Daniele Mauri
  • Publication number: 20050063103
    Abstract: A method of forming an embedded read element is used in the fabrication process of a magnetic head assembly including write and read heads. In this method, three photolithographic patterning steps are applied for defining the designed height of the embedded read element, defining its designed width, and connecting it with conducting layers, respectively. An in-line lapping guide is also formed with a spacing in front of the embedded read element. In this method, two mechanical lapping steps are applied, one monitored by measuring the resistance of a parallel circuit of the embedded read element and the in-line lapping guide, and the other monitored by measuring the GMR response of the embedded read element.
    Type: Application
    Filed: September 19, 2003
    Publication date: March 24, 2005
    Inventors: Meng Ding, Kuok Ho, Tsann Lin, Huey-Ming Tzeng
  • Publication number: 20050047027
    Abstract: A Current-Perpendicular-to-Plane (CPP) Giant Magneto-Resistance (GMR) sensor (700/800) has either a composite film (708) embedded into a ferromagnetic reference layer (710) or a composite film (806) embedded into a ferromagnetic keeper layer (804). The embedded composite film is deposited by sputtering from a ferromagnetic metallic target and a non-magnetic oxide target simultaneously or sequentially. Varying sputtering powers of the ferromagnetic metallic and non-magnetic oxide targets leads to various volume fractions of ferromagnetic metallic and non-magnetic oxide phases. By carefully adjusting these volume fractions, the product of junction resistance and area of the CPP GMR sensor (700/800) can be finely tuned to a designed value and thus provide optimum read performance of the CPP GMR sensor (700/800) for magnetic recording at ultrahigh densities.
    Type: Application
    Filed: August 29, 2003
    Publication date: March 3, 2005
    Inventor: Tsann Lin
  • Publication number: 20050024789
    Abstract: The GMR read head includes a GMR read sensor and a longitudinal bias (LB) stack in a read region, and the GMR read sensor, the LB stack and a first conductor layer in two overlay regions. In its fabrication process, the GMR read sensor, the LB stack and the first conductor layer are sequentially deposited on a bottom gap layer. A monolayer photoresist is deposited, exposed and developed in order to open a read trench region for the definition of a read width, and RIE is then applied to remove the first conductor layer in the read trench region. After liftoff of the monolayer photoresist, bilayer photoresists are deposited, exposed and developed in order to mask the read and overlay regions, and a second conductor layer is deposited in two unmasked side regions. As a result, side reading is eliminated and a read width is sharply defined by RIE.
    Type: Application
    Filed: August 24, 2004
    Publication date: February 3, 2005
    Inventors: Tsann Lin, Daniele Mauri
  • Publication number: 20040264070
    Abstract: A magnetic head including a spin valve sensor having a sensor layer stack that includes a pinned magnetic layer, a spacer layer formed on the pinned magnetic layer, and a free magnetic layer formed on the spacer layer. In a preferred embodiment the spacer layer is comprised of CuOx. Plasma smoothing of the upper surface of the pinned magnetic layer is conducted prior to depositing the spacer layer, and a preferred plasma gas is a mixture of argon and oxygen.
    Type: Application
    Filed: July 16, 2004
    Publication date: December 30, 2004
    Inventors: Wen-Yaung Lee, Tsann Lin, Danielle Mauri, Alexander Michael Zeltser
  • Publication number: 20040264067
    Abstract: A read head for use with an interconnect transmission line having a characteristic impedance of Z0 includes a tunnel valve device and a shunt resistor RS that is connected in parallel across the tunnel valve device. The tunnel valve device has a device resistance RT corresponding to a predetermined resistance-area (RA) product. The value of the shunt resistance is based on the parallel combination of RT and RS substantially equaling the characteristic impedance Z0 of the interconnect transmission line. The predetermined resistance-area (RA) product is about equal to at least about 10 Ohms-&mgr;m2. Alternatively, the predetermined resistance-area (RA) product is about equal to a “corner” value of RAc for the tunnel valve device.
    Type: Application
    Filed: June 30, 2003
    Publication date: December 30, 2004
    Applicant: Hitachi Global Storage Technologies
    Inventors: Tsann Lin, Daniele Mauri, Neil Smith
  • Patent number: 6822838
    Abstract: A dual magnetic tunnel junction (MTJ) sensor is provided with a longitudinal bias stack sandwiched between a first MTJ stack and a second MTJ stack. The longitudinal bias stack comprises an antiferromagnetic (AFM) layer sandwiched between first and second ferromagnetic layers. The first and second MTJ stacks comprise antiparallel (AP)-pinned layers pinned by AFM layers made of an AFM material having a higher blocking temperature than the AFM material of the bias stack allowing the AP-pinned layers to be pinned in a transverse direction and the bias stack to be pinned in a longitudinal direction. The demagnetizing fields of the two AP-pinned layers cancel each other and the bias stack provides flux closures for the sense layers of the first and second MTJ stacks.
