Patents by Inventor Yanko K Sheiretov

Yanko K Sheiretov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9823179
    Abstract: Detection of corrosion and other defects in piping is needed to prevent catastrophic pipeline failure. Sensors, systems and methods are provided to enable detection of such defects. These apparatus and methods are configured to characterize pipe protected by insulation and conductive weather protection. The sensors may utilize inductive and/or solid state sensing element arrays operated in a magnetic field generated in part by a drive winding of the sensor. Multiple excitation frequencies are used to generate the magnetic field and record corresponding sensing element responses. Relatively high excitation frequencies may be used to estimate the properties of the weather protection and sensor lift-off while lower frequencies may be used to detect internal and external pipe damage. Linear arrays may be moved to generate damage images of the pipe providing size and location information for defects. Two dimensional sensor arrays may be used to provide imaging without moving the sensor.
    Type: Grant
    Filed: January 21, 2016
    Date of Patent: November 21, 2017
    Assignee: Jentek Sensors, Inc.
    Inventors: Scott A. Denenberg, Todd M. Dunford, Neil J. Goldfine, Yanko K. Sheiretov
  • Publication number: 20160349214
    Abstract: A sensor system has an integrated sensor cartridge, and instrument, and an instrument side connector. The integrated sensor cartridge has a mechanical support, a flexible sensor array, and a rigid connector. The mechanical support is shaped to facilitate sensor measurements on a test object. The rigid connector has a mechanical connection and an electrical connection for simultaneous electrical and mechanical mating of the sensor cartridge to the instrument side connector. The flexible array has a connecting portion, a lead portion, and a sensing portion. The sensing portion is attached to the mechanical support, and the connecting portion interfaces with the rigid connector. The connecting portion may form the electrical connection of the rigid connector or may simply mate internally with the electrical connection. The instrument side connector is connected to the instrument which measures the response of the flexible sensor array.
    Type: Application
    Filed: May 31, 2016
    Publication date: December 1, 2016
    Inventors: Neil J. Goldfine, Yanko K. Sheiretov, Scott A. Denenberg, Karen Walrath, Todd M. Dunford, Kevin P. Dixon, Christopher T. Martin
  • Publication number: 20160274060
    Abstract: System and method for characterizing material condition. The system includes a sensor, impedance instrument and processing unit to collect measurements and assess material properties. A model of the system may be used to enable accurate measurements of multiple material properties. A cylindrical model for an electromagnetic field sensor is disclosed for modeling substantially cylindrically symmetric material systems. Sensor designs and data processing approaches are provided to focus the sensitivity of the sensor to localize material conditions. Improved calibration methods are shown. Sizing algorithms are provided to estimate the size of defects such as cracks and corrosion. Corrective measures are provided where the actual material configuration differs from the data processing assumptions. Methods are provided for use of the system to characterize material condition, and detailed illustration is given for corrosion, stress, weld, heat treat, and mechanical damage assessment.
    Type: Application
    Filed: October 22, 2014
    Publication date: September 22, 2016
    Applicant: JENTEK Sensors, Inc.
    Inventors: Scott A Denenberg, Yanko K Sheiretov, Neil J Goldfine, Todd M Dunford, Andrew P Washabaugh, Don Straney, Brian L Manning
  • Publication number: 20160238514
    Abstract: Detection of corrosion and other defects in piping is needed to prevent catastrophic pipeline failure. Sensors, systems and methods are provided to enable detection of such defects. These apparatus and methods are configured to characterize pipe protected by insulation and conductive weather protection. The sensors may utilize inductive and/or solid state sensing element arrays operated in a magnetic field generated in part by a drive winding of the sensor. Multiple excitation frequencies are used to generate the magnetic field and record corresponding sensing element responses. Relatively high excitation frequencies may be used to estimate the properties of the weather protection and sensor lift-off while lower frequencies may be used to detect internal and external pipe damage. Linear arrays may be moved to generate damage images of the pipe providing size and location information for defects. Two dimensional sensor arrays may be used to provide imaging without moving the sensor.
