Abstract: An apparatus having a power bus supplying power to a component of a memory device. The apparatus includes a noise source circuit generating a plurality of noise source signals that simulate a real-world noise. The apparatus can include a pulse generator circuit that receives the noise source signal and outputs at least one noise profile signal based on the noise source signal. A bus shorting circuit can be connected to the pulse generator circuit to receive the at least one noise profile signal. The bus shorting circuit can have at least one transistor connected between a first rail and a second rail of the power bus. Based on the at least one noise profile signal, the bus shorting circuit intermittently connects the at least one transistor between the first rail to the second rail to induce noise on the power bus.

Abstract: A device includes a clock input circuit that when in operation receives a clock signal and transmits an internal clock signal based on the clock signal. The device also includes an internal clock generator coupled to the clock input circuit to receive the internal clock signal, wherein the internal clock generator comprises clock adjustment circuitry that when in operation generates a phase controlled internal clock signal having subsequent clock edges based upon a single clock edge of the internal clock signal, wherein the phase controlled internal clock signal comprises a first frequency as a multiple of a second frequency of the internal clock signal.

Abstract: Pulse detection in microelectronic devices, and related methods, devices, and systems, are described herein. A device may detect and compare a number of pulses of a signal to a timing aperture to determine if any of the number of pulses is unacceptable. The timing aperture, which may be based on a timing signal and/or one or more pulse width thresholds, may define an acceptable pulse versus an unacceptable pulse.

Abstract: A time to digital circuit may provide a time measurement of an event, or a time measurement of a duration between multiple events. Various electronic devices may include one or more time to digital circuits. A time to digital circuit may include circuitry to use Thermometer Code for measuring the duration of the time. For example, the time to digital circuit may generate alternating signals using a ring oscillator when receiving an indication of an event. Moreover, the time to digital circuit may convert the alternating signals to a consistent signal with only one transition between high and low signals in multiple consecutive signals. Furthermore, the time to digital circuit may correct erroneous signal values of the consistent signals when multiple transitions between high and low signals in multiple consecutive signals occurs.

Abstract: A time to digital circuit may provide a time measurement of an event, or a time measurement of a duration between multiple events. Various electronic devices may include one or more time to digital circuits. A time to digital circuit may include circuitry to use Thermometer Code for measuring the duration of the time. For example, the time to digital circuit may generate alternating signals using a ring oscillator when receiving an indication of an event. Moreover, the time to digital circuit may convert the alternating signals to a consistent signal with only one transition between high and low signals in multiple consecutive signals. Furthermore, the time to digital circuit may correct erroneous signal values of the consistent signals when multiple transitions between high and low signals in multiple consecutive signals occurs.

Abstract: Glitch detection in microelectronic devices, and related methods, devices, and systems, are described herein. A device may detect and compare a number of pulses of a signal to a timing aperture to determine if any of the number of pulses is a glitch. The timing aperture, which may be based on a timing signal and/or one or more pulse width thresholds, may define an acceptable pulse versus a problematic glitch.

Abstract: An apparatus having a power bus supplying power to a component of a memory device. The apparatus includes a noise source circuit generating a plurality of noise source signals that simulate a real-world noise. The apparatus can include a pulse generator circuit that receives the noise source signal and outputs at least one noise profile signal based on the noise source signal. A bus shorting circuit can be connected to the pulse generator circuit to receive the at least one noise profile signal. The bus shorting circuit can have at least one transistor connected between a first rail and a second rail of the power bus. Based on the at least one noise profile signal, the bus shorting circuit intermittently connects the at least one transistor between the first rail to the second rail to induce noise on the power bus.

Abstract: A jitter generator may include a duty cycle code generator that generates a duty cycle control signal and an input buffer that outputs a signal based on its duty cycle. The input buffer may be coupled to the duty cycle code generator and to a source of a clock signal. After receiving the clock signal, the input buffer outputs the clock signal having jitter relative to the clock signal received from the source. The jitter may be added at least in part by components of the input buffer offsetting different transitions of the clock signal according to the duty cycle. Jitter may be added when the duty cycle changes in response to changes in the duty cycle control signal, such as in response to number generator circuitry of the duty cycle code generator update its output number, in response to a mode change received from a controller, or the like.

Abstract: A jitter generator may include a duty cycle code generator that generates a duty cycle control signal and an input buffer that outputs a signal based on its duty cycle. The input buffer may be coupled to the duty cycle code generator and to a source of a clock signal. After receiving the clock signal, the input buffer outputs the clock signal having jitter relative to the clock signal received from the source. The jitter may be added at least in part by components of the input buffer offsetting different transitions of the clock signal according to the duty cycle. Jitter may be added when the duty cycle changes in response to changes in the duty cycle control signal, such as in response to number generator circuitry of the duty cycle code generator update its output number, in response to a mode change received from a controller, or the like.

Abstract: Glitch detection in microelectronic devices, and related methods, devices, and systems, are described herein. A device may detect and compare a number of pulses of a signal to a timing aperture to determine if any of the number of pulses is a glitch. The timing aperture, which may be based on a timing signal and/or one or more pulse width thresholds, may define an acceptable pulse versus a problematic glitch.

