Abstract: Disclosed are a display panel and a display device. The display panel includes M rows and N columns of pixel units. The display panel is divided into R regions along a column direction, and an i-th region includes: (1+M(i?1)/R)-th row to a (Mi/R)-th row of pixel units. The display panel further includes M shift registers, M light emitting drivers, R light emitting control scan staring signal terminals, R scan start signal terminals for controlling time length and R scan start signal terminals for controlling current. An i-th row of pixel units is connected with an i-th shift register and an i-th light emitting driver, a light emitting driver connected to a first row of pixel units in the i-th region is connected with an i-th scan start signal terminal for controlling light emission.

Abstract: The present disclosure provides a shift register unit and a driving method thereof, a gate driving circuit and a driving method thereof, and a display device. The shift register unit includes: a first shift register, a second shift register and a switch control circuit, signal input terminals of the first and second shift registers are coupled to a cascade signal input terminal through the switch control circuit, the switch control circuit is configured to allow a current between the signal input terminal of the first shift register and the cascade signal input terminal or not, and allow a current between the signal input terminal of the second shift register and the cascade signal input terminal or not; the first shift register and the second shift register are configured such that at least one of them operates upon receiving a cascade signal provided by the cascade signal input terminal.

Abstract: The present invention relates to a locking mechanism for a press head, and an electronic device testing apparatus comprising the same, wherein a slider and a locking pin are disposed on the press head and a test socket substrate, respectively. When the press head is moved and engaged with the test socket substrate, an actuator drives the slider to secure the locking pin, so as to secure the press head and the test socket substrate and prevent the press head and the test socket substrate from being separated from each other. The mechanism is simple in construction, easy to install and maintain, reliable, and can be integrated into the support arms, and occupies a relatively small space. Energy is consumed only when the actuator is actuated to effect locking or unlocking. That is, only when the slider is driven and moved, energy is consumed. No extra energy is needed to persistently press down or drive the locking mechanism.

Abstract: Disclosed is a display substrate including a base substrate, and gate lines, data lines, common electrode lines and common electrodes on the base substrate; the gate lines and the data lines intersect to define pixel areas; the common electrodes are located in the pixel areas; the gate lines and the common electrode lines are alternately arranged one by one; each common electrode lines includes target wire segments and non-target wire segments, the target wire segments are wire segments where the common electrode lines and the data lines intersect, and the non-target wire segments are wire segments on the common electrode line except the target wire segments; and for each common electrode line, a distance between any position point on the target wire segment and a target gate line is less than a distance between the non-target wire segment and the target gate line.

Abstract: Disclosed is a display substrate including a base substrate, and gate lines, data lines, common electrode lines and common electrodes on the base substrate; the gate lines and the data lines intersect to define pixel areas; the common electrodes are located in the pixel areas; the gate lines and the common electrode lines are alternately arranged one by one; each common electrode lines includes target wire segments and non-target wire segments, the target wire segments are wire segments where the common electrode lines and the data lines intersect, and the non-target wire segments are wire segments on the common electrode line except the target wire segments; and for each common electrode line, a distance between any position point on the target wire segment and a target gate line is less than a distance between the non-target wire segment and the target gate line.

Abstract: The present invention relates to a locking mechanism for a press head, and an electronic device testing apparatus comprising the same, wherein a slider and a locking pin are disposed on the press head and a test socket substrate, respectively. When the press head is moved and engaged with the test socket substrate, an actuator drives the slider to secure the locking pin, so as to secure the press head and the test socket substrate and prevent the press head and the test socket substrate from being separated from each other. The mechanism is simple in construction, easy to install and maintain, reliable, and can be integrated into the support arms, and occupies a relatively small space. Energy is consumed only when the actuator is actuated to effect locking or unlocking. That is, only when the slider is driven and moved, energy is consumed. No extra energy is needed to persistently press down or drive the locking mechanism.

Abstract: Disclosed are a display panel and a display device. The display panel includes M rows and N columns of pixel units. The display panel is divided into R regions along a column direction, and an i-th region includes: (1+M(i?1)/R)-th row to a (Mi/R)-th row of pixel units. The display panel further includes M shift registers, M light emitting drivers, R light emitting control scan staring signal terminals, R scan start signal terminals for controlling time length and R scan start signal terminals for controlling current. An i-th row of pixel units is connected with an i-th shift register and an i-th light emitting driver, a light emitting driver connected to a first row of pixel units in the i-th region is connected with an i-th scan start signal terminal for controlling light emission.

Abstract: A robot arm and a transfer robot are disclosed. In one embodiment, a robot arm includes an arm body and a plurality of adjustment units. The arm body has a first carrying surface and defines a length direction along which a length of the arm body is in and a width direction along which a width of the arm body is in. The adjustment units is disposed on at least one side of the arm body in the width direction. Each adjustment unit includes: a connection member fixed to the arm body, and an adjustment member movably connected to the connection member and having a second carrying surface that is parallel to the first carrying surface. The adjustment member is movable relative to the connection member in the width direction so that the second carrying surface is adjustable in the width direction.

Abstract: The invention relates to a sliding test device for electronic components, which mainly comprises a base, a sliding frame and a pressing member, wherein an electronic component to be tested is placed in a chip receiving module of the base, and the sliding frame is slidably moved with respect to the base under sliding engagement between a first sliding guide and a second sliding guide so that a pressing block of the pressing member is aligned with the electronic component presses the electronic component. According to the present invention, the pressing member presses the electronic component and exerts a sufficient contact force on the electronic component, and a reaction force caused by the contact force and the elastic restoring force of probes is internally balanced in the device.

