Abstract: An improved 20/22 nm standard cell library, as depicted in FIGS. 1-491, achieves surprisingly significant improvements in manufacturing yield, as compared to a commercially-used library for the same fabrication process. The invention relates to product ICs made using this library (or topologically equivalent variants thereof), as well as processes for making such product ICs using said library (or its variants).

Abstract: Product ICs/wafers include additional diagnostic, test, or monitoring structures opportunistically placed in filler cell positions, within tap cells, within decap cells, within scribe line areas, and/or within dummy fill regions. Improved fabrication processes utilize data from such structure(s) in wafer disposition decisions, rework decisions, process control, yield learning, or fault diagnosis.

Abstract: A method and system are described to group logic terms at a higher level of abstraction than that found using standard cells to implement the logic functions using a reduced number of transistors, and to reduce the total number of unique geometry patterns needed to create the integrated circuit implementation. By grouping the logic functions in terms of a larger number of literals (logic variable inputs), the functions can be implemented in terms of a number of transistors that is often less and no more than equal to that which is required for implementing the same function with a number of logic primitives, or simpler standard logic cells. The optimized transistor level designs are further optimized and physically constructed to reduce the total number of unique geometry patterns required to implement the integrated circuit.

Abstract: A method and system are described to group logic terms at a higher level of abstraction than that found using standard cells to implement the logic functions using a reduced number of transistors, and to reduce the total number of unique geometry patterns needed to create the integrated circuit implementation. By grouping the logic functions in terms of a larger number of literals (logic variable inputs), the functions can be implemented in terms of a number of transistors that is often less and no more than equal to that which is required for implementing the same function with a number of logic primitives, or simpler standard logic cells. The optimized transistor level designs are further optimized and physically constructed to reduce the total number of unique geometry patterns required to implement the integrated circuit.