Abstract: The present invention makes it possible to supply transportation capacity suitable for movement demand in numerous circumstances.

Abstract: A train operation support system for outputting a rescheduled timetable for a planned timetable of a train from a computer by using the planned timetable and an actual timetable of the train includes a timetable modification unit that modifies the planned timetable by using a given timetable modification method, a passenger flow prediction unit that calculates passenger staying information containing information indicating the number of staying passengers in each time zone at each station, by using demand information indicating a destination of a passenger in each time zone at each station where the train stops, a timetable rescheduling unit that modifies the demand information in reference to the planned timetable modified by the timetable modification unit, inputs the modified demand information to the passenger flow prediction unit, and creates the rescheduled timetable for the planned timetable by using the passenger staying information output from the passenger flow prediction unit, and an output unit th

Abstract: When input information including starting point information and destination information are input, this transport navigation system searches for a route for traveling from the starting point to the destination by a train of a transportation means on the basis of the input information, and outputs travel route information about the travel route obtained. The transport navigation system includes: a storage unit which stores the input information, an actual timetable including actual operation of the train, and a software program; and a CPU which executes the software program with reference to the input information and the actual timetable. The CPU calculates, on the basis of the actual timetable and the input information, the travel route from the starting point to the destination and a statistical amount about a travel time according to the travel route, and generate travel route information on the basis of the travel route and the statistical amount.

Abstract: Provided is a service plan change assistance apparatus (110) including: a storage apparatus (13) that stores a decision model in which a service status of each of a delayed train and a to-be-delayed train to be delayed due to the delayed train and train service plan change content for recovering a delay of the to-be-delayed train are associated with each other, in association with a station at which the to-be-delayed train is delayed due to the delayed train; and an arithmetic apparatus (11) that estimates a future train service status based on a train service plan and a train service record before a current time, identifies, from the estimated train service status, the station at which the to-be-delayed train to be delayed due to the delayed train is standing, inputs information on the estimated train service status to a decision model associated with the identified station to create a service plan change proposal that includes information indicating train service change content for recovering the delay of t

Abstract: A replanned plan output device that outputs a replanned plan for an operation plan of performing planned schedules in order by an operation of a vehicle in charge, includes: a replanned candidate determination unit configured to, when a difficult-to-perform schedule that becomes difficult to be performed by the vehicle in charge among the planned schedules occurs, determine another vehicle as a candidate for a substitute vehicle for performing the difficult-to-perform schedule; and a substitute vehicle selection unit configured to, when a plurality of candidates for the substitute vehicle are set, select the substitute vehicle for performing the difficult-to-perform schedule from the plurality of candidates for the substitute vehicle in consideration of the number of changes of the vehicle in charge and an additional cost of each of the schedules specified in the operation plan.

Abstract: A timetable planning system 1 includes a storage device 13 and a computing device 11. The storage device 13 stores evaluation index improvement degree information 320 that stores relations between a change of each constituent element of an operation timetable on one hand and a change in quality of the operation timetable resulting from the change of each constituent element in terms of each operation timetable viewpoint on the other hand.

Abstract: A replanned plan output device that outputs a replanned plan for an operation plan of performing planned schedules in order by an operation of a vehicle in charge, includes: a replanned candidate determination unit configured to, when a difficult-to-perform schedule that becomes difficult to be performed by the vehicle in charge among the planned schedules occurs, determine another vehicle as a candidate for a substitute vehicle for performing the difficult-to-perform schedule; and a substitute vehicle selection unit configured to, when a plurality of candidates for the substitute vehicle are set, select the substitute vehicle for performing the difficult-to-perform schedule from the plurality of candidates for the substitute vehicle in consideration of the number of changes of the vehicle in charge and an additional cost of each of the schedules specified in the operation plan.

Abstract: A timetable creation apparatus 100 for correcting a target timetable being a train timetable to be used to control a group of trains by using a predicted passenger demand to thereby create a new target timetable, includes: an objective function generation unit 115 that generates an objective function for an operation headway between trains included in the group of trains by using the predicted passenger demand; a constraint condition generation unit 117 that derives constraint conditions which an arrival time and a departure time of each of the trains at each of stations should satisfy for operation of the group of trains; and a candidate timetable creation unit 119 that creates a candidate timetable as an update candidate for a target timetable by using an arrival time and a departure time of each of the trains at each of the stations derived by optimizing the objective function under the constraint conditions.

Abstract: A data analysis support apparatus includes a relationship network generation section that analyzes a relationship between operating systems, a relationship between operation data tables, a relationship between data items possessed by the operation data tables and a relationship between data values possessed by records of the operation data tables and stores them, as a relationship network; a data item classification section that classifies data items that become a data analysis target into a first data type based on an actual value and a second data type based on a planned value; an analysis data table generation section that generates and accumulates an analysis data table to be used for data analysis; a data model generation section that generates, as a data model, a data item group that allows data analysis in combination; and an analysis target item presentation section that recommends a data item to be made an analysis target.

Abstract: When input information including starting point information and destination information are input, this transport navigation system searches for a route for traveling from the starting point to the destination by a train of a transportation means on the basis of the input information, and outputs travel route information about the travel route obtained. The transport navigation system includes: a storage unit which stores the input information, an actual timetable including actual operation of the train, and a software program; and a CPU which executes the software program with reference to the input information and the actual timetable. The CPU calculates, on the basis of the actual timetable and the input information, the travel route from the starting point to the destination and a statistical amount about a travel time according to the travel route, and generate travel route information on the basis of the travel route and the statistical amount.

