Patents by Inventor Xiao-Dong Xiang
Xiao-Dong Xiang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7034091Abstract: Methods and apparatus for the preparation and use of a substrate having an array of diverse materials in predefined regions thereon. A substrate having an array of diverse materials thereon is generally prepared by delivering components of materials to predefined regions on a substrate, and simultaneously reacting the components to form at least two materials. Materials which can be prepared using the methods and apparatus of the present invention include, for example, covalent network solids, ionic solids and molecular solids. More particularly, materials which can be prepared using the methods and apparatus of the present invention include, for example, inorganic materials, intermetallic materials, metal alloys, ceramic materials, organic materials, organometallic materials, non-biological organic polymers, composite materials (e.g., inorganic composites, organic composites, or combinations thereof), etc.Type: GrantFiled: February 11, 2002Date of Patent: April 25, 2006Assignees: The Regents of the University of California, Symyx Technologies, Inc.Inventors: Peter G. Schultz, Xiao-Dong Xiang, Isy Goldwasser, Gabriel Briceno, Xiao-Dong Sun, Kai-An Wang
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Publication number: 20060071662Abstract: A novel spin resonance microscope is disclosed, the microscope design comprising an integrated evanescent wave probe and scanning tunneling microscope tip. The probe and tip may be either the same structure, or they may be separate structures. The integrated design allows for coherent excitation of precessing electron spin states in the sample such that spin resonance may be detected because the tunneling current is modulated by the spin resonance. Spin resonance may be affected by either adjacent nuclei, or by adjacent electrons. The present apparatus requires significantly reduced power inputs, such that the dead time of the system is short, and relaxation phenomena may be evaluated without swamping the instrument's electronics.Type: ApplicationFiled: August 30, 2005Publication date: April 6, 2006Applicant: Intematix CorporationInventors: Xiao-Dong Xiang, Haitao Yang
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Publication number: 20050260332Abstract: A combinatorial method for discovering or optimizing materials is disclosed. The method uses solution-based components that are mixed and dispensed into regions on a substrate for drying and/or heat-treating. The drying and/or heat-treating produces materials that can be tested for a desired property.Type: ApplicationFiled: March 31, 2003Publication date: November 24, 2005Inventors: Daniel Giaquinta, Martin Devenney, Keith Hall, Isy Goldwasser, Peter Schultz, Xiao-Dong Xiang, Xiao-Dong Sun, Gabriel Briceno, Kai-An Wang
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Patent number: 6946835Abstract: Methods for spatially resolved spin resonance detection in a sample of material, with a resolution as small as 0.5 ? m –1 mm. In one embodiment, a coupler having at least one pair of degenerate orthogonal modes provides an evanescent input signal along one coupler axis to the sample, to which a magnetic field is applied, and senses a spin interaction signal along another coupler axis. In another embodiment, an evanescent input signal is applied to the sample along one of two identical transmission line resonators, and a difference of the two resonator signals provides a spin interaction signal. In another embodiment, a polarized laser beam provides an evanescent input signal to the sample, and the spin interaction signal is sensed according to a second beam polarization direction. Certain ferromagnetic or ferrimagnetic molecules, such as YIG, can be used to tag selected chemical and biological molecules, using spatially resolved spin resonance detection for interrogation.Type: GrantFiled: January 16, 2004Date of Patent: September 20, 2005Assignee: Intematix CorporationInventors: Xiao-Dong Xiang, Gang Wang, Haitao Yang
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Patent number: 6924150Abstract: A method for improving the magnetic resonance imaging contrast of a selected portion of a sample. A selected ferrimagnetic constituent is associated with the sample portion, by molecular or biological attachment or by some other means, so that the sample portion is distinguished from other adjacent portions of the sample that do not have the selected ferrimagnetic constituent associated therewith. Alternatively, the sample portion is suspected, but not yet confirmed, to have the selected ferrimagnetic constituent associated with it. Ferromagnetic resonance imaging is performed on the sample portion, and at least one resonance frequency ?0 of the sample portion is provided. At least one material parameter of the sample portion is measured at or near the frequency ?0, with enhanced imaging contrast relative to adjacent portions of the sample that do not have the selected ferrimagnetic constituent in association.Type: GrantFiled: April 17, 2002Date of Patent: August 2, 2005Assignee: Intematix CorporationInventors: Xiao Dong Xiang, Gerald F. Dionne, Haitao Yang
