Patents by Inventor Tsukasa TOKUTOMI
Tsukasa TOKUTOMI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20200098431Abstract: According to one embodiment, a memory system includes a semiconductor memory and a controller. The semiconductor memory includes: first memory cells, first word lines, a first row decoder, and a driver circuit. The first row decoder includes first transistors capable of coupling the first word lines to first signal lines, and a first block decoder supplying a first block selection signal to the first transistors. When the controller issues a data read command, the first block decoder asserts the first block selection signal to allow the first transistors to transfer a first voltage to a selected first word line, and a second voltage to unselected other first word lines. After data is read, the first block decoder continues asserting the first block selection signal, and the driver circuit transfers a third voltage.Type: ApplicationFiled: November 27, 2019Publication date: March 26, 2020Applicant: Toshiba Memory CorporationInventors: Masanobu SHIRAKAWA, Marie TAKADA, Tsukasa TOKUTOMI, Yoshihisa KOJIMA, Kiichi TACHI
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Publication number: 20200090763Abstract: According to one embodiment, a memory system includes a nonvolatile memory and a memory controller. The memory controller is configured: to store, in a buffer, a data set read from a cell unit, and an expected data set generated by an error correction on the data set; to count a number of first and second memory cells corresponding to a first and a second combination of data in the data set and the expected data set, respectively, among the memory cells in the cell unit; to calculate a shift amount of a read voltage used in a read operation from the cell unit, based on the number of the first and second memory cells; and to apply the shift amount to a next read operation from the first cell unit.Type: ApplicationFiled: March 11, 2019Publication date: March 19, 2020Applicant: Toshiba Memory CorporationInventors: Tsukasa Tokutomi, Masanobu Shirakawa, Kengo Kurose, Marie Takada, Ryo Yamaki, Kiyotaka Iwasaki, Yoshihisa Kojima
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Publication number: 20200091169Abstract: According to one embodiment, a semiconductor memory device includes: first and second memory cells; a first and second word lines; and a first bit line. The device is configured to execute first to sixth operations. In the first operation, a first voltage is applied to the first word line and a second voltage is applied to a semiconductor layer. In the second operation, the first voltage is applied to the second word line. In the third operation, a third voltage is applied to the first word line. In the fourth operation, the third voltage is applied to the second word line. In the fifth operation, a fourth voltage is applied to the first word line. In the sixth operation, the fourth voltage is applied to the second word line.Type: ApplicationFiled: March 11, 2019Publication date: March 19, 2020Applicant: TOSHIBA MEMORY CORPORATIONInventors: Tsukasa TOKUTOMI, Masanobu Shirakawa, Takuya Futatsuyama
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Publication number: 20200090766Abstract: According to one embodiment, a controller is configured to write four-bit data in each of memory cells, and read first data item from the memory cells through application of a first voltage to a word line. The controller is configured to read second data items by repeating a first operation of reading data including data of respective first bits of the memory cells through application of two voltages to the word line at different timings while changing the two voltages in each first operation from the two voltages in another first operation. The controller is configured to mask part of each of the second data items using the first data.Type: ApplicationFiled: March 4, 2019Publication date: March 19, 2020Applicant: Toshiba Memory CorporationInventors: Tsukasa Tokutomi, Masanobu Shirakawa
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Publication number: 20200090762Abstract: According to one embodiment, a memory system includes a semiconductor memory device and a controller. The device includes a plurality of memory cells capable of storing at least first to third data and a word line coupled to the plurality of memory cells. The first data is determined by a first read operation including a first read level. The second data is determined by a second read operation including a second read level. The third data is determined by a third read operation including a third read level. The controller controls the semiconductor memory device to perform a forth read operation including the first and second read levels in a search operation for first to third read voltages corresponding to the first to third read levels, respectively.Type: ApplicationFiled: March 4, 2019Publication date: March 19, 2020Applicant: Toshiba Memory CorporationInventors: Masanobu Shirakawa, Tsukasa Tokutomi, Marie Takada
