Patents by Inventor Tuman Earl Allen, III
Tuman Earl Allen, III has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11424291Abstract: A method of forming an array of memory cells comprises forming an elevationally inner tier of memory cells comprising spaced inner tier lower first conductive lines, spaced inner tier upper second conductive lines, and programmable material of individual inner tier memory cells elevationally between the inner tier first lines and the inner tier second lines where such cross. First insulative material is formed laterally between the inner tier second lines to have respective elevationally outermost surfaces that are lower than elevationally outermost surfaces of immediately laterally-adjacent of the inner tier second lines. Second insulative material is formed elevationally over the first insulative material and laterally between the inner tier second lines. The second insulative material is of different composition from that of the first insulative material.Type: GrantFiled: December 21, 2017Date of Patent: August 23, 2022Assignee: Micron Technology, Inc.Inventors: Denzil S. Frost, Tuman Earl Allen, III
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Patent number: 10629652Abstract: Embodiments of the present disclosure describe techniques and configurations for a memory device comprising a memory array having a plurality of wordlines disposed in a memory region of a die. Fill regions may be disposed between respective pairs of adjacent wordlines of the plurality of wordlines. The fill regions may include a first dielectric layer and a second dielectric layer disposed on the first dielectric layer. The first dielectric layer may comprise organic (e.g., carbon-based) spin-on dielectric material (CSOD). The second dielectric layer may comprise a different dielectric material than the first dielectric layer, such as, for example, inorganic dielectric material. Other embodiments may be described and/or claimed.Type: GrantFiled: November 15, 2018Date of Patent: April 21, 2020Assignee: Intel CorporationInventors: Michael J. Bernhardt, Yudong Kim, Denzil S. Frost, Tuman Earl Allen, III, Kevin Lee Baker, Kolya Yastrebenetsky, Ronald Allen Weimer
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Publication number: 20190206942Abstract: Embodiments of the present disclosure describe techniques and configurations for a memory device comprising a memory array having a plurality of wordlines disposed in a memory region of a die. Fill regions may be disposed between respective pairs of adjacent wordlines of the plurality of wordlines. The fill regions may include a first dielectric layer and a second dielectric layer disposed on the first dielectric layer. The first dielectric layer may comprise organic (e.g., carbon-based) spin-on dielectric material (CSOD). The second dielectric layer may comprise a different dielectric material than the first dielectric layer, such as, for example, inorganic dielectric material. Other embodiments may be described and/or claimed.Type: ApplicationFiled: November 15, 2018Publication date: July 4, 2019Inventors: Michael J. Bernhardt, Yudong Kim, Denzil S. Frost, Tuman Earl Allen, III, Kevin Lee Baker, Kolya Yastrebenetsky, Ronald Allen Weimer
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Publication number: 20180122858Abstract: A method of forming an array of memory cells comprises forming an elevationally inner tier of memory cells comprising spaced inner tier lower first conductive lines, spaced inner tier upper second conductive lines, and programmable material of individual inner tier memory cells elevationally between the inner tier first lines and the inner tier second lines where such cross. First insulative material is formed laterally between the inner tier second lines to have respective elevationally outermost surfaces that are lower than elevationally outermost surfaces of immediately laterally-adjacent of the inner tier second lines. Second insulative material is formed elevationally over the first insulative material and laterally between the inner tier second lines. The second insulative material is of different composition from that of the first insulative material.Type: ApplicationFiled: December 21, 2017Publication date: May 3, 2018Inventors: Denzil S. Frost, Tuman Earl Allen, III
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Patent number: 9881972Abstract: A method of forming an array of memory cells comprises forming an elevationally inner tier of memory cells comprising spaced inner tier lower first conductive lines, spaced inner tier upper second conductive lines, and programmable material of individual inner tier memory cells elevationally between the inner tier first lines and the inner tier second lines where such cross. First insulative material is formed laterally between the inner tier second lines to have respective elevationally outermost surfaces that are lower than elevationally outermost surfaces of immediately laterally-adjacent of the inner tier second lines. Second insulative material is formed elevationally over the first insulative material and laterally between the inner tier second lines. The second insulative material is of different composition from that of the first insulative material.Type: GrantFiled: May 20, 2016Date of Patent: January 30, 2018Assignee: Micron Technology, Inc.Inventors: Denzil S. Frost, Tuman Earl Allen, III
