Patents by Inventor Yanyan Wu

Yanyan Wu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8205500
    Abstract: An ultrasound inspection system is provided for inspecting an object. The inspection system includes an ultrasound probe configured to scan the object and acquire a plurality of ultrasound scan data. The inspection system further includes a processor coupled to the ultrasound probe and configured to apply a transfer function to the ultrasound scan data to compensate for distortion of a plurality of ultrasound signals through the object and thereby generate a plurality of compensated ultrasound scan data, and to process the compensated ultrasonic scan data to characterize a feature in the object.
    Type: Grant
    Filed: November 25, 2008
    Date of Patent: June 26, 2012
    Assignee: General Electric Company
    Inventors: Yanyan Wu, Edward James Nieters, Thomas James Batzinger, Nicholas Joseph Kray, James Norman Barshinger, Jian Li, Waseem Ibrahim Faidi, Prabhjot Singh, Francis Howard Little, Michael Everett Keller, Timothy Jesse Sheets
  • Patent number: 8179132
    Abstract: A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring machine (CMM) and combining eddy current (EC) capabilities and CMM capabilities to form an inspection probe. The method further includes installing the inspection probe on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures at least one of internal boundaries, internal defects, surface defects, and material properties of the machine component with the EC capabilities, which are directly linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed with a CAD model to enable a direct comparison between the inspection data and the nominal requirements specified on the CAD model.
    Type: Grant
    Filed: February 18, 2009
    Date of Patent: May 15, 2012
    Assignee: General Electric Company
    Inventors: Yanyan Wu, Thomas James Batzinger, Nicholas Joseph Kray, Changting Wang, Haiyan Sun, Francis Howard Little, David Paul Lappas, David Michael Dombrowski
  • Patent number: 8041527
    Abstract: Systems and methods are disclosed for consistently translating or converting between geometric dimensioning and tolerancing information and variation parameters for a three dimensional variation analysis tool. The methods and systems may receive geometric dimensioning and tolerancing information; translate, with a computer, the received geometric dimensioning and tolerancing information into variation parameters for a three dimensional variation analysis tool; and output the variation parameters.
    Type: Grant
    Filed: June 1, 2007
    Date of Patent: October 18, 2011
    Assignee: The Boeing Company
    Inventors: James A Day, Zuozhi Zhao, Yanyan Wu, Dean M. Robinson
  • Patent number: 8020308
    Abstract: An inspection system comprises a sensor configured to acquire inspection data of the object, a motion control device, a joint assembly coupled to the motion control device, and a probe housing coupled to the joint assembly and configured to hold the sensor. The inspection system further comprises a compliant element coupled to the probe housing and configured to cooperate with the joint assembly and the motion control device to position the sensor relative to the object. A self-aligning probe assembly is also presented.
    Type: Grant
    Filed: May 29, 2009
    Date of Patent: September 20, 2011
    Assignee: General Electric Company
    Inventors: Byungwoo Lee, Yanyan Wu, Nicholas Joseph Kray
  • Patent number: 8010315
    Abstract: An inspection method is provided and includes acquiring at least one inspection data set. Each inspection data set comprises inspection data for a component. The inspection method further includes mapping the inspection data set onto a three-dimensional (3D) model of the component, to generate a 3D inspection model for the component, and validating the inspection data against the 3D model of the component using at least one validation criterion. A multi-modality inspection method is also provided and includes acquiring multiple inspection data sets corresponding to multiple inspection modalities for a component and fusing the inspection data sets to form a fused data set. The multi-modality inspection method further includes mapping the fused data set onto a 3D model of the component to generate a 3D multi-modality inspection model for the component.
    Type: Grant
    Filed: November 27, 2007
    Date of Patent: August 30, 2011
    Assignee: General Electric Company
    Inventors: Yanyan Wu, Francis Howard Little, Prabhjot Singh
  • Patent number: 7921575
    Abstract: A method is provided for assembling a measurement device for use in measuring a machine component. The method includes providing a coordinate measuring machine (CMM). The method also includes combining ultrasonic inspection (UT) capabilities and CMM capabilities to form an inspection probe. The inspection probe is installed on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures internal boundaries of the machine component with the UT capabilities.
    Type: Grant
    Filed: December 27, 2007
    Date of Patent: April 12, 2011
    Assignee: General Electric Company
    Inventors: Francis Howard Little, Yanyan Wu, Jian Li, Nicholas J. Kray
  • Patent number: 7877888
    Abstract: A method includes measuring a radius of curvature at each of the plurality of positions of the outer peripheral surface of the predetermined section of the pipe is measured through the first device. A second device is detachably coupled to the plurality of positions along the outer peripheral surface of the predetermined section of the pipe. A wall thickness at each of the plurality of positions of the outer peripheral surface of the predetermined section of the pipe is measured through the second device. A cross-sectional area of the predetermined section of the pipe is measured based on a measurement data including the radius of curvature and wall thickness at each of the plurality of positions of the outer peripheral surface of the predetermined section of the pipe.