Abstract: A robot arm and a transfer robot are disclosed. In one embodiment, a robot arm includes an arm body and a plurality of adjustment units. The arm body has a first carrying surface and defines a length direction along which a length of the arm body is in and a width direction along which a width of the arm body is in. The adjustment units is disposed on at least one side of the arm body in the width direction. Each adjustment unit includes: a connection member fixed to the arm body, and an adjustment member movably connected to the connection member and having a second carrying surface that is parallel to the first carrying surface. The adjustment member is movable relative to the connection member in the width direction so that the second carrying surface is adjustable in the width direction.

Abstract: The application discloses a radio frequency identification (RFID) tag reading system, an RFID reading-writing apparatus and an RFID tag reading method. According to an embodiment of the RFID tag reading system, an RFID tag is attached to a side surface of a sample vessel and stores preset information indicating a unique identity of one or more biological samples loaded in the sample vessel. When an RFID reading-writing apparatus and the sample vessel are arranged on a same bench, and a distance between the RFID reading-writing apparatus and the RFID tag is less than or equal to a preset induction distance, the RFID reading-writing apparatus can read the preset information stored in the RFID tag through an induction field which is generated on a side of the RFID reading-writing apparatus and can emit radio frequency signals along a substantially horizontal direction.

Abstract: Embodiments of the present invention provide an array substrate and a method of producing the same, a display panel and a display device, solving problems of detaching of film formed by CVD in the array substrate in prior art. The array substrate includes a plurality of data lines and a plurality of gate lines that are disposed in cross orientation. The array substrate further includes: a conductive repairing structure located at a damaged region of the data line and/or a damaged region of the gate line; and an insulating protective film configured to cover a region where at least one conductive repairing structure is located. As the region where the at least one conductive repairing structure is located is covered by the insulating protective film, the conductive repairing structure covered by the insulating protective film is not prone to be detached off.

Abstract: Methods, machines, and stored instructions are provided for determining hierarchical paths to nodes based on stored information about the nodes. A node analyzer analyzes a hierarchy to create mappings that represent the hierarchy. The mappings may include a “parent mapping” that maps selected-level nodes to parent nodes of the selected-level nodes, and a “path mapping” that maps a plurality of nodes other than the selected-level nodes to a plurality of paths, within the hierarchy, to the plurality of nodes. A path module then determines path(s) to specified node(s) at least in part by mapping the specified node(s) to particular parent node(s) of the specified node(s) using the parent mapping. The path module also maps the particular parent node(s) to particular path(s) using the path mapping. The information from the path and parent mappings may be assembled to form path(s) within the hierarchy to the specified node(s).

Abstract: An automatic retest method for a system-level IC test equipment and the IC test equipment is disclosed, wherein the IC test equipment includes multiple testing units, a loading/unloading unit, and a processing unit; each testing unit is capable of testing an IC individually and has a pass rate. When the testing unit finishes a test operation, it will send test report of the IC to the processing unit. The processing unit will determine whether the IC has reached a pass threshold of the testing unit. The processing unit will issue a command, according to a predetermined rule, to transfer the IC that failed to reach the pass threshold to one of the testing units conforming to the predetermined rule to conduct a retest operation. Finally, the processing unit will confirm whether the IC that failed to reach the pass threshold has reached the pass threshold in the retest operation.

Abstract: Methods, machines, and stored instructions are provided for determining hierarchical paths to nodes based on stored information about the nodes. A node analyzer analyzes a hierarchy to create mappings that represent the hierarchy. The mappings may include a “parent mapping” that maps selected-level nodes to parent nodes of the selected-level nodes, and a “path mapping” that maps a plurality of nodes other than the selected-level nodes to a plurality of paths, within the hierarchy, to the plurality of nodes. A path module then determines path(s) to specified node(s) at least in part by mapping the specified node(s) to particular parent node(s) of the specified node(s) using the parent mapping. The path module also maps the particular parent node(s) to particular path(s) using the path mapping. The information from the path and parent mappings may be assembled to form path(s) within the hierarchy to the specified node(s).

Abstract: A contact type electret condenser pickup to deliver high anti noise, top talking quality, and comprehensive range of applications includes a casing provided with an accommodation chamber to contain an O-ring, a vibration part, an insulation packing, a back plate retaining ring containing a back plate, a conductive connection ring, and a circuit board horizontally placed in sequence; vibration of a sound of a user is transmitted to the vibration part; then an inertia vibration of the metal sheet changes capacitance between the vibration part and the back plate; the changed vibration is converted through the circuit board set into voltage of alternating signals for output variable according to changes of vibration.

Abstract: A contact type electret condenser pickup to deliver high anti noise, top talking quality, and comprehensive range of applications includes a casing provided with an accommodation chamber to contain an O-ring, a vibration part, an insulation packing, a back plate retaining ring containing a back plate, a conductive connection ring, and a circuit board horizontally placed in sequence; vibration of a sound of a user is transmitted to the vibration part; then an inertia vibration of the metal sheet changes capacitance between the vibration part and the back plate; the changed vibration is converted through the circuit board set into voltage of alternating signals for output variable according to changes of vibration.