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Publication number: 20170338280Abstract: A method of forming an array of memory cells comprises forming an elevationally inner tier of memory cells comprising spaced inner tier lower first conductive lines, spaced inner tier upper second conductive lines, and programmable material of individual inner tier memory cells elevationally between the inner tier first lines and the inner tier second lines where such cross. First insulative material is formed laterally between the inner tier second lines to have respective elevationally outermost surfaces that are lower than elevationally outermost surfaces of immediately laterally-adjacent of the inner tier second lines. Second insulative material is formed elevationally over the first insulative material and laterally between the inner tier second lines. The second insulative material is of different composition from that of the first insulative material.Type: ApplicationFiled: May 20, 2016Publication date: November 23, 2017Inventors: Denzil S. Frost, Tuman Earl Allen, III
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Publication number: 20170271412Abstract: Embodiments of the present disclosure describe techniques and configurations for a memory device comprising a memory array having a plurality of wordlines disposed in a memory region of a die. Fill regions may be disposed between respective pairs of adjacent wordlines of the plurality of wordlines. The fill regions may include a first dielectric layer and a second dielectric layer disposed on the first dielectric layer. The first dielectric layer may comprise organic (e.g., carbon-based) spin-on dielectric material (CSOD). The second dielectric layer may comprise a different dielectric material than the first dielectric layer, such as, for example, inorganic dielectric material. Other embodiments may be described and/or claimed.Type: ApplicationFiled: June 2, 2017Publication date: September 21, 2017Inventors: Michael J. Bernhardt, Yudong Kim, Denzil S. Frost, Tuman Earl Allen, III, Kevin Lee Baker, Kolya Yastrebenetsky, Ronald Allen Weimer
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Patent number: 9704923Abstract: Embodiments of the present disclosure describe techniques and configurations for a memory device comprising a memory array having a plurality of wordlines disposed in a memory region of a die. Fill regions may be disposed between respective pairs of adjacent wordlines of the plurality of wordlines. The fill regions may include a first dielectric layer and a second dielectric layer disposed on the first dielectric layer. The first dielectric layer may comprise organic (e.g., carbon-based) spin-on dielectric material (CSOD). The second dielectric layer may comprise a different dielectric material than the first dielectric layer, such as, for example, inorganic dielectric material. Other embodiments may be described and/or claimed.Type: GrantFiled: December 23, 2015Date of Patent: July 11, 2017Assignee: Intel CorporationInventors: Michael J. Bernhardt, Yudong Kim, Denzil S. Frost, Tuman Earl Allen, III, Kevin Lee Baker, Kolya Yastrebenetsky, Ronald Allen Weimer
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Publication number: 20170186815Abstract: Embodiments of the present disclosure describe techniques and configurations for a memory device comprising a memory array having a plurality of wordlines disposed in a memory region of a die. Fill regions may be disposed between respective pairs of adjacent wordlines of the plurality of wordlines. The fill regions may include a first dielectric layer and a second dielectric layer disposed on the first dielectric layer. The first dielectric layer may comprise organic (e.g., carbon-based) spin-on dielectric material (CSOD). The second dielectric layer may comprise a different dielectric material than the first dielectric layer, such as, for example, inorganic dielectric material. Other embodiments may be described and/or claimed.Type: ApplicationFiled: December 23, 2015Publication date: June 29, 2017Inventors: Michael J. Bernhardt, Yudong Kim, Denzil S. Frost, Tuman Earl Allen, III, Kevin Lee Baker, Kolya Yastrebenetsky, Ronald Allen Weimer
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Patent number: 8120101Abstract: The invention includes a transistor device having a semiconductor substrate with an upper surface. A pair of source/drain regions are formed within the semiconductor substrate and a channel region is formed within the semiconductor substrate and extends generally perpendicularly relative to the upper surface of the semiconductor substrate. A gate is formed within the semiconductor substrate between the pair of the source/drain regions.Type: GrantFiled: September 27, 2010Date of Patent: February 21, 2012Assignee: Micron Technology, Inc.Inventors: Sanh D. Tang, Gordon A. Haller, Kris K. Brown, Tuman Earl Allen, III
