Abstract: An x-ray mass flow rate sensor uses a low density polymer pipe, an x-ray source, and an x-ray detector. The polymer pipe has a low density (less than 2.8 SG) and a high pressure rating (greater than 5 ksi). By using a low density polymer pipe, the sensor is able to use an x-ray source that does not require a linear accelerator and is less than or equal to 450 kV. The x-ray source and the x-ray detector are mounted on opposite sides of the polymer pipe to form a detection area that passes through the polymer pipe. A real-time calibration of the sensor is performed by detecting gray level values in a calibration region of the detection area for two reference materials placed in the detection area. The sensor may additionally include a mechanical flow rate sensor with a plurality of pistons with springs of varying spring constants.

Abstract: An x-ray mass flow rate sensor uses a low density polymer pipe, an x-ray source, and an x-ray detector. The polymer pipe has a low density (less than 2.8 SG) and a high pressure rating (greater than 5 ksi). By using a low density polymer pipe, the sensor is able to use an x-ray source that does not require a linear accelerator and is less than or equal to 450 kV. The x-ray source and the x-ray detector are mounted on opposite sides of the polymer pipe to form a detection area that passes through the polymer pipe. A real-time calibration of the sensor is performed by detecting gray level values in a calibration region of the detection area for two reference materials placed in the detection area. The sensor may additionally include a mechanical flow rate sensor with a plurality of pistons with springs of varying spring constants.

Abstract: An embodiment provides a circuit for testing an integrated circuit. The circuit includes an input converter that receives N scan inputs and generates M pseudo scan inputs, where M and N are integers. A scan compression architecture is coupled to the input converter and generates P pseudo scan outputs in response to the M pseudo scan inputs. An output converter is coupled to the scan compression architecture and generates Q scan outputs in response to the P pseudo scan outputs, wherein P and Q are integers. The input converter receives the N scan inputs at a first frequency and generates the M pseudo scan inputs at a second frequency and the output converter receives the P pseudo scan outputs at the second frequency and generates the Q scan outputs at the first frequency.

Abstract: An integrated circuit device having a p-well plane, a plurality of substantially parallel n-well rows, and a logic cell. The p-well plane is comprised of p-type semiconductor material. Each n-well row comprises an n-type layer disposed on the surface of the p-well plane. The plurality of n-well rows includes a first n-well row and a second n-well row. The logic cell is arranged on the p-well plane and the footprint of the logic cell encompasses both the first and second n-well rows.

Abstract: An integrated circuit device having a p-well plane, a plurality of substantially parallel n-well rows, and a logic cell. The p-well plane is comprised of p-type semiconductor material. Each n-well row comprises an n-type layer disposed on the surface of the p-well plane. The plurality of n-well rows includes a first n-well row and a second n-well row. The logic cell is arranged on the p-well plane and the footprint of the logic cell encompasses both the first and second n-well rows.

Abstract: A scan chain may be formed throughout an integrated circuit in which the scan chain includes at least a first segment and a second segment. A first portion of a test pattern is scanned into the first segment by clocking a first scan cell of the first segment with an even clock while clocking a remainder of the plurality of scan cells in the first segment with an odd clock, in which the odd clock is out of phase with the even clock, in which the even clock and odd clock have a rate equal to a scan rate of the test pattern divided by an integer N. A second portion of the test pattern is scanned into the second segment by clocking the plurality of scan cells in the second segment with the odd clock, such that the second portion of the test pattern is not scanned into the first segment.

Abstract: An embodiment provides a circuit for testing an integrated circuit. The circuit includes an input converter that receives N scan inputs and generates M pseudo scan inputs, where M and N are integers. A scan compression architecture is coupled to the input converter and generates P pseudo scan outputs in response to the M pseudo scan inputs. An output converter is coupled to the scan compression architecture and generates Q scan outputs in response to the P pseudo scan outputs, wherein P and Q are integers. The input converter receives the N scan inputs at a first frequency and generates the M pseudo scan inputs at a second frequency and the output converter receives the P pseudo scan outputs at the second frequency and generates the Q scan outputs at the first frequency.

Abstract: An embodiment provides a circuit for testing an integrated circuit. The circuit includes an input converter that receives N scan inputs and generates M pseudo scan inputs, where M and N are integers. A scan compression architecture is coupled to the input converter and generates P pseudo scan outputs in response to the M pseudo scan inputs. An output converter is coupled to the scan compression architecture and generates Q scan outputs in response to the P pseudo scan outputs, wherein P and Q are integers. The input converter receives the N scan inputs at a first frequency and generates the M pseudo scan inputs at a second frequency and the output converter receives the P pseudo scan outputs at the second frequency and generates the Q scan outputs at the first frequency.

Abstract: A scan chain may be formed throughout an integrated circuit in which the scan chain includes at least a first segment and a second segment. A first portion of a test pattern is scanned into the first segment by clocking a first scan cell of the first segment with an even clock while clocking a remainder of the plurality of scan cells in the first segment with an odd clock, in which the odd clock is out of phase with the even clock, in which the even clock and odd clock have a rate equal to a scan rate of the test pattern divided by an integer N. A second portion of the test pattern is scanned into the second segment by clocking the plurality of scan cells in the second segment with the odd clock, such that the second portion of the test pattern is not scanned into the first segment.

Abstract: A clock dithering circuit that provides cancellation of digital noise spurs is disclosed. The clock dithering circuit includes a control unit that receives an input clock. An ICG (integrated clock gating) cell receives the input clock and receives an enable signal from the control unit. The ICG cell generates a gated clock. A coarse dither unit receives the gated clock and receives a coarse select signal from the control unit. The coarse dither unit generates a coarse dither clock. A fine dither unit receives the coarse dither clock and receives a fine select signal from the control unit. The fine dither unit generates a fine dither clock.