    Type: Grant
    Filed: October 25, 2007
    Date of Patent: February 1, 2011
    Assignee: General Electric Company
    Inventors: Thomas James Batzinger, Jeffrey David Tilden, Xiaolei Shirley Ao, Waseem Ibrahim Faidi, Yanyan Wu, Nelson Raymond Corby, Jr.
  • Publication number: 20100305876
    Abstract: An inspection system comprises a sensor configured to acquire inspection data of the object, a motion control device, a joint assembly coupled to the motion control device, and a probe housing coupled to the joint assembly and configured to hold the sensor. The inspection system further comprises a compliant element coupled to the probe housing and configured to cooperate with the joint assembly and the motion control device to position the sensor relative to the object. A self-aligning probe assembly is also presented.
    Type: Application
    Filed: May 29, 2009
    Publication date: December 2, 2010
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Byungwoo Lee, Yanyan Wu, Nicholas Joseph Kray
  • Patent number: 7840367
    Abstract: An inspection artifact includes a central portion and multiple optical and coordinate measurement machine (CMM) alignment features arranged on the central portion. The optical and CMM alignment features are configured to align the coordinates for an optical or a CMM measurement system to a common coordinate system. Another inspection artifact includes a central portion and multiple computed tomography (CT) alignment features arranged on the central portion. The CT alignment features are configured to align the coordinates for a CT system to a common coordinate system.
    Type: Grant
    Filed: November 28, 2007
    Date of Patent: November 23, 2010
    Assignee: General Electric Company
    Inventors: Francis Howard Little, Yanyan Wu, Prabhjot Singh
  • Publication number: 20100205816
    Abstract: A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring device, such as a coordinate measuring machine (CMM), and integrating with a plurality of nondestructive examination (NDE) capabilities with a plurality of coordinate measuring device capabilities to form an inspection probe. The method further includes integrating the NDE inspection probe with the coordinate measuring device such that the inspection probe substantially simultaneously measures a plurality of NDE measurements and external/internal geometry and defects of machine component, which are linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed together with a CAD model to enable a direct comparison between the inspection data and the nominal requirements carried on the CAD model.
    Type: Application
    Filed: February 18, 2009
    Publication date: August 19, 2010
    Inventors: Yanyan Wu, Dean Michael Robinson, Shridhar Nath, Nicholas Joseph Kray
  • Publication number: 20100207619
    Abstract: A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring machine (CMM) and combining eddy current (EC) capabilities and CMM capabilities to form an inspection probe. The method further includes installing the inspection probe on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures at least one of internal boundaries, internal defects, surface defects, and material properties of the machine component with the EC capabilities, which are directly linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed with a CAD model to enable a direct comparison between the inspection data and the nominal requirements specified on the CAD model.
    Type: Application
    Filed: February 18, 2009
    Publication date: August 19, 2010
    Inventors: Yanyan Wu, Thomas James Batzinger, Nicholas Joseph Kray, Changting Wang, Haiyan Sun, Francis Howard Little, David Paul Lappas, David Michael Dombrowski
  • Publication number: 20100126277
    Abstract: An ultrasound inspection system is provided for inspecting an object. The inspection system includes an ultrasound probe configured to scan the object and acquire a plurality of ultrasound scan data. The inspection system further includes a processor coupled to the ultrasound probe and configured to apply a transfer function to the ultrasound scan data to compensate for distortion of a plurality of ultrasound signals through the object and thereby generate a plurality of compensated ultrasound scan data, and to process the compensated ultrasonic scan data to characterize a feature in the object.
    Type: Application
    Filed: November 25, 2008
    Publication date: May 27, 2010
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Yanyan Wu, Edward James Nieters, Thomas James Batzinger, Nicholas Joseph Kray, James Norman Barshinger, Jian Li, Waseem Ibrahim Faidi, Prabhjot Singh, Francis Howard Little, Michael Everett Keller, Timothy Jesse Sheets
  • Publication number: 20100124369
    Abstract: A method for determining 3D distances on a 2D pixelized image of a part or object includes acquiring a real 2D pixelized image of the object, creating a simulated image of the object using the 3D CAD model and the 2D pixelized image, determining a specified cost function comparing the simulated image with the real 2D pixilated image and repositioning the simulated image in accordance with iterated adjustments of a relative position between the CAD model and the XID pixilated image to change the simulated image until the specified cost function is below a specified value. Then, the workstation is used to generate a 3D distance scale matrix using the repositioned simulated image, and to measure and display distances between selected pixels on a surface of the real image using 2D distances on the 2D pixelized image of the object and the 3D distance scale matrix.
