Patents by Inventor Ying-Cheng WANG

Ying-Cheng WANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10527553
    Abstract: The disclosure relates to a carrier for use in single molecule detection. The carrier includes a flexible substrate and a metal layer on the flexible substrate. The flexible substrate includes a base and a bulge pattern located on a surface of the base. The bulge pattern includes a number of strip-shaped bulges intersecting with each other to form a net and define a number of recesses. The metal layer is located on the bulge pattern. The carrier for use in single molecule detection has a relative higher SERS and can enhance the Raman scattering.
    Type: Grant
    Filed: August 29, 2018
    Date of Patent: January 7, 2020
    Assignees: Tsinghua University, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Ying-Cheng Wang, Yuan-Hao Jin, Qun-Qing Li, Shou-Shan Fan
  • Patent number: 10483472
    Abstract: A Schottky diode includes an insulating substrate and at least one Schottky diode unit. The at least one Schottky diode unit is located on a surface of the insulating substrate. The at least one Schottky diode unit includes a first electrode, a semiconductor structure and a second electrode. The semiconductor structure comprising a first end and a second end. The first end is laid on the first electrode, the second end is located on the surface of the insulating substrate. The semiconducting structure includes a carbon nanotube structure. The second electrode is located on the second end.
    Type: Grant
    Filed: December 19, 2017
    Date of Patent: November 19, 2019
    Assignees: Tsinghua University, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Yu-Dan Zhao, Xiao-Yang Xiao, Ying-Cheng Wang, Yuan-Hao Jin, Tian-Fu Zhang, Qun-Qing Li
  • Patent number: 10475936
    Abstract: The disclosure relates to a thin film transistor and a method for making the same. The thin film transistor includes a substrate; a gate on the substrate; a dielectric layer on the gate, wherein the dielectric layer includes a first sub-dielectric layer and a second sub-dielectric layer stacked on one another, and the first sub-dielectric layer is a first oxide dielectric layer formed by magnetron sputtering and in direct contact with the gate; a semiconductor layer on the dielectric layer, wherein the semiconductor layer includes nano-scaled semiconductor materials; and a source and a drain, wherein the source and the drain are on the dielectric layer, spaced apart from each other, and electrically connected to the semiconductor layer. The thin film transistor almost has no current hysteresis.
    Type: Grant
    Filed: November 17, 2017
    Date of Patent: November 12, 2019
    Assignees: Tsinghua University, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Yu-Jia Huo, Yu-Dan Zhao, Xiao-Yang Xiao, Ying-Cheng Wang, Tian-Fu Zhang, Yuan-Hao Jin, Qun-Qing Li, Shou-Shan Fan
  • Patent number: 10431662
    Abstract: The disclosure relates to a thin film transistor and a method for making the same. The thin film transistor includes a substrate; a semiconductor layer on the substrate, wherein the semiconductor layer includes nano-scaled semiconductor materials; a source and a drain, wherein the source and the drain are on the substrate, spaced apart from each other, and electrically connected to the semiconductor layer; a dielectric layer on the semiconductor layer, wherein the dielectric layer includes a first sub-dielectric layer and a second sub-dielectric layer stacked on one another, and the first sub-dielectric layer is a first oxide dielectric layer grown by magnetron sputtering; and a gate in direct contact with the first sub-dielectric layer. The thin film transistor almost has no current hysteresis.
    Type: Grant
    Filed: November 20, 2017
    Date of Patent: October 1, 2019
    Assignees: Tsinghua University, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Yu-Jia Huo, Yu-Dan Zhao, Xiao-Yang Xiao, Ying-Cheng Wang, Tian-Fu Zhang, Yuan-Hao Jin, Qun-Qing Li, Shou-Shan Fan
  • Patent number: 10381585
    Abstract: A thin film transistor includes a gate electrode, a insulating medium layer and at least one Schottky diode unit. The at least one Schottky diode unit is located on a surface of the insulating medium layer. The at least one Schottky diode unit includes a first electrode, a semiconductor structure and a second electrode. The semiconductor structure comprising a first end and a second end. The first end is laid on the first electrode, the second end is located on the surface of the insulating medium layer. The semiconducting structure includes a carbon nanotube structure. The second electrode is located on the second end.
