Abstract: A position measurement system for measuring positional coordinates of a point under measurement includes a first noise removal unit, a parameter determination unit and a second noise removal unit. The first noise removal unit removes noise from the measured positional coordinates to acquire first positional coordinate values The parameter determination unit determines a noise removal parameter on a basis of the first positional coordinate values. The second noise removal unit again removes noise from the first positional coordinate values with using the noise removal parameter, to acquire second positional coordinate values.

Abstract: A position measurement system, includes: a plurality of concentric pattern projectors each for projecting a concentric pattern; an image sensor that has a sensor plane and that detects the concentric pattern; and an arithmetic unit that calculates a position of the image sensor and a normal direction of the sensor plane from a detection signal of the image sensor.

Abstract: An information processing method using a terminal apparatus, including: applying light with a concentric ring-like interference fringe pattern on one of subjects by using a pointer provided in the terminal apparatus; detecting the interference fringe pattern by using a detector; calculating an optical axis of the pointer on the basis of a detection signal obtained from the detector; specifying attribute information of the subject on the basis of arrangement information of the subject intersected by the optical axis in the condition that arrangement information of the subjects and attribute information of the subjects are stored in a storage device in advance while the arrangement information of each subject and the attribute information of the subject are associated with each other; and displaying the attribute information of the specified subject on the terminal apparatus.

Abstract: A position measurement system includes a photographing unit and an arithmetic processing unit. The photographing unit has a lens and a light-receiving element. The lens forms an optical ring image from light from a light source through spherical aberration. The light-receiving element detects the optical ring image formed by the lens. The arithmetic processing unit measures a distance to the light source on the basis of the quantity of light of the optical ring image detected by the light-receiving element.

Abstract: A position measuring system including a laser light source for radiating a laser beam, an optical lens system for generating an interference pattern on the basis of the laser beam having passed through different optical paths, a detector for detecting the interference pattern, and an arithmetic unit for calculating the position of at least one of the light source and the detector on the basis of a detection signal issued from the detector. For example, a spherical lens can be used as the optical lens system. In this case, the interference pattern is formed on the basis of spherical aberration of the lens. Alternatively, a multifocal lens may be used as the optical lens system.

Abstract: A position measurement system optically measures a position of an object in a simple manner at low cost. The position measurement system includes: a light source; an optical lens with a large spherical aberration which transmits light from the light source and forms a light ring due to its spherical aberration; a light receiving device (CCD sensor) which detects the light ring as formed by the optical lens; and a calculator which measures a position of the light source according to detected information on the light ring as detected by the CCD sensor. An optical mirror with a large spherical aberration may be used instead of the optical lens.

Abstract: An optical lens system includes a lens surface capable of forming concentric interference patterns on an object as if light emitted from a single light source were virtually emitted from two or more light sources within a plane containing an optical axis of the single light source.

Abstract: A positional measurement system includes an electromagnetic wave source which emits an electromagnetic wave, a lens system which has a first lens surface, an electromagnetic wave shield section provided around a center axis of the first lens surface, and a second lens surface, and causes the electromagnetic wave having entered by way of the first lens surface exclusive of the electromagnetic wave shield section to exit from the second lens surface, to form an electromagnetic wave concentrated area at a position opposite the electromagnetic wave source, a receiving device which detects the electromagnetic wave concentrated area formed by the lens system, and a computing device which measures a position of the electromagnetic wave source based on information detected by the receiving device on the electromagnetic wave concentrated area.

Abstract: A master device and a slave device are each constituted of a transmitting section; a receiving section; and a control section including a three-dimensional position calculation section for calculating a three-dimensional position of the transmitting section of the counterpart master device or that of the counterpart slave device and an element drive section for driving an MEMS element. First, the master device outputs transmission light having comparatively narrow directivity, and the transmission light is two-dimensionally scanned. Next, the receiving section of the slave device receives that transmission light, calculates the transmission direction of the master device from the position of a spot of transmitted light on a light-detecting element array, and transmits the transmission light in that direction. At this point in time, scanning of the transmission light from the master device is stopped, and subsequently communication is initiated.

Abstract: A position measurement system optically measures a position of an object in a simple manner at low cost. The position measurement system includes: a light source; an optical lens with a large spherical aberration which transmits light from the light source and forms a light ring due to its spherical aberration; a light receiving device (CCD sensor) which detects the light ring as formed by the optical lens; and a calculator which measures a position of the light source according to detected information on the light ring as detected by the CCD sensor. An optical mirror with a large spherical aberration may be used instead of the optical lens.

Abstract: A position measuring system including a laser light source for radiating a laser beam, an optical lens system for generating an interference pattern on the basis of the laser beam having passed through different optical paths, a detector for detecting the interference pattern, and an arithmetic unit for calculating the position of at least one of the light source and the detector on the basis of a detection signal issued from the detector. For example, a spherical lens can be used as the optical lens system. In this case, the interference pattern is formed on the basis of spherical aberration of the lens. Alternatively, a multifocal lens may be used as the optical lens system.

