Abstract: One or more performance parameters associated with data stored at a storage device of a plurality of storage devices are received by a storage controller. A first number of blocks of the storage device to a high resiliency portion and a second number of blocks of the storage device to a low resiliency portion of the storage device are allocated based on the one or more performance parameters.

Abstract: One or more performance parameters associated with data stored at a storage device of a plurality of storage devices are received by a storage controller. A first number of blocks of the storage device to a high resiliency portion and a second number of blocks of the storage device to a low resiliency portion of the storage device are allocated based on the one or more performance parameters.

Abstract: One or more performance parameters associated with data stored at a storage device of a plurality of storage devices are received by a storage controller. A first number of blocks of the storage device to a high resiliency portion and a second number of blocks of the storage device to a low resiliency portion of the storage device are allocated based on the one or more performance parameters.

Abstract: One or more performance parameters associated with data stored at a storage device of a plurality of storage devices are received by a storage controller. A first number of blocks of the storage device to a high resiliency portion and a second number of blocks of the storage device to a low resiliency portion of the storage device are allocated based on the one or more performance parameters.

Abstract: One or more performance parameters associated with data stored at a storage device of a plurality of storage devices are received by a storage controller. A first number of blocks of the storage device to a high resiliency portion and a second number of blocks of the storage device to a low resiliency portion of the storage device are allocated based on the one or more performance parameters.

Abstract: A storage array controller may receive data to be programmed to a solid-state storage device of a plurality of solid-state storage devices. The storage array controller may identify a type of the data and determine whether to program the data to a low latency portion of the solid-state storage device based on the type of the data. In response to determining to program the data to the low latency portion of the solid-state storage device, the storage array controller may program the data to the low latency portion of the solid-state storage device.

Abstract: A storage array controller may receive data to be programmed to a solid-state storage device of a plurality of solid-state storage devices. The storage array controller may identify a type of the data and determine whether to program the data to a low latency portion of the solid-state storage device based on the type of the data. In response to determining to program the data to the low latency portion of the solid-state storage device, the storage array controller may program the data to the low latency portion of the solid-state storage device.

Abstract: Memory devices including a controller configured to cause the memory device to apply a positive first voltage level to a first data line selectively connected to a first string of series-connected memory cells while applying a second voltage level, higher than the first voltage level, to a second data line selectively connected to a second string of series-connected memory cells; while applying the first voltage level to the first data line and applying the second voltage level to the second data line, applying a third voltage level to a particular access line coupled to a memory cell of a first string of series-connected memory cells selected for programming, wherein a differential between the third voltage level and the first voltage level is configured to increase a threshold voltage of the memory cell selected for programming, as well as other apparatus containing similar memory devices.

Abstract: Memory devices including a controller configured to cause the memory device to apply a positive first voltage level to a first data line selectively connected to a first string of series-connected memory cells while applying a second voltage level, higher than the first voltage level, to a second data line selectively connected to a second string of series-connected memory cells; while applying the first voltage level to the first data line and applying the second voltage level to the second data line, applying a third voltage level to a particular access line coupled to a memory cell of a first string of series-connected memory cells selected for programming, wherein a differential between the third voltage level and the first voltage level is configured to increase a threshold voltage of the memory cell selected for programming, as well as other apparatus containing similar memory devices.

Abstract: Memory devices including a controller configured to cause the memory device to apply a positive first voltage level to a first data line selectively connected to a first string of series-connected memory cells while applying a second voltage level, higher than the first voltage level, to a second data line selectively connected to a second string of series-connected memory cells; while applying the first voltage level to the first data line and applying the second voltage level to the second data line, applying a third voltage level to a particular access line coupled to a memory cell of a first string of series-connected memory cells selected for programming, wherein a differential between the third voltage level and the first voltage level is configured to increase a threshold voltage of the memory cell selected for programming, as well as other apparatus containing similar memory devices.

Abstract: Methods of programming a memory include applying a programming voltage on an access line selected for a programming operation of a single page of the memory, applying a second voltage on an access line unselected for the programming operation, increasing the programming voltage for a first plurality of steps of the programming operation, and increasing the second voltage for a second plurality of steps of a first portion of the programming operation, then decreasing the second voltage at a particular point of the programming operation after completing the second plurality of steps and before completing the first plurality of steps.