    Type: Application
    Filed: November 20, 2008
    Publication date: May 20, 2010
    Inventors: Yanyan Wu, Donald Robert Howard, Harry Israel Ringermacher, Robert August Kaucic, Zhaohui Sun, Francis Howard Little, Xiaodong Tao, Patrick Joseph Howard, Matthew Edward Dragovich, Eric Scott Foster
  • Publication number: 20090136114
    Abstract: An inspection method is provided and includes acquiring at least one inspection data set. Each inspection data set comprises inspection data for a component. The inspection method further includes mapping the inspection data set onto a three-dimensional (3D) model of the component, to generate a 3D inspection model for the component, and validating the inspection data against the 3D model of the component using at least one validation criterion. A multi-modality inspection method is also provided and includes acquiring multiple inspection data sets corresponding to multiple inspection modalities for a component and fusing the inspection data sets to form a fused data set. The multi-modality inspection method further includes mapping the fused data set onto a 3D model of the component to generate a 3D multi-modality inspection model for the component.
    Type: Application
    Filed: November 27, 2007
    Publication date: May 28, 2009
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Yanyan Wu, Francis Howard Little, Prabhjot Singh
  • Publication number: 20090138231
    Abstract: An inspection artifact includes a central portion and multiple optical and coordinate measurement machine (CMM) alignment features arranged on the central portion. The optical and CMM alignment features are configured to align the coordinates for an optical or a CMM measurement system to a common coordinate system. Another inspection artifact includes a central portion and multiple computed tomography (CT) alignment features arranged on the central portion. The CT alignment features are configured to align the coordinates for a CT system to a common coordinate system.
    Type: Application
    Filed: November 28, 2007
    Publication date: May 28, 2009
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Francis Howard Little, Yanyan Wu, Prabhjot Singh
  • Publication number: 20090112509
    Abstract: A method includes measuring a radius of curvature at each of the plurality of positions of the outer peripheral surface of the predetermined section of the pipe is measured through the first device. A second device is detachably coupled to the plurality of positions along the outer peripheral surface of the predetermined section of the pipe. A wall thickness at each of the plurality of positions of the outer peripheral surface of the predetermined section of the pipe is measured through the second device. A cross-sectional area of the predetermined section of the pipe is measured based on a measurement data including the radius of curvature and wall thickness at each of the plurality of positions of the outer peripheral surface of the predetermined section of the pipe.
    Type: Application
    Filed: October 25, 2007
    Publication date: April 30, 2009
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Thomas James Batzinger, Jeffrey David Tilden, Xiaolei Shirley Ao, Waseem Ibrahim Faidi, Yanyan Wu, Nelson Raymond Corby, JR.
  • Publication number: 20080300711
    Abstract: Systems and methods are disclosed for consistently translating or converting between geometric dimensioning and tolerancing information and variation parameters for a three dimensional variation analysis tool. The methods and systems may receive geometric dimensioning and tolerancing information; translate, with a computer, the received geometric dimensioning and tolerancing information into variation parameters for a three dimensional variation analysis tool; and output the variation parameters.
    Type: Application
    Filed: June 1, 2007
    Publication date: December 4, 2008
    Inventors: James A. Day, Zuozhi Zhao, Yanyan Wu, Dean M. Robinson
  • Patent number: 7433385
    Abstract: In a CDMA communication system, stations operating in the same area transmit to a receiver using a common carrier frequency. Each station transmits a plurality of bits in parallel using orthogonal spreading signals. These spreading signals are used by the stations in time-offset manner so that the transmissions from the stations are mutually orthogonal. The spreading signals may be generated by phase modulating a common spreading sequence so that the spectra of the spreading signals rotate at different rates.
    Type: Grant
    Filed: September 20, 2000
    Date of Patent: October 7, 2008
    Assignee: Nokia Corporation
    Inventor: Yanyan Wu
  • Patent number: 7058091
    Abstract: A method of mapping internet protocol (IP) based data and signalling data for a forming a single connection between a mobile handsets in a code division multiple access (CDMA) system. Two or more sets of physical channels are used, in which each of the physical channels in each set has the same spreading factor as other physical channels in that set. The IP-based data including header data and application data, each of the header data, signalling data and application data are assigned to at least one transport channel (“TrCH”). At least a first one of the transport channels is mapped to a first one of the sets of physical channels. Simultaneously, at least a second one of the transport channels is mapped to a second one of the sets of physical channels.
    Type: Grant
    Filed: November 8, 2001
    Date of Patent: June 6, 2006
    Assignee: Nokia Corporation
    Inventors: Harri Honksasalo, Yanyan Wu, Anu Virtanen
  • Publication number: 20050250462
    Abstract: An automatic gain control circuit is used to vary the gain of a low noise amplifier and baseband amplifiers in a direct conversion receiver in a mobile telephone handset. The automatic gain control circuit is configured to cause a power level (57) of a signal supplied to an analog-to-digital converter having a signal-to-noise ratio of 33 dB to converge on a reference level (49) using a two-stage process.
    Type: Application
    Filed: August 19, 2003
    Publication date: November 10, 2005
    Inventors: YanYan Wu, Derya Olgen, Ken Mason