Patents by Inventor Xi-Cheng Zhang

Xi-Cheng Zhang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200096449
    Abstract: A highly integrated, fully automatic chemiluminescence detection equipment and its operation method are disclosed. The chemiluminescence detection equipment comprises a control module, a first electrical machine, a reagent wheel disc tank, a sampling module, a washing module, a second electrical machine and a detection module. Compared with the traditional large-scale chemiluminescence detection equipment, the chemiluminescence detection equipment of the present invention has the advantage of high integration, and greatly reduces the overall volume and weight of the chemiluminescence detection equipment.
    Type: Application
    Filed: December 7, 2018
    Publication date: March 26, 2020
    Inventors: LIN CHENG, CHUN-YAN LIU, YA-XIONG ZHANG, XI-JIANG QIAN, QUAN-QI YANG, XIAN-HUA WANG, HUI XU, BO YU, YE-QI JIN
  • Patent number: 9110022
    Abstract: Methods and systems for detecting radiation for example, terahertz radiation, with the aid of acoustic signal generation and detection include: directing an optical beam into a volume of gas; ionizing at least a portion of the volume of gas with the optical beam to produce a plasma; and detecting an acoustic signal produced from an interaction of a radiation wave with the plasma. The methods and systems are particularly adapted for remote detection of chemicals, biological substances, and explosives, among others. The capability of the methods and systems can be enhanced by employing multi-color laser excitation to produce the plasma and varying the time delay between the multi-color pulses.
    Type: Grant
    Filed: April 29, 2011
    Date of Patent: August 18, 2015
    Assignee: RENSSELAER POLYTECHNIC INSTITUTE
    Inventors: Benjamin Clough, Jingle Liu, Xi-Cheng Zhang
  • Publication number: 20140306128
    Abstract: Methods and apparatus for detecting variations in electromagnetic fields, in particular, terahertz (THz) electromagnetic fields, are provided. The methods and apparatus employ polarization detection devices and controllers to maintain or vary the polarization of modulated signals as desired. The methods and apparatus are provided to characterize electromagnetic fields by directing the electromagnetic field and a probe beam upon an electro-crystal and detecting the modulation of the resulting probe beam. Detection of the modulation of the probe beam is practiced by detecting and comparing the polarization components of the modulated probe beam. Aspects of the invention may be used to analyze or detect explosives, explosive related compounds, and pharmaceuticals, among other substances. A compact apparatus, modular optical devices for use with the apparatus, sample holders, and radiation source mounts are also disclosed.
    Type: Application
    Filed: June 26, 2014
    Publication date: October 16, 2014
    Applicant: RENSSELAER POLYTECHNIC INSTITUTE
    Inventors: Brian SCHULKIN, Xi-Cheng ZHANG, Thomas TONGUE, Jingzhou XU, Jian CHEN
  • Patent number: 8796653
    Abstract: Methods and apparatus for detecting variations in electromagnetic fields, in particular, terahertz (THz) electromagnetic fields, are provided. The methods and apparatus employ polarization detection devices and controllers to maintain or vary the polarization of modulated signals as desired. The methods and apparatus are provided to characterize electromagnetic fields by directing the electromagnetic field and a probe beam upon an electro-crystal and detecting the modulation of the resulting probe beam. Detection of the modulation of the probe beam is practiced by detecting and comparing the polarization components of the modulated probe beam. Aspects of the invention may be used to analyze or detect explosives, explosive related compounds, and pharmaceuticals, among other substances. A compact apparatus, modular optical devices for use with the apparatus, sample holders, and radiation source mounts are also disclosed.
    Type: Grant
    Filed: September 20, 2010
    Date of Patent: August 5, 2014
    Assignee: Rensselaer Polytechnic Institute
    Inventors: Brian Schulkin, Xi-Cheng Zhang, Thomas Tongue, Jingzhou Xu, Jian Chen
  • Patent number: 8674304
    Abstract: Methods and systems for characterizing a plasma with radiation, particularly, terahertz (THz) radiation, are disclosed. The disclosed method of characterizing a plasma includes directing THz radiation into the plasma; and detecting an emission due to interaction of the THz radiation with the plasma to characterize the plasma. A disclosed plasma characterizing device includes a means for directing THz radiation into a plasma; and a detector adapted to detect an emission emitted by the plasma due to interaction of the THz radiation with the plasma to characterize the plasma. A plasma characterizing system is also disclosed. The emission detected may be a fluorescence, a variation in fluorescence and/or an acoustic emission.
