Abstract: A semiconductor device includes a substrate, an elastic buffer layer disposed on a surface of the substrate, wiring patterns disposed on a first surface of the elastic buffer layer, and a semiconductor chip disposed on a second surface of the elastic buffer layer facing away from the first surface of the elastic buffer layer. The semiconductor chip includes trenches formed on a surface facing the elastic buffer layer. Interconnection members are disposed to electrically connect the elastic buffer layer to the substrate. Each of the interconnection members has one end electrically connected to one of the wiring patterns and the other end electrically connected to the substrate.

Abstract: A package substrate includes a core layer, first external interconnection lines on a top surface of the core layer, and internal interconnection lines. The first external interconnection lines include a first outermost external interconnection line on an edge of the core layer, and the internal interconnection lines include an outermost internal interconnection line in the edge of the core layer. A first bonding pad is disposed on the first outermost external interconnection line and exposed in a first bonding region of the core layer. A second bonding pad is disposed on the outermost internal interconnection line and exposed in a second bonding region of the core layer. The first bonding region is spaced apart from a chip attachment region by a first distance, and the second bonding region is spaced apart from the chip attachment region by a second distance greater than the first distance.