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Publication number: 20040196037Abstract: Methods and systems for spatially resolved spin resonance detection in a sample of material are disclosed. Also disclosed are methods and systems for spatially resolved impedance measurements in a sample of material. The disclosed methods and samples can be used in screening of plurality of biological, chemical and material samples.Type: ApplicationFiled: April 28, 2004Publication date: October 7, 2004Applicant: INTEMATIX CORPORATIONInventors: Xiao Dong Xiang, Haitao Yang, Gang Wang
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Patent number: 6794052Abstract: Methods and apparatus for the preparation and use of a substrate having an array of diverse materials in predefined regions thereon. A substrate having an array of diverse materials thereon is generally prepared by delivering components of materials to predefined regions on a substrate, and simultaneously reacting the components to form at least two materials. Materials which can be prepared using the methods and apparatus of the present invention include, for example, covalent network solids, ionic solids and molecular solids. More particularly, materials which can be prepared using the methods and apparatus of the present invention include, for example, inorganic materials, intermetallic materials, metal alloys, ceramic materials, organic materials, organometallic materials, non-biological organic polymers, composite materials (e.g., inorganic composites, organic composites, or combinations thereof), etc.Type: GrantFiled: August 22, 2002Date of Patent: September 21, 2004Assignees: The Regents of the University of California, Symyx Technologies, Inc.Inventors: Peter G. Schultz, Xiao-Dong Xiang, Isy Goldwasser, Gabriel Briceño, Xiao-Dong Sun
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Publication number: 20040154704Abstract: Methods and apparatus for the preparation and use of a substrate having an array of diverse materials in predefined regions thereon. A substrate having an array of diverse materials thereon is generally prepared by delivering components of materials to predefined regions on a substrate, and simultaneously reacting the components to form at least two materials. Materials which can be prepared using the methods and apparatus of the present invention include, for example, covalent network solids, ionic solids and molecular solids. More particularly, materials which can be prepared using the methods and apparatus of the present invention include, for example, inorganic materials, intermetallic materials, metal alloys, ceramic materials, organic materials, organometallic materials, non-biological organic polymers, composite materials (e.g., inorganic composites, organic composites, or combinations thereof), etc.Type: ApplicationFiled: February 4, 2004Publication date: August 12, 2004Applicant: The Regents of the University of California and Symyx Technologies, Inc.Inventors: Peter G. Schultz, Xiao-Dong Xiang, Isy Goldwasser, Gabriel Briceno, Xiao-Dong Sun, Kai-An Wang
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Patent number: 6693426Abstract: Methods for spatially resolve spin resonance detection in a sample of material, with a resolution as small as 0.5 &mgr;m-1 mm. In one embodiment, a coupler having at least one pair of degenerate orthogonal modes provides an evanescent input signal along one coupler axis to the sample, to which a magnetic field is applied, and senses a spin interaction signal along another coupler axis. In another embodiment, an evanescent input signal is applied to the sample along one of two identical transmission line resonators, and a difference of the two resonator signals provides a spin interaction signal. In another embodiment, a polarized laser beam provides an evanescent input signal to the sample, and the spin interaction signal is sensed according to a second beam polarization direction. Certain ferromagnetic or ferrimagnetic molecules, such as YIG, can be used to tag selected chemical and biological molecules, using spatially resolved spin resonance detection for interrogation.Type: GrantFiled: February 9, 2002Date of Patent: February 17, 2004Assignee: Intematix CorporationInventors: Xiao Dong Xiang, Gang Wang, Haitao Yang, Gerald F. Dionne
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Publication number: 20040014077Abstract: Methods and apparatus for the preparation and use of a substrate having an array of diverse materials in predefined regions thereon. A substrate having an array of diverse materials thereon is generally prepared by delivering components of materials to predefined regions on a substrate, and simultaneously reacting the components to form at least two materials. Materials which can be prepared using the methods and apparatus of the present invention include, for example, covalent network solids, ionic solids and molecular solids. More particularly, materials which can be prepared using the methods and apparatus of the present invention include, for example, inorganic materials, intermetallic materials, metal alloys, ceramic materials, organic materials, organometallic materials, non-biological organic polymers, composite materials (e.g., inorganic composites, organic composites, or combinations thereof), etc.Type: ApplicationFiled: January 23, 2003Publication date: January 22, 2004Inventors: Peter G. Schultz, Xiao-Dong Xiang, Isy Goldwasser, Gabriel Briceno, Xiao-Dong Sun, Kai-An Wang
