Abstract: A method for testing an antenna array uses a probe antenna to measure an RF signal antenna pattern of the antenna array. The method includes measuring the RF signal antenna pattern at a first position and at a second position relative to the antenna array. The first position and the second position are located at different distances from the antenna array in a middle field of the antenna array. The middle field satisfies near field criteria for the antenna array and also satisfies far field criteria for each antenna element of the plurality of antenna elements in the antenna array. The method further includes determining, based on the first measurement and based on the second measurement, the RF signal antenna pattern at a third position relative to the antenna array located in a far field of the antenna array.

Abstract: A test system includes: a signal processor configured to generate a plurality of orthogonal baseband sequences; a signal generator configured to supply the plurality of orthogonal baseband sequences to a corresponding plurality of RF transmitters of a device under test (DUT), wherein the RF transmitters each employ the corresponding orthogonal baseband sequence to generate a corresponding RF signal on a corresponding channel among a plurality of channels of the DUT such that the RF transmitters output a plurality of orthogonal RF signals at a same time; a combiner network configured to combine the plurality of orthogonal RF signals and to output a single signal under test; and a single channel measurement instrument configured to receive the single signal under test and to measure independently therefrom at least one characteristic of each of the RF transmitters. Orthogonal RF test signals may be used similarly to test RF receivers of the DUT.

Abstract: A patterned light guide structure includes a transparent substrate with a first side and with a second side, an anti-reflective layer directly attached to the first side, a first light-shielding layer directly disposed on the anti-reflective layer, a second light-shielding layer directly disposed on the second side, and a protecting layer directly disposed on the first light-shielding layer to keep the first light-shielding layer from any deteriorating damage.

Abstract: A system and a method to determine beam dynamics and multi-user performance of a base station having an antenna array including multiple antenna elements are disclosed. The system includes a measurement probe antenna positioned in a mid-field of the antenna array, a reference antenna having a fixed position with respect to the base station antenna array, and a coupling probe array including multiple coupling probe antennas positioned in a reactive field of the base station antenna array for coupling RF signals of the antenna elements to selected coupling probe antennas to form a high dimension radiation channel matrix between the antenna array and the coupling probe array. The system further includes a channel emulator configured to receive the measured antenna element patterns from the measurement probe antenna, to receive the RF signals coupled to the selected coupling probe antennas, to provide bi-directional channel models of channels between the base station and user devices.

Abstract: A liquid crystal display includes a first substrate, a pixel array, a first pad, a dielectric layer, a filling pattern, a first conductor, a second substrate and a liquid crystal layer. The first substrate has a display area and a pad area located outside the display area. The pixel array is disposed on the display area. The first pad is disposed on the pad area. The dielectric layer has a first opening overlapped with the first pad. The filling pattern is disposed within the first opening of the dielectric layer. The filling pattern has through holes, and the through holes of the filling pattern are overlapped with the first pads. The first conductor is disposed in the first opening of the dielectric layer, and is electrically connected to the first pad via the through holes of the filling pattern.

Abstract: A test system includes: a signal processor configured to generate a plurality of orthogonal baseband sequences; a signal generator configured to supply the plurality of orthogonal baseband sequences to a corresponding plurality of RF transmitters of a device under test (DUT), wherein the RF transmitters each employ the corresponding orthogonal baseband sequence to generate a corresponding RF signal on a corresponding channel among a plurality of channels of the DUT such that the RF transmitters output a plurality of orthogonal RF signals at a same time; a combiner network configured to combine the plurality of orthogonal RF signals and to output a single signal under test; and a single channel measurement instrument configured to receive the single signal under test and to measure independently therefrom at least one characteristic of each of the RF transmitters. Orthogonal RF test signals may be used similarly to test RF receivers of the DUT.

Abstract: A system and method determine beam dynamics and multi-user performance of a base station having an antenna array including multiple antenna elements. The system includes a measurement probe antenna positioned in a mid-field of the antenna array, a reference antenna having a fixed position with respect to the base station antenna array, and a coupling probe array including multiple coupling probe antennas positioned in a reactive field of the base station antenna array for coupling RF signals of the antenna elements to selected coupling probe antennas to form high dimension radiation channel matrix between the antenna array and the coupling probe array. The system further includes a channel emulator configured to receive the measured antenna element patterns from the measurement probe antenna, to receive the RF signals coupled to the selected coupling probe antennas, to provide bi-directional channel models of channels between the base station and user devices.

Abstract: A method for testing an antenna array uses a probe antenna to measure an RF signal antenna pattern of the antenna array. The method includes measuring the RF signal antenna pattern at a first position and at a second position relative to the antenna array. The first position and the second position are located at different distances from the antenna array in a middle field of the antenna array. The middle field satisfies near field criteria for the antenna array and also satisfies far field criteria for each antenna element of the plurality of antenna elements in the antenna array. The method further includes determining, based on the first measurement and based on the second measurement, the RF signal antenna pattern at a third position relative to the antenna array located in a far field of the antenna array.