    Type: Application
    Filed: January 21, 2016
    Publication date: August 18, 2016
    Inventors: Scott A. Denenberg, Todd M. Dunford, Neil J. Goldfine, Yanko K. Sheiretov
  • Patent number: 9255875
    Abstract: Detection of corrosion and other defects in piping is needed to prevent catastrophic pipeline failure. Sensors, systems and methods are provided to enable detection of such defects. These apparatus and methods are configured to characterize pipe protected by insulation and conductive weather protection. The sensors may utilize inductive and/or solid state sensing element arrays operated in a magnetic field generated in part by a drive winding of the sensor. Multiple excitation frequencies are used to generate the magnetic field and record corresponding sensing element responses. Relatively high excitation frequencies may be used to estimate the properties of the weather protection and sensor lift-off while lower frequencies may be used to detect internal and external pipe damage. Linear arrays may be moved to generate damage images of the pipe providing size and location information for defects. Two dimensional sensor arrays may be used to provide imaging without moving the sensor.
    Type: Grant
    Filed: October 25, 2012
    Date of Patent: February 9, 2016
    Assignee: Jentek Sensors, Inc.
    Inventors: Scott A. Denenberg, Todd A. Dunford, Neil J. Goldfine, Yanko K. Sheiretov
  • Patent number: 8768657
    Abstract: Predicting the remaining life of individual aircraft, fleets of aircraft, aircraft components and subpopulations of these components. This is accomplished through the use of precomputed databases of response that are generated from a model for the nonlinear system behavior prior to the time that decisions need to be made concerning the disposition of the system. The database is calibrated with a few data points, to account for unmodeled system variables, and then used with an input variable to predict future system behavior. These methods also permit identification of the root causes for observed system behavior. The use of the response databases also permits rapid estimations of uncertainty estimates for the system behavior, such as remaining life estimates, particularly, when subsets of an input variable distribution are passed through the database and scaled appropriately to construct the output distribution.
    Type: Grant
    Filed: January 12, 2007
    Date of Patent: July 1, 2014
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, Volker Weiss, Yanko K. Sheiretov
  • Patent number: 8494810
    Abstract: A framework for adaptively managing the life of components. A sensor provides non-destructive test data obtained from inspecting a component. The inspection data may be filtered using reference signatures and by subtracting a baseline. The filtered inspection data and other inspection data for the component is analyzed to locate flaws and estimate the current condition of the component. The current condition may then be used to predict the component's condition at a future time or to predict a future time at which the component's condition will have deteriorated to a certain level. A current condition may be input to a precomputed database to look up the future condition or time. The future condition or time is described by a probability distribution which may be used to assess the risk of component failure. The assessed risk may be used to determine whether the part should continue in service, be replaced or repaired.
    Type: Grant
    Filed: June 7, 2010
    Date of Patent: July 23, 2013
    Assignee: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Yanko K. Sheiretov, Andrew P. Washabaugh, Vladimir A. Zilberstein, David C. Grundy, Robert J. Lyons, David A. Jablonski, Floyd W. Spencer
  • Patent number: 8415947
    Abstract: An apparatus for the nondestructive measurement of materials that includes at least two layers of electrical conductors. Within each layer, a meandering primary winding is used to create a magnetic field for interrogating a test material while sense elements or conducting loops within each meander provide a directional measurement of the test material condition. In successive layers extended portions of the meanders are rotated so that the sense elements provide material condition in different orientations without requiring movement of the test circuit or apparatus. Multidirectional permeability measurements are used to assess the stress or torque on a component. These measurements are combined in a manner that removes temperature effects and hysteresis on the property measurements. This can be accomplished through a correction factor that accounts for the temperature dependence.
    Type: Grant
    Filed: July 16, 2012
    Date of Patent: April 9, 2013
    Assignee: Jentek Sensors, Inc.