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Patent number: 6660414Abstract: A dielectric thin film material for high frequency use, including use as a capacitor, and having a low dielectric loss factor is provided, the film comprising a composition of tungsten-doped barium strontium titanate of the general formula (BaxSr1−x)TiO3, where X is between about 0.5 and about 1.0. Also provided is a method for making a dielectric thin film of the general formula (BaxSr1−x)TiO3 and doped with W, where X is between about 0.5 and about 1.0, a substrate is provided, TiO2, the W dopant, Ba, and optionally Sr are deposited on the substrate, and the substrate containing TiO2, the W dopant, Ba, and optionally Sr is heated to form a low loss dielectric thin film.Type: GrantFiled: April 26, 1999Date of Patent: December 9, 2003Assignee: U.S. Department of EnergyInventors: Xiao-Dong Xiang, Hauyee Chang, Chen Gao, Ichiro Takeuchi, Peter G. Schultz
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Patent number: 6641940Abstract: Composition for a solid state material, in bulk and in thin film form, that provides relatively high dielectric permittivity that is tunable with variable electrical field bias, relatively low loss tangent and low leakage current for microwave applications. In a first embodiment, the material is BaySr1−yTi1−xMxO3, where M is a substance or mixture including one or more elements drawn from a group consisting of Ta, Zr, Hf, V, Nb, Al, Ga, Cr, Mo, W, Mn, Sc and Re, and the indices x and y satisfy 0≦x≦1 and 0≦y≦1. A preferred choice is M=Ta, V, W, Mo and/or Nb. In a second embodiment, the material is BaySr1−yTi1−x−zTaxMzO3, where M is a substance or mixture including one or more trivalent elements drawn from a group consisting of Al, Ga and Cr and the indices x, y and z satisfy 0≦x+z≦1 and 0≦y≦1.Type: GrantFiled: October 9, 2001Date of Patent: November 4, 2003Assignee: Intematix CorporationInventors: Yi-Qun Li, Xiao-Dong Xiang, Yi Dong, Shifan Cheng, Gang Wang, Ning Wang
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Publication number: 20030134089Abstract: Methods and apparatus for the preparation and use of a substrate having an array of diverse materials in predefined regions thereon. A substrate having an array of diverse materials thereon is generally prepared by delivering components of materials to predefined regions on a substrate, and simultaneously reacting the components to form at least two materials. Materials which can be prepared using the methods and apparatus of the present invention include, for example, covalent network solids, ionic solids and molecular solids. More particularly, materials which can be prepared using the methods and apparatus of the present invention include, for example, inorganic materials, intermetallic materials, metal alloys, ceramic materials, organic materials, organometallic materials, non-biological organic polymers, composite materials (e.g., inorganic composites, organic composites, or combinations thereof), etc.Type: ApplicationFiled: August 22, 2002Publication date: July 17, 2003Inventors: Peter G. Schultz, Xiao-Dong Xiang, Isy Goldwasser, Gabriel Briceno, Xiao-Dong Sun
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Patent number: 6580271Abstract: Methods and systems for estimating a value of a static or time varying magnetic field that is present. In a first embodiment, a layer of a magnetostrictive (MNS) material and a layer of a piezoresistive (PZR) material are combined and exposed to the unknown magnetic field, and a current source and charge-carrying line are connected between two spaced apart locations in the PZR layer. A meter measures a voltage difference or current between the two locations and estimates the value of the magnetic field. In a second embodiment, a layer of a magnetostrictive (MNS) material and a layer of a piezoelectric (PZT) material are combined and exposed to a combination of the unknown magnetic field and a selected time varying magnetic field. A meter measures a voltage change, current change or other electrical variable between two spaced apart locations at two or more selected times and estimates the value of the unknown magnetic field.Type: GrantFiled: December 11, 2000Date of Patent: June 17, 2003Assignee: Spinix CorporationInventors: Yi-Qun Li, Xiao-Dong Xiang
