Abstract: An LED lamp including a first light source device and a second light source device is provided. The first light source device has a light exiting surface and a connection portion, and is used for emitting a first illumination light through the light exiting surface. The light exiting surface surrounds the connection portion. The second light source device is connected to the connection portion, and is used for emitting a second illumination light.

Abstract: A memory device includes a memory sector including a memory sector, a row of select transistors and a number of drivers. The memory sector includes a plurality of word lines each couples to a plurality of memory cells. The row of select transistors select the memory sector and separate the memory sector from an immediately adjacent memory sector in the memory device. Each of the number of drivers is coupled to one of the plurality of word lines. A first one of the drivers is coupled to a first one of the word lines to receive a first control signal to conduct the first word line and a voltage source, and a second one of the drivers is coupled to a second one of the word lines to receive a second control signal to disconnect the second word line from the voltage source.

Abstract: A method and circuit for testing a multi-chip package is provided. The multi-chip package includes at least a memory chip, and the memory chip includes a number of memory cells. The method includes performing a normal read operation on the memory cells to check if data read from the memory cells is the same with preset data in the memory cells; and performing a special read operation on the memory cells to check if data read from the memory cells is the same with an expected value, wherein the expected value is independent from data stored in the memory cells.

Abstract: A method for checking reading errors of a memory includes the following steps. A first data fragment is received. A first count index according to the first data fragment is generated, wherein the first count index is corresponding to a quantity of one kind of binary value in the first data fragment. The first data fragment is written into the memory. The first data fragment is read from the memory as a second data fragment. A second count index is generated according to the second data fragment. The first count index is compared with the second count index.

Abstract: A method of programming a memory, wherein the memory includes many memory regions having multiple multi-level cells. Each memory region includes a first bit line, a second bit line, a data buffer and a protecting unit. The protecting unit, coupled to the first and second bit lines, and the data buffer, prevents a programming error from occurring. In an embodiment of the programming method, corresponding data are inputted to the data buffers respectively. The data corresponding to an nth phase are programmed into the targeted multi-level cells. Data corresponding to an (n+1)th phase is modified to make the data corresponding to the (n+1)th phase be the same as the data corresponding to the nth phase if the targeted multi-level cells pass a programming verification process according to an nth programming verification voltage. The above steps are repeated until n is equal to a maximum, n being a positive integer.

Abstract: A compensation circuit includes a comparator and an emulation circuit. The comparator has a first terminal, and a second terminal for receiving a reference voltage. The emulation circuit is coupled to the first terminal of the comparator. The emulation circuit responses to the temperature, so that the comparator outputs a read timing control signal at a first time spot, or outputs the read timing control signal at a second time spot, the first time spot is later than the second time spot.

Abstract: An illuminating device includes a tubular light guide, a plurality of light-emitting devices, and a base. The tubular light guide has a light input edge and an inner space. The light-emitting devices are distributed at the light input edge to provide lights into the tubular light guide. The base supports the light-emitting devices and the tubular light guide. The base also has an electronic circuit to provide power to the light-emitting devices. The base has at least one air circulation hole for connecting an outer space with the inner space.

Abstract: A method for checking reading errors of a memory includes the following steps. A first data fragment is received. A first count index according to the first data fragment is generated, wherein the first count index is corresponding to a quantity of one kind of binary value in the first data fragment. The first data fragment is written into the memory. The first data fragment is read from the memory as a second data fragment. A second count index is generated according to the second data fragment. The first count index is compared with the second count index.

Abstract: A pre-code device includes firstly memory circuit, an address decoder, and an alternative logic circuit. The first memory circuit includes a number of memory blocks and at east a replacing block. The memory blocks are pointed by a number of respective physical addresses. The replacing block is pointed by a replacing address. The address decoder decodes an input address to provide a pre-code address. The alternative logic circuit looks up an address mapping table, which maps defect physical address among the physical addresses to the replacing address, to map the pre-code address to the replacing address when the pre-code address corresponds to the defect physical address. The alternative logic circuit correspondingly pre-codes the pre-code data to the replacing block.

