Abstract: A chemical analysis apparatus in which a sample to be analyzed and a reagent are placed into a reaction container, and sound waves are irradiated to said reaction container so as to agitate them, wherein said chemical analysis apparatus comprises a piezoelectric element producing said sound waves, and drivers for driving said piezoelectric element, said sound waves being intermittently irradiated into said reaction container.

Abstract: A conventional automated analyzer has a mechanism for performing a stirring operation and a mechanism for performing a pipetting operation. The mechanisms are independent of each other. The time interval between the stirring operation and the pipetting operation is at least several seconds. A solid particle starts to settle out at the time of termination of the stirring operation. In the pipetting operation, an operation for suctioning a liquid is performed during a transient period of the process in which the solid particle settles out. The suction of the liquid containing a solid particle during the transition period of the process may cause a variation in the number of solid particles contained in the liquid pipetted. The problem is solved by means for simultaneously performing an operation for stirring a liquid reagent containing a solid particle and an operation for maintaining the reagent.

Abstract: To increase the direct light received by the detector and decrease reflections from the detection component support structures, the luminescent substance is placed as close to the detector as possible. More specifically, the apparatus is configured so as to slide out a structure shielding the detector from light and at the same time slide in the vessel containing the luminescent substance therein until the vessel comes right under the detector. The invention can detect trace luminescence from a small-volume sample by maximizing the amount of direct light received from the sample and minimizing the decay of indirect light received from the sample attributable to interactions with the vessel for containing the sample therein, the structure for collecting light, and the structure for supporting other detection components.

Abstract: A chemical analysis apparatus in which a sample to be analyzed and a reagent are placed into a reaction container, and sound waves are irradiated to said reaction container so as to agitate them, wherein said chemical analysis apparatus comprises a piezoelectric element producing said sound waves, and drivers for driving said piezoelectric element, said sound waves being intermittently irradiated into said reaction container.

Abstract: A vehicle includes a first panel member, which defines a cabin, and second panel member, which is disposed to face the first panel member from outside of the cabin. The second panel member and the first panel member form a receptacle therebetween. The receptacle contains a window regulator. The first panel member includes a first portion which separates the cabin and the receptacle from each other, and a second portion which separates inside and outside of the cabin from each other. The second panel member covers the first portion of the first panel member from outside of the cabin and is fixed to the second portion.

Abstract: A vehicle includes a first panel member, which defines a cabin, and second panel member, which is disposed to face the first panel member from outside of the cabin. The second panel member and the first panel member form a receptacle therebetween. The receptacle contains a window regulator. The first panel member includes a first portion which separates the cabin and the receptacle from each other, and a second portion which separates inside and outside of the cabin from each other. The second panel member covers the first portion of the first panel member from outside of the cabin and is fixed to the second portion.

Abstract: In order to provide an automatic analyzer which ensures accurate absorbance measurement even when ultrasonic wave intensity for agitation of the sample and reagent or the like becomes excessive, multiple reaction vessels 8 are placed as follows: As viewed from the top of the reaction disk 15, the reaction disk 15 is divided into four parts, and the side wall of the reaction vessel 8 does not intersect with two light beams 20 which intersect with each other at right angles. Herein multiple reaction vessels 8 are located at an inclined position approximately at an angle of about 45 deg. This layout allows the reaction vessel 8 to have the surface exposed to ultrasonic wave 22 intersecting to the applied ultrasonic wave appropriately at right angles, and absorbance measuring surface 21 intersecting to the applied measurement wave appropriately at right angles.

Abstract: Provided is a chemical analysis apparatus comprising a mechanism which can efficiently agitate a substance to be agitated so that a sample and a reagent are agitated and mixed together in a shorter time with a saved consumption power, incorporating a plurality of sound sources or reflecting plates, and a reaction container is located between one of the sound sources and another of the sound sources or one of the reflecting plates, whereby sound waves can be irradiated toward the reaction container in several directions in order to efficiently fluidize a solution in the reaction container.

Abstract: In order to provide an automatic analyzer which ensures accurate absorbance measurement even when ultrasonic wave intensity for agitation of the sample and reagent or the like becomes excessive, multiple reaction vessels 8 are placed as follows: As viewed from the top of the reaction disk 15, the reaction disk 15 is divided into four parts, and the side wall of the reaction vessel 8 does not intersect with two light beams 20 which intersect with each other at right angles. Herein multiple reaction vessels 8 are located at an inclined position approximately at an angle of about 45 deg. This layout allows the reaction vessel 8 to have the surface exposed to ultrasonic wave 22 intersecting to the applied ultrasonic wave appropriately at right angles, and absorbance measuring surface 21 intersecting to the applied measurement wave appropriately at right angles.

Abstract: As a polarization beam separating device constituting a projection device, a thin-film multilayer film (reflective polarizer) is used. The thin-film multilayer film is composed of a plurality of alternately stacked layers including layers having a refractive index in a predetermined direction and a refractive index in a direction perpendicular to the predetermined direction, the refractive indices being almost equal to each other, and layers having different refractive indices in a predetermined direction and in a direction perpendicular to the predetermined direction. The use of the reflective polarizer makes it possible to reflect linearly polarized light polarized in a first direction and to transmit linearly polarized light polarized in a second direction, which is perpendicular to the first direction, with respect to light of almost all wavelengths in the visible region. As a result, the contrast of an image to be projected can be improved.

Abstract: A measuring apparatus is provided in one of two objects moving relatively to each other. The apparatus includes a circuit for effecting a direct spread modulation with respect to a transmission carrier signal using modulation codes; an antenna unit for transmitting the modulated carrier signal toward the other of the two objects and for receiving a reflection wave therefrom; a circuit for demodulating the received reflection wave signal using the transmission carrier signal; a circuit for making correlation between the demodulated output signal and a signal having the same code as that of the modulation code and having a phase delayed by a predetermined time; a unit for extracting a Doppler frequency component contained in a signal which has been propagated through a propagation path existing in a specified distance range; and a circuit for properly processing the extracted Doppler frequency component.

Abstract: Methods of improving the thickness and characteristics of galvanizing processes are disclosed. Several methods are disclosed which promote growth of the .zeta. layer in a double dipping galvanizing process. In one process a metal article is dipped in a molten-zinc bath at 430.degree.-480.degree. C. The article is then air-cooled or semi-air-cooled before it is dipped in a molten zinc bath containing no less than 0.1% aluminum at 390.degree.-460.degree. C. In another method, after molten-zinc-plating a metal article at 480.degree.-500.degree. C., the article is plated in a molten zinc bath containing no less than 0.1% of aluminum at 390.degree.-460.degree. C. In a third method, the surface of a metal article is blasted to form a surface having a roughness of at least 20 .mu.m before plating the article in a molten-zinc bath at 430.degree.-480.degree. C. The article is then plated in a molten zinc bath containing no less than 0.1% of aluminum at 390.degree.-450.degree. C.