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Patent number: 6577705Abstract: Method and system for analyzing local composition and structure of a compound having one or more non-zero gradients in concentration for one or more selected constituents in a selected direction. A beam of X rays having representative energy E is received by a mono-capillary or poly-capillary device and is directed at a selected small region of the compound. A portion of the X rays is diffracted at the selected region by one or more constituents of the compound, at each of two or more diffraction angles relative to a selected surface or lattice plane(s) of the compound; and the diffracted portion of X rays for each of these diffraction angles is received and analyzed at an X-ray detector. A portion of the X rays excites fluorescence radiation that is received by a fluorescence detector to estimate the relative concentrations in a compound having two or more constituents. Fluorescence X rays and diffraction X rays can be detected at each desired translational position and rotation for a target site.Type: GrantFiled: April 2, 2001Date of Patent: June 10, 2003Inventors: William Chang, Xiao-Dong Xiang, Edward D. Franco
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Patent number: 6532806Abstract: A novel scanning microscope is described that uses near-field evanescent electromagnetic waves to probe sample properties. The novel microscope is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The inventive scanning evanescent wave electromagnetic microscope (SEMM) can map dielectric constant, tangent loss, conductivity, complex electrical impedance, and other electrical parameters of materials. The quantitative map corresponds to the imaged detail. The novel microscope can be used to measure electrical properties of both dielectric and electrically conducting materials.Type: GrantFiled: October 23, 2000Date of Patent: March 18, 2003Assignee: The Regents of the University of CaliforniaInventors: Xiao-Dong Xiang, Chen Gao, Peter G. Schultz, Tao Wei
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Publication number: 20010028245Abstract: Methods and systems for estimating a value of a static or time varying magnetic field that is present. In a first embodiment, a layer of a magnetostrictive (MNS) material and a layer of a piezoresistive (PZR) material are combined and exposed to the unknown magnetic field, and a current source and charge-carrying line are connected between two spaced apart locations in the PZR layer. A meter measures a voltage difference or current between the two locations and estimates the value of the magnetic field. In a second embodiment, a layer of a magnetostrictive (MNS) material and a layer of a piezoelectric (PZT) material are combined and exposed to a combination of the unknown magnetic field and a selected time varying magnetic field. A meter measures a voltage change, current change or other electrical variable between two spaced apart locations at two or more selected times and estimates the value of the unknown magnetic field.Type: ApplicationFiled: December 11, 2000Publication date: October 11, 2001Applicant: SPINIX CORPORATIONInventors: Yi-Qun Li, Xiao-Dong Xiang
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Patent number: 6285049Abstract: A dielectric thin-film material for microwave applications, including use as a capacitor, the thin-film comprising a composition of barium strontium calcium and titanium of perovskite type (BaxSryCa1−x−y)TiO3. Also provided is a method for making a dielectric thin film of that formula over a wide compositional range through a single deposition process.Type: GrantFiled: September 28, 2000Date of Patent: September 4, 2001Assignee: The United States of America as represented by the United States Department of EnergyInventors: Xiao-Dong Xiang, Hauyee Chang, Ichiro Takeuchi
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Patent number: 6173604Abstract: A novel scanning microscope is described that uses near-field evanescent electromagnetic waves to probe sample properties. The novel microscope is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The inventive scanning evanescent wave electromagnetic microscope (SEMM) can map dielectric constant, tangent loss, conductivity, complex electrical impedance, and other electrical parameters of materials. The quantitative map corresponds to the imaged detail. The novel microscope can be used to measure electrical properties of both dielectric and electrically conducting materials.Type: GrantFiled: September 22, 1998Date of Patent: January 16, 2001Assignee: The Regents of the University of CaliforniaInventors: Xiao-Dong Xiang, Chen Gao
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Patent number: 6146907Abstract: A dielectric thin-film material for microwave applications, including use as a capacitor, the thin-film comprising a composition of barium strontium calcium and titanium of perovskite type (Ba.sub.x Sr.sub.y Ca.sub.1-x-y)TiO.sub.3. Also provided is a method for making a dielectric thin film of that formula over a wide compositional range through a single deposition process.Type: GrantFiled: October 19, 1999Date of Patent: November 14, 2000Assignee: The United States of America as represented by the United States Department of EnergyInventors: Xiao-Dong Xiang, Hauyee Chang, Ichiro Takeuchi