Patents by Inventor Yasuji Seko
Yasuji Seko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8170329Abstract: A position measuring system includes: an image capturing unit that captures reference points provided on an object, the reference points composed of at least four first reference points provided respectively at vertices of a polygon or at vertices and a barycenter of a polygon and at least one second reference point provided so as to have a specific positional relationship with respect to the first reference points; an identification unit that identifies images of the first reference points and the second reference point captured by the image capturing unit, on the basis of positional relationships between the images of the first reference points and the second reference point; and a calculation unit that calculates a three-dimensional position and three-axial angles of the object on the basis of positional relationships of the images of the first reference points identified by the identification unit.Type: GrantFiled: March 5, 2009Date of Patent: May 1, 2012Assignee: Fuji Xerox Co., Ltd.Inventors: Yasuji Seko, Hiroyuki Hotta, Yasuyuki Saguchi
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Publication number: 20110063435Abstract: A position measuring target includes four or more reference points and a plurality of shading pattern portions. The four or more reference points are defined on a plane. The references points have positional relationships among them. The plurality of shading pattern portions corresponds a plurality of geometric curved surfaces in relation to the degree of shading used for defining the reference points.Type: ApplicationFiled: March 30, 2010Publication date: March 17, 2011Applicant: FUJI XEROX CO., LTD.Inventor: YASUJI SEKO
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Patent number: 7830605Abstract: A longitudinal interference fringe pattern projection lens with a lens body is provided. The lens body includes a lens first surface that has two convex portions or two concave portions that extend in parallel to each other in a constant direction and have the same shape, and a lens second surface. Laser light passing through one convex or concave portion interferes with laser light passing through the other convex or concave portion to form a longitudinal interference fringe pattern.Type: GrantFiled: May 18, 2007Date of Patent: November 9, 2010Assignee: Fuji Xerox Co., Ltd.Inventor: Yasuji Seko
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Publication number: 20100231709Abstract: A position measurement system includes a marker set attached to an object, a camera and a computing apparatus. The marker set includes three or more directed basic markers each having a shape indicating a direction. The directed basic markers are oriented in directions toward a specific point. A positional relationship among the directed basic markers is known. The camera includes a two-dimensional imaging device configured to take an image of the marker set. The computing apparatus computes at least one of a position of the object and an angle of the object based on an image, taken by the camera, of the directed basic markers, which are oriented in the directions toward the specific point.Type: ApplicationFiled: August 21, 2009Publication date: September 16, 2010Applicant: Fuji Xerox Co., Ltd.Inventors: Yasuji Seko, Hiroyuki Hotta, Yasuyuki Saguchi
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Patent number: 7791736Abstract: A position measurement system for measuring positional coordinates of a point under measurement includes a first noise removal unit, a parameter determination unit and a second noise removal unit. The first noise removal unit removes noise from the measured positional coordinates to acquire first positional coordinate values. The parameter determination unit determines a noise removal parameter on a basis of the first positional coordinate values. The second noise removal unit again removes noise from the first positional coordinate values with using the noise removal parameter, to acquire second positional coordinate values.Type: GrantFiled: July 24, 2009Date of Patent: September 7, 2010Assignee: Fuji Xerox Co., Ltd.Inventors: Yasuji Seko, Yoshinori Yamaguchi, Yasuyuki Saguchi
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Patent number: 7742895Abstract: The position measurement system includes: an image capturing unit capturing first reference points which are three reference points on a plane arranged on a target and whose positional relation with each other is specified, and a second reference point which is a single reference point at a distance away from the plane and whose positional relation with the first reference points is specified; an identifying unit identifying images of the first and second reference points based on the positional relation among the images; and a calculating unit calculating a three-dimensional position and triaxial angles of the target based on the positional relation between the images of the first and second reference points. The calculating unit specifies the plane including the first reference points on the target from the images of the first reference points and a normal direction of the plane according to the image of the second reference point.Type: GrantFiled: April 8, 2008Date of Patent: June 22, 2010Assignee: Fuji Xerox Co., Ltd.Inventors: Yasuji Seko, Hiroyuki Hotta, Yasuyuki Saguchi