    Type: Grant
    Filed: April 29, 2011
    Date of Patent: March 18, 2014
    Assignee: Rensselaer Polytechnic Institute
    Inventors: Xi-Cheng Zhang, Jingle Liu
  • Patent number: 8653462
    Abstract: Methods and systems for detecting radiation, particularly, terahertz (THz) radiation, are disclosed. The methods and systems disclosed include directing an optical beam in a volume of gas; ionizing at least a portion of the volume of gas with the optical beam to produce a plasma; and detecting a fluorescence produced from an interaction of a radiation wave with the plasma. The information contained in the characteristics of the detected fluorescence, for example, the amplitude and/or phase are used to characterize the radiation wave. Aspects of the invention may be used for homeland security, medicine, and astronomy, among other fields.
    Type: Grant
    Filed: April 27, 2011
    Date of Patent: February 18, 2014
    Assignee: Rensselaer Polytechnic Institute
    Inventors: Xi-Cheng Zhang, Jingle Liu
  • Publication number: 20130153790
    Abstract: Methods and systems for detecting radiation for example, terahertz radiation, with the aid of acoustic signal generation and detection include: directing an optical beam into a volume of gas; ionizing at least a portion of the volume of gas with the optical beam to produce a plasma; and detecting an acoustic signal produced from an interaction of a radiation wave with the plasma. The methods and systems are particularly adapted for remote detection of chemicals, biological substances, and explosives, among others. The capability of the methods and systems can be enhanced by employing multi-color laser excitation to produce the plasma and varying the time delay between the multi-color pulses.
    Type: Application
    Filed: April 29, 2011
    Publication date: June 20, 2013
    Applicant: RENSSELAER POLYTECHNIC INSTITUTE
    Inventors: Benjamin Clough, Jingle Liu, Xi-Cheng Zhang
  • Patent number: 8338802
    Abstract: A terahertz (THz) anti-reflection device, for example, a broadband tunable THz anti-reflection device, includes a silicon substrate having a plurality of recesses, each of the plurality of recesses having a plurality of cavities of decreasing dimension. The cavities may be nested polygonal cavities, for example, having a square or rectangular cross section. The recesses having the cavities may be positioned at regular periods, for example, periods ranging from 10 ?m to 20 ?m. The devices may be fabricated by conventional lithographic methods. Also disclosed are methods for modifying terahertz radiation and methods for fabricating anti-reflection devices.
    Type: Grant
    Filed: August 26, 2011
    Date of Patent: December 25, 2012
    Assignee: Rensselaer Polytechnic Institute
    Inventors: Xi-Cheng Zhang, Pengyu Han, Yuting W. Chen
  • Patent number: 8299435
    Abstract: A broadband anti-reflection apparatus for use with terahertz radiation includes a layer having an outer surface comprising a plurality of pyramid structures having about a 30 ?m to about a 110 ?m period, and wherein reflectance of the terahertz radiation is reduced compared to a layer comprising a planar outer surface. Also disclosed is a method for modifying terahertz radiation which includes receiving terahertz radiation on a device having an anti-reflection layer having an outer surface comprising a plurality of pyramid structures having about a 30 ?m to a 110 ?m period, and modifying the terahertz radiation passing through the device or processing the terahertz radiation in the device.
    Type: Grant
    Filed: August 12, 2010
    Date of Patent: October 30, 2012
    Assignee: Rensselaer Polytechnic Institute
    Inventors: Xi-Cheng Zhang, Pengyu Han, Yuting W. Chen
  • Publication number: 20120193535
    Abstract: Methods and systems for characterizing a plasma with radiation, particularly, terahertz (THz) radiation, are disclosed. The disclosed method of characterizing a plasma includes directing THz radiation into the plasma; and detecting an emission due to interaction of the THz radiation with the plasma to characterize the plasma. A disclosed plasma characterizing device includes a means for directing THz radiation into a plasma; and a detector adapted to detect an emission emitted by the plasma due to interaction of the THz radiation with the plasma to characterize the plasma. A plasma characterizing system is also disclosed. The emission detected may be a fluorescence, a variation in fluorescence and/or an acoustic emission.
