Patents by Inventor Tsung-Chieh Chen

Tsung-Chieh Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6160311
    Abstract: An enhanced heat dissipating Chip Scale Package (CSP) method and devices include preparing a heat dissipating base with a recess surrounded by a guarding wall. A chip with an integrated circuit (IC) layout is adhered the heat dissipating base in the recess. A substrate with a metallic circuit layer that is smaller size than the chip is then adhered to the chip. Then coupling the metallic circuit layer with the IC layout. A non-conductive resin is then filled in the recess within the guarding wall and covers the coupling portion. The resulting package device produced by means of BGA package process is small size and has enhanced heat dissipating property. The Package size/chip size ratio may be lower than 1.2 to meet the CSP requirements.
    Type: Grant
    Filed: June 14, 1999
    Date of Patent: December 12, 2000
    Assignee: First International Computer Inc.
    Inventors: Tsung-Chieh Chen, Yi-Liang Peng
  • Patent number: 6130477
    Abstract: A thin enhanced TAB BGA package includes an IC chip, a substrate having a center opening and one side laid with a metallic circuitry which has a plurality of inner leads extending to the center opening, a plurality of metallic solder balls attached to the substrate at one side and coupling with the metallic circuitry, and a heat dissipating member adhering partly to the a side of the chip and partly to the substrate for heat dissipating, positioning and supporting the IC chip and the substrate. The IC chip has a another side exposed to ambience to add heat dissipating effect. The heat dissipating member has about same thickness as the substrate. Hence the ball grid array package may be made of a small size and thin thickness. The adhering of heat dissipating member to the chip and substrate may be done at the same process of bonding the inner leads to the IC chip. Thus the thin enhanced TAB BGA package of this invention may be produced at low cost without additional equipment or process.
    Type: Grant
    Filed: March 17, 1999
    Date of Patent: October 10, 2000
    Inventors: Tsung-Chieh Chen, Ken-Hsiung Hsu, Yi-Liang Peng, Cheng-Chieh Hsu
  • Patent number: 6077724
    Abstract: A multi-chips semiconductor package and fabrication method mainly combines LOC and BGA techniques to overlap one chip upon another chip in an IC component package. One chip uses leads of a lead frame as connection interface of the circuit in the chip to outside. Another chip uses solder balls as connection interface of the circuit in another chip to outside. The two chips are supported by the lead frame without a substrate used in a conventional BGA package. The two chips may have same or different function. The structure is simple and easy to produce at low cost. The size and length of the IC component is smaller than the one produced by conventional multi-chips packaging techniques.
    Type: Grant
    Filed: September 5, 1998
    Date of Patent: June 20, 2000
    Assignee: First International Computer Inc.
    Inventor: Tsung-Chieh Chen
  • Patent number: 6075281
    Abstract: A lead frame equipped with modified lead fingers which have inclined tip portions for achieving an improved wire bond is provided. The inclined tip portions on the lead fingers can be formed in a stamping process with an angle on a top surface of the inclined tip portion measured at smaller than 30.degree. from a horizontal plane of the lead finger. It is preferred that the inclined angle should be between about 5.degree. and about 30.degree., and more preferred that the angle should be between about 5.degree. and about 20.degree.. A wedge bond formed on the inclined tip portion of a lead finger has improved thickness and thermal stress endurance. The thermal stress endurance may be improved by at least 20% and preferably by at least 50% when tested in a thermal cycling test between 150.degree. C. and -65.degree. C.
    Type: Grant
    Filed: March 30, 1999
    Date of Patent: June 13, 2000
    Assignee: Vanguard International Semiconductor Corporation
    Inventors: Kuang-Ho Liao, Tsung-Chieh Chen, Chuen-Jye Lin