    Type: Grant
    Filed: April 2, 2002
    Date of Patent: November 23, 2004
    Assignee: International Business Machines Corporation
    Inventors: Tsann Lin, Daniele Mauri
  • Patent number: 6788499
    Abstract: A spin valve sensor with insulating and conductive seed layers is provided. The sensor comprising Al2O3/Ni—Cr—Fe/Ni—Fe/Co—Fe/Cu/Co—Fe/Ru/Co—Fe/Pt—Mn films is formed by depositing an insulating Al2O3 seed layer in a first chamber by reactively pulsed DC magnetron sputtering, depositing a conducting Ni—Cr—Fe seed layer and a ferromagnetic Ni—Fe free layer in a second chamber by ion beam sputtering, and then forming the remainder of the spin valve sensor in a third chamber by DC magnetron sputtering.
    Type: Grant
    Filed: May 19, 2003
    Date of Patent: September 7, 2004
    Assignee: International Business Machines Corporation
    Inventors: Tsann Lin, Daniele Mauri
  • Patent number: 6785099
    Abstract: A read head is provided having having ultrathin read gap layers with improved insulative properties between a magnetoresistive sensor and ferromagnetic shield layers. The read head comprises a magnetoresistive sensor with first and second shield cap layers made of high resistivity permeable magnetic material formed between the first and second ferromagnetic shields and the first and second insulative read gap layers, respectively. The shield cap layers made of Fe—Hf—Ox material, or alternatively, the Mn—Zn ferrite material provide highly resistive or insulating soft ferromagnetic layers which add to the electrically insulative read gap layers to provide increased electrical insulation of the spin valve sensor from the metallic ferromagnetic shields while not adding to the magnetic read gap of the read head.
    Type: Grant
    Filed: February 4, 2002
    Date of Patent: August 31, 2004
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Wen-Yaung Lee, Tsann Lin, Daniele Mauri
  • Patent number: 6780524
    Abstract: Disclosed is a spin-valve sensor disposed between first and second gap layers and formed of one or more in-situ oxidized films. The improved spin valve sensor helps eliminate electrical shorting between the spin-valve sensor and shield layers. A fabrication method of the gap layers comprises repeatedly depositing a metallic films on a wafer in a DC-magnetron sputtering module of a sputtering system, and then transferring the wafer in a vacuum to an oxidation module where in-situ oxidation is conducted. This deposition/in-situ oxidation process is repeated until a designed thicknesses of gap layers is attained. Smaller, more sensitive spin-valve sensors may be sandwiched between thinner gap layers formed of in-situ oxidized films, thus allowing for greater recording data densities in disk drive systems.
    Type: Grant
    Filed: February 4, 2002
    Date of Patent: August 24, 2004
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Tsann Lin, Daniele Mauri
  • Patent number: 6775111
    Abstract: A trilayer seed layer structure is employed between a first read gap layer and a spin valve sensor for improving the magnetic and giant magnetoresistive properties and the thermal stability. In the spin valve sensor, the trilayer seed layer structure is located between a first read gap layer and a ferromagnetic free layer. The antiferromagnetic pinning layer is preferably nickel manganese (Ni—Mn). The trilayer seed layer structure includes a first seed layer that is a first metallic oxide, a second seed layer that is a second metallic oxide and a third seed layer that is a nonmagnetic metal. A preferred embodiment is a first seed layer of nickel oxide (NiO), a second seed layer of nickel manganese oxide (NiMnOx), and a third seed layer of copper (Cu).
    Type: Grant
    Filed: May 3, 2002
    Date of Patent: August 10, 2004
    Assignee: International Business Machines Corporation
    Inventors: Tsann Lin, Daniele Mauri
  • Publication number: 20040114282
    Abstract: A self aligned magnetoresistive sensor having a narrow and well defined track width and method of manufacture thereof.
    Type: Application
    Filed: December 17, 2002
    Publication date: June 17, 2004
    Applicant: International Business Machines Corporation
    Inventors: Edward Hin Pong Lee, Kim Y. Lee, Tsann Lin
  • Patent number: 6747852
    Abstract: A magnetoresistance sensor structure is formed of a magnetoresistance sensor having a transverse biasing stack including a transverse pinning layer made of a transverse-pinning-layer antiferromagnetic material, and a transverse pinned layer structure overlying the transverse pinning layer, a spacer layer overlying the transverse pinned layer structure, a sensing stack overlying the spacer layer, and a decoupling layer overlying the sensing stack. A longitudinal biasing stack overlies the magnetoresistance sensor and includes a longitudinal pinned layer, and a longitudinal pinning layer overlying the longitudinal pinned layer and made of a longitudinal-pinning-layer antiferromagnetic material. The transverse-pinning-layer antiferromagnetic material and the longitudinal-pinning-layer antiferromagnetic material are preferably Pt—Mn or Ni—Mn.