    Inventors: Yanko K. Sheiretov, Neil J. Goldfine, Todd M. Dunford, Scott A. Denenberg, David C. Grundy, Darrell E. Schlicker, Andrew P. Washabaugh, Karen E. Walrath
  • Publication number: 20130014589
    Abstract: An apparatus for the nondestructive measurement of materials that includes at least two layers of electrical conductors. Within each layer, a meandering primary winding is used to create a magnetic field for interrogating a test material while sense elements or conducting loops within each meander provide a directional measurement of the test material condition. In successive layers extended portions of the meanders are rotated so that the sense elements provide material condition in different orientations without requiring movement of the test circuit or apparatus. Multidirectional permeability measurements are used to assess the stress or torque on a component. These measurements are combined in a manner that removes temperature effects and hysteresis on the property measurements. This can be accomplished through a correction factor that accounts for the temperature dependence.
    Type: Application
    Filed: July 16, 2012
    Publication date: January 17, 2013
    Inventors: Yanko K. Sheiretov, Neil J. Goldfine, Todd M. Dunford, Scott A. Denenberg, David C. Grundy, Darrel E. Schlicker, Andrew P. Washabaugh, Karen E. Walrath
  • Publication number: 20120271824
    Abstract: Methods and apparatus for enhancing performance curve generation, damage monitoring, and improving non-destructive testing performance. Damage standards used for performance curve generation are monitored using a non-destructive testing (NDT) sensor during a damage evolution test performed with the standard. The evolution test may be intermittently paused to permit ground truth data to be collected in addition to the NDT sensor data. A damage evolution model may be used to estimate ground truth data during the intervening periods of the damage evolution test. The NDT sensor data and ground truth data are used to generate performance curves for the NDT system. Multiple sensors may be monitored at multiple locations on the damage standard and multiple damage evolution tests may be performed with multiple damage standards.
    Type: Application
    Filed: April 19, 2012
    Publication date: October 25, 2012
    Applicant: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Yanko K. Sheiretov, Floyd W. Spencer, David A. Jablonski, David C. Grundy, Darrell E. Schlicker
  • Patent number: 8222897
    Abstract: An apparatus for the nondestructive measurement of materials that includes at least two layers of electrical conductors. Within each layer, a meandering primary winding is used to create a magnetic field for interrogating a test material while sense elements or conducting loops within each meander provide a directional measurement of the test material condition in different orientations without requiring movement of the test circuit or apparatus. In a bidirectional implementation the meanders are oriented 90° apart while in a quadridirectional implementation the meanders are orientated at ?45, 0, 45, and 90°. Multidirectional permeability measurements are used to assess the stress or torque on a component. These measurements are combined in a manner that removes temperature effects and hysteresis on the property measurements. This can be accomplished through a correction factor that accounts for the temperature dependence.
    Type: Grant
    Filed: June 12, 2008
    Date of Patent: July 17, 2012
    Assignee: JENTEK Sensors, Inc.
    Inventors: Yanko K. Sheiretov, Neil J. Goldfine, Todd M. Dunford, Scott A. Denenberg, David C. Grundy, Darrell E. Schlicker, Andrew P. Washabaugh, Karen E. Walrath
  • Publication number: 20110060568
    Abstract: A framework for adaptively managing the life of components. A sensor provides non-destructive test data obtained from inspecting a component. The inspection data may be filtered using reference signatures and by subtracting a baseline. The filtered inspection data and other inspection data for the component is analyzed to locate flaws and estimate the current condition of the component. The current condition may then be used to predict the component's condition at a future time or to predict a future time at which the component's condition will have deteriorated to a certain level. A current condition may be input to a precomputed database to look up the future condition or time. The future condition or time is described by a probability distribution which may be used to assess the risk of component failure. The assessed risk may be used to determine whether the part should continue in service, be replaced or repaired.