Abstract: The present invention makes it possible to supply transportation capacity suitable for movement demand in numerous circumstances.

Abstract: A data analysis support apparatus includes: a relationship network generation section that analyzes a relationship between operating systems, a relationship between operation data tables, a relationship between data items possessed by the operation data tables and a relationship between data values possessed by records of the operation data tables and stores them, as a relationship network; a data item classification section that classifies data items that become a data analysis target into a first data type based on an actual value and a second data type based on a planned value or a pre-definition; an analysis data table generation section that generates and accumulates an analysis data table to be used for data analysis; a data model generation section that generates, as a data model, a data item group that allows data analysis in combination; and an analysis target item presentation section that recommends a data item to be made an analysis target.

Abstract: A dimension measuring apparatus for measuring a dimension between a first data contour which is an evaluation reference of a pattern to be evaluated and a second data contour which is the pattern to be evaluated generates first correspondence information between a point on the first data contour and a point on the second data contour, determines consistency of a correspondence included in the first correspondence information, corrects an inconsistent correspondence, and generates second correspondence information, when associating a point on the first contour data and a point on the second contour data with each other.

Abstract: A pattern evaluation device of the present invention includes a model estimation unit that estimates a model caused by a manufacturing method on the basis of an inspection image, a deformation amount estimation unit that estimates a deformation amount of the inspection image by using the estimated model, a reference data deformation unit that deforms reference data by using the estimated deformation amount, and an evaluation unit that performs an evaluation process by comparing the reference data which is deformed by the reference data deformation unit with the inspection image.

Abstract: Provided is a pattern inspecting and measuring device that decreases the influence of noise and the like and increases the reliability of an inspection or measurement result during inspection or measurement using the position of an edge extracted from image data obtained by imaging a pattern as the object of inspection or measurement. For this purpose, in the pattern inspecting and measuring device in which inspection or measurement of an inspection or measurement object pattern is performed using the position of the edge extracted, with the use of an edge extraction parameter, from the image data obtained by imaging the inspection or measurement object pattern, the edge extraction parameter is generated using a reference pattern having a shape as an inspection or measurement reference and the image data.

Abstract: Provided are an image evaluation method and an image evaluation apparatus to evaluate a two-dimensional shape and a change in shape of a pattern side wall of a semiconductor pattern based on a SEM image, thus estimating an exposure condition. To this end, a method and a device include a storage unit that stores a model indicating a relationship between a feature amount that is obtained by creating a plurality of outlines from a SEM image and an exposure condition, and outline creation parameter information corresponding to the model; an outline creation unit that creates a plurality of outlines from a SEM image using the outline creation parameter information; and an estimation unit that uses a feature amount that is found based on the plurality of outlines created by the outline creation unit and the model to find an exposure condition.

Abstract: A pattern evaluation device of the present invention includes a model estimation unit that estimates a model caused by a manufacturing method on the basis of an inspection image, a deformation amount estimation unit that estimates a deformation amount of the inspection image by using the estimated model, a reference data deformation unit that deforms reference data by using the estimated deformation amount, and an evaluation unit that performs an evaluation process by comparing the reference data which is deformed by the reference data deformation unit with the inspection image.

Abstract: Provided are an image evaluation method and an image evaluation apparatus to evaluate a two-dimensional shape and a change in shape of a pattern side wall of a semiconductor pattern based on a SEM image, thus estimating an exposure condition. To this end, a method and a device include a storage unit that stores a model indicating a relationship between a feature amount that is obtained by creating a plurality of outlines from a SEM image and an exposure condition, and outline creation parameter information corresponding to the model; an outline creation unit that creates a plurality of outlines from a SEM image using the outline creation parameter information; and an estimation unit that uses a feature amount that is found based on the plurality of outlines created by the outline creation unit and the model to find an exposure condition.

Abstract: Provided is a pattern inspecting and measuring device that decreases the influence of noise and the like and increases the reliability of an inspection or measurement result during inspection or measurement using the position of an edge extracted from image data obtained by imaging a pattern as the object of inspection or measurement. For this purpose, in the pattern inspecting and measuring device in which inspection or measurement of an inspection or measurement object pattern is performed using the position of the edge extracted, with the use of an edge extraction parameter, from the image data obtained by imaging the inspection or measurement object pattern, the edge extraction parameter is generated using a reference pattern having a shape as an inspection or measurement reference and the image data.

Abstract: A defect inspection method comprising: picking up an image of a subject under inspection to thereby acquire an inspection image; extracting multiple templates corresponding to multiple regions, respectively from design data of the subject under inspection; finding a first misregistration amount between the inspection image and the design data using a first template as any one template selected from among the plural templates; finding a second misregistration amount between the inspection image and the design data using a second template other than the first template, the second template being selected from among the plural templates, and the first misregistration-amount; and converting the design data, misregistration thereof being corrected using the first misregistration-amount, and the second misregistration-amount, into a design data image, and comparing the design data image with the inspection image to thereby detect a defect of the subject under inspection.