Patents by Inventor Yong Liang Chen

Yong Liang Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for retesting semiconductor device
    Patent number: 7109740
    Abstract: A method for re-testing semiconductor device includes following processes: (1) providing a first carrier for accommodating semiconductor devices which have been tested; (2) taking the semiconductor devices out from the first carrier and placing them according to the information of a fist map by a pick-and-place machine, wherein the information of the first map has the coordinates of the positions of the film frame where the semiconductor is to be placed; (3) placing the film frame with the semiconductor devices placed thereon to a testing machine, and re-testing the semiconductor devices according to the information of the first map by the tester; (4) placing the film frame with the semiconductor devices attached thereon to a pick-and-place machine, and taking the semiconductor devices out according to the result of the retesting from the film frame, and placing the semiconductor devices on at least one carriers.
    Type: Grant
    Filed: June 28, 2005
    Date of Patent: September 19, 2006
    Assignee: Advanced Semiconductor Engineering, Inc.
    Inventors: Chin-Chen Chuan, Chiu-Cheng Lin, Cheng Chieh Lee, Kuei Lin Huang, Yong Liang Chen, Jui Liang Wang, Pao Ta Chien, Hsiang-Han Kung, Chao Hsiung Hwu