    Type: Application
    Filed: June 7, 2010
    Publication date: March 10, 2011
    Applicant: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Yanko K. Sheiretov, Andrew P. Washabaugh, Vladimir A. Zilberstein, David C. Grundy, Robert J. Lyons, David A. Jablonski, Floyd W. Spencer
  • Publication number: 20110054806
    Abstract: A framework for adaptively managing the life of components. A sensor provides non-destructive test data obtained from inspecting a component. The inspection data may be filtered using reference signatures and by subtracting a baseline. The filtered inspection data and other inspection data for the component is analyzed to locate flaws and estimate the current condition of the component. The current condition may then be used to predict the component's condition at a future time or to predict a future time at which the component's condition will have deteriorated to a certain level. A current condition may be input to a precomputed database to look up the future condition or time. The future condition or time is described by a probability distribution which may be used to assess the risk of component failure. The assessed risk may be used to determine whether the part should continue in service, be replaced or repaired.
    Type: Application
    Filed: June 7, 2010
    Publication date: March 3, 2011
    Applicant: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Yanko K. Sheiretov, Andrew P. Washabaugh, Vladimir A. Ziberstein, David C. Grundy, Robert J. Lyons, David A. Jablonski, Floyd W. Spencer
  • Patent number: 7812601
    Abstract: Eddy current sensors and sensor arrays are used for process quality and material condition assessment of conducting materials. In an embodiment, changes in spatially registered high resolution images taken before and after cold work processing reflect the quality of the process, such as intensity and coverage. These images also permit the suppression or removal of local outlier variations. Anisotropy in a material property, such as magnetic permeability or electrical conductivity, can be intentionally introduced and used to assess material condition resulting from an operation, such as a cold work or heat treatment. The anisotropy is determined by sensors that provide directional property measurements. The sensor directionality arises from constructs that use a linear conducting drive segment to impose the magnetic field in a test material. Maintaining the orientation of this drive segment, and associated sense elements, relative to a material edge provides enhanced sensitivity for crack detection at edges.
    Type: Grant
    Filed: June 15, 2009
    Date of Patent: October 12, 2010
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Andrew P. Washabaugh, Yanko K. Sheiretov, Darrell E. Schlicker, Robert J. Lyons, Mark D. Windoloski, Christopher A. Craven, Vladimir B. Tsukernik, David C. Grundy
  • Publication number: 20100026285
    Abstract: Eddy current sensors and sensor arrays are used for process quality and material condition assessment of conducting materials. In an embodiment, changes in spatially registered high resolution images taken before and after cold work processing reflect the quality of the process, such as intensity and coverage. These images also permit the suppression or removal of local outlier variations. Anisotropy in a material property, such as magnetic permeability or electrical conductivity, can be intentionally introduced and used to assess material condition resulting from an operation, such as a cold work or heat treatment. The anisotropy is determined by sensors that provide directional property measurements. The sensor directionality arises from constructs that use a linear conducting drive segment to impose the magnetic field in a test material. Maintaining the orientation of this drive segment, and associated sense elements, relative to a material edge provides enhanced sensitivity for crack detection at edges.
    Type: Application
    Filed: June 15, 2009
    Publication date: February 4, 2010
    Applicant: Jentek Sensors, Inc.
    Inventors: Neil J. Goldfine, Andrew P. Washabaugh, Yanko K. Sheiretov, Darrell E. Schlicker, Robert J. Lyons, Mark D. Windoloski, Christopher A. Craven, Vladimir B. Tsukernik, David C. Grundy
  • Patent number: 7533575
    Abstract: Magnetic or electric field sensors are mounted against a material surface and used for stress, strain, and load monitoring of rotating components such as vehicle drive trains. The stationary sensors are mounted at multiple locations around the component and used assess the stress on the component at multiple rotational positions. The sensor response is typically converted into a material property, such as magnetic permeability or electrical conductivity, which accounts for any coating thickness that may be present between the sensor and mounting surface. The sensors are not in direct contact with the rotating component and are typically mounted on an annular material or ring that encircles the rotating component. Measurements of the annular material properties, such as the stress, are related to the stress on the rotating component and discrete features on the component.