Abstract: Provided is a semiconductor device that has pseudo lattice matched layers with good crystallinity, formed with lattice mismatched materials. Tensile-strained n-type Al0.5Ga0.5N layers (lower side) and compressive-strained n-type Ga0.9In0.1N layers (upper side) are grown on a GaN crystal layer substrate in 16.5 periods to form an n-type DBR mirror; an undoped GaN spacer layer and an active region are grown on the n-type DBR mirror; and an undoped a GaN spacer layer is grown on the active region. Further, tensile-strained p-type Al0.5Ga0.5N layers (lower side) and compressive-strained p-type Ga0.9In0.1N layers (upper side) are grown on the spacer layer in 12 periods to form a p-type DBR mirror and eventually complete a surface emitting semiconductor laser.

Abstract: A surface emitting semiconductor laser and a surface emitting semiconductor laser array having a photodetector capable of monitoring the light output of a laser easily at a high speed without deteriorating the performance of a surface emitting laser. An n type GaAs optical absorbing layer having an opening in the center of a waveguide path is inserted between the p type DBR layer and the spacer layer of the surface emitting semiconductor laser as a light receiving part and a PD electrode which takes out electrons generated in this optical absorbing layer is formed on the optical absorbing layer.

Abstract: A semiconductor device includes a light-emitting element array including plural light-emitting elements and being formed on a semiconductor substrate, a switching element array formed on the semiconductor substrate monolithically with the light-emitting element array, and including switching elements laid out in a matrix form and each having an input end, an output end and a control end with one of the input end and the output end being connected to any one of the plural light-emitting elements, first connection means for connecting the control end of each of the plural switching elements disposed in the same column or the other of the input end and the output end thereof to a first external connection end different per the same column, and second connection means for connecting the control end of each of the plurality of switching elements disposed in the same column or one side of the other of the input end and the output end thereof not being connected to the first external connection end to a second exter

Abstract: A surface emitting semiconductor laser comprises a semiconductor multilayer reflecting film of a first conductivity type, a quantum well active layer having at least one quantum well structure, a semiconductor multilayer reflecting film of a second conductivity type and a contact layer of the second conductivity type sequentially stacked in a layered manner inside a concavity formed on a surface of a semiconductor substrate. The contact layer of the second conductivity type is formed in a buried manner so that the surface of the contact layer is approximately flush with the surface of the semiconductor substrate. A second electrode is formed on a part of the surface of the contact layer other than a part left for forming a light guiding region thereon.

Abstract: Described is an optical equipment using a semiconductor light emitting device array which has light emitting points formed thereon at a high density and has highly reliability. The optical equipment according to the present invention features that it is equipped with a light emitting device array on which light emitting points LP have been arranged two-dimensionally, focusing means for focusing the light from the light emitting points, photo-detecting means which is disposed at the position where the light focused through the focusing means forms image formation points, and transferring means for transferring the image formation points relative to the photo-detecting means; said light-emitting device array being composed of a plurality of semiconductor chips and adjacent end surfaces of two semiconductor chips being bonded each other so as to have an inclination against the transferring direction.

Abstract: Laser elements are arranged in two dimensions in an elongated region which is longer in the horizontal direction than in the vertical direction, wherein n laser elements are arranged in the horizontal direction, while m laser elements in the vertical direction, where n>m. The anode wiring extends to a direction which is inclined to the horizontal direction and the cathode wiring extends to another direction inclined to the horizontal direction, thereby the anode wiring and the cathode wiring crossing with each other. The anodes of m laser elements in maximum arranged in the direction of the anode wiring are connected to an anode wire, while the cathodes of m laser elements in maximum arranged in the cathode wiring are connected to a cathode wire.

Abstract: An image recording apparatus has an array light source having a plurality of light-emitting elements arrayed in a predetermined density; a photosensitive member exposed to light beams emitted from the plural light-emitting elements so that images are recorded by fixing a traveling path of the light beams from the plural light-emitting elements to the photosensitive member and by moving the photosensitive member relative to the array light source; a beam-converging unit which intercrosses a bundle of the light beams emitted from the light-emitting elements onto a beam-conversion point; and an focusing unit disposed between the beam-converging unit and the photosensitive member, which images the light beams emitted from the plural of light-emitting elements and intercrossed by the beam-converging unit onto the photosensitive member.

Abstract: An apparatus for correcting positional deviation of the light source emitting light beams in an image recording apparatus is disclosed which corrects change of the image size (dimensions of the image) on the photosensitive member due to positional deviations of beam spots on the photosensitive member on account of physical distortions caused by external vibration, temperature change, and the like. Changes in the diameter of detective light beams are measured by photodetecting portions 5.sub.R and 5.sub.L and piezoelectric devices 6a and 6b are driven based on the results of the detection, whereby the semiconductor laser array 1 is moved so that the multiplication b/a for the image size may be kept constant.

Abstract: A semiconductor laser array driving method for driving a semiconductor laser array having a plurality of light-emitting points arranged on a base member. The semiconductor laser array driving method has a step of driving the plurality of light-emitting points by a driving pulse current of a pulse width and a duty factor meeting an inequality: .DELTA.T.sub.1 /.DELTA.T.sub.0 <1/2, where .DELTA.T.sub.0 is a temperature rise in active layers of the light-emitting points when the semiconductor laser array is driven in a continuous drive mode using a continuous current, and .DELTA.T.sub.1 is a temperature rise in the active layers of the light-emitting points when the semiconductor laser array is driven in a pulse drive mode using a pulse current. In the semiconductor laser array driving method, the plurality of light-emitting points are driven by a driving pulse current having a duty factor of 0.4 or below meeting an inequality: y<3.1 exp(-8.9x), where x is a duty factor and y is a pulse width (.mu.s).