    Type: Grant
    Filed: August 17, 2001
    Date of Patent: June 8, 2004
    Assignee: International Business Machines Corporation
    Inventors: Tsann Lin, Daniele Mauri
  • Publication number: 20040095691
    Abstract: An antiferromagnetic stabilization scheme is employed in a magnetic head for magnetically stabilizing a free layer of a spin valve. This is accomplished by utilizing an antiferromagnetic oxide film below a spin valve sensor in a read region and first and second lead layers in end regions and a ferromagnetic film in each of the lead layers that exchange couples to the antiferromagnetic oxide film in the end regions. The ferromagnetic films are pinned with their magnetic moments oriented parallel to an air bearing surface (ABS) of the magnetic head. The ferromagnetic film magnetostatically couples to the free layer which causes the free layer to be in a single magnetic domain state. Accordingly, when the free layer is subjected to magnetic incursions from a rotating disk in a disk drive, the free layer maintains a stable magnetic condition so that resistance changes of the free layer are not altered by differing magnetic conditions of the free layer.
    Type: Application
    Filed: November 7, 2003
    Publication date: May 20, 2004
    Inventors: Tsann Lin, Daniele Mauri
  • Publication number: 20040090717
    Abstract: A magnetic head including a spin valve sensor having a sensor layer stack that includes a pinned magnetic layer, a spacer layer formed on the pinned magnetic layer, and a free magnetic layer formed on the spacer layer. In a preferred embodiment the spacer layer is comprised of CuOx. Plasma smoothing of the upper surface of the pinned magnetic layer is conducted prior to depositing the spacer layer, and a preferred plasma gas is a mixture of argon and oxygen.
    Type: Application
    Filed: November 13, 2002
    Publication date: May 13, 2004
    Inventors: Wen-Yaung Lee, Tsann Lin, Danielle Mauri, Alexander Michael Zeltser
  • Patent number: 6735058
    Abstract: A current-perpendicular-to-plane (CPP) read head with an amorphous magnetic bottom shield layer and an amorphous nonmagnetic bottom lead gap layer is disclosed. The amorphous magnetic bottom shield layer and amorphous nonmagnetic bottom lead layer provide a planar surface for the CPP read head deposited thereon to exhibit a low ferromagnetic coupling field and a high giant (or tunneling) magnetoresistance coefficient. The amorphous magnetic bottom shield layer is preferably formed of an Fe-based or Co-based film. The amorphous nonmagnetic bottom lead layer is preferable formed of a W-based or Ni-based film.
    Type: Grant
    Filed: February 4, 2002
    Date of Patent: May 11, 2004
    Assignee: International Business Machines Corporation
    Inventors: Tsann Lin, Daniele Mauri
  • Publication number: 20040085683
    Abstract: A dual spin valve (SV) sensor is provided with a longitudinal bias stack sandwiched between a first SV stack and a second SV stack. The longitudinal bias stack comprises an antiferromagnetic (AFM) layer sandwiched between first and second ferromagnetic layers. The first and second SV stacks comprise antiparallel (AP)-pinned layers pinned by AFM layers made of an AFM material having a higher blocking temperature than the AFM material of the bias stack allowing the AP-pinned layers to be pinned in a transverse direction and the bias stack to be pinned in a longitudinal direction. The demagnetizing fields of the two AP-pinned layers cancel each other and the bias stack provides flux closures for the sense layers of the first and second SV stacks.
    Type: Application
    Filed: October 24, 2003
    Publication date: May 6, 2004
    Applicant: Hitachi Global Storage Technologies
    Inventors: Tsann Lin, Daniele Mauri
  • Patent number: 6731477
    Abstract: Disclosed is a system and method for forming a current-perpendicular-to-plane (CPP) spin-valve sensor with one or more metallic oxide barrier layers in order to provide a low junction resistance and a high GMR coefficient. In disclosed embodiments, the metallic oxide barrier layers are formed with oxygen-doping/in-situ oxidation processes comprising depositing a metallic film in a first mixture of argon and oxygen gases and subsequent in-situ oxidization in a second mixture of argon and oxygen gases. The exposure to oxygen may be conducted at a low partial oxygen pressure and at a moderate temperature. Smaller, more sensitive CPP spin-valve sensors may be formed through the use of the oxygen-doping/in-situ oxidization processes of the present invention, thus allowing for greater densities of disk drive systems.
    Type: Grant
    Filed: September 20, 2001
    Date of Patent: May 4, 2004
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Tsann Lin, Daniele Mauri