Abstract: A control store in a data processor is addressed by means of next address generation logic which includes a first multiplexer utilized to address the control store, which multiplexer has several inputs. One of such inputs is received from a latching mechanism which allows more than one test condition to be simultaneously utilized for addressing the control store on a free flow basis. These test conditions, as well as information from an addressed control word, are utilized in a multiplexed arrangement as one input of the first multiplexer. By use of other inputs of such first multiplexer, the control store may be addressed by use of branch address information, as well as other test condition information. A page register provides the page address, to a plurality of pages included in this control store with the locations in each such page addressed by use of the above noted multiplexer combination.

Abstract: Interrupts generated within a data processor (internal interrupts) and an interrupt received from a peripheral device (external interrupts) coupled with the processor are prioritized and, unless suppressed, are coupled to generate an interrupt signal for use in addressing a routine for servicing the particular highest priority requesting internal or external interrupt. All further interrupts are suppressed during the time required to service the interrupt and, depending upon the type of interrupt, either the internal or external interrupt may be suppressed for one or two instruction times for debug purposes or under computer program control as required for a particular operation.

Abstract: Diagnostic testing of a central processor is provided in conjunction with a memory coupled with the processor without any requirement for an input device such as a tape or card reader. Local storage of a test program is provided in the processor which, under the control of a local control store, enables the transfer of the test program to the memory for execution. The central processor may thus be given an initial test to insure a basic performance level.

Abstract: Two numbers are multiplied together without first changing either of them, if negative, to a positive number, thereby minimizing the time required in the multiplication process. In the multiplication, depending upon the sign of the multiplier and the sign of a bit in a predetermined bit location of the multiplier as shifted in a shift register, the multiplier and the multiplicand are operated on by either a shift operation or operated on by a shift and add operation.

Abstract: A control store having a first portion for storing system operation instructions (opcodes), a second portion for storing control store addressing information, wherein the second portion includes a greater number of storage locations than does the first portion in order to efficiently store different control store address information which may be required for the same opcode. Addressing apparatus coupled to address a location in the first portion and any one of at least two corresponding locations in the second portion is provided, thereby minimizing the number of locations required in the first portion of the control store.

Abstract: Data transfer synchronization is achieved in a data processing system by a transferring unit enabling a clock cycle stall mechanism each time a transfer is attempted, disabling such mechanism upon receipt of a predetermined response from the receiving unit, the mechanism actually producing a clock cycle stall if such predetermined response is delayed beyond the duration of the clock cycle. Further, such stall mechanism is enabled in a receiving unit before the expected receipt of information, and actually produces a clock cycle stall if such response is so delayed.