Abstract: Provided herein are systems and methods for an intelligent diagnostic probe configured to provide troubleshooting guidance during diagnosing faults within vehicle electrical systems. The intelligent diagnostic probe is configured, in some embodiments, to receive raw measurement data, such as voltage, current, and resistance, from tools and take the data into an intelligence system so as to interpret the data and provide actionable output for practitioners operating the intelligent diagnostic probe. The intelligent diagnostic probe is configured, in some embodiments, to divide vehicle electrical diagnosis procedures of into segments, include appropriate tolerance ranges for readings, and provide feedback and suggestions regarding the readings. The intelligent diagnostic probe is configured, in some embodiments, to operate as an artificial intelligence that uses a large number of previously coded measurements to learn to accurately diagnose electrical faults based on currently measured raw data.

Abstract: The invention relates to a composition comprising a GLP-1/GLP-2 dual agonist for use in the treatment of a patient receiving parenteral nutrition.

Abstract: The present invention relates to an agonist combination comprising a GLP-1 agonist and a GLP-2 agonist, for use in the treatment of a patient who has undergone surgical resection of the bowel.

Abstract: An apparatus and a method are provided for a modular lighting system. In one embodiment, the modular lighting system comprises a compact and lightweight outer enclosure that features a plurality of lighting elements. It is envisioned that a subsection of the lighting elements is static, in that it may not be removed from the outer enclosure. The plurality of lighting elements are configured so that they may be detached from the outer enclosure and placed at locations based on the user's discretion so as to substantially reduce shadows and illuminate key areas. The modular lighting system may be operated wirelessly. In at least one embodiment, the detachable lighting elements include independent power sources.

Abstract: A conductive probe may include a probe body for communicating with a circuit tester or a jumper. The probe body may be formed of metal and may have a free end. A probe tip may be mounted to the end of the probe body. The probe tip may be formed of thorium-tungsten. The probe tip may be configured for contacting a circuit node.

Abstract: A conductive probe may include a probe body for communicating with a circuit tester or a jumper. The probe body may be formed of metal and may have a free end. A probe tip may be mounted to the end of the probe body. The probe tip may be formed of thorium-tungsten. The probe tip may be configured for contacting a circuit node.

Abstract: Provided herein are systems and methods for an intelligent diagnostic probe configured to provide troubleshooting guidance during diagnosing faults within vehicle electrical systems. The intelligent diagnostic probe is configured, in some embodiments, to receive raw measurement data, such as voltage, current, and resistance, from tools and take the data into an intelligence system so as to interpret the data and provide actionable output for practitioners operating the intelligent diagnostic probe. The intelligent diagnostic probe is configured, in some embodiments, to divide vehicle electrical diagnosis procedures of into segments, include appropriate tolerance ranges for readings, and provide feedback and suggestions regarding the readings. The intelligent diagnostic probe is configured, in some embodiments, to operate as an artificial intelligence that uses a large number of previously coded measurements to learn to accurately diagnose electrical faults based on currently measured raw data.

Abstract: An apparatus is provided for a diagnostic circuit test device having multi-meter functionality and being adapted to provide current sourcing to an electrical system for selective measurement of a plurality of parameters thereof in powered and unpowered states. The diagnostic circuit test device comprises a conductive probe element configured to be placed into contact with the electrical system and provide an input signal thereto. A power supply is interconnected between an internal power source and the conductive probe element. Processors are electrically connected to the conductive probe element and configured to manipulate the input signal provided to the electrical system and receive an output signal in response to the input signal. The output signal is representative of at least one of the parameters of the electrical system. A display device is configured to display a reading of the output signal which is representative of the parameter.

Abstract: An apparatus and a method are provided for a modular lighting system. In one embodiment, the modular lighting system comprises a compact and lightweight outer enclosure that features a plurality of lighting elements. It is envisioned that a subsection of the lighting elements is static, in that it may not be removed from the outer enclosure. The plurality of lighting elements are configured so that they may be detached from the outer enclosure and placed at locations based on the user's discretion so as to substantially reduce shadows and illuminate key areas. The modular lighting system may be operated wirelessly. In at least one embodiment, the detachable lighting elements include independent power sources.

