Abstract: A method of an aspect includes determining a different operational configuration for each of a plurality of different maximum failure rates. Each of the different maximum failure rates corresponds to a different task of a plurality of tasks. The method also includes enforcing a plurality of logic each executing a different task of the plurality of tasks to operate according to the different corresponding determined operational configuration. Other methods, apparatus, and systems are also disclosed.

Abstract: In one embodiment, a processor includes at least one functional block and banking logic. The banking logic may be to determine an average reliability metric associated with the at least one functional block. The banking logic may also be to, if the average reliability metric exceeds a required level, implement a reduced reliability mode in the at least one functional block, where the reduced reliability mode is associated with a reduction in the average reliability metric. Other embodiments are described and claimed.

Abstract: Methods and apparatus relating to disabling one or more cache portions during low voltage operations are described. In some embodiments, one or more extra bits may be used for a portion of a cache that indicate whether the portion of the cache is capable at operating at or below Vccmin levels. Other embodiments are also described and claimed.

Abstract: Some implementations disclosed herein provide techniques and arrangements for recovery of data stored in memory shared by a number of processors through information stored in a cache directory. A core of a processor may initiate access (e.g., read or write) to particular data located in a first cache that is accessible to the core. In response to detecting an error associated with accessing the particular data, a location in the processor that includes the particular data may be identified and the particular data may be copied from the location to the first cache.

Abstract: Embodiments of systems, apparatuses, and methods for reducing data cache power consumption and error protection overhead are described. In some embodiments, the data cache is partitioned into cache portions. Each cache portion stores data that has a different fault tolerance and uses a different type of error detection mechanism than the other cache portions.

Abstract: An apparatus, system, and method for controlling traffic on an on-chip network. Embodiments of the method comprise injecting a packet at a first rate into the on-chip network by a first node coupled to the on-chip network, receiving the packet at a second node coupled to the on-chip network, modifying a bit in the packet by the second node in response to determining that a rate at which packets are injected into the on-chip network should change, returning the packet with the bit modified to the first node by the second node, and changing the first rate by the first node in response to detecting that the bit in the packet was modified.

Abstract: Embodiments of systems, apparatuses, and methods for utilizing a faulty cache line in a cache are described. In some embodiments, a graphics processing unit is allowed to access a faulty cache line in the cache. A cache access request to access a faulty cache line from a central processing unit core is remapped to access a fault-free cache line.

Abstract: Some implementations provide techniques and arrangements for detecting a register value having a life longer than a threshold period based, at least in part, on at least one code segment of a code being translated by a binary translator. For a register value detected as having a life longer than a threshold period, at least one instruction to cause an access of the detected register value during the life of the register value may be included in at least one translated code segment to be output by the binary translator.

Abstract: Methods and apparatus to reduce aging effect on registers are described. In one embodiment, a select value is stored in a register that is unused, for example, to reduce the effects of negative bias temperature instability (NBTI) or oxide degradation on the register. Other embodiments are also described.

Abstract: Low supply voltage memory apparatuses are presented. In one embodiment, a memory apparatus comprises a memory and a memory controller. The memory controller includes a read controller. The read controller prevents a read operation to a memory location from being completed, for at least N clock cycles after a write operation to the memory location, where N is the number of clock cycles for the memory location to stabilize after the write operation.

Abstract: In one embodiment, the present invention includes a method for determining a vulnerability level for an instruction executed in a processor, and re-executing the instruction if the vulnerability level is above a threshold. The vulnerability level may correspond to a soft error likelihood for the instruction while the instruction is in the processor. Other embodiments are described and claimed.

Abstract: Embodiments of apparatuses and methods for protecting data storage structures from intermittent errors are disclosed. In one embodiment, an apparatus includes a plurality of data storage locations, execution logic, error detection logic, and control logic. The execution logic is to execute an instruction to generate a data value to store in one of the data storage locations. The error detection logic is to detect an error in the data value stored in the data storage location. The control logic is to respond to the detection of the error by causing the execution logic to re-execute the instruction to regenerate the data value to store in the data storage location, causing the error detection logic to check the data value read from the data storage location, and deactivating the data storage location if another error is detected.

Abstract: Methods and apparatus relating to disabling one or more cache portions during low voltage operations are described. In some embodiments, one or more extra bits may be used for a portion of a cache that indicate whether the portion of the cache is capable at operating at or below Vccmin levels. Other embodiments are also described and claimed.

Abstract: Methods and apparatus relating to disabling one or more cache portions during low voltage operations are described. In some embodiments, one or more extra bits may be used for a portion of a cache that indicate whether the portion of the cache is capable at operating at or below Vccmin levels. Other embodiments are also described and claimed.

Abstract: The present invention includes a method for obtaining dynamic operating parameter information of a semiconductor device such as a processor, determining dynamic usage of the device, either as a whole or for one or more portions thereof, based on the dynamic operating parameter information, and dynamically estimating a remaining lifetime of the device based on the dynamic usage. Depending on the estimated remaining lifetime, the device may be controlled in a desired manner.

Abstract: In one embodiment, the present invention includes a method for determining a vulnerability level for an instruction executed in a processor, and re-executing the instruction if the vulnerability level is above a threshold. The vulnerability level may correspond to a soft error likelihood for the instruction while the instruction is in the processor. Other embodiments are described and claimed.

Abstract: Methods and apparatus relating to disabling one or more cache portions during low voltage operations are described. In some embodiments, one or more extra bits may be used for a portion of a cache that indicate whether the portion of the cache is capable at operating at or below Vccmin levels. Other embodiments are also described and claimed.

Abstract: In one embodiment, the present invention includes a method for determining a vulnerability level for an instruction executed in a processor, and re-executing the instruction if the vulnerability level is above a threshold. The vulnerability level may correspond to a soft error likelihood for the instruction while the instruction is in the processor. Other embodiments are described and claimed.

Abstract: In one embodiment, the present invention includes a method for identifying available cores of a many-core processor, allocating a first subset of the cores to an enabled state and a second subset of the cores to a spare state, and storing information regarding the allocation in a storage. The allocation of cores to the enables state may be based on a temperature-aware algorithm, in certain embodiments. Other embodiments are described and claimed.

Abstract: Methods and apparatuses for on-line testing for decode logic are presented. In one embodiment, a processor comprises translation logic to decode an instruction to micro-operations and extraction logic to determine first information about numbers of occurrences of fields in the micro-operations. In one embodiment, the processor further comprises verification logic to indicate whether the decoding results of the instruction are accurate based at least on the first information.