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Publication number: 20110012182Abstract: The invention includes a transistor device having a semiconductor substrate with an upper surface. A pair of source/drain regions are formed within the semiconductor substrate and a channel region is formed within the semiconductor substrate and extends generally perpendicularly relative to the upper surface of the semiconductor substrate. A gate is formed within the semiconductor substrate between the pair of the source/drain regions.Type: ApplicationFiled: September 27, 2010Publication date: January 20, 2011Applicant: Micron Technology Inc.Inventors: Sanh D. TANG, Gordon HALLER, Kris K. BROWN, Tuman Earl ALLEN, III
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Patent number: 7825462Abstract: The invention includes a transistor device having a semiconductor substrate with an upper surface. A pair of source/drain regions are formed within the semiconductor substrate and a channel region is formed within the semiconductor substrate and extends generally perpendicularly relative to the upper surface of the semiconductor substrate. A gate is formed within the semiconductor substrate between the pair of the source/drain regions.Type: GrantFiled: February 15, 2008Date of Patent: November 2, 2010Assignee: Micron Technology, Inc.Inventors: Sanh D. Tang, Gordon Haller, Kris K. Brown, Tuman Earl Allen, III
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Patent number: 7547945Abstract: The invention includes a transistor device having a semiconductor substrate with an upper surface. A pair of source/drain regions are formed within the semiconductor substrate and a channel region is formed within the semiconductor substrate and extends generally perpendicularly relative to the upper surface of the semiconductor substrate. A gate is formed within the semiconductor substrate between the pair of the source/drain regions.Type: GrantFiled: September 1, 2004Date of Patent: June 16, 2009Assignee: Micron Technology, Inc.Inventors: Sanh D. Tang, Gordon Haller, Kris K. Brown, Tuman Earl Allen, III
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Patent number: 7501684Abstract: The invention includes a transistor device having a semiconductor substrate with an upper surface. A pair of source/drain regions are formed within the semiconductor substrate and a channel region is formed within the semiconductor substrate and extends generally perpendicularly relative to the upper surface of the semiconductor substrate. A gate is formed within the semiconductor substrate between the pair of the source/drain regions.Type: GrantFiled: July 31, 2006Date of Patent: March 10, 2009Assignee: Micron Technology, Inc.Inventors: Sanh D. Tang, Gordon Haller, Kris K. Brown, Tuman Earl Allen, III
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Patent number: 6967170Abstract: The invention includes a method of patterning a material over a semiconductive substrate, comprising: a) forming a layer of first material against a second material and over the substrate, the substrate comprising a surface having a center and an edge; b) first etching the first material in a reaction chamber, the first etching comprising a first center-to-edge uniformity across the surface of the wafer and comprising a first selectivity for the first material relative to the second material; c) second etching the first material in the reaction chamber, the second etching comprising a second selectivity for the first material relative to the second material, the second center-to-edge uniformity being less than the first center-to-edge uniformity, the second selectivity being greater than the first selectivity; and d) cleaning a component of the first material from at least one sidewall of the reaction chamber between the first and second etchings.Type: GrantFiled: September 30, 2002Date of Patent: November 22, 2005Assignee: Micron Technology, Inc.Inventor: Tuman Earl Allen, III
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Patent number: 6878300Abstract: In one embodiment, the invention includes a method of removing at least a portion of a material from a substrate. The method includes providing a substrate in a reaction chamber, the substrate having a material supported thereover, and first etching the material while the substrate is in the reaction chamber. The method also includes, after the first etching, cleaning a component from at least one sidewall of the reaction chamber while the substrate remains therein; the component comprising a species that is present in the material. The cleaning includes exposing the sidewall and substrate to conditions which substantially selectively remove the component from the sidewall while not removing the material from the substrate, and not etching any other materials supported by the substrate. After the cleaning, the method includes second etching the material while the substrate is in the reaction chamber.Type: GrantFiled: October 1, 2002Date of Patent: April 12, 2005Assignee: Micron Technology, Inc.Inventor: Tuman Earl Allen, III
