Abstract: An integrated circuit device has at least one environment-hardened die and at least one less-environment-hardened die. Environment-hardened circuitry on the environment-hardened die is more resistant to the degradation when exposed to a predetermined environmental condition than the less-environment-hardened circuitry on the environment-hardened die. The dice are combined using a 3D or 2.5D integrated circuit technology. This is very useful for testing circuits at adverse environmental conditions (e.g. high temperature), or for providing circuits to operate at such conditions.

Abstract: An apparatus including a Correlated Electron Switch (CES) element and a programing circuit is provided. The programing circuit provides a programing signal to the CES element to program the CES element to an impedance state of multiple impedance states when a number of times the CES element has been programed is less than a threshold.

Abstract: A protected circuit includes a logic circuit having one or more input nodes and one or more output nodes. The logic circuit has a network of logic elements and one or more logic encryption elements. A logic encryption element includes a memory cell, such as a correlated electron switch for example, coupled with a configurable sub-circuit that is configured by a value stored in the memory cell to encrypt a signal or a signal path. A mapping of values at the one or more input nodes to values at the one or more output nodes corresponds to a desired mapping when values stored in the one or more memory cells match component values of a prescribed key vector. The memory cells may be programmed after fabrication of the circuit.

Abstract: A method and apparatus is provided for wear leveling of a storage medium in an electronic device. Wear leveling is achieved by mapping each logical memory address to a corresponding physical memory address. The mapping information is consistent over an on-period of a power cycle, but changes from one power cycle to another. The mapping information, such as a key value for example, may be stored in non-volatile memory such as, for example, a correlated electron random switch (CES) storage element. The mapping may be obtained by manipulating bits of the logical address to obtain the physical address.

Abstract: Subject matter disclosed herein may relate to correlated electron switch devices, and may relate more particularly to compensating for integrated circuit manufacturing process variation with correlated electron switch devices.

Abstract: A computer-implemented system and method is provided for reducing failure-in-time (FIT) errors associated with one or more sequential devices of a circuit design for a process technology. The method comprises receiving an input data file that includes register transfer level (RTL) data of the circuit design. The RTL data includes the one or more sequential devices. The method further comprises identifying a preferred logic state for each sequential device of the one or more sequential devices. The method further comprises adjusting the one or more sequential devices based on the preferred logic state.

Abstract: A configurable impeder is provided. The configurable impeder comprises of multiple CESs. Each of the CESs is capable of being configured into one of a plurality of impedance states. Further, a programing circuit is provided. The programing circuit provides a plurality of programing signals in dependence of an input signal. Each programing signal configures an impedance state of a respective CES from the plurality of CESs.

Abstract: An approach is provided for predicting an exception during a debugging of software code before the debugging encounters the exception. A number of lines X is received. During a debugging of a line number L of the code, upcoming lines consisting of line numbers L+1 through L+X are executed. Based on the execution of the upcoming lines, the exception is predicted to be encountered at line number M, which is within a range of line numbers L+1 through L+X. During the debugging of the line number L, and based on the prediction and the line number being within the range, a warning is displayed that the exception is to be encountered at line number M.

Abstract: Various implementations described herein may refer to and may be directed to error detection circuitry for use with memory. In one implementation, an integrated circuit may include a memory array having a plurality of rows of memory cells, where a respective row is configured to store a data word and one or more check bits corresponding to the data word. The integrated circuit may also include inline error detection circuitry coupled to the respective row and configured to generate one or more flag bit values based on a detection of one or more bit errors in the data word stored in the respective row. The integrated circuit may further include error correction circuitry configured to correct the one or more bit errors in the data word stored in the respective row in response to the one or more generated flag bit values.

Abstract: An approach is provided for predicting an exception during debugging of software code before the debugging encounters the exception. A number of lines X is received. A line number L of the code is debugged. In a new thread, upcoming lines consisting of line numbers L+1 through L+X are executed. Based on the execution of the upcoming lines, a prediction is determined that the exception will be encountered at line number M, which is within a range of line numbers L+1 and L+X. Based on the prediction and the line number being within the range, a warning is displayed that the exception is likely to be encountered at line number M. Responsive to the displayed warning, an indication that a corrective action was taken to avoid the exception is received.

