Abstract: A performance projection system includes a test IHS and multiple currently existing IHSs. The performance projection system includes user application software and surrogate programs that execute on currently existing IHSs. The performance projection system measures user application software and surrogate program performance during execution on currently existing IHSs. The performance projection systems measures runtime program performance during execution of surrogate programs on a future semiconductor die IC design model or virtualized future system. Designers normalize and compare surrogate program runtime performance data with user application software performance data. Designers un-normalize the normalized runtime performance data to generate a projection of runtime performance on the future system.

Abstract: A performance projection system includes a test IHS and a currently existing IHS. The performance projection system includes surrogate programs and user application software. The test IHS or simulator includes a processor with hardware (HW) counter(s) and an L1 cache. The test IHS employs a memory that includes a virtual future IHS, currently existing IHS, surrogate programs, and user application software for determination of runtime and HW counter performance data. The user application software and surrogate programs execute on the currently existing IHS to provide designers with runtime data and HW counter or microarchitecture dependent data. Designers execute surrogate programs on the future IHS to provide runtime and HW counter data. Designers normalize and weight the runtime and HW counter data to provide a representative surrogate program for comparison to user application software performance on the future IHS.

Abstract: A test system or simulator includes an enhanced IC test application sampling software program that executes test application software on a semiconductor die IC design model. The enhanced test application sampling software may include trace, simulation point, CPI error, clustering, instruction budgeting, and other programs. The enhanced test application sampling software generates basic block vectors (BBVs) and fly-by vectors (FBVs) from instruction trace analysis of test application software workloads. The enhanced test application sampling software utilizes the microarchitecture dependent information to generate the FBVs to select representative instruction intervals from the test application software. The enhanced test application sampling software generates a reduced representative test application software program from the BBV and FBV data utilizing a global instruction budgeting analysis method.

Abstract: A test system or simulator includes an integrated circuit (IC) benchmark software program that executes workload program software on a semiconductor die IC design model. The benchmark software program includes trace, simulation point, basic block vector (BBV) generation, cycles per instruction (CPI) error, clustering and other programs. The test system also includes CPI stack program software that generates CPI stack data that includes microarchitecture dependent information for each instruction interval of workload program software. The CPI stack data may also include an overall analysis of CPI data for the entire workload program. IC designers may utilize the benchmark software and CPI stack program to develop a reduced representative workload program that includes CPI data as well as microarchitecture dependent information.

Abstract: A test system or simulator includes an IC test application sampling software program that executes test application software on a semiconductor die IC design model. The test application sampling software includes trace, simulation point, CPI error, clustering and other programs. IC designers utilize the test application sampling software to evaluate the performance characteristics of IC designs with test software applications. The test application sampling software generates basic block vectors (BBVs) and fly-by vectors (FBVs) from instruction trace analysis of test application software. The test application sampling software analyzes microarchitecture dependent information that it uses to generate the FBVs. Test application sampling software generates a reduced representative test application software program from the BBV and FBV data utilizing an instruction budgeting method.

Abstract: A test system or simulator includes an IC benchmark software program that executes application software on a semiconductor die IC design model. The benchmark software includes trace, simulation point, clustering and other programs. IC designers utilize the benchmark software to evaluate the performance characteristics of IC designs with customer user software applications. The benchmark software generates basic block vectors BBVs from instruction traces of application software. The benchmark software analyzes data dependent information that it appends to BBVs to create enhanced BBVs or EBBVs. The benchmark software may graph the EBBV information in a cluster diagram and selects a subset of EBBVs as a representative sample for each program phase. Benchmarking software generates a reduced application software program from the representative EBBV samples.

Abstract: A method, system, and computer program product are provided for identifying instructions to obtain representative traces. A phase instruction budget is calculated for each phase in a set of phases. The phase instruction budget is based on a weight associated with each phase and a global instruction budget. A starting index and an ending index are identified for instructions within a set of intervals in each phase in order to meet the phase instruction budget for that phase, thereby forming a set of interval indices. A determination is made as to whether the instructions within the set of interval indices meet the global instruction budget. Responsive to the global instruction budget being met, the set of interval indices are output as collection points for the representative traces.