    Type: Grant
    Filed: February 5, 2007
    Date of Patent: May 19, 2009
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, David C. Grundy, Yanko K. Sheiretov, Leandro M. Lorilla, Vladimir A. Zilberstein, Volker Weiss, J. Timothy Lovett, Andrew P. Washabaugh
  • Patent number: 7528598
    Abstract: Damage and usage conditions in the vicinity of fasteners in joined structures are nondestructively evaluated using the fasteners themselves. Sensors or sensor conductors are embedded in the fasteners or integrated within the fastener construct, either in the clearance gap between the fastener and the structure material or as an insert inside the shaft or pin of the fastener. The response of the material to an interrogating magnetic or electric field is then measured with drive and sense electrodes both incorporated into the fastener or with either drive or sense electrodes external to the fastener on the material surface. In another configuration, an electric current is applied to one or more fasteners and the electric potential is measured at locations typically between the driven electrodes applying the current. The potential is measured circumferentially around the fastener at locations on the material surface or across pairs of fasteners throughout or along the joint.
    Type: Grant
    Filed: June 22, 2006
    Date of Patent: May 5, 2009
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, David C. Grundy, Andrew P. Washabaugh, Yanko K. Sheiretov, Darrell E. Schlicker
  • Publication number: 20090001974
    Abstract: An apparatus for the nondestructive measurement of materials that includes at least two layers of electrical conductors. Within each layer, a meandering primary winding is used to create a magnetic field for interrogating a test material while sense elements or conducting loops within each meander provide a directional measurement of the test material condition. In successive layers extended portions of the meanders are rotated so that the sense elements provide material condition in different orientations without requiring movement of the test circuit or apparatus. In a bidirectional implementation the angle is 90° while in a quadridirectional implementation the relative angles are ?45, 0, 45, and 90°. Multidirectional permeability measurements are used to assess the stress or torque on a component. These measurements are combined in a manner that removes temperature effects and hysteresis on the property measurements.
    Type: Application
    Filed: June 12, 2008
    Publication date: January 1, 2009
    Applicant: JENTEK Sensors, Inc.
    Inventors: Yanko K. Sheiretov, Neil J. Goldfine, Todd M. Dunford, Scott A. Denenberg, David C. Grundy, Darrell E. Schlicker, Andrew P. Washabaugh, Karen E. Walrath
  • Patent number: 7289913
    Abstract: Local features such as cracks in materials are nondestructively characterized by measuring a response with an electromagnetic sensor and converting this response into a selected property using a database. The database is generated prior to data acquisition by using a model to generate a baseline response or field distribution for the sensor and combining these results with another model, which may be simpler than the first model or provide a local representation of the field perturbations around a feature, which is evaluated multiple times over a range of values of the selected property. In addition, the presence of a feature may be detected by converting the sensor response into a reference parameter, such as a lift-off factor that reflects the sensor position relative to a material edge, and using this parameter to determine a reference response that can be compared to the measured response.
    Type: Grant
    Filed: October 11, 2005
    Date of Patent: October 30, 2007
    Assignee: JENTEK Sensors, Inc.
    Inventors: Darrell E. Schlicker, Neil J. Goldfine, Andrew P. Washabaugh, Yanko K. Sheiretov, Mark D. Windoloski
  • Patent number: 7280940
    Abstract: The condition of insulating and semiconducting dielectric materials is assessed by a sensor array that uses electric fields to interrogate the test material. The sensor has a linear array of parallel drive conductors interconnected to form a single drive electrode and sense conductors placed on each side of and parallel to a drive conductor. Subsets of the sense conductors are interconnected to form at least two sense elements sensitive to different material regions. The sense conductors may be at different distances to the drive conductors, enabling measurement sensitivity to different depths into the test material. The material condition is assessed directly from the sense element responses or after conversion to an effective material property, such as an electrical conductivity or dielectric permittivity.
    Type: Grant
    Filed: March 7, 2006
    Date of Patent: October 9, 2007
    Assignee: JENTEK Sensors, Inc.
    Inventors: Neil J. Goldfine, Darrell E. Schlicker, Yanko K Sheiretov, Andrew P. Washabaugh, David C. Grundy, Vladimir A. Zilberstein