Abstract: According to one embodiment of the present disclosure, a device comprises a latching circuitry, where the latching circuitry comprises at least one correlated electron random access memory (CeRAM) element. The latching circuitry further comprises a control circuit coupled to the at least one CeRAM element. The control circuit is configured to receive at least one control signal. Based on the at least one control signal, perform at least one of storing data into the latching circuitry and outputting data from the latching circuitry.

Abstract: Various implementations described herein are directed to a memory device. The memory device may include a first interleaving circuit that receives data words and generates a first error correction code based on the received data words. The memory device may include a second interleaving circuit that receives the data words and generates a second error correction code based on the received data words as a complement to the first error correction code. The second interleaving circuit may interleave data bits from multiple different data words and store modified data words based on the multiple different data words.

Abstract: According to one embodiment of the present disclosure, a device comprises a latching circuitry, where the latching circuitry comprises at least one correlated electron random access memory (CeRAM) element. The latching circuitry further comprises a control circuit coupled to the at least one CeRAM element. The control circuit is configured to receive at least one control signal. Based on the at least one control signal, perform at least one of storing data into the latching circuitry and outputting data from the latching circuitry.

Abstract: An apparatus including a Correlated Electron Switch (CES) element and a programing circuit is provided. The programing circuit provides a programing signal to the CES element to program the CES element to an impedance state of multiple impedance states when a number of times the CES element has been programed is less than a threshold.

Abstract: Disclosed are a circuit and method for implementing a switching function. In an embodiment, the circuit includes a first logic circuit, a second logic circuit, and a Correlated electron switch (CES) element. The CES element is configurable to have a non-volatile state to enable or disable an electrical connection between the first logic circuit and the second logic circuit.

Abstract: A computer implemented system and method is provided for reducing failure in time (FIT) errors associated with one or more sequential devices of a circuit design for a process technology. The method comprises receiving an input data file that includes register transfer level (RTL) data of the circuit design. The RTL data includes the one or more sequential devices. The method further comprises identifying a preferred logic state for each of the one or more sequential devices. The method further comprises adjusting the one or more sequential devices based on the preferred logic state.

Abstract: A configurable impeder is provided. The configurable impeder comprises of multiple CESs. Each of the CESs is capable of being configured into one of a plurality of impedance states. Further, a programing circuit is provided. The programing circuit provides a plurality of programing signals in dependence of an input signal. Each programing signal configures an impedance state of a respective CES from the plurality of CESs.

Abstract: A data storage apparatus is provided which has a plurality of data storage units, each respective data storage unit configured to store a respective data bit of a data word. Stored data value parity generation circuitry is configured to generate a parity bit for the data word in dependence on the data bits of the data word stored in the plurality of data storage units. The stored data value parity generation circuitry is configured such that switching within the stored data value parity generation circuitry does not occur when the data word is read out from the plurality of data storage units. Transition detection circuitry is configured to detect a change in value of the parity bit.

Abstract: According to one embodiment of the present disclosure, a device comprises a latching circuitry, where the latching circuitry comprises at least one correlated electron random access memory (CeRAM) element. The latching circuitry further comprises a control circuit coupled to the at least one CeRAM element. The control circuit is configured to receive at least one control signal. Based on the at least one control signal, perform at least one of storing data into the latching circuitry and outputting data from the latching circuitry.

Abstract: An approach is provided for predicting an exception during debugging of software code before the debugging encounters the exception. A number of lines X is received. A line number L of the code is debugged. In a new thread, upcoming lines consisting of line numbers L+1 through L+X are executed. Based on the execution of the upcoming lines, a prediction is determined that the exception will be encountered at line number M, which is within a range of line numbers L+1 and L+X. Based on the prediction and the line number being within the range, a warning is displayed that the exception is likely to be encountered at line number M. Responsive to the displayed warning, an indication that a corrective action was taken to avoid the exception is received.