Abstract: Methods and apparatus for performing read and write operations in a semiconductor memory device comprising an I/O (input/output) architecture comprising a separate data input bus and data output bus. Read and write operations are sequentially performed in a same cycle using QDR2 (Quadruple Data Rate 2) wherein each of the input and output modes operate at a 2-bit burst mode and a double data rate (DDR) mode, thereby minimizing cycle time or read and write operations are sequentially performed in a same cycle using QDR4 (Quadruple Data Rate 4), wherein each of the input and output modes operate at a 4-bit burst mode and a DDR mode, thereby minimizing the cycle time. In another aspect, when a read command is input in one cycle, a read operation is performed in synchronization with a rising edge of clock and a write operation is performed in synchronization with a signal that operates during the read operation.

Abstract: Disclosed is a semiconductor integrated circuit device which includes a test element group circuit connected between a first and a second pad. The test element group circuit includes a plurality of semiconductor devices connected in series between the first and second pads. At least two adjacent ones of the semiconductor devices are connected to each other via a signal path that is formed by a multi-layer interconnection structure.

Abstract: The present invention relates to a semiconductor memory device capable of performing a write operation 1 or 2 cycles after receiving a write command without necessitating a dead cycle. The elimination of the dead cycle between read and write operations improves bus efficiency and thus, speed. The memory device of the present invention includes an address input control means for receiving an external write or read address and delaying the write address by either 1 or 2 cycles. A data input control means receives external write data and delays the write data by a first or second predetermined number of cycles according to the write mode. A data transmission control means transmits the delayed write data responsive to a predetermined set of input commands. The data input control means reads the data from a cell corresponding to the read address, provides the write data to a cell corresponding to the write address, and writes the transmitted delayed data into the cell corresponding to the write address.

Abstract: Disclosed is a semiconductor memory device comprising a pipeline structure having a sense amplifier responsive to a first enable signal; a data register responsive to a second enable signal for latching an output of said sense amplifier between said sense amplifier and a common data line; and a monitoring part to monitor said first and second enable signals and adapted to prevent overlapping between an enabling interval of said first enable signal and said second enable signal.

Abstract: Methods and apparatus for performing read and write operations in a semiconductor memory device comprising an I/O (input/output) architecture comprising a separate data input bus and data output bus. In one aspect, read and write operations are sequentially performed in a same cycle using QDR2 (Quadruple Data Rate 2) in a separate input and output architecture wherein each of the input and output modes operate at a 2-bit burst mode and a double data rate (DDR) mode, thereby minimizing cycle time. In another aspect, read and write operations are sequentially performed in a same cycle using QDR4 (Quadruple Data Rate 4) in a separate input and output architecture, wherein each of the input and output modes operate at a 4-bit burst mode and a DDR mode, thereby minimizing the cycle time.

Abstract: A synchronous semiconductor memory device includes a plurality of main data lines each coupled between a block sense amplifier array and a data output buffer. Each main data line prefetches a plurality of cell data segments from memory cells corresponding to an input/output port and transmits the cell data to the data output buffer. The memory device also includes a pass/latch part connected to one or more corresponding block sense amplifiers within a corresponding block sense amplifier array. The pass/latch part receives a plurality of cell data segments in parallel from the block sense amplifiers and transmits them in series to a corresponding main data line. This invention reduces a chip size and peak electric current of the semiconductor device by minimizing the number of main data lines required for prefetch operations.

Abstract: Disclosed is a semiconductor memory device comprising a pipeline structure having a sense amplifier responsive to a first enable signal; a data register responsive to a second enable signal for latching an output of said sense amplifier between said sense amplifier and a common data line; and a monitoring part to monitor said first and second enable signals and adapted to prevent overlapping between an enabling interval of said first enable signal and said second enable signal.

Abstract: A synchronous semiconductor memory device includes a plurality of main data lines each coupled between a block sense amplifier array and a data output buffer. Each main data line prefetches a plurality of cell data segments from memory cells corresponding to an input/output port and transmits the cell data to the data output buffer. The memory device also includes a pass/latch part connected to one or more corresponding block sense amplifiers within a corresponding block sense amplifier array. The pass/latch part receives a plurality of cell data segments in parallel from the block sense amplifiers and transmits them in series to a corresponding main data line. This invention reduces a chip size and peak electric current of the semiconductor device by minimizing the number of main data lines required for prefetch operations.

Abstract: An internal clock generating circuit of a synchronous type semiconductor memory device includes a transmission part for transmitting a first clock enable signal in response to applying a first level of a first clock signal. It also includes a latch part for latching the first clock enable signal transmitted from the transmission part. A gating part gates the latched first clock enable signal with the first clock signal to generate a second clock signal as an internal clock signal for the memory device. This reduces a time lag by which the speed of the internal clock is synchronized with the external clock signal.