Abstract: An electronic device is described. The electronic device includes a first integrated circuit (IC) and a second integrated circuit (IC). The electronic device also includes a multiplexer configured to multiplex a parallel data signal into a serial data signal, and a transmitter configured to transmit the serial data signal from the first IC to the second IC. The electronic device further includes a receiver configured to receive the serial data signal. The receiver includes a clamp circuit configured to clamp the voltage swing of an analog node within a determined range. The clamp also helps to extend the bandwidth of the receiver.

Abstract: A transceiver interface for data transfer between two integrated circuits (ICs or “chips”) utilizes a current mode technique rather than conventional voltage mode differential signaling techniques. A current pulse is injected into one of two transmission wires based on a signal value to be transmitted (e.g., logic “0” or “1”) by a driver on a transmitting chip. The current pulse is received as a differential current signal at a receive block in a receiving chip. The differential signal is converted to a low swing differential voltage signal by current comparators. The differential voltage signal may be detected by an op-amp receiver which outputs the appropriate signal value.

Abstract: An electrostatic discharge (ESD) protection circuit uses two N-channel field effect transistors (NFETs) to conduct ESD current from a first to a second supply node. During the ESD event, an ESD detection circuit couples the gates of both NFETs to the first supply node through separate conductive paths. In one novel aspect, an RC trigger circuit includes a capacitance that is charged through a resistance. The resistance involves a P-channel transistor whose gate is coupled to the gate of the second NFET. During a normal power-up condition, the P-channel transistor is conductive, thereby preventing the RC trigger from triggering if the supply voltage VDD were to rise rapidly. In another novel aspect, a novel level-shifting inverter drives the second NFET. The level-shifting inverter uses a pull down resistor to avoid snap-back and also isolates the gate of the second NFET from a capacitively loaded third supply node.

Abstract: A digital output driver includes a pre-driver and a driver that may be implemented with thin-oxide FETs. The pre-driver generates first and second digital signals based on a digital input signal. The first digital signal has a first voltage range determined by a first (e.g., pad) supply voltage and an intermediate voltage. The second digital signal has a second voltage range determined by a second (e.g., core) supply voltage and circuit ground. The driver receives the first and second digital signals and provides a digital output signal having a third voltage range determined by the first supply voltage and circuit ground. The pre-driver may include a latch and a latch driver. The latch stores the current logic value for the digital input signal. The latch driver writes the logic value to the latch. The latch driver is enabled for a short time duration to write the logic value and is turned off afterward.

Abstract: This disclosure describes a clock circuit for a memory controller. The described circuit uses a processor clock signal to generate an input clock signal for use during write operations to the memory, or to generate a feedback clock signal for use during read operations from the memory. The circuit is particularly applicable to mobile wireless devices that include memories that do not generate a strobe. The clock circuit may comprise a driver in series with a resistor element that generates an input clock signal for input to a memory, and a resistor-capacitor (RC) filter in series with a receiver that generates a feedback clock signal for output from the memory, wherein an input to the RC filter is tapped between the driver and the resistor element.

Abstract: A transceiver interface for data transfer between two integrated circuits (ICs or “chips”) utilizes a current mode technique rather than conventional voltage mode differential signaling techniques. A current pulse is injected into one of two transmission wires based on a signal value to be transmitted (e.g., logic “0” or “1”) by a driver on a transmitting chip. The current pulse is received as a differential current signal at a receive block in a receiving chip. The differential signal is converted to a low swing differential voltage signal by current comparators. The differential voltage signal may be detected by an op-amp receiver which outputs the appropriate signal value.

Abstract: A main die and a stacked die are included in the same component package. A transmission gate (370) is implemented on the main die, and can be enabled to receive leakage current in a connection (318) between the main die and the stacked die, and to conduct the leakage current to a bonding pad (344) that is accessible external to the package. Thus, the connectivity between the main die and the stacked die can be tested after the dies are packaged. The transmission gate is disabled during high-speed testing and normal operation. The package can also include a multiplexer (364) that is enabled during high-speed testing to input and output test signals at the package level. A direction signal is used to indicate whether test signals are being input to or output from the main die.

Abstract: A main die and a stacked die are included in the same component package. A transmission gate (370) is implemented on the main die, and can be enabled to receive leakage current in a connection (318) between the main die and the stacked die, and to conduct the leakage current to a bonding pad (344) that is accessible external to the package. Thus, the connectivity between the main die and the stacked die can be tested after the dies are packaged. The transmission gate is disabled during high-speed testing and normal operation. The package can also include a multiplexer (364) that is enabled during high-speed testing to input and output test signals at the package level. A direction signal is used to indicate whether test signals are being input to or output from the main die.

Abstract: A main die and a stacked die are included in the same component package. A transmission gate (370) is implemented on the main die, and can be enabled to receive leakage current in a connection (318) between the main die and the stacked die, and to conduct the leakage current to a bonding pad (344) that is accessible external to the package. Thus, the connectivity between the main die and the stacked die can be tested after the dies are packaged. The transmission gate is disabled during high-speed testing and normal operation. The package can also include a multiplexer (364) that is enabled during high-speed testing to input and output test signals at the package level. A direction signal is used to indicate whether test signals are being input to or output from the main die.

Abstract: A break-before-make predriver for disabling a PFET of an output driver before enabling an NFET, and vice versa. The predriver includes an input inverter, two cross-coupled inverters, and output buffers. The predriver provides enhanced break-before-make action through sizing the NFETs larger than the PFETs in the predriver's cross-coupled inverters. The input inverter, the cross-coupled inverters and the first and second output buffers are sized with respect to each other such that substantially equal break before make action is provided on both rising and falling edges. The predriver also includes level-shifting capabilities through a different voltage supply at the PFETs of the cross-coupled inverter. The predriver also includes two data output nodes for connection to the two inputs of an output driver. The predriver provides for tristate action by disabling the signal from the predriver output nodes.