Abstract: A method for reading data stored in a flash memory. The flash memory comprises a plurality of memory cells and each memory cell has a particular threshold voltage. The method includes: obtaining a first threshold voltage distribution representing threshold voltages of a first group of the memory cells; obtaining a second threshold voltage distribution representing threshold voltages of a second group of the memory cells, wherein the second threshold voltage distribution is different from the first threshold voltage distribution, and the first group of the memory cells comprises at least a part of the second group of the memory cells; and controlling the flash memory to perform at least one read operation upon the first group of the memory cells according to the second threshold voltage distribution.

Abstract: A method and a system for mental index prediction are provided. The method includes the following steps. A plurality of images of a subject person are obtained. A plurality of emotion tags of the subject person in the images are analyzed. A plurality of integrated emotion tags in a plurality of predetermined time periods are calculated according to the emotion tags respectively corresponding to the images. A plurality of preferred features are determined according to the integrated emotion tags. A mental index prediction model is established according to the preferred features to predict a mental index according to the emotional index prediction model.

Abstract: A method for performing memory access of a Flash cell of a Flash memory includes: performing a series of sensing operations respectively corresponding to a plurality of sensing voltages, wherein a sensing voltage of a specific sensing operation of the series of sensing operations has a sensing voltage determined according to a result of an initial sensing operation of the series of sensing operations; determining a threshold voltage of the Flash cell according to at least a digital value generated by the series of sensing operations; and using the determined threshold voltage to perform soft decoding of the Flash cell.

Abstract: A flash memory controller for controlling a flash memory module includes a communication interface for receiving a first data and a second data; and a processing circuit for dynamically controlling a data writing mode of the flash memory module according to an amount of stored data in the flash memory module. If the amount of stored data in the flash memory module is less than a first threshold when the communication interface receives the first data, the processing circuit controls the flash memory module so that the first data is written into the first data block under an one-bit-per-cell mode. If the amount of stored data in the flash memory module is greater than the first threshold when the communication interface receives the second data, the processing circuit controls the flash memory module so that the second data is written into the second data block under a two-bit-per-cell mode.

Abstract: A flash memory storage management method includes: providing a flash memory module including single-level-cell (SLC) blocks and at least one multiple-level-cell block such as MLC block, TLC block, or QLC block; classifying data to be programmed into groups of data; respectively executing SLC programing and RAID-like error code encoding to generate corresponding parity check codes, to program the groups of data and corresponding parity check codes to the SLC blocks; when completing program of the SLC blocks, performing an internal copy to program the at least one multiple-level-cell block by sequentially reading and writing the groups of data and corresponding parity check codes from the SLC blocks to the multiple-level-cell block according to a storage order of the SLC blocks.

Abstract: A flash memory method includes: classifying data into a plurality of groups of data; respectively executing error code encoding to generate first corresponding parity check code to store the groups of data and first corresponding parity check code into flash memory module as first blocks; reading out the groups of data from first blocks; executing error correction and de-randomize operation upon read out data to generate de-randomized data; executing randomize operation upon de-randomized data according to a set of seeds to generate randomized data; performing error code encoding upon randomized data to generate second corresponding parity check code; and, storing randomized data and second corresponding parity check code into flash memory module as second block; a cell of first block is used for storing data of first bit number which is different from second bit number corresponding to a cell of second block.

Abstract: An exemplary method for reading data stored in a flash memory includes: selecting an initial gate voltage combination from a plurality of predetermined gate voltage combination options; controlling a plurality of memory units in the flash memory according to the initial gate voltage combination, and reading a plurality of bit sequences; performing a codeword error correction upon the plurality of bit sequences, and determining if the codeword error correction successful; if the codeword error correction is not successful, determining an electric charge distribution parameter; determining a target gate voltage combination corresponding to the electric charge distribution parameter by using a look-up table; and controlling the plurality of memory units to read a plurality of updated bit sequences according to the target gate voltage combination.

Abstract: A method for performing data retention management of a memory device with aid of pre-shutdown control and associated apparatus are provided. The method may include: receiving a predetermined host command from a host device; in response to the predetermined host command, performing a re-programming procedure on the NV memory, for enhancing data storage reliability of the memory device, for example, reading stored data from at least one source location within the at least one NV memory element to prepare re-programming data according to the stored data, and programming the re-programming data into at least one destination location within the at least one NV memory element to be replacement of the stored data; and in response to the re-programming procedure being completed, sending completion information of the predetermined host command to the host device, to allow the host device to trigger the shutdown of the memory device.

Abstract: A method for performing data management of a memory device with aid of targeted protection control and associated apparatus are provided. The method may include: receiving a first host command from a host device; sending a first operating command to a non-volatile (NV) memory to read first stored data from a first location within the NV memory; monitoring a read count of the first location to determine whether the read count of the first location reaches a read count threshold; monitoring at least one error bit count of other stored data of at least one other location within the NV memory to determine whether the at least one error bit count reaches an error bit count threshold; and starting a targeted protection procedure to process second stored data, for preventing the second stored data from being damaged by at least one reading behavior of the host device.

Abstract: A method for reading data stored in a flash memory. The flash memory comprises a plurality of memory cells and each memory cell has a particular threshold voltage. The method includes: obtaining a first threshold voltage distribution representing threshold voltages of a first group of the memory cells; obtaining a second threshold voltage distribution representing threshold voltages of a second group of the memory cells, wherein the second threshold voltage distribution is different from the first threshold voltage distribution, and the first group of the memory cells comprises at least a part of the second group of the memory cells; and controlling the flash memory to perform at least one read operation upon the first group of the memory cells according to the second threshold voltage distribution.