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Publication number: 20100014750Abstract: A position measuring system includes: an image capturing unit that captures reference points provided on an object, the reference points composed of at least four first reference points provided respectively at vertices of a polygon or at vertices and a barycenter of a polygon and at least one second reference point provided so as to have a specific positional relationship with respect to the first reference points; an identification unit that identifies images of the first reference points and the second reference point captured by the image capturing unit, on the basis of positional relationships between the images of the first reference points and the second reference point; and a calculation unit that calculates a three-dimensional position and three-axial angles of the object on the basis of positional relationships of the images of the first reference points identified by the identification unit.Type: ApplicationFiled: March 5, 2009Publication date: January 21, 2010Applicant: Fuji Xerox Co., Ltd.Inventors: Yasuji SEKO, Hiroyuki Hotta, Yasuyuki Saguchi
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Publication number: 20090310142Abstract: A position measurement system for measuring positional coordinates of a point under measurement includes a first noise removal unit, a parameter determination unit and a second noise removal unit. The first noise removal unit removes noise from the measured positional coordinates to acquire first positional coordinate values. The parameter determination unit determines a noise removal parameter on a basis of the first positional coordinate values. The second noise removal unit again removes noise from the first positional coordinate values with using the noise removal parameter, to acquire second positional coordinate values.Type: ApplicationFiled: July 24, 2009Publication date: December 17, 2009Applicant: Fuji Xerox Co., Ltd.Inventors: Yasuji Seko, Yoshinori Yamaguchi, Yasuyuki Saguchi
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Patent number: 7633628Abstract: An optical lens system includes a lens surface capable of forming concentric interference patterns on an object as if light emitted from a single light source were virtually emitted from two or more light sources within a plane containing an optical axis of the single light source.Type: GrantFiled: December 19, 2008Date of Patent: December 15, 2009Assignee: Fuji Xerox Co., Ltd.Inventor: Yasuji Seko
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Patent number: 7583388Abstract: A position measurement system for measuring positional coordinates of a point under measurement includes a first noise removal unit, a parameter determination unit and a second noise removal unit. The first noise removal unit removes noise from the measured positional coordinates to acquire first positional coordinate values. The parameter determination unit determines a noise removal parameter on a basis of the first positional coordinate values. The second noise removal unit again removes noise from the first positional coordinate values with using the noise removal parameter, to acquire second positional coordinate values.Type: GrantFiled: June 12, 2006Date of Patent: September 1, 2009Assignee: Fuji Xerox Co., Ltd.Inventors: Yasuji Seko, Yoshinori Yamaguchi, Yasuyuki Saguchi
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Patent number: 7562821Abstract: A position measurement system, includes: a plurality of concentric pattern projectors each for projecting a concentric pattern; an image sensor that has a sensor plane and that detects the concentric pattern; and an arithmetic unit that calculates a position of the image sensor and a normal direction of the sensor plane from a detection signal of the image sensor.Type: GrantFiled: February 14, 2006Date of Patent: July 21, 2009Assignee: Fuji Xerox Co., Ltd.Inventors: Yasuji Seko, Tsutomu Abe, Yoshinori Yamaguchi, Hiroyuki Miyake
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Patent number: 7554676Abstract: A positional measurement system includes an electromagnetic wave source which emits an electromagnetic wave, a lens system which has a first lens surface, an electromagnetic wave shield section provided around a center axis of the first lens surface, and a second lens surface, and causes the electromagnetic wave having entered by way of the first lens surface exclusive of the electromagnetic wave shield section to exit from the second lens surface, to form an electromagnetic wave concentrated area at a position opposite the electromagnetic wave source, a receiving device which detects the electromagnetic wave concentrated area formed by the lens system, and a computing device which measures a position of the electromagnetic wave source based on information detected by the receiving device on the electromagnetic wave concentrated area.Type: GrantFiled: September 15, 2004Date of Patent: June 30, 2009Assignee: Fuji Xerox Co., Ltd.Inventor: Yasuji Seko
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Publication number: 20090103104Abstract: An optical lens system includes a lens surface capable of forming concentric interference patterns on an object as if light emitted from a single light source were virtually emitted from two or more light sources within a plane containing an optical axis of the single light source.Type: ApplicationFiled: December 19, 2008Publication date: April 23, 2009Applicant: FUJI XEROX CO., LTD.Inventor: Yasuji SEKO