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Patent number: 6800561Abstract: A processing method includes patterning a material over a semiconductive substrate having a center and an edge. The method includes forming a layer of first material against a second material and over the semiconductive substrate and first etching the first material in a reaction chamber. First etching provides a first center-to-edge uniformity across the wafer surface and a first selectivity for the first material relative to the second material. The method also includes second etching the first material to provide a second center-to-edge uniformity across the wafer surface and a second selectivity greater than the first selectivity for the first material relative to the second material. The second center-to-edge uniformity is less than the first center-to-edge uniformity. The method also includes cleaning a component of the first material from at least one sidewall of the reaction chamber between the first and second etchings.Type: GrantFiled: September 30, 2002Date of Patent: October 5, 2004Assignee: Micron Technology, Inc.Inventor: Tuman Earl Allen, III
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Patent number: 6533953Abstract: In one embodiment, the invention includes a method of removing at least a portion of a material from a substrate. The method includes providing a substrate in a reaction chamber, the substrate having a material supported thereover, and first etching the material while the substrate is in the reaction chamber. The method also includes, after the first etching, cleaning a component from at least one sidewall of the reaction chamber while the substrate remains therein; the component comprising a species that is present in the material. The cleaning includes exposing the sidewall and substrate to conditions which substantially selectively remove the component from the sidewall while not removing the material from the substrate, and not etching any other materials supported by the substrate. After the cleaning, the method includes second etching the material while the substrate is in the reaction chamber.Type: GrantFiled: February 28, 2001Date of Patent: March 18, 2003Assignee: Micron Technology, Inc.Inventor: Tuman Earl Allen, III
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Patent number: 6479393Abstract: A processing method includes patterning a material over a semiconductive substrate having a center and an edge. The method includes forming a layer of first material against a second material and over the semiconductive substrate and first etching the first material in a reaction chamber. First etching provides a first center-to-edge uniformity across the wafer surface and a first selectivity for the first material relative to the second material. The method also includes second etching the first material to provide a second center-to-edge uniformity across the wafer surface and a second selectivity greater than the first selectivity for the first material relative to the second material. The second center-to-edge uniformity is less than the first center-to-edge uniformity. The method also includes cleaning a component of the first material from at least one sidewall of the reaction chamber between the first and second etchings.Type: GrantFiled: March 1, 2000Date of Patent: November 12, 2002Assignee: Micron Technology, Inc.Inventor: Tuman Earl Allen, III
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Patent number: 6478978Abstract: The invention includes a method of patterning a material over a semiconductive substrate, comprising: a) forming a layer of first material against a second material and over the substrate, the semiconductive substrate comprising a surface having a center and an edge; b) first etching the first material in a reaction chamber, the first etching comprising a first center-to-edge uniformity across the surface of the wafer and comprising a first selectivity for the first material relative to the second material; c) second etching the first material in the reaction chamber, the second etching comprising a second selectivity for the first material relative to the second material, the second center-to-edge uniformity being less than the first center-to-edge uniformity, the second selectivity being greater than the first selectivity; and d) cleaning a component of the first material from at least one sidewall of the reaction chamber between the first and second etchings.Type: GrantFiled: March 1, 2000Date of Patent: November 12, 2002Assignee: Micron Technology, Inc.Inventor: Tuman Earl Allen, III