    Type: Application
    Filed: April 29, 2011
    Publication date: August 2, 2012
    Applicant: RENSSELAER POLYTECHNIC INSTITUTE
    Inventors: Xi-Cheng ZHANG, Jingle LIU
  • Patent number: 8134128
    Abstract: A method of analyzing a remotely-located object includes the step of illuminating at least a portion of a targeted object with electromagnetic radiation to induce a phase transformation in the targeted object, wherein the phase transformation produces an emitter plasma, which emits terahertz radiation. The method also includes the step of ionizing a volume of an ambient gas to produce a sensor plasma by focusing an optical probe beam in the volume and the step of detecting an optical component of resultant radiation produced from an interaction of the focused optical probe beam and the terahertz radiation in the sensor plasma. Detecting an optical component of the resultant radiation emitted by the sensor plasma facilitates detection of a characteristic fingerprint of the targeted object imposed onto the terahertz radiation produced as a result of the induced phase transformation.
    Type: Grant
    Filed: December 9, 2009
    Date of Patent: March 13, 2012
    Assignee: Rensselaer Polytechnic Institute
    Inventors: Xi-Cheng Zhang, Jianming Dai, Xu Xie
  • Publication number: 20120049090
    Abstract: A terahertz (THz) anti-reflection device, for example, a broadband tunable THz anti-reflection device, includes a silicon substrate having a plurality of recesses, each of the plurality of recesses having a plurality of cavities of decreasing dimension. The cavities may be nested polygonal cavities, for example, having a square or rectangular cross section. The recesses having the cavities may be positioned at regular periods, for example, periods ranging from 10 ?m to 20 ?m. The devices may be fabricated by conventional lithographic methods. Also disclosed are methods for modifying terahertz radiation and methods for fabricating anti-reflection devices.
    Type: Application
    Filed: August 26, 2011
    Publication date: March 1, 2012
    Applicant: RENSSELAER POLYTECHNIC INSTITUTE
    Inventors: Xi-Cheng ZHANG, Pengyu HAN, Yuting W. CHEN
  • Publication number: 20110272584
    Abstract: Methods and systems for detecting radiation, particularly, terahertz (THz) radiation, are disclosed. The methods and systems disclosed include directing an optical beam in a volume of gas; ionizing at least a portion of the volume of gas with the optical beam to produce a plasma; and detecting a fluorescence produced from an interaction of a radiation wave with the plasma. The information contained in the characteristics of the detected fluorescence, for example, the amplitude and/or phase are used to characterize the radiation wave. Aspects of the invention may be used for homeland security, medicine, and astronomy, among other fields.
    Type: Application
    Filed: April 27, 2011
    Publication date: November 10, 2011
    Applicant: Rensselaer Polytechnic Institute
    Inventors: Xi-Cheng ZHANG, Jingle LIU
  • Publication number: 20110036984
    Abstract: A broadband anti-reflection apparatus for use with terahertz radiation includes a layer having an outer surface comprising a plurality of pyramid structures having about a 30 ?m to about a 110 ?m period, and wherein reflectance of the terahertz radiation is reduced compared to a layer comprising a planar outer surface. Also disclosed is a method for modifying terahertz radiation which includes receiving terahertz radiation on a device having an anti-reflection layer having an outer surface comprising a plurality of pyramid structures having about a 30 ?m to a 110 ?m period, and modifying the terahertz radiation passing through the device or processing the terahertz radiation in the device.
    Type: Application
    Filed: August 12, 2010
    Publication date: February 17, 2011
    Applicant: RENSSELAER POLYTECHNIC INSTITUTE
    Inventors: Xi-Cheng ZHANG, Pengyu HAN, Yuting W. CHEN
  • Publication number: 20110006226
    Abstract: Methods and apparatus for detecting variations in electromagnetic fields, in particular, terahertz (THz) electromagnetic fields, are provided. The methods and apparatus employ polarization detection devices and controllers to maintain or vary the polarization of modulated signals as desired. The methods and apparatus are provided to characterize electromagnetic fields by directing the electromagnetic field and a probe beam upon an electro-crystal and detecting the modulation of the resulting probe beam. Detection of the modulation of the probe beam is practiced by detecting and comparing the polarization components of the modulated probe beam. Aspects of the invention may be used to analyze or detect explosives, explosive related compounds, and pharmaceuticals, among other substances. A compact apparatus, modular optical devices for use with the apparatus, sample holders, and radiation source mounts are also disclosed.