    Type: Grant
    Filed: December 19, 2017
    Date of Patent: August 13, 2019
    Assignees: Tsinghua University, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Yu-Dan Zhao, Xiao-Yang Xiao, Ying-Cheng Wang, Yuan-Hao Jin, Tian-Fu Zhang, Qun-Qing Li
  • Patent number: 10374180
    Abstract: A thin film transistor includes a gate, an insulating medium layer and a Schottky diode. The Schottky diode includes a first electrode, a second electrode and a semiconducting structure. The first electrode is located on the surface of the insulating medium layer and includes a first metal layer and a second metal layer. The second electrode is located on the surface of the insulating medium layer and includes a third metal layer and a fourth metal layer. The semiconductor structure includes a first end and a second end. The first end is sandwiched by the first metal layer and the second metal layer, the second end is sandwiched by the third metal layer and the fourth metal layer. The semiconductor structure includes a carbon nanotube structure.
    Type: Grant
    Filed: December 19, 2017
    Date of Patent: August 6, 2019
    Assignees: Tsinghua University, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Yu-Dan Zhao, Xiao-Yang Xiao, Ying-Cheng Wang, Yuan-Hao Jin, Tian-Fu Zhang, Qun-Qing Li
  • Patent number: 10347854
    Abstract: The disclosure relates to a logic circuit. The logic circuit includes two ambipolar thin film transistors. Each of the two ambipolar thin film transistors includes a substrate; a semiconductor layer located on the substrate and including nano-scaled semiconductor materials; a source and a drain, wherein the source and the drain are located on the substrate, spaced apart from each other, and electrically connected to the semiconductor layer; a dielectric layer located on the substrate and covering the semiconductor layer, wherein the dielectric layer includes a normal dielectric layer and an abnormal dielectric layer stacked on one another, and the abnormal dielectric layer is an oxide dielectric layer grown by magnetron sputtering; and a gate in direct contact with the abnormal dielectric layer. The two ambipolar thin film transistors share the same substrate, the same gate, and the same drain.
    Type: Grant
    Filed: November 20, 2017
    Date of Patent: July 9, 2019
    Assignees: Tsinghua University, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Yu-Dan Zhao, Yu-Jia Huo, Xiao-Yang Xiao, Ying-Cheng Wang, Tian-Fu Zhang, Yuan-Hao Jin, Qun-Qing Li, Shou-Shan Fan
  • Patent number: 10330601
    Abstract: The disclosure relates to a method for detecting single molecules on an object. The method includes: providing a carrier; attaching the carrier on a surface of the object so that the surface of the object is indirect contact with the carrier; and detecting the single molecules on the object with a detector. The carrier includes a flexible substrate and a metal layer on the flexible substrate. The flexible substrate includes a base and a bulge pattern located on a surface of the base. The bulge pattern includes a number of strip-shaped bulges intersecting with each other to form a net and define a number of recesses. The metal layer is located on the bulge pattern. The carrier has a relative higher SERS and can enhance the Raman scattering.
    Type: Grant
    Filed: August 29, 2018
    Date of Patent: June 25, 2019
    Assignees: Tsinghua University, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Ying-Cheng Wang, Yuan-Hao Jin, Qun-Qing Li, Shou-Shan Fan
  • Patent number: 10326089
    Abstract: The disclosure relates to a logic circuit. The logic circuit includes a n-type thin film transistor and a p-type thin film transistor. Each thin film transistor includes a substrate; a semiconductor layer including nano-scaled semiconductor materials; a source and a drain, wherein the source and the drain are spaced apart from each other, and electrically connected to the semiconductor layer; a dielectric layer covering the semiconductor layer, wherein the dielectric layer includes a normal dielectric layer and an abnormal dielectric layer stacked on one another, and the abnormal dielectric layer is an oxide dielectric layer grown by magnetron sputtering; and a gate in direct contact with the abnormal dielectric layer. The n-type thin film transistor and the p-type thin film transistor share the same substrate and the same gate.
