Abstract: The present invention provides an array substrate, a display device, and a mother board. One or more short-circuit rings are each arranged at an end of a corresponding signal line and connected to the corresponding signal line, and the short-circuit rings are serially connected through a common electrode line. The array substrate is added with a test line and a testing terminal pad, the testing terminal pad is connected to the common electrode line via the test line and is configured to apply a negative voltage onto the common electrode line connected to the test line while testing the signal line.

Abstract: The present disclosure provides a method for forming a thin film pattern. The method includes steps of: forming a mask pattern on a thin film in such a manner that the mask pattern includes a reserved portion corresponding to a region where the thin film pattern to be formed is located, and a partially-reserved portion neighboring the reserved portion; performing a wet-etching process to etch off a portion of the thin film which is not covered by the mask pattern; performing a dry etching process to remove the partially-reserved portion and thin the reserved portion; and performing a dry etching process to etch off a portion of the thin film which is not covered by the remaining mask pattern, so as to form the thin film pattern.

Abstract: The present disclosure provides a method for forming a thin film pattern. The method includes steps of: forming a mask pattern on a thin film in such a manner that the mask pattern includes a reserved portion corresponding to a region where the thin film pattern to be formed is located, and a partially-reserved portion neighboring the reserved portion; performing a wet-etching process to etch off a portion of the thin film which is not covered by the mask pattern; performing a dry etching process to remove the partially-reserved portion and thin the reserved portion; and performing a dry etching process to etch off a portion of the thin film which is not covered by the remaining mask pattern, so as to form the thin film pattern.

Abstract: The present invention provides an array substrate, a method for manufacturing the same, and a display device including the same. In the manufacturing method of the present invention, photoresist is exposed and developed by using a mask to allow the first regions to retain photoresist with a first thickness and second regions to retain photoresist with a second thickness, wherein the first thickness is greater than the second thickness, and each of the first regions is at least partially connected with the second region, so that the contact area between the exposed photoresist and the substrate is large and the photoresist in the first regions is unlikely to peel off. The manufacturing method of the present invention is applicable to manufacturing various array substrates.

Abstract: Embodiments of the present disclosure relate to a three-dimensional touch sensing method, a three-dimensional display device and a wearable device. The three-dimensional touch sensing method, comprising: receiving an electron beam being perpendicularly incident to a preset plane on the preset plane, the electron beam having a preset emission intensity; obtaining a reception position and a reception intensity of the electron beam; determining a projection position of a touch position on the preset plane according to the reception position of the electron beam; and calculating a distance from the touch position to the preset plane according to the reception intensity of the electron beam and the preset emission intensity.

Abstract: The present disclosure relates to an image calibrating method and device of a testing apparatus for thin film transistor (TFT) substrate. The method comprises following steps of: calculating an image offset value by using coordinate information of each pixel in a prescribed target image obtained by the testing apparatus for the thin film transistor substrate; and determining whether the offset value is smaller than a prescribed threshold value, in a case where the offset value is not smaller than the prescribed threshold value, adjusting the image by using the offset value and recalculating the offset value by using the coordinate information of each pixel in the adjusted image; in a case where the offset value is smaller than the prescribed threshold value, calibrating the image obtained by the testing apparatus for the thin film transistor substrate with the offset value as a calibrating value.

Abstract: The present invention provides an array substrate, a display device, and a mother board. One or more short-circuit rings are each arranged at an end of a corresponding signal line and connected to the corresponding signal line, and the short-circuit rings are serially connected through a common electrode line. The array substrate is added with a test line and a testing terminal pad, the testing terminal pad is connected to the common electrode line via the test line and is configured to apply a negative voltage onto the common electrode line connected to the test line while testing the signal line.

Abstract: Embodiments of the present invention provide a LCD Q-Panel, a LCD panel and a LCD apparatus, for solving the technical problem that there is a large loss of a signal over the resistance of the signal transmission line when the signal is loaded into a general signal connection port of the LCD Q-Panel in the prior art. The LCD Q-Panel provided in embodiments of the present invention comprises: a general signal connection port, at least one LCD panel comprising a signal connection point, and at least one voltage follower; the signal input from the general signal connection port is transmitted via the at least one voltage follower to the signal connection point connected to an output terminal of the at least one voltage follower and the LCD panel comprising the signal connection point.