    Type: Application
    Filed: September 20, 2010
    Publication date: January 13, 2011
    Applicant: RENSSELAER POLYTECHNIC INSTITUTE
    Inventors: Brian SCHULKIN, Xi-Cheng ZHANG, Thomas TONGUE, Jingzhou XU, Jian CHEN
  • Publication number: 20100277718
    Abstract: A method of analyzing a remotely-located object includes the step of illuminating at least a portion of a targeted object with electromagnetic radiation to induce a phase transformation in the targeted object, wherein the phase transformation produces an emitter plasma, which emits terahertz radiation. The method also includes the step of ionizing a volume of an ambient gas to produce a sensor plasma by focusing an optical probe beam in the volume and the step of detecting an optical component of resultant radiation produced from an interaction of the focused optical probe beam and the terahertz radiation in the sensor plasma. Detecting an optical component of the resultant radiation emitted by the sensor plasma facilitates detection of a characteristic fingerprint of the targeted object imposed onto the terahertz radiation produced as a result of the induced phase transformation.
    Type: Application
    Filed: December 9, 2009
    Publication date: November 4, 2010
    Applicant: Rensselaer Polytechnic Institute
    Inventors: Xi-Cheng Zhang, Jianming Dai, Xu Xie
  • Patent number: 7808636
    Abstract: Methods and apparatus for detecting variations in electromagnetic fields, in particular, terahertz (THz) electromagnetic fields, are provided. The methods and apparatus employ polarization detection devices and controllers to maintain or vary the polarization of modulated signals as desired. The methods and apparatus are provided to characterize electromagnetic fields by directing the electromagnetic field and a probe beam upon an electro-crystal and detecting the modulation of the resulting probe beam. Detection of the modulation of the probe beam is practiced by detecting and comparing the polarization components of the modulated probe beam. Aspects of the invention may be used to analyze or detect explosives, explosive related compounds, and pharmaceuticals, among other substances. A compact apparatus, modular optical devices for use with the apparatus, sample holders, and radiation source mounts are also disclosed.
    Type: Grant
    Filed: January 11, 2008
    Date of Patent: October 5, 2010
    Assignee: Rensselaer Polytechnic Institute
    Inventors: Brian Schulkin, Xi-Cheng Zhang, Thomas Tongue, Jingzhou Xu, Jian Chen
  • Patent number: 7718969
    Abstract: A method for generating amplified terahertz radiation includes inducing a first volume of a gas to produce a seed plasma and emit pulsed seed terahertz radiation by focusing an optical seed beam in the first volume. The seed terahertz radiation is then amplified by focusing an optical gain beam to produce a gain plasma in a second volume overlapping with the pulsed seed terahertz radiation remote from the seed plasma. The method may be implemented in a system for detecting and analyzing a remotely-located object such as an explosive material, a biological agent, and a chemical agent.
    Type: Grant
    Filed: May 31, 2007
    Date of Patent: May 18, 2010
    Assignee: Rensselaer Polytechnic Institute
    Inventors: Xi-Cheng Zhang, Jianming Dai, Xu Xie
  • Patent number: 7652253
    Abstract: A method of analyzing a remotely-located object includes the step of illuminating at least a portion of a targeted object with electromagnetic radiation to induce a phase transformation in the targeted object, wherein the phase transformation produces an emitter plasma, which emits terahertz radiation. The method also includes the step of ionizing a volume of an ambient gas to produce a sensor plasma by focusing an optical probe beam in the volume and the step of detecting an optical component of resultant radiation produced from an interaction of the focused optical probe beam and the terahertz radiation in the sensor plasma. Detecting an optical component of the resultant radiation emitted by the sensor plasma facilitates detection of a characteristic fingerprint of the targeted object imposed onto the terahertz radiation produced as a result of the induced phase transformation.
    Type: Grant
    Filed: August 7, 2007
    Date of Patent: January 26, 2010
    Assignee: Rensselaer Polytechnic Institute
    Inventors: Xi-Cheng Zhang, Jianming Dai, Xu Xie
  • Patent number: 7595491
    Abstract: A method for generating terahertz radiation includes inducing a background plasma in a volume of a gas by focusing a first optical beam in the volume, and generating pulsed terahertz radiation with enhanced generation efficiency by focusing a second time-delayed optical beam in the background plasma. The method may be implemented in a system for detecting and analyzing a remotely-located object.
    Type: Grant
    Filed: May 31, 2007
    Date of Patent: September 29, 2009
    Assignee: Rensselaer Polytechnic Institute
    Inventors: Xi-Cheng Zhang, Jianming Dai, Xu Xie