Abstract: Circuits and methods for refreshing memory banks in a DRAM are provided. A refresh circuit is provided in a DRAM having at least one memory bank and a plurality of word lines connected to memory locations in the memory bank. The word lines are subdivided into first and second groups of subword lines. The refresh circuit includes a delay circuit, a first driving circuit, and a second driving circuit. The delay circuit receives a refresh signal and outputs a delayed refresh signal a predetermined time delay later. The first driving circuit responds to the refresh signal by driving word lines in the first group of subword lines and the second driving circuit responds to the delayed refresh signal by driving word lines in the second group of subword lines.

Abstract: An internal reset signal generator that generates an internal reset disable signal after an internal high voltage device has been completely reset. This can substantially reduce errors in operation of semiconductor memory devices. A first circuit generates a first control signal until the power source voltage reaches a stabilized state and a second control signal thereafter. A delay circuit responds to the first and second control signals and a reset complete signal from a reset circuit, and generates an internal reset disable signal only when the second control signal and the reset completion signal are inputted simultaneously, and in other cases, generates an internal reset signal. A reset circuit is connected in a feedback circuit with the delay circuit. It resets a high-voltage device in response to the internal reset signal, and generates a reset completion signal when the high voltage device is reset.

Abstract: A high voltage generation circuit comprises a first boosting unit, a second boosting unit, a delay circuit which delays the output of the first boosting unit as applied the second boosting unit, a pre-charge unit, and switch units which connect respective nodes in response to control signals. A voltage supply circuit is also provided that converts an externally supplied power source voltage (VCC) to a predetermined pre-charge voltage (VPP2).

Abstract: Provided are a reset circuit of a data path using a clock enable signal, a reset method and a semiconductor memory device having the reset circuit. The reset circuit includes an external voltage detector and a second reset signal generator, in which the second reset signal is used to reset a block related to a data path of the semiconductor memory device. The external voltage detector detects the level of an external voltage and generates a first reset signal. The second reset signal generator performs a logical sum of an external signal, which is externally input, and the first reset signal, and generates a second reset signal. The first reset signal is used to reset blocks other than the blocks related to the data path. The external signal is a clock enable signal. In the soft reset, the blocks related to the data path are reset using the external signal which is applied at a certain level.

Abstract: An integrated circuit memory device includes an XY array of memory cell sub-blocks and row and column decoder circuitry that is electrically coupled to the array. The array includes first and second offset grids of sub-word line driver control circuits therein, with each of the sub-word line driver control circuits configured to selectively activate a pair of the memory cell sub-blocks in response to a respective pair of active row and column select signals. In order to improve power consumption requirements when switching back and fourth between normal and refresh modes of operation, the row and column decoder circuitry is configured to drive a selected one of a plurality of row select lines associated with the first grid with an asserted row select signal and a plurality of column select lines associated with the second grid with asserted column select signals during a write operation.

Abstract: A semiconductor memory device comprises a write column select line or read column select line for shielding a signal line. The semiconductor memory device may include a signal line, a read column select line, and a write column select line. The signal line may transmit an operation signal related to the operation of the semiconductor memory device. The read column select line may transmit a read column select signal, which may control transfer of a data signal of a bit line to a data line. The write column select line may transmit a write column select signal, which may control transfer of the data signal of the data line to the bit line. One of the read column select line and the write column select line to transmit a deactivated column select signal among the read column select signal and the write column select signal, may be maintained at a predetermined logic level and may shield the signal line.

Abstract: Provided are a reset circuit of a data path using a clock enable signal, a reset method and a semiconductor memory device having the reset circuit. The reset circuit includes an external voltage detector and a second reset signal generator, in which the second reset signal is used to reset a block related to a data path of the semiconductor memory device. The external voltage detector detects the level of an external voltage and generates a first reset signal. The second reset signal generator performs a logical sum of an external signal, which is externally input, and the first reset signal, and generates a second reset signal. The first reset signal is used to reset blocks other than the blocks related to the data path. The external signal is a clock enable signal. In the soft reset, the blocks related to the data path are reset using the external signal which is applied at a certain level.

Abstract: An integrated circuit memory device includes an XY array of memory cell sub-blocks and row and column decoder circuitry that is electrically coupled to the array. The array includes first and second offset grids of sub-word line driver control circuits therein, with each of the sub-word line driver control circuits configured to selectively activate a pair of the memory cell sub-blocks in response to a respective pair of active row and column select signals. In order to improve power consumption requirements when switching back and fourth between normal and refresh modes of operation, the row and column decoder circuitry is configured to drive a selected one of a plurality of row select lines associated with the first grid with an asserted row select signal and a plurality of column select lines associated with the second grid with asserted column select signals during a write operation.

Abstract: A memory charging circuit includes a read charge control circuit controlled according to a read control signal and an address value. A write charge control circuit is controlled according to a write control signal and the same or a different address value. Charging to and charging from the same data IO lines is controlled using the read charge amplifier circuit and the write charge amplifier circuit. A column select line circuit can be configured into a first arrangement where a first output is activated according to a read control signal and an address and a second output is activated according to a write control signal and the same or a different address. In a second arrangement, the first output is activated according to an address and either the read control signal or the write control signal.

Abstract: A semiconductor memory device comprises a write column select line or read column select line for shielding a signal line. The semiconductor memory device may include a signal line, a read column select line, and a write column select line. The signal line may transmit an operation signal related to the operation of the semiconductor memory device. The read column select line may transmit a read column select signal, which may control transfer of a data signal of a bit line to a data line. The write column select line may transmit a write column select signal, which may control transfer of the data signal of the data line to the bit line. One of the read column select line and the write column select line to transmit a deactivated column select signal among the read column select signal and the write column select signal, may be maintained at a predetermined logic level and may shield the signal line.

Abstract: Circuits and methods for refreshing memory banks in a DRAM are provided. A refresh circuit is provided in a DRAM having at least one memory bank and a plurality of word lines connected to memory locations in the memory bank. The word lines are subdivided into first and second groups of subword lines. The refresh circuit includes a delay circuit, a first driving circuit, and a second driving circuit. The delay circuit receives a refresh signal and outputs a delayed refresh signal a predetermined time delay later. The first driving circuit responds to the refresh signal by driving word lines in the first group of subword lines and the second driving circuit responds to the delayed refresh signal by driving word lines in the second group of subword lines.

Abstract: A memory charging circuit includes a read charge control circuit controlled according to a read control signal and an address value. A write charge control circuit is controlled according to a write control signal and the same or a different address value. Charging to and charging from the same data IO lines is controlled using the read charge amplifier circuit and the write charge amplifier circuit. A column select line circuit can be configured into a first arrangement where a first output is activated according to a read control signal and an address and a second output is activated according to a write control signal and the same or a different address. In a second arrangement, the first output is activated according to an address and either the read control signal or the write control signal.