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Publication number: 20200090779Abstract: A memory system according to an embodiment includes a semiconductor memory, and a memory controller. The semiconductor memory comprises memory cells and word lines. Each of the word lines is connected to the memory cells. The memory controller executes a patrol operation including a read operation of the semiconductor memory. The word lines are classified into one of first and second groups. The memory controller executes patrol operations in which the word lines are respectively selected in a first patrol period and, in a second patrol period subsequent to the first patrol period, executes a patrol operation in which the word line included in the first group is selected and omits a patrol operation in which the word line included in the second group is selected.Type: ApplicationFiled: March 6, 2019Publication date: March 19, 2020Applicant: Toshiba Memory CorporationInventors: Tsukasa TOKUTOMI, Masanobu SHIRAKAWA, Kiwamu WATANABE, Kengo KUROSE
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Publication number: 20200075106Abstract: According to one embodiment, a memory system includes a semiconductor memory and a controller. The semiconductor memory includes first to fourth word lines and first to fourth memory cells. The controller is configured to issue first and second instructions. The controller is further configured to execute a first operation to obtain a first read voltage based on a threshold distribution of the first memory cell, and a second operation to read data from the second memory cell.Type: ApplicationFiled: March 11, 2019Publication date: March 5, 2020Applicant: TOSHIBA MEMORY CORPORATIONInventors: Tsukasa TOKUTOMI, Masanobu SHIRAKAWA, Marie TAKADA, Shohei ASAMI, Masamichi FUJIWARA
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Publication number: 20200075110Abstract: According to one embodiment, a nonvolatile memory includes: a memory cell array including memory cells; and a controller configured to execute a first refresh process on receiving a first command. The first refresh process includes reprogramming at least one second memory cell among first memory cells to which data has been programmed in a first group. In executing the first refresh process, the controller is configured to: select the second memory cell by verifying with a first voltage using a first amount in a case where the second memory cell has been programmed using the first voltage; and select the second memory cell by verifying with a second voltage using a second amount in a case where the second memory cell has been programmed using the second voltage.Type: ApplicationFiled: June 3, 2019Publication date: March 5, 2020Applicant: Toshiba Memory CorporationInventors: Riki SUZUKI, Masanobu SHIRAKAWA, Yoshihisa KOJIMA, Marie TAKADA, Tsukasa TOKUTOMI
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Patent number: 10541030Abstract: According to one embodiment, a memory system includes a semiconductor memory and a controller. The semiconductor memory includes: first memory cells, first word lines, a first row decoder, and a driver circuit. The first row decoder includes first transistors capable of coupling the first word lines to first signal lines, and a first block decoder supplying a first block selection signal to the first transistors. When the controller issues a data read command, the first block decoder asserts the first block selection signal to allow the first transistors to transfer a first voltage to a selected first word line, and a second voltage to unselected other first word lines. After data is read, the first block decoder continues asserting the first block selection signal, and the driver circuit transfers a third voltage.Type: GrantFiled: March 9, 2018Date of Patent: January 21, 2020Assignee: Toshiba Memory CorporationInventors: Masanobu Shirakawa, Marie Takada, Tsukasa Tokutomi, Yoshihisa Kojima, Kiichi Tachi
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Publication number: 20190377636Abstract: In general, according to an embodiment, a memory system includes a memory device including a memory cell; and a controller. The controller is configured to: receive first data from the memory cell in a first data reading; receive second data from the memory cell in a second data reading that is different from the first data reading; convert a first value that is based on the first data and the second data, to a second value in accordance with a first relationship; and convert the first value to a third value in accordance with a second relationship that is different from the first relationship.Type: ApplicationFiled: August 21, 2019Publication date: December 12, 2019Applicant: Toshiba Memory CorporationInventors: Tsukasa TOKUTOMI, Masanobu SHIRAKAWA, Marie TAKADA, Masamichi FUJIWARA, Kazumasa YAMAMOTO, Naoaki KOKUBUN, Tatsuro HITOMI, Hironori UCHIKAWA