Abstract: A clock dithering circuit that provides cancellation of digital noise spurs is disclosed. The clock dithering circuit includes a control unit that receives an input clock. An ICG (integrated clock gating) cell receives the input clock and receives an enable signal from the control unit. The ICG cell generates a gated clock. A coarse dither unit receives the gated clock and receives a coarse select signal from the control unit. The coarse dither unit generates a coarse dither clock. A fine dither unit receives the coarse dither clock and receives a fine select signal from the control unit. The fine dither unit generates a fine dither clock.

Abstract: A circuit for reducing gate leakage current in a switchable power domain of a CMOS (complementary metal oxide semiconductor) integrated circuit chip includes a first transistor having a drain electrode coupled to a first terminal of a power switch having a second terminal coupled to a first reference voltage, the first transistor having a gate electrode, a body electrode, and a source electrode. The source electrode and body electrodes are coupled to a second reference voltage. The first transistor has a relatively high first gate leakage current that flows from its gate electrode to its body electrode if the power switch is open and a voltage of the gate electrode of the first transistor representing a first logic level exceeds a voltage of the body electrode by more than a first predetermined amount.

Abstract: An embodiment provides a circuit for testing an integrated circuit. The circuit includes an input converter that receives N scan inputs and generates M pseudo scan inputs, where M and N are integers. A scan compression architecture is coupled to the input converter and generates P pseudo scan outputs in response to the M pseudo scan inputs. An output converter is coupled to the scan compression architecture and generates Q scan outputs in response to the P pseudo scan outputs, wherein P and Q are integers. The input converter receives the N scan inputs at a first frequency and generates the M pseudo scan inputs at a second frequency and the output converter receives the P pseudo scan outputs at the second frequency and generates the Q scan outputs at the first frequency.

Abstract: Apparatuses and methods for suppressing power supply noise harmonics are disclosed. A method includes selecting at least one flip-flop of a plurality of data paths of an integrated circuit based on a slack associated with the at least one flip-flop. The method also includes providing at least one delay circuit at an output of at least one flip-flop. The at least one delay circuit is configured to delay the output of the at least one flip-flop by a threshold clock cycle for managing current at a positive edge of a clock input and current at a negative edge of the clock input, thereby suppressing power supply noise harmonics of the integrated circuit.

Abstract: Several methods and circuits configured to mitigate signal interference of at least one aggressor circuit operable on a first clock signal within an interfering frequency range of at least one victim circuit in an IC are disclosed. In an embodiment, a signal interference mitigation circuit is configured to be associated with the aggressor circuit and includes a clock divider circuit and a control circuit. The clock divider circuit is configured to generate the first clock signal based on a second clock signal and a division factor pattern. The control circuit is coupled with the clock divider circuit and configured to determine the division factor pattern and provide the division factor pattern to the clock divider circuit. The division factor pattern comprises a plurality of division factors selected randomly based on a plurality of random numbers, and is configured to control a throughput frequency associated with the signal interference mitigation circuit.

Abstract: Several methods and circuits configured to mitigate signal interference of at least one aggressor circuit operable on a first clock signal within an interfering frequency range of at least one victim circuit in an IC are disclosed. In an embodiment, a signal interference mitigation circuit is configured to be associated with the aggressor circuit and includes a clock divider circuit and a control circuit. The clock divider circuit is configured to generate the first clock signal based on a second clock signal and a division factor pattern. The control circuit is coupled with the clock divider circuit and configured to determine the division factor pattern and provide the division factor pattern to the clock divider circuit. The division factor pattern comprises a plurality of division factors selected randomly based on a plurality of random numbers, and is configured to control a throughput frequency associated with the signal interference mitigation circuit.

Abstract: A digital system includes a spur calculator that computes harmonics of a frequency of a digital clock signal and that identities a harmonic that lies in a frequency band of operation of a radio frequency circuit. A duty cycle computation module receives the harmonic and computes a duty cycle for the harmonic. Further, a clock generator that is coupled to the duty cycle computation block generates a digital clock signal of the frequency and with the duty cycle such that amplitude of spur caused due to the harmonic is suppressed.

Abstract: A clock generation circuit in an IC is provided for mitigating signal interferences caused by an aggressor block operable on a first clock signal with a frequency range of a victim block. The clock generation circuit includes a gating circuit configured to perform gating of a second clock signal to generate a third clock signal based on control signal. An average frequency of the third clock signal is substantially matched to a frequency of the first clock signal, and harmonics of the third clock signal do not interfere with the frequency range of the victim block. The clock generation circuit further includes a FIFO buffer circuit configured to receive the first clock signal as a write clock and the third clock signal as read clock, and a control circuit for generating the control signal based on an occupancy level of FIFO buffer circuit and a plurality of random numbers.

Abstract: Apparatuses and methods for suppressing power supply noise harmonics are disclosed. A method includes selecting at least one flip-flop of a plurality of data paths of an integrated circuit based on a slack associated with the at least one flip-flop. The method also includes providing at least one delay circuit at an output of at least one flip-flop. The at least one delay circuit is configured to delay the output of the at least one flip-flop by a threshold clock cycle for managing current at a positive edge of a clock input and current at a negative edge of the clock input, thereby suppressing power supply noise harmonics of the integrated circuit.

Abstract: A digital system includes a spur calculator that computes harmonics of a frequency of a digital clock signal and that identities a harmonic that lies in a frequency band of operation of a radio frequency circuit. A duty cycle computation module receives the harmonic and computes a duty cycle for the harmonic. Further, a clock generator that is coupled to the duty cycle computation block generates a digital clock signal of the frequency and with the duty cycle such that amplitude of spur caused due to the harmonic is suppressed.