    Type: Grant
    Filed: November 20, 2017
    Date of Patent: June 18, 2019
    Assignees: Tsinghua University, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Yu-Dan Zhao, Yu-Jia Huo, Xiao-Yang Xiao, Ying-Cheng Wang, Tian-Fu Zhang, Yuan-Hao Jin, Qun-Qing Li, Shou-Shan Fan
  • Publication number: 20190157467
    Abstract: A Schottky diode includes an insulating substrate and at least one Schottky diode unit. The at least one Schottky diode unit is located on a surface of the insulating substrate. The at least one Schottky diode unit includes a first electrode, a semiconductor structure and a second electrode. The semiconductor structure comprising a first end and a second end. The first end is laid on the first electrode; the second end is located on the surface of the insulating substrate. The semiconducting structure is nano-scale semiconductor structure. The second electrode is located on the second end.
    Type: Application
    Filed: January 4, 2019
    Publication date: May 23, 2019
    Inventors: YU-DAN ZHAO, XIAO-YANG XIAO, YING-CHENG WANG, YUAN-HAO JIN, TIAN-FU ZHANG, QUN-QING LI
  • Patent number: 10297696
    Abstract: A Schottky diode includes an insulating substrate and at least one Schottky diode unit. The at least one Schottky diode unit is located on a surface of the insulating substrate. The at least one Schottky diode unit includes a first electrode, a semiconductor structure and a second electrode. The semiconductor structure comprising a first end and a second end. The first end is laid on the first electrode, the second end is located on the surface of the insulating substrate. The semiconducting structure is nano-scale semiconductor structure. The second electrode is located on the second end.
    Type: Grant
    Filed: December 19, 2017
    Date of Patent: May 21, 2019
    Assignees: Tsinghua University, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Yu-Dan Zhao, Xiao-Yang Xiao, Ying-Cheng Wang, Yuan-Hao Jin, Tian-Fu Zhang, Qun-Qing Li
  • Publication number: 20190113461
    Abstract: A carrier for single molecule detection is related. The carrier includes a substrate; a middle layer, on the substrate; and a metal layer, on the middle layer; wherein the substrate is a flexible substrate, the middle layer includes a base and a patterned bulge on the base, the patterned bulge includes a plurality of strip-shaped bulges, the metal layer is on the patterned bulge.
    Type: Application
    Filed: September 6, 2018
    Publication date: April 18, 2019
    Inventors: YING-CHENG WANG, YUAN-HAO JIN, QUN-QING LI, SHOU-SHAN FAN
  • Publication number: 20190113462
    Abstract: A molecular detection device is related. The device includes a carrier, a detector and a control computer. The carrier includes a substrate, a middle layer and a metal layer. The middle layer is sandwiched between the substrate and the middle layer. The detector is configured to detect molecules on a surface of the carrier. The control computer is connected to the detector and configured to analyze a detection result. The middle layer includes a base and a patterned bulge on the base, and the patterned bulge includes a plurality of strip-shaped bulges, the metal layer is on the patterned bulge.
    Type: Application
    Filed: September 7, 2018
    Publication date: April 18, 2019
    Inventors: YING-CHENG WANG, YUAN-HAO JIN, QUN-QING LI, SHOU-SHAN FAN
  • Publication number: 20190079017
    Abstract: A carrier for use in single molecule detection is related. The carrier includes a substrate; a middle layer, on the substrate; and a metal layer, on the middle layer; wherein the substrate is a flexible substrate, the middle layer includes a base and a patterned bulge on the base, the patterned bulge includes a plurality of strip-shaped bulges, the metal layer is on the patterned bulge, the carrier further includes a carbon nanotube composite structure between the metal layer and the patterned bulge.
    Type: Application
    Filed: August 31, 2018
    Publication date: March 14, 2019
    Inventors: YING-CHENG WANG, YUAN-HAO JIN, QUN-QING LI, SHOU-SHAN FAN
  • Publication number: 20190079016
    Abstract: The disclosure relates to a method for detecting single molecules on an object. The method includes: providing a carrier; attaching the carrier on a surface of the object so that the surface of the object is indirect contact with the carrier; and detecting the single molecules on the object with a detector. The carrier includes a flexible substrate and a metal layer on the flexible substrate. The flexible substrate includes a base and a bulge pattern located on a surface of the base. The bulge pattern includes a number of strip-shaped bulges intersecting with each other to form a net and define a number of recesses. The metal layer is located on the bulge pattern. The carrier has a relative higher SERS and can enhance the Raman scattering.