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Publication number: 20190362783Abstract: According to an embodiment, a control circuitry performing: a first operation of reading data out of a memory cell with a first voltage applied to a word line while changing the first voltage by a first shift amount within a first range, and a second operation of reading data out of the memory cell with a second voltage applied to the word line while changing the second voltage by a second shift amount within a second range, wherein the second shift amount is smaller than the first shift amount, and wherein the control circuitry performs the second operation to apply the second voltage to the word line subsequently to application of the first voltage to the word line in the first operation.Type: ApplicationFiled: August 9, 2019Publication date: November 28, 2019Applicant: Toshiba Memory CorporationInventors: Tsukasa Tokutomi, Masanobu Shirakawa, Marie Takada
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Patent number: 10430275Abstract: In general, according to an embodiment, a memory system includes a memory device including a memory cell; and a controller. The controller is configured to: receive first data from the memory cell in a first data reading; receive second data from the memory cell in a second data reading that is different from the first data reading; convert a first value that is based on the first data and the second data, to a second value in accordance with a first relationship; and convert the first value to a third value in accordance with a second relationship that is different from the first relationship.Type: GrantFiled: March 9, 2018Date of Patent: October 1, 2019Assignee: Toshiba Memory CorporationInventors: Tsukasa Tokutomi, Masanobu Shirakawa, Marie Takada, Masamichi Fujiwara, Kazumasa Yamamoto, Naoaki Kokubun, Tatsuro Hitomi, Hironori Uchikawa
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Patent number: 10431299Abstract: According to an embodiment, a control circuitry performing: a first operation of reading data out of a memory cell with a first voltage applied to a word line while changing the first voltage by a first shift amount within a first range, and a second operation of reading data out of the memory cell with a second voltage applied to the word line while changing the second voltage by a second shift amount within a second range, wherein the second shift amount is smaller than the first shift amount, and wherein the control circuitry performs the second operation to apply the second voltage to the word line subsequently to application of the first voltage to the word line in the first operation.Type: GrantFiled: December 13, 2018Date of Patent: October 1, 2019Assignee: Toshiba Memory CorporationInventors: Tsukasa Tokutomi, Masanobu Shirakawa, Marie Takada
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Publication number: 20190294367Abstract: According to one embodiment, a memory system includes a semiconductor memory and a controller. The memory system is capable of executing a first operation and a second operation. In the first operation, the controller issues a first command sequence, the semiconductor memory applies a first voltage to a first word line and applies a second voltage to a second word line to read data from the first memory, and the read data is transmitted to the controller from the semiconductor memory. In the second operation, the controller issues a second command sequence, the semiconductor memory applies a third voltage to the first word line and applies a fourth voltage to the second word line, and data held in the memory cell array is left untransmitted to the controller.Type: ApplicationFiled: August 31, 2018Publication date: September 26, 2019Applicant: Toshiba Memory CorporationInventors: Marie Takada, Masanobu Shirakawa, Tsukasa Tokutomi
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Publication number: 20190259459Abstract: According to an embodiment, a semiconductor memory, on receiving a first command, applies a voltage within a first range and a voltage within a second range to a word line and reads a first bit from a memory cell, and, on receiving a second command, applies a voltage within a third range to the word line and reads a second bit from the memory cell. The controller issues the first command a plurality of times and changes the voltages to be applied to the word line within the first range and the second range in accordance with the plurality of first commands, specifies a first and second voltage within the first and the second range, respectively, and estimates a third voltage within the third range. The voltage applied to read the second bit is the estimated third voltage.Type: ApplicationFiled: April 29, 2019Publication date: August 22, 2019Applicant: Toshiba Memory CorporationInventors: Tsukasa Tokutomi, Masanobu Shirakawa, Marie Takada