Abstract: A method for performing memory access of a Flash cell of a Flash memory includes: performing a plurality of sensing operations respectively corresponding to a plurality of sensing voltages to generate a first digital value and a second digital value of the Flash cell, the second digital value representing at least one candidate threshold voltage of the Flash cell; determining a threshold voltage of the Flash cell according to whether the at least one candidate threshold voltage is high or low; determining soft information of a bit stored in the Flash cell according to the threshold voltage of the Flash cell; and using the soft information to perform soft decoding.

Abstract: A flash memory method includes: classifying data into a plurality of groups of data; respectively executing error code encoding to generate first corresponding parity check code to store the groups of data and first corresponding parity check code into flash memory module as first blocks; reading out the groups of data from first blocks; executing error correction and de-randomize operation upon read out data to generate de-randomized data; executing randomize operation upon de-randomized data according to a set of seeds to generate randomized data; performing error code encoding upon randomized data to generate second corresponding parity check code; and, storing randomized data and second corresponding parity check code into flash memory module as second block; a cell of first block is used for storing data of first bit number which is different from second bit number corresponding to a cell of second block.

Abstract: An exemplary method for reading data stored in a flash memory includes: selecting an initial gate voltage combination from a plurality of predetermined gate voltage combination options; controlling a plurality of memory units in the flash memory according to the initial gate voltage combination, and reading a plurality of bit sequences; performing a codeword error correction upon the plurality of bit sequences, and determining if the codeword error correction successful; if the codeword error correction is not successful, determining an electric charge distribution parameter; determining a target gate voltage combination corresponding to the electric charge distribution parameter by using a look-up table; and controlling the plurality of memory units to read a plurality of updated bit sequences according to the target gate voltage combination.

Abstract: A method for performing data access management of a memory device with aid of randomness-property control and associated apparatus are provided. The method may include: receiving a plurality of host commands from a host device and performing data access on the NV memory according to the plurality of host commands, for example, in response to at least one host write command, programming data into at least one single level cell (SLC) block to be first stored data corresponding to a data reception stage; and performing a seed-aware garbage collection (GC) procedure to collect valid data among the first stored data of the at least one SLC block into at least one non-SLC block to be second stored data corresponding to a data storage stage, for example, performing a randomness-property checking operation on multiple seeds to selectively determine respective data of multiple pages within the SLC block as target data.

Abstract: A method and apparatus for performing access control of a memory device with aid of multi-stage garbage collection (GC) management are provided. The method includes: during a first GC stage, sending a first simple read command to the NV memory in order to try reading first valid data from a first source block, sending the first valid data into an internal buffer of the NV memory, for being programed into a first destination block, sending a second simple read command to the NV memory in order to try reading second valid data from the first source block, and in response to reading the second valid data from the first source block being unsuccessful, preventing retrying reading the second valid data from the first source block; completing at least one host-triggered operation; and during a second GC stage, retrying reading the second valid data from the first source block.

Abstract: A method for reading data stored in a flash memory includes at least the following steps: controlling the flash memory to perform a plurality of read operations upon a plurality of memory cells included in the flash memory; obtaining a plurality of bit sequences read from the memory cells, respectively, wherein the read operations read bits of a predetermined bit order from the memory cells by utilizing different control gate voltage settings; and determining readout information of the memory cells according to binary digit distribution characteristics of the bit sequences.

Abstract: A method for reading data stored in a flash memory includes at least the following steps: controlling the flash memory to perform a plurality of read operations upon a plurality of memory cells included in the flash memory; obtaining a plurality of bit sequences read from the memory cells, respectively, wherein the read operations read bits of a predetermined bit order from the memory cells by utilizing different control gate voltage settings; and determining readout information of the memory cells according to binary digit distribution characteristics of the bit sequences.

Abstract: The present invention provides a method for accessing a flash memory module is disclosed, wherein the flash memory module includes at least one flash memory chip, each flash memory chip includes a plurality of block, each block is implemented by a plurality of word lines, each word line corresponds to K pages, and each word line includes a plurality of memory cells supporting a plurality of states, and the method includes the steps of: receiving data from a host device; generating dummy data; and writing the data with the dummy data to a plurality of specific blocks, wherein for each of a portion of the word lines of the specific blocks, the dummy data is written into at least one of the K pages, and the data from the host device is written into the other page(s) of the K pages.

Abstract: A method and apparatus for performing access control of a memory device with aid of additional physical address information are provided. The method includes: during a garbage collection procedure, reading valid data from a source block and writing the valid data into a destination block; updating at least one logical-to-physical address mapping table; receiving a first read request from a host device, wherein the first read request indicates reading at a first logical address; in response to the first read request, reading the valid data of the destination block according to the second physical address associated with the first logical address; receiving a second read request from the host device, wherein the second read request indicates reading at the first logical address; and in response to the second read request, reading the valid data of the source block according to the first physical address associated with the first logical address.

Abstract: A method and apparatus for performing access control of a memory device with aid of additional physical address information are provided. The method includes: during a garbage collection procedure, reading valid data from a source block and writing the valid data into a destination block; updating at least one logical-to-physical address mapping table; receiving a first read request from a host device, wherein the first read request indicates reading at a first logical address; in response to the first read request, reading the valid data of the destination block according to the second physical address associated with the first logical address; receiving a second read request from the host device, wherein the second read request indicates reading at the first logical address; and in response to the second read request, reading the valid data of the source block according to the first physical address associated with the first logical address.