Abstract: A light emitting diode lamp including a back plate, at least one cover, a light guide plate, at least one magnetic element, and a light emitting diode light source is provided. The cover is fixed to the back plate. The light guide plate is disposed on the back plate, and a part of the light guide plate is sandwiched between the back plate and the cover. The magnetic element is disposed on the back plate and sandwiched between the back plate and the cover. The light emitting diode light source is disposed at a side of the light guide plate.

Abstract: A light source apparatus includes a light guide plate, at least one light emitting device, and a reflecting unit. The light guide plate has a first surface, a second surface opposite to the first surface, and a light incident surface connecting the first surface and the second surface. The first surface and the second surface connect to form a tip opposite to the light incident surface. An included angle formed between the first surface and the second surface at the tip is greater than 0 degree and less than or equal to 20 degrees. The light emitting device is disposed beside the light incident surface. The reflecting unit is disposed on the second surface. A method of using a light source apparatus is also provided.

Abstract: An illuminating device includes a tubular light guide, a plurality of light-emitting devices, and a base. The tubular light guide has a light input edge and an inner space. The light-emitting devices are distributed at the light input edge to provide lights into the tubular light guide. The base supports the light-emitting devices and the tubular light guide. The base also has an electronic circuit to provide power to the light-emitting devices. The base has at least one air circulation hole for connecting an outer space with the inner space.

Abstract: An illuminating apparatus includes a plurality of light source units and a light guide plate. The light guide plate has a flat part and a protruding part, wherein the light source units provide a side light beam into the light guide plate at an edge surface, the side light beam is guided in the light guide plate and exits at the protruding part.

Abstract: A method for checking reading errors of a memory includes the following steps. A first data fragment is received. A first count index according to the first data fragment is generated, wherein the first count index is corresponding to a quantity of one kind of binary value in the first data fragment. The first data fragment is written into the memory. The first data fragment is read from the memory as a second data fragment. A second count index is generated according to the second data fragment. The first count index is compared with the second count index.

Abstract: A memory and a method applied in one program command for the memory are provided. The memory includes a buffer and at least one program unit. The method includes the following steps. First, enter the program command to the memory. Next, enter user data to the buffer. Read the data of the program unit. Determine whether the user data fill the buffer. Fill the part of the buffer unoccupied by the user data with the data of the program unit if the user data do not fill the buffer. Erase the program unit if the program unit is not empty. Finally, program the data of the buffer into the program unit.

Abstract: A pre-code device includes firstly memory circuit, an address decoder, and an alternative logic circuit. The first memory circuit includes a number of memory blocks and at east a replacing block. The memory blocks are pointed by a number of respective physical addresses. The replacing block is pointed by a replacing address. The address decoder decodes an input address to provide a pre-code address. The alternative logic circuit looks up an address mapping table, which maps defect physical address among the physical addresses to the replacing address, to map the pre-code address to the replacing address when the pre-code address corresponds to the defect physical address. The alternative logic circuit correspondingly pre-codes the pre-code data to the replacing block.

Abstract: A two transistor word line driver is disclosed. An example disclosed word line driver is simplified with common signals on the gates of the p-type and the n-type transistors. An example disclosed word line driver consumes less power by applying a negative voltage to a word line driver selected from multiple word line drivers.

Abstract: A method for metal bit line arrangement is applied to a virtual ground array memory having memory cell blocks. Each memory cell block has memory cells and m metal bit lines, wherein m is a positive integer. The method includes the following steps. First, one of the memory cells is selected as a target memory cell. When the target memory cell is being read, the metal bit line electrically connected to a drain of the target memory cell is a drain metal bit line, and the metal bit line electrically connected to a source is a source metal bit line. Next, a classification of whether the other metal bit lines are charged up when the target memory cell is being read is made. Thereafter, the m metal bit lines are arranged such that charged up metal bit lines are not adjacent to the source metal bit line.

Abstract: A memory device includes a memory sector including a memory sector, a row of select transistors and a number of drivers. The memory sector includes a plurality of word lines each couples to a plurality of memory cells. The row of select transistors select the memory sector and separate the memory sector from an immediately adjacent memory sector in the memory device. Each of the number of drivers is coupled to one of the plurality of word lines, wherein a first one of the drivers is coupled to a first one of the word lines to receive a first control signal to conduct the first word line and a voltage source, and a second one of the drivers is coupled to a second one of the word lines to receive a second control signal to disconnect the second word line from the voltage source.