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Patent number: 10325664Abstract: According to an embodiment, a semiconductor memory, on receiving a first command, applies a voltage within a first range and a voltage within a second range to a word line and reads a first bit from a memory cell, and, on receiving a second command, applies a voltage within a third range to the word line and reads a second bit from the memory cell. The controller issues the first command a plurality of times and changes the voltages to be applied to the word line within the first range and the second range in accordance with the plurality of first commands, specifies a first and second voltage within the first and the second range, respectively, and estimates a third voltage within the third range. The voltage applied to read the second bit is the estimated third voltage.Type: GrantFiled: September 7, 2017Date of Patent: June 18, 2019Assignee: Toshiba Memory CorporationInventors: Tsukasa Tokutomi, Masanobu Shirakawa, Marie Takada
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Publication number: 20190130968Abstract: According to an embodiment, a control circuitry performing: a first operation of reading data out of a memory cell with a first voltage applied to a word line while changing the first voltage by a first shift amount within a first range, and a second operation of reading data out of the memory cell with a second voltage applied to the word line while changing the second voltage by a second shift amount within a second range, wherein the second shift amount is smaller than the first shift amount, and wherein the control circuitry performs the second operation to apply the second voltage to the word line subsequently to application of the first voltage to the word line in the first operation.Type: ApplicationFiled: December 13, 2018Publication date: May 2, 2019Applicant: Toshiba Memory CorporationInventors: Tsukasa TOKUTOMI, Masanobu SHIRAKAWA, Marie TAKADA
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Publication number: 20190087264Abstract: In general, according to an embodiment, a memory system includes a memory device including a memory cell; and a controller. The controller is configured to: receive first data from the memory cell in a first data reading; receive second data from the memory cell in a second data reading that is different from the first data reading; convert a first value that is based on the first data and the second data, to a second value in accordance with a first relationship; and convert the first value to a third value in accordance with a second relationship that is different from the first relationship.Type: ApplicationFiled: March 9, 2018Publication date: March 21, 2019Applicant: Toshiba Memory CorporationInventors: Tsukasa Tokutomi, Masanobu Shirakawa, Marie Takada, Masamichi Fujiwara, Kazumasa Yamamoto, Naoaki Kokubun, Tatsuro Hitomi, Hironori Uchikawa
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Publication number: 20190088333Abstract: According to one embodiment, a memory system includes a semiconductor memory and a controller. The semiconductor memory includes: first memory cells, first word lines, a first row decoder, and a driver circuit. The first row decoder includes first transistors capable of coupling the first word lines to first signal lines, and a first block decoder supplying a first block selection signal to the first transistors. When the controller issues a data read command, the first block decoder asserts the first block selection signal to allow the first transistors to transfer a first voltage to a selected first word line, and a second voltage to unselected other first word lines. After data is read, the first block decoder continues asserting the first block selection signal, and the driver circuit transfers a third voltage.Type: ApplicationFiled: March 9, 2018Publication date: March 21, 2019Applicant: Toshiba Memory CorporationInventors: Masanobu SHIRAKAWA, Marie Takada, Tsukasa Tokutomi, Yoshihisa Kojima, Kiichi Tachi
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Patent number: 10204680Abstract: According to an embodiment, a control circuitry performing: a first operation of reading data out of a memory cell with a first voltage applied to a word line while changing the first voltage by a first shift amount within a first range, and a second operation of reading data out of the memory cell with a second voltage applied to the word line while changing the second voltage by a second shift amount within a second range, wherein the second shift amount is smaller than the first shift amount, and wherein the control circuitry performs the second operation to apply the second voltage to the word line subsequently to application of the first voltage to the word line in the first operation.Type: GrantFiled: September 7, 2017Date of Patent: February 12, 2019Assignee: Toshiba Memory CorporationInventors: Tsukasa Tokutomi, Masanobu Shirakawa, Marie Takada