Abstract: A quantum cascade element includes a first substrate, a quantum cascade layer and a second substrate. The quantum cascade layer is provided at a front surface side of the first substrate. The quantum cascade layer includes a plurality of quantum well layers and a plurality of barrier layers alternately stacked in a direction perpendicular to the front surface of the first substrate. The second substrate is bonded to the first substrate with the quantum cascade layer interposed. The second substrate includes a photonic crystal contacting the quantum cascade layer. The photonic crystal includes a plurality of recesses at a side contacting the quantum cascade layer. The plurality of recesses faces an uppermost layer of the plurality of barrier layers.

Abstract: A decoration bearing element is configured to be fitted on a slider body of a slider of a slide fastener and provides a top surface or a decoration bearing surface onto which a perceivable decoration can be applied. The decoration bearing element includes: a plurality of oppositely facing cooperating surfaces configured for engaging with and receiving at least a portion of the slider body and restraining the decoration bearing element onto the slider body in at least three non-identical directions of first direction, second direction and third direction.

Abstract: A quantum cascade laser includes light-emitting quantum well layers configured to emit infrared laser light by an intersubband transition; and injection quantum well layers configured to relax carrier energy. The light-emitting quantum well layers and the injection quantum well layers are stacked alternately. The injection quantum well layers relax the energy of carriers injected from the light-emitting quantum well layers, respectively. The light-emitting quantum well layers and the injection quantum well layers including barrier layers. At least one barrier layer includes first and second regions of a first ternary compound semiconductor, and a binary compound semiconductor thin film. The binary compound semiconductor thin film is provided between the first and second regions. The first ternary compound semiconductor includes Group III atoms and a Group V atom. The binary compound semiconductor thin film includes one Group III atom of the first ternary compound semiconductor and the Group V atom.

Abstract: According to one embodiment, a surface emitting quantum cascade laser includes: a first surface that emits laser light; a second surface opposite to the first surface; an active layer provided between the first surface and the second surface; a photonic crystal provided between the active layer and the first surface or between the active layer and the second surface, the photonic crystal having a predetermined periodicity; a first electrode located on the first surface outside a region where the laser light is emitted; a second electrode provided on the second surface, the photonic crystal being located between the first surface and the second electrode; and a third electrode provided on the second surface and separated from the second electrode, the active layer extending between the first surface and the second electrode and between the first surface and the third electrode.

Abstract: [Problem] To reduce a filter penalty caused by narrowing of an optical signal band due to optical filters having a multiplexing/demultiplexing function in an optical transmission line between transponder units. [Solution] In an optical transmission system 10A, transponder units 21a to 21n and 22a to 22n connected by optical fibers 14 in which optical filters having a multiplexing/demultiplexing function of an optical signal are interposed include a transmission unit 22 that transmits the optical signal obtained by modulating laser light from a laser light source 34 with an electric signal from a communication apparatus to the optical fibers 14, and a reception unit 23 that receives the optical signal from the optical fibers 14 and converts the received optical signal into an electric signal. The reception unit 23 includes a BER measurement unit that measures a BER, based on a received signal, and feeds the measured BER back to a transmitting side.

Abstract: Provided is a cleaning agent composition that is capable of efficiently performing the substitution of a molding raw material in a hot runner type mold. The cleaning agent composition contains 100 parts by weight of a thermoplastic resin; 1 part by weight to 20 parts by weight of at least one type of fatty acid ester that is selected from glycerin fatty acid ester, polyglycerin fatty acid ester, or sorbitan fatty acid ester; and 1 part by weight to 15 parts by weight of a metal salt of a fatty acid and/or a hydroxyfatty acid. The cleaning agent composition is used for cleaning a flow channel for resin in a hot runner type mold.

Abstract: A cleaning agent composition contains 100 parts by weight of polyethylene oxide; 25 parts by weight to 90 parts by weight of at least one type of fatty acid ester that is selected from glycerin fatty acid ester, polyglycerin fatty acid ester, or sorbitan fatty acid ester; and 15 parts by weight to 45 parts by weight of a metal salt of a fatty acid and/or a hydroxyfatty acid. The cleaning agent composition is used for cleaning a flow channel for resin in a hot runner type mold.

Abstract: In order to provide a charged particle beam apparatus capable of stably detecting secondary particles and electromagnetic waves even for a non-conductive sample under high vacuum environment and enabling excellent observation and analysis, the charged particle beam apparatus includes a charged particle gun (12), scanning deflectors (17 and 18) configured to scan a charged particle beam (20) emitted from the charged particle gun (12) onto a sample (21), detectors (40 and 41) configured to detect a scanning control voltage input from an outside into the scanning deflectors, an arithmetic unit (42) configured to calculate, based on the detected scanning control voltage, irradiation pixel coordinates for the charged particle beam; and an irradiation controller (45) configured to control irradiation of the sample with the charged particle beam according to the irradiation pixel coordinates.

Abstract: In order to provide a charged particle beam apparatus capable of stably detecting secondary particles and electromagnetic waves even for a non-conductive sample under high vacuum environment and enabling excellent observation and analysis, the charged particle beam apparatus includes a charged particle gun (12), scanning deflectors (17 and 18) configured to scan a charged particle beam (20) emitted from the charged particle gun (12) onto a sample (21), detectors (40 and 41) configured to detect a scanning control voltage input from an outside into the scanning deflectors, an arithmetic unit (42) configured to calculate, based on the detected scanning control voltage, irradiation pixel coordinates for the charged particle beam; and an irradiation controller (45) configured to control irradiation of the sample with the charged particle beam according to the irradiation pixel coordinates.

