Abstract: An electroforming process for a resistive memory of a memory device including a memory controller, an encoder computing an inversion-invariant linear error correction code, and a write device connected directly to the encoder. An electroforming device performing electroforming through write operations to such a resistive memory and to a method for checking a write operation.

Abstract: A method is provided for writing a data word to a resistive memory consisting of 2T2R differential cells each having first and second sets of a resistor (R) and a selection transistor (T). The method includes generating an initial codeword, programming it in 1T1R mode, checking its programming in 1T1R mode, inverting it, programming the inverted initial codeword in 1T1R mode, checking its programming in 1T1R mode, and reading, in 2T2R differential mode, that the read data correspond to said initial data. A device designed to implement this write method and to an electronic system including this device is also provided.

Abstract: A solution for improving the correction of errors in a 2T2R resistive memory protected by an error correction code. A method that makes it possible, through 1T1R read operations, to identify, in a codeword stored in memory, bits liable to be incorrect, called “erasures”, and then to invert these bits in the stored codeword in order to generate a new word corrected by the ECC.

Abstract: A method for selectively inverting a word to be written to a memory is provided. The memory includes memory cells, each memory cell allowing at least two values associated with at least one bit to be stored, the decision as to whether to invert a word being made depending on a number of vulnerable values, which number is determined on the basis of the data bits, of the inversion bit and of uneven check bits.

Abstract: A method for controlling the refresh of data in reprogrammable nonvolatile memories includes a plurality of memory pages for storing data.

Abstract: A method for selectively inverting a word to be written to a memory is provided. The memory includes memory cells, each memory cell allowing at least two values associated with at least one bit to be stored, the decision as to whether to invert a word being made depending on a number of vulnerable values, which number is determined on the basis of the data bits, of the inversion bit and of uneven check bits.

Abstract: A method for controlling the refresh of data in reprogrammable nonvolatile memories includes a plurality of memory pages for storing data.

Abstract: A device for controlling the refresh cycles of data stored in a non-volatile memory is provided. The device comprises a temperature sensor capable of measuring the temperature of at least one non-volatile memory and of delivering information representing the measured temperature, and a control module coupled to the temperature sensor capable of using the temperature information with modelling of the impact of the temperature on the retention time of the data in order to determine whether a loss of data is imminent and, if so, in order to generate an alarm.

Abstract: A device for controlling the refresh cycles of data stored in a non-volatile memory is provided. The device comprises a temperature sensor capable of measuring the temperature of at least one non-volatile memory and of delivering information representing the measured temperature, and a control module coupled to the temperature sensor capable of using the temperature information with modelling of the impact of the temperature on the retention time of the data in order to determine whether a loss of data is imminent and, if so, in order to generate an alarm.

Abstract: A method is provided for generating a maximized linear correcting code from a base linear correcting code, the base correcting code and the maximized linear correcting code being associated with one and the same parity matrix H, the matrix being used to generate syndromes, the syndromes being used for decoding code words. The method comprises a step of identifying the syndromes unused for decoding the base linear correcting code, a step of identifying the errors that can affect the code words and make it possible to obtain the unused syndromes when a code word is multiplied by the matrix H and a step of selecting a unique error for each unused syndrome from among the identified errors, the error being called additional error.

Abstract: A device for correcting an initial binary word affected by an error in 1 or 2 bits and arising from a corrector code endowed with a minimum Hamming distance of 3 or 4, comprises first means for correcting an error of 1 bit and for detecting an error of more than 1 bit in the initial word and second means for correcting an error of 1 bit in a word arising from an inversion module, able to receive a datum indicative of a binary level of confidence, low or high, assigned to each of the bits of at least one part of the initial word, said inversion module being configured to invert the bits of the initial word which suffer the low confidence level, and a multiplexer with at least two inputs which is driven by the means for detecting an error of more than 1 bit in the initial word, said multiplexer being fed on a first input by the output of the first correction means and on a second input by the output of the second correction means.

Abstract: A scan sequential element device for an integrated circuit receiving three input signals, at least one clock signal as input, and an output comprises: a system sequential element including an input controlled by a first input signal of the device, an input controlled by a second input signal of the device, and an input controlled by one of the clock signals received as input by the device, and a shadow sequential element including an input controlled by the third input signal of the device, an input controlled by the second input signal of the device, and an input controlled by one of said clock signals received as input by the device, the device being configured so the first input signal is propagated to the output of the device through the system sequential element when the second input signal is disabled, and the third input signal is propagated to the output of the device through the shadow sequential element and the system sequential element when the second input signal is enabled, the propagation of the

Abstract: A device for monitoring the latency of electronic circuits based on microtechnology and/or nanotechnology, said circuits to be tested being supplied with the aid of a voltage Vdd, having a low level and a high level, for the detection of delay faults of said circuits, comprises: at least one device of type I placed between the high level of the power supply voltage and the elements of the circuit to be tested, and/or at least one device of type II placed between the low level of the power supply voltage of the elements of the elements of said circuit to be tested, the device of type I and the device of type II comprising at least one low-latency electrical path, said low-latency path being connected in parallel with a high-latency electrical path, a test signal monitoring the opening of the low-latency paths while the high-latency electrical paths are open.

