Patents by Inventor Vamshi Krishna

Vamshi Krishna has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20100057854
    Abstract: A computer-implemented method, apparatus, and computer program code for managing messages. Responsive to receiving a message at a data processing system, wherein the message comprises a number of message identifiers and metadata identifying the message as pointing to a number of messages in a message history store in the data processing system, the number of messages in the message history on the data processing system is identified to form an identified number of messages. A presence of the identified number of messages in the message history is displayed on a display in the data processing system.
    Type: Application
    Filed: August 27, 2008
    Publication date: March 4, 2010
    Applicant: International Business Machines Corporation
    Inventors: Kotaiah Chinnam, Eric Philip Fried, Vijayasekhar Mekala, Vamshi Krishna Thatikonda
  • Publication number: 20090249879
    Abstract: An inspection system includes an ultrasonic transducer configured to deliver ultrasonic wave energy to at least one sub volume of the part, and an ultrasonic receiver configured to receive ultrasonic wave energy from the part at a fundamental frequency and at least one harmonic frequency. Both the ultrasonic transducer and the ultrasonic receiver are located on the same side of the part in various configurations. In a method, ultrasonic wave energy is delivered to at least one subvolume of the part using an ultrasonic transducer and ultrasonic wave energy from the part at a fundamental frequency is received at least one harmonic frequency using an ultrasonic receiver positioned on the same side of the part to determine whether one or more material property anomalies are present in the part.
    Type: Application
    Filed: June 15, 2009
    Publication date: October 8, 2009
    Applicant: General Electric
    Inventors: Satheesh Jeyaraman, Sivaramanivas Ramaswamy, Vamshi Krishna Reddy Kommareddy, Baskan Ganesan
  • Patent number: 7546769
    Abstract: A method and system for microstructural evaluation and degradation evaluation of an object are provided. The method comprises insonifying at least one subvolume of the object with ultrasonic energy at a fundamental frequency and acquiring receive energy from the object at the fundamental frequency and at least one harmonic frequency thereof. A nonlinearity parameter is determined using the receive energy. The nonlinearity parameter is then used to determine a grain size for the subvolume of the object and a variation of the grain size within the object. The nonlinearity parameter is also used to determine fatigue damage or a residual stress.
    Type: Grant
    Filed: December 1, 2005
    Date of Patent: June 16, 2009
    Assignee: General Electric Compnay
    Inventors: Sivaramanivas Ramaswamy, Michael Francis Xavier Gigliotti, Vamshi Krishna Reddy Kommareddy, Richard Eugene Klaassen, Edward James Nieters, Mandayam Tondanur Shyamsunder, Michael Everett Keller, Nihat Kurkcu
  • Publication number: 20090083166
    Abstract: A digital processing system supporting management of purchase orders according to chargeable subcontracting model in an outsourcing organization. In one embodiment, when a user provides an order for a desired quantity of an assembly type from an external organization, the digital processing system automatically raises a sales order, as originating from the external organization, corresponding to each of a set of components required for manufacturing the assembly type. On receiving a receipt indication indicating the successful delivery of the order, the digital processing system calculates a net payable amount to be paid to the external organization. Additional aspects of the invention facilitate setting up of chargeable contracting model with simulated (within the digital processing system) external organizations, planning of purchase orders, etc.
    Type: Application
    Filed: September 26, 2007
    Publication date: March 26, 2009
    Applicant: Oracle International Corporation
    Inventors: Kachireddy Venkata Reddy, Rajesh Krishnan, Frederic Dubois, Satoru Kengaku, Vincent Shu-Lai Chu, Prabha Seshadri, Neelam Soni, Vamshi Krishna Mutyala
  • Publication number: 20080236288
    Abstract: A method for inspecting a part is provided. The method includes immersing the part in a couplant medium, delivering ultrasonic wave energy to at least one subvolume of the part using an ultrasonic transducer immersed in the couplant medium and receiving ultrasonic wave energy from the part at a fundamental frequency and at least one harmonic frequency using an ultrasonic receiver immersed in the couplant medium. The method also includes generating a nonlinear image corresponding to at least one material property variation of the part using the received ultrasonic energy and using the nonlinear image of the part to determine whether one or more material property anomalies are present in the part.
    Type: Application
    Filed: April 2, 2007
    Publication date: October 2, 2008
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Edward James Nieters, Michael Francis Xavier Gigliotti, Ramkumar Kashyap Oruganti, Sivaramanivas Ramaswamy, Balachandar Ramadurai, Vamshi Krishna Reddy Kommareddy, Ganesan Baskaran, Michael Everett Keller
  • Patent number: 7337651
    Abstract: A method for generating a scanplan for inspection of a component is provided. The method includes loading a geometric model of the component and generating the scanplan of the component based on the geometric model and at least one scanning parameter. A method of inspecting a component is also provided and includes loading a geometric model of the component, generating a scanplan of the component based on the geometric model and at least one scanning parameter, mounting the component on an inspection system manipulator and inspecting the component including moving an inspection probe relative to the component using the scanplan.
    Type: Grant
    Filed: April 5, 2005
    Date of Patent: March 4, 2008
    Assignee: General Electric Company
    Inventors: Suneel Tumkur Shankarappa, William Stewart McKnight, Vamshi Krishna Reddy Kommareddy, Ui Won Suh, Mandar Diwakar Godbole, Anjani Narendra Schrad, Prafull Sharma