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Publication number: 20090070065Abstract: The position measurement system includes: an image capturing unit capturing first reference points which are three reference points on a plane arranged on a target and whose positional relation with each other is specified, and a second reference point which is a single reference point at a distance away from the plane and whose positional relation with the first reference points is specified; an identifying unit identifying images of the first and second reference points based on the positional relation among the images; and a calculating unit calculating a three-dimensional position and triaxial angles of the target based on the positional relation between the images of the first and second reference points. The calculating unit specifies the plane including the first reference points on the target from the images of the first reference points and a normal direction of the plane according to the image of the second reference point.Type: ApplicationFiled: April 8, 2008Publication date: March 12, 2009Applicant: FUJI XEROX CO., LTD.Inventors: Yasuji Seko, Hiroyuki Hotta, Yasuyuki Saguchi
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Patent number: 7489406Abstract: An optical lens system includes a lens surface capable of forming concentric interference patterns on an object as if light emitted from a single light source were virtually emitted from two or more light sources within a plane containing an optical axis of the single light source.Type: GrantFiled: August 13, 2007Date of Patent: February 10, 2009Assignee: Fuji Xerox Co., Ltd.Inventor: Yasuji Seko
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Patent number: 7474418Abstract: A position measurement system includes a photographing unit and an arithmetic processing unit. The photographing unit has a lens and a light-receiving element. The lens forms an optical ring image from light from a light source through spherical aberration. The light-receiving element detects the optical ring image formed by the lens. The arithmetic processing unit measures a distance to the light source on the basis of the quantity of light of the optical ring image detected by the light-receiving element.Type: GrantFiled: August 19, 2005Date of Patent: January 6, 2009Assignee: Fuji Xerox Co., Ltd.Inventors: Yasuji Seko, Yoshinori Yamaguchi, Hiroyuki Miyake
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Publication number: 20080112054Abstract: A longitudinal interference fringe pattern projection lens includes: a lens body; a lens first surface that constitutes one surface of the lens body, and that has two convex or concave portions, which extend in parallel to each other in constant direction and have a same shape; and a lens second surface that constitutes the other surface of the lens body, wherein laser light passing through one convex or concave portion interferes with laser light passing through the other convex or concave portion to form a longitudinal interference fringe pattern.Type: ApplicationFiled: May 18, 2007Publication date: May 15, 2008Applicant: FUJI XEROX CO., LTD.Inventor: Yasuji Seko
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Patent number: 7360708Abstract: An information processing method using a terminal apparatus, including: applying light with a concentric ring-like interference fringe pattern on one of subjects by using a pointer provided in the terminal apparatus; detecting the interference fringe pattern by using a detector; calculating an optical axis of the pointer on the basis of a detection signal obtained from the detector; specifying attribute information of the subject on the basis of arrangement information of the subject intersected by the optical axis in the condition that arrangement information of the subjects and attribute information of the subjects are stored in a storage device in advance while the arrangement information of each subject and the attribute information of the subject are associated with each other; and displaying the attribute information of the specified subject on the terminal apparatus.Type: GrantFiled: April 11, 2006Date of Patent: April 22, 2008Assignee: Fuji Xerox Co., Ltd.Inventors: Hiroyuki Miyake, Yasuji Seko, Yoshinori Yamaguchi, Shoji Sakamoto
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Publication number: 20070291278Abstract: An optical lens system includes a lens surface capable of forming concentric interference patterns on an object as if light emitted from a single light source were virtually emitted from two or more light sources within a plane containing an optical axis of the single light source.Type: ApplicationFiled: August 13, 2007Publication date: December 20, 2007Applicant: FUJI XEROX CO., LTD.Inventor: Yasuji SEKO
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Patent number: 7274461Abstract: An optical lens system includes a lens surface capable of forming concentric interference patterns on an object as if light emitted from a single light source were virtually emitted from two or more light sources within a plane containing an optical axis of the single light source.Type: GrantFiled: December 17, 2004Date of Patent: September 25, 2007Assignee: Fuji Xerox Co., Ltd.Inventor: Yasuji Seko