Abstract: An apparatus is provided for a diagnostic circuit test device having multi-meter functionality and being adapted to provide current sourcing to an electrical system for selective measurement of a plurality of parameters thereof in powered and unpowered states. The diagnostic circuit test device comprises a conductive probe element configured to be placed into contact with the electrical system and provide an input signal thereto. A power supply is interconnected between an internal power source and the conductive probe element. Processors are electrically connected to the conductive probe element and configured to manipulate the input signal provided to the electrical system and receive an output signal in response to the input signal. The output signal is representative of at least one of the parameters of the electrical system. A display device is configured to display a reading of the output signal which is representative of the parameter.

Abstract: An apparatus is provided for a diagnostic circuit test device having multi-meter functionality and being adapted to provide current sourcing to an electrical system for selective measurement of a plurality of parameters thereof in powered and unpowered states. The diagnostic circuit test device comprises a conductive probe element configured to be placed into contact with the electrical system and provide an input signal thereto. A power supply is interconnected between an internal power source and the conductive probe element. Processors are electrically connected to the conductive probe element and configured to manipulate the input signal provided to the electrical system and receive an output signal in response to the input signal. The output signal is representative of at least one of the parameters of the electrical system. A display device is configured to display a reading of the output signal which is representative of the parameter.

Abstract: A conductive probe may include a probe body for communicating with a circuit tester or a jumper. The probe body may be formed of metal and may have a free end. A probe tip may be mounted to the end of the probe body. The probe tip may be formed of thorium-tungsten. The probe tip may be configured for contacting a circuit node.

Abstract: A conductive probe may include a probe body for communicating with a circuit tester or a jumper. The probe body may be formed of metal and may have a free end. A probe tip may be mounted to the end of the probe body. The probe tip may be formed of thorium-tungsten. The probe tip may be configured for contacting a circuit node.

Abstract: An apparatus is provided for a diagnostic circuit test device having multi-meter functionality and being adapted to provide current sourcing to an electrical system for selective measurement of a plurality of parameters thereof in powered and unpowered states. The diagnostic circuit test device comprises a conductive probe element configured to be placed into contact with the electrical system and provide an input signal thereto. A power supply is interconnected between an internal power source and the conductive probe element. Processors are electrically connected to the conductive probe element and configured to manipulate the input signal provided to the electrical system and receive an output signal in response to the input signal. The output signal is representative of at least one of the parameters of the electrical system. A display device is configured to display a reading of the output signal which is representative of the parameter.

Abstract: An apparatus and a method are provided for a smart modular illumination system configured to orient and illuminate a plurality of illumination nodes toward a moving object within a target area. The system comprises a controller that signals the illumination nodes when a motion detector observes movement within the target area. The controller refrains from signaling the illumination nodes when ambient light within the target area exceeds a predetermined value. An adjustable mounting member coupled with each of the illumination nodes orients the illumination nodes according to signals received from the controller. The smart modular illumination system is configured to adjust the orientation and brightness of all of the illumination nodes so as to cast light on the moving object from a variety of angles with a reduced occurrence of shadows.

Abstract: Methods, computer readable media, and apparatuses for balancing the number of transaction requests with the number of applications running and processing information for those transaction requests are presented. According to one or more aspects, a message queue receives one or more messages, each including a transaction request, from a computing device. The message queue sends a trigger message to a trigger queue. The load balancing utility monitors the number of messages in the message queue and determines a number of transaction requests to process and starts a number of additional applications to process the additional transaction requests. The applications process the transaction requests and send a response for each of the transaction requests to the message queue. The message queue sends the response back to the computing device.

Abstract: A conductive probe may include a probe body for communicating with a circuit tester or a jumper. The probe body may be formed of metal and may have a free end. A probe tip may be mounted to the end of the probe body. The probe tip may be formed of thorium-tungsten. The probe tip may be configured for contacting a circuit node.

Abstract: A rotary actuator comprises a rotatable chuck assembly and an actuating mechanism. The chuck assembly may include a chuck housing movable between retracted and deployed positions. The chuck assembly may further include a pair of jaws pivotable between open and closed positions in correspondence to the retracted and deployed positions of the chuck housing. The actuating mechanism may be coupled to the chuck assembly for rotation between “Off”, “Neutral”, and/or “On” positions.

Abstract: Methods, computer readable media, and apparatuses for balancing the number of transaction requests with the number of applications running and processing information for those transaction requests are presented. According to one or more aspects, a message queue receives one or more messages, each including a transaction request, from a computing device. The message queue sends a trigger message to a trigger queue. The load balancing utility monitors the number of messages in the message queue and determines a number of transaction requests to process and starts a number of additional applications to process the additional transaction requests. The applications process the transaction requests and send a response for each of the transaction requests to the message queue. The message queue sends the response back to the computing device.