    Type: Application
    Filed: August 29, 2018
    Publication date: March 14, 2019
    Inventors: YING-CHENG WANG, YUAN-HAO JIN, QUN-QING LI, SHOU-SHAN FAN
  • Publication number: 20190079018
    Abstract: A method for detecting molecular is related. The method includes providing a sample, in which a sample surface is distributed with analyte molecules; providing a carrier including a substrate, a middle layer and a metal layer, in which the middle layer is sandwiched between the substrate and the metal layer, the middle layer includes a base and a patterned bulge on a surface of the base, the patterned bulge includes a plurality of strip-shaped bulges intersected with each other to form a net and define a number of holes, and the metal layer is on the patterned bulge; placing the carrier on the sample surface to make the metal layer being attached to the sample surface, in which parts of the analyte molecules are formed on the metal layer; detecting the analyte molecules on the metal layer with a detector.
    Type: Application
    Filed: August 31, 2018
    Publication date: March 14, 2019
    Inventors: YING-CHENG WANG, YUAN-HAO JIN, QUN-QING LI, SHOU-SHAN FAN
  • Publication number: 20190078997
    Abstract: A method for making carrier for use in single molecule detection is related. The method includes following steps: firstly, placing a middle layer on a substrate; secondly, providing a carbon nanotube composite structure, wherein the carbon nanotube composite structure includes a carbon nanotube structure and a protective layer coated on the carbon nanotube structure, the carbon nanotube structure includes a plurality of carbon nanotubes intersected with each other and defines a plurality of openings; thirdly, placing the carbon nanotube composite structure on a surface of the middle layer, wherein parts of the surface are exposed through the plurality of openings; fourthly, forming the patterned bulge by dry etching the middle layer using the carbon nanotube composite structure as a mask, wherein the patterned bulge includes a plurality of strip-shaped bulges intersected with each other; depositing the metal layer on the patterned bulge.
    Type: Application
    Filed: August 31, 2018
    Publication date: March 14, 2019
    Inventors: YING-CHENG WANG, YUAN-HAO JIN, QUN-QING LI, SHOU-SHAN FAN
  • Publication number: 20190077666
    Abstract: The disclosure relates to a method for making carrier for use in single molecule detection. The method includes: providing a rigid substrate; coating a polymer layer on a surface of the rigid substrate, the polymer layer is in semisolid state; transferring a nano-scaled pattern of a template on a surface of the polymer layer by pressing the template on the surface of the polymer layer; obtaining a flexible substrate by removing the template; and applying a metal layer on the flexible substrate. The carrier for use in single molecule detection has a relative higher SERS and can enhance the Raman scattering.
    Type: Application
    Filed: August 29, 2018
    Publication date: March 14, 2019
    Applicants: Tsinghua University, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: YING-CHENG WANG, YUAN-HAO JIN, QUN-QING LI, SHOU-SHAN FAN
  • Publication number: 20190079015
    Abstract: The disclosure relates to a carrier for use in single molecule detection. The carrier includes a flexible substrate and a metal layer on the flexible substrate. The flexible substrate includes a base and a bulge pattern located on a surface of the base. The bulge pattern includes a number of strip-shaped bulges intersecting with each other to form a net and define a number of recesses. The metal layer is located on the bulge pattern. The carrier for use in single molecule detection has a relative higher SERS and can enhance the Raman scattering.
    Type: Application
    Filed: August 29, 2018
    Publication date: March 14, 2019
    Inventors: YING-CHENG WANG, YUAN-HAO JIN, QUN-QING LI, SHOU-SHAN FAN
  • Patent number: 10217833
    Abstract: A thin film transistor includes a gate, an insulating medium layer and a Schottky diode. The Schottky diode includes a first electrode, a second electrode and a semiconducting structure. The first electrode is located on the surface of the insulating medium layer and includes a first metal layer and a second metal layer. The second electrode is located on the surface of the insulating medium layer and includes a third metal layer and a fourth metal layer. The semiconductor structure includes a first end and a second end. The first end is sandwiched by the first metal layer and the second metal layer, the second end is sandwiched by the third metal layer and the fourth metal layer. The semiconductor structure includes a nano-scale semiconductor structure.
    Type: Grant
    Filed: December 19, 2017
    Date of Patent: February 26, 2019
    Assignees: Tsinghua University, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Yu-Dan Zhao, Xiao-Yang Xiao, Ying-Cheng Wang, Yuan-Hao Jin, Tian-Fu Zhang, Qun-Qing Li