Abstract: Memory devices including a controller configured to cause the memory device to apply a positive first voltage level to a first data line selectively connected to a first string of series-connected memory cells while applying a second voltage level, higher than the first voltage level, to a second data line selectively connected to a second string of series-connected memory cells; while applying the first voltage level to the first data line and applying the second voltage level to the second data line, applying a third voltage level to a particular access line coupled to a memory cell of a first string of series-connected memory cells selected for programming, wherein a differential between the third voltage level and the first voltage level is configured to increase a threshold voltage of the memory cell selected for programming, as well as other apparatus containing similar memory devices.

Abstract: A first string of memory cells, including a selected memory cell, and a second string of memory cells are coupled to a common data line and a common source. The data line is biased to a first potential greater than a second potential to which the source is biased and a select gate coupled between the second string of memory cells and the data line is deactivated during a programming operation performed on the selected memory cell. The programming operation includes applying a programming potential to a control gate of the selected memory cell concurrently with biasing the data line to the first potential and biasing the source to the second potential while the select gate is deactivated.

Abstract: Methods of programming a memory include applying a programming voltage on an access line selected for a programming operation of a single page of the memory, applying a second voltage on an access line unselected for the programming operation, increasing the programming voltage for a first plurality of steps of the programming operation, and increasing the second voltage for a second plurality of steps of a first portion of the programming operation, then decreasing the second voltage at a particular point of the programming operation after completing the second plurality of steps and before completing the first plurality of steps.

Abstract: A method of programming a memory includes boosting a channel voltage while a first portion of a plurality of increasing programming pulses is applied to a selected access line, and when a criteria is met, reducing the channel voltage to a reduced voltage level and subsequently boosting the channel voltage, starting from the reduced voltage level, while a second portion of the plurality of increasing programming pulses is applied to the selected access line. Differences between the channel voltage boosted while the first portion of the plurality of increasing programming pulses is applied and voltages of the first portion of the plurality of increasing programming pulses are substantially the same as differences between the channel voltage boosted while the second portion of the plurality of increasing programming pulses is applied and voltages of the second portion of the plurality of increasing programming pulses.

Abstract: A first string of memory cells, including a selected memory cell, and a second string of memory cells are coupled to a common data line and a common source. The data line is biased to a first potential greater than a second potential to which the source is biased and a select gate coupled between the second string of memory cells and the data line is deactivated during a programming operation performed on the selected memory cell. The programming operation includes applying a programming potential to a control gate of the selected memory cell concurrently with biasing the data line to the first potential and biasing the source to the second potential while the select gate is deactivated.

Abstract: Methods of biasing in memory devices facilitate memory device programming operations. In at least one embodiment, a first string of memory cells comprising a selected memory cell and a second string of memory cells are coupled to a common data line and a common source, where the data line is biased to a potential greater than a potential to which the source is biased during a programming operation performed on the selected memory cell.

Abstract: A method of programming a memory includes boosting a channel voltage while a first portion of a plurality of increasing programming pulses is applied to a selected access line, and when a criteria is met, reducing the channel voltage to a reduced voltage level and subsequently boosting the channel voltage, starting from the reduced voltage level, while a second portion of the plurality of increasing programming pulses is applied to the selected access line. Differences between the channel voltage boosted while the first portion of the plurality of increasing programming pulses is applied and voltages of the first portion of the plurality of increasing programming pulses are substantially the same as differences between the channel voltage boosted while the second portion of the plurality of increasing programming pulses is applied and voltages of the second portion of the plurality of increasing programming pulses.

Abstract: Memory devices and programming methods for memories are disclosed, such as those adapted to program a memory using an increasing channel voltage for a first portion of programming, and an increasing but reduced channel voltage for a second portion of programming.

Abstract: Methods of biasing in memory devices facilitate memory device programming operations. In at least one embodiment, a first string of memory cells comprising a selected memory cell and a second string of memory cells are coupled to a common data line and a common source, where the data line is biased to a potential greater than a potential to which the source is biased during a programming operation performed on the selected memory cell.