Abstract: Methods and apparatuses of a two-phase flip-flop with symmetrical rise and fall times are disclosed herein. An example apparatus may include a clock generator circuit including a two-phase flip-flop circuit configured to provide an output signal. The two-phase flip-flop circuit includes a two-phase flip-flop and a driver circuit. The two-phase flip-flop is configured to provide a first driver control signal and a second driver control signal responsive to a clock signal. The first driver control signal and the second driver control signal are complementary. The driver circuit is configured to provide the output signal responsive to the first driver control signal and the second driver control signal.

Abstract: An electronic device including: a delay circuit configured to adjust a delay of an input for generating an output signal; and an input selection circuit coupled to the delay circuit, the input selection circuit configured to control a phase for a clock input based at least in part on a measurement of a delay corresponding to the delay circuit in generating the input.

Abstract: A device may include an integrated circuit and a jitter generator located on the integrated circuit. The jitter generator may include a random number generator to generate a random number in response to a clock input signal. The jitter generator may also include delay-causing circuitry to receive the clock input signal, where the delay-causing circuitry may create a delayed clock input signal. The jitter generator may also include a phase mixer to receive the random number, the delayed clock input signal, and the clock input signal, where the phase mixer additionally outputs a clock output signal having the clock input signal and having jitter.

Abstract: Circuits, apparatuses, and methods are disclosed for frequency division. In one such example circuit, a frequency divider is configured to alternate between providing a common frequency clock signal as an output clock signal through a first circuit responsive to a reference clock signal and providing a reduced frequency clock signal as the output clock signal through a second circuit responsive to the reference clock signal. The first and second circuits share a shared circuit through which the output clock signal is provided. An enable circuit is configured to cause the frequency divider to alternate between providing the common frequency clock signal as the output clock signal through the first circuit and the reduced frequency clock signal as the output clock signal through the second circuit.

Abstract: Apparatuses and methods for maintaining a duty cycle error counter. An example apparatus may a duty cycle detect circuit configured to receive a clock signal and to detect a duty cycle error of the clock signal. The duty cycle detect error includes a counter configured to store a count value indicating the duty cycle error using Gray code. The counter is adjusted in response to detection of non-zero duty cycle error, and the counter is configured to convert the count value from Gray code to binary code as a binary count value. The duty cycle detect circuit is further configured to provide a duty cycle error signal based on the binary count value. The example apparatus further comprising a duty cycle correction circuit configured to adjust a duty cycle of the clock signal based on the duty cycle error signal.

Abstract: An electronic device including: a delay circuit configured to adjust a delay of an input for generating an output signal; and an input selection circuit coupled to the delay circuit, the input selection circuit configured to control a phase for a clock input based at least in part on a measurement of a delay corresponding to the delay circuit in generating the input.

Abstract: An electronic device including: a variable delay circuit configured to adjust a delay of a variable delay input for generating an output signal; a decision circuit coupled to the variable delay, the decision circuit configured to: generate a start signal for the variable delay circuit to begin measuring a coarse delay, generate a stop signal for the variable delay circuit to stop measuring the coarse delay, and generate an inversion-decision signal based at least in part on measuring the coarse delay; and an input selection circuit coupled to the variable delay circuit and the decision circuit, the input selection circuit configured to control a phase for a clock input based on the inversion-decision signal in generating the variable delay input.

Abstract: An electronic device including: a variable delay circuit configured to adjust a delay of a variable delay input for generating an output signal; a decision circuit coupled to the variable delay, the decision circuit configured to: generate a start signal for the variable delay circuit to begin measuring a coarse delay, generate a stop signal for the variable delay circuit to stop measuring the coarse delay, and generate an inversion-decision signal based at least in part on measuring the coarse delay; and an input selection circuit coupled to the variable delay circuit and the decision circuit, the input selection circuit configured to control a phase for a clock input based on the inversion-decision signal in generating the variable delay input.

Abstract: Apparatuses and methods for maintaining a duty cycle error counter. An example apparatus may a duty cycle detect circuit configured to receive a clock signal and to detect a duty cycle error of the clock signal. The duty cycle detect error includes a counter configured to store a count value indicating the duty cycle error using Gray code. The counter is adjusted in response to detection of non-zero duty cycle error, and the counter is configured to convert the count value from Gray code to binary code as a binary count value. The duty cycle detect circuit is further configured to provide a duty cycle error signal based on the binary count value. The example apparatus further comprising a duty cycle correction circuit configured to adjust a duty cycle of the clock signal based on the duty cycle error signal.

Abstract: A device may include an integrated circuit and a jitter generator located on the integrated circuit. The jitter generator may include a random number generator to generate a random number in response to a clock input signal. The jitter generator may also include delay-causing circuitry to receive the clock input signals, where the delay-causing circuitry may create a delayed clock input signal. The jitter generator may also include a phase mixer to receive the random number, the delayed clock input signal, and the clock input signal, where the phase mixer additionally outputs a clock output signal having the clock input signal and having jitter.