Abstract: A MIMO test system is provided that performs non-cable-conducted, over-the-air radiated calibration and test modes of operations. A DUT is located in an anechoic chamber having a plurality of probe antennas disposed therein. During the calibration mode, the test instrument causes predetermined signals to be transmitted over a transmission channel comprising a non-cable-conducted, OTA interface between probe antennas of the chamber and antenna ports of the DUT and obtains measurements of received power and relative phase. The test instrument uses the measurements to construct a radiation channel matrix associated with the transmission channel and obtains an inverse matrix of the radiation channel matrix. During the test mode, the test system performs a non-cable-conducted, OTA radiated test during which the test instrument applies the inverse matrix to DUT performance measurements obtained by the test instrument to calibrate out the radiation channel matrix from the DUT performance measurements.

Abstract: A testing system includes a test chamber including an array of spaced-apart probe antennas and a positioner configured to support a device under test (DUT) having an array of digital antenna elements, a radio frequency (RF) signal generator and analyzer configured to send and receive RF test signals to/from the spaced-apart probe antennas, and an RF switch component configured to selectively couple the RF signal generator and analyzer to the array of spaced-apart probe antennas within the test chamber.

Abstract: A method is provided for testing an antenna array of a DUT using a probe antenna, the antenna array including multiple antenna elements. The method includes providing a correction table that includes predetermined correction data of differences between far field antenna patterns from different positions in a far field of the antenna array and a middle field antenna pattern from a position in a middle field of the antenna array, where the middle field satisfies near field criteria for the antenna array and satisfies far field criteria for each antenna element in the antenna array; measuring an antenna pattern at a first position in the middle field of the antenna array; retrieving predetermined correction data from the correction table corresponding to a second position located in the far field of the antenna array; and translating the measured antenna pattern to the far field by adding the retrieved predetermined correction data.

Abstract: A method of fabricating an image sensor includes the following steps. A substrate is provided. A first infrared filter is formed on a first region of the substrate. A second infrared filter is deposited on the substrate and the first infrared filter. The deposited second infrared filter covers the first infrared filter. The second infrared filter is lowered to expose the first infrared filter. The lowered second infrared filter is on a second region of the substrate and neighbors the first infrared filter.

Abstract: A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.

Abstract: A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.

Abstract: The multi-channel signal processing device includes a multi-channel continuous waveform (CW) phase shifter module configured to generate phase control and filter interference therein for multiple local oscillator (LO) signals at a same frequency, a multi-channel up-converter module configured to up-convert the multiple LO signals to a desired frequency and filter respective image signals therein, and a multi-channel wideband mixer module configured to receive and mix the up-converted LO signals at the desired frequency from the multi-channel up-converter module with radio frequency (RF) signals.

Abstract: A method of fabricating an image sensor includes the following steps. A substrate is provided. A first infrared filter is formed on a first region of the substrate. A second infrared filter is deposited on the substrate and the first infrared filter. The deposited second infrared filter covers the first infrared filter. The second infrared filter is lowered to expose the first infrared filter. The lowered second infrared filter is on a second region of the substrate and neighbors the first infrared filter.

Abstract: A method of fabricating an image sensor includes the following steps. A substrate is provided. A first infrared filter is formed on a first region of the substrate. A second infrared filter is deposited on the substrate and the first infrared filter. The deposited second infrared filter covers the first infrared filter. The second infrared filter is lowered to expose the first infrared filter. The lowered second infrared filter is on a second region of the substrate and neighbors the first infrared filter.

Abstract: A method of fabricating an image sensor includes the following steps. A substrate is provided. A first infrared filter is formed on a first region of the substrate. A second infrared filter is deposited on the substrate and the first infrared filter. The deposited second infrared filter covers the first infrared filter. The second infrared filter is lowered to expose the first infrared filter. The lowered second infrared filter is on a second region of the substrate and neighbors the first infrared filter.

Abstract: A test system includes a single-channel signal generator configured to generate an autocorrelation test signal to be distributed to each of a plurality of RF channels of a device under test (DUT). A time offset network includes a plurality of time offset channels each corresponding to one of the plurality of RF channels of the DUT, and is configured to, in combination with the DUT, provide corresponding autocorrelation test signals each with a different time delay as respective RF channel test signals. A single-channel measurement instrument is configured to process a single-channel test signal, based upon a combination of the RF channel test signals, to independently measure at least one characteristic of each of the RF channels of the DUT. The time offset network may be configured to be coupled between the single-channel signal generator and the DUT. Or, the time offset network may be configured to be coupled between the DUT and the single-channel measurement instrument.

Abstract: A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.