Abstract: A cleaning agent composition contains 100 parts by weight of polyethylene oxide; 25 parts by weight to 90 parts by weight of at least one type of fatty acid ester that is selected from glycerin fatty acid ester, polyglycerin fatty acid ester, or sorbitan fatty acid ester; and 15 parts by weight to 45 parts by weight of a metal salt of a fatty acid and/or a hydroxyfatty acid. The cleaning agent composition is used for cleaning a flow channel for resin in a hot runner type mold.

Abstract: Provided is a cleaning agent composition that is capable of efficiently performing the substitution of a molding raw material in a hot runner type mold. The cleaning agent composition contains 100 parts by weight of a thermoplastic resin; 1 part by weight to 20 parts by weight of at least one type of fatty acid ester that is selected from glycerin fatty acid ester, polyglycerin fatty acid ester, or sorbitan fatty acid ester; and 1 part by weight to 15 parts by weight of a metal salt of a fatty acid and/or a hydroxyfatty acid. The cleaning agent composition is used for cleaning a flow channel for resin in a hot runner type mold.

Abstract: The present invention relates to enabling a versatile charged particle beam device, which is used for a wide range of kinds of samples to be observed and has parameters of emission conditions of a primary charged particle beam that is difficult to be registered in advance, to be operated easily and accurately even by a less-experienced operator and to obtain high-resolution images.

Abstract: To provide a sheet former capable of suitably regulating the thickness of a sheet forming body in a width direction in response to factors changing with time. A sheet former includes at least one vessel which stores slurry as a raw material, a wire cylinder immersed in the slurry inside the vessel and making sheets from solid components in the slurry while being rotated, and a sheet-forming amount regulator which regulates an amount of the solid components for making sheets by the wire cylinder in a width direction in accordance with a thickness of a sheet forming body in the approximately width direction formed for making sheets by the wire cylinder.

Abstract: A charged particle beam device allowing an analysis position in a sample analyzable with an EBSD detector to be acquired beforehand, and allowing a sample to be adjusted to a desired analysis position in a short time. A charged particle beam device is provided with a charged particle source (111), a charged particle optical system (115), an EBSD detector (101), a sample stage (116), an image display unit (117) for displaying a portion of the sample observable with the EBSD detector and a non-observable portion of the sample such that said portions are distinguished from each other, an operation input unit (121) where a position to be observed by the EBSD detector is entered, and a control unit (118) for controlling a planar movement, an inclination movement and a rotation movement of the sample stage so as to allow the observation position entered from the operation input unit to be observed with the EBSD detector.

Abstract: To provide a sheet former capable of suitably regulating the thickness of a sheet forming body in a width direction in response to factors changing with time. A sheet former includes at least one vessel which stores slurry as a raw material, a wire cylinder immersed in the slurry inside the vessel and making sheets from solid components in the slurry while being rotated, and a sheet-forming amount regulator which regulates an amount of the solid components for making sheets by the wire cylinder in a width direction in accordance with a thickness of a sheet forming body in the approximately width direction formed for making sheets by the wire cylinder.

Abstract: According to one embodiment, an inspection apparatus includes an optical system portion on which a plurality of reflected light rays corresponding to a plurality of observation directions with respect to an optical variable image device are incident and which images the plurality of reflected light rays incident thereon, an imaging portion that images the plurality of reflected light rays imaged by the optical system portion and thereby generates reflected light images corresponding the plurality of respective observation directions, an object relation determination portion that determines whether or not there is a predetermined geometric difference between objects that are contained in reflected light images imaged by the imaging portion and corresponding to different observation directions, and an authenticity determination portion that determines authenticity of the optical variable image device based on a result of the determination by the object relation determination portion.

Abstract: A charged particle beam device allowing an analysis position in a sample analyzable with an EBSD detector to be acquired beforehand, and allowing a sample to be adjusted to a desired analysis position in a short time. A charged particle beam device is provided with a charged particle source (111), a charged particle optical system (115), an EBSD detector (101), a sample stage (116), an image display unit (117) for displaying a portion of the sample observable with the EBSD detector and a non-observable portion of the sample such that said portions are distinguished from each other, an operation input unit (121) where a position to be observed by the EBSD detector is entered, and a control unit (118) for controlling a planar movement, an inclination movement and a rotation movement of the sample stage so as to allow the observation position entered from the operation input unit to be observed with the EBSD detector.

Abstract: The present invention relates to enabling a versatile charged particle beam device, which is used for a wide range of kinds of samples to be observed and has parameters of emission conditions of a primary charged particle beam that is difficult to be registered in advance, to be operated easily and accurately even by a less-experienced operator and to obtain high-resolution images.

Abstract: The X-ray processing device comprises a work table on which a processing object is placed, X-ray processors irradiating the processing object placed in a given processing zone on the work table with an X-ray for processing, a pressing member, and X-ray shielding sheets. The pressing member presses and collapses any remaining raised edges at the sides of the processing object. The X-ray shielding sheets are provided on the side of the pressing member that is closest to the processing zone and shield the X-ray from the X-ray processors.