Abstract: A device for correcting an initial binary word affected by an error in 1 or 2 bits and arising from a corrector code endowed with a minimum Hamming distance of 3 or 4, comprises first means for correcting an error of 1 bit and for detecting an error of more than 1 bit in the initial word and second means for correcting an error of 1 bit in a word arising from an inversion module, able to receive a datum indicative of a binary level of confidence, low or high, assigned to each of the bits of at least one part of the initial word, said inversion module being configured to invert the bits of the initial word which suffer the low confidence level, and a multiplexer with at least two inputs which is driven by the means for detecting an error of more than 1 bit in the initial word, said multiplexer being fed on a first input by the output of the first correction means and on a second input by the output of the second correction means.

Abstract: A method for determining the erroneous bits in an initial binary word affected by a double error and arising from a code endowed with a minimum Hamming distance equal to 3 or 4 comprises reception of a datum indicative of a binary level of confidence, low or high, assigned to each of the bits of at least one part of the initial word, a step of generating the syndrome on the basis of the initial word and a step of determining whether the syndrome is that of a code word affected by a double error, in which if it identifies, on the basis of the syndrome, an error in the initial word whose two affected bits correspond to bits of low confidence in the initial word, the two erroneous bits are selected to be corrected. The method applies notably to the fields of error correcting codes and nanometric technologies.

Abstract: A device for testing and monitoring digital circuits for detecting timing faults affecting a signal D received directly at the input of a flip-flop called primary sampling element, supplying a first value D1 of the signal D and receiving a first clock signal, including at least: a scan logic module having a first input receiving the signal “D”, a second input receiving a “scan in” signal and a third input receiving a “scan enable” signal suitable for selecting the operating mode of the testing device in a scan mode or an operational mode, and an output linked to a secondary sampling element supplying a second sampled signal D2 of the signal D after passing through the scan logic module, and receiving a second clock signal; a module for comparison of the signal D1 and the signal D2 generating an alert or error signal.

Abstract: A method for online testing pipeline systems comprising a succession of stages separated by buffers each associated with an idle signal, or idle signal, and/or at least one status bit, comprising: detecting values of the idle signal and/or the corresponding status bits indicating the availability of a cycle or the abrupt interruption of the flow of operations in a pipeline, and indicating that a valid operation, executed by a stage in the pipeline, is followed by an unused cycle; maintaining the state of the buffer in order to allow said valid operation to be re-executed during the unused cycle indicated by said idle signal; re-executing, during the unused cycle, the valid operation, in order to obtain at least a first version and a second version of said valid operation; memorizing, at the output of the pipeline, the results that correspond to the first version of said repeated or re-executed operation, in order to compare with the results of said second version of the same repeated or re-executed operation;

Abstract: A method is provided for generating a maximized linear correcting code from a base linear correcting code, the base correcting code and the maximized linear correcting code being associated with one and the same parity matrix H, the matrix being used to generate syndromes, the syndromes being used for decoding code words. The method comprises a step of identifying the syndromes unused for decoding the base linear correcting code, a step of identifying the errors that can affect the code words and make it possible to obtain the unused syndromes when a code word is multiplied by the matrix H and a step of selecting a unique error for each unused syndrome from among the identified errors, the error being called additional error.

Abstract: A method for online testing pipeline systems comprising a succession of stages separated by buffers each associated with an idle signal, or idle signal, and/or at least one status bit, comprising: detecting values of the idle signal and/or the corresponding status bits indicating the availability of a cycle or the abrupt interruption of the flow of operations in a pipeline, and indicating that a valid operation, executed by a stage in the pipeline, is followed by an unused cycle; maintaining the state of the buffer in order to allow said valid operation to be re-executed during the unused cycle indicated by said idle signal; re-executing, during the unused cycle, the valid operation, in order to obtain at least a first version and a second version of said valid operation; memorizing, at the output of the pipeline, the results that correspond to the first version of said repeated or re-executed operation, in order to compare with the results of said second version of the same repeated or re-executed operation;

Abstract: A device for monitoring the latency of electronic circuits based on microtechnology and/or nanotechnology, said circuits to be tested being supplied with the aid of a voltage Vdd, having a low level and a high level, for the detection of delay faults of said circuits, comprises: at least one device of type I placed between the high level of the power supply voltage and the elements of the circuit to be tested, and/or at least one device of type II placed between the low level of the power supply voltage of the elements of the elements of said circuit to be tested, the device of type I and the device of type II comprising at least one low-latency electrical path said low-latency path being connected in parallel with a high-latency electrical path, a test signal monitoring the opening of the low-latency paths while the high-latency electrical paths are open.