Abstract: A data strobe signal generator according to the present invention includes a control unit, a pulse delay unit, a clock generator, and a data strobe output unit. The control unit generates a CAS latency signal and a preamble signal. The pulse delay unit delays a pulse signal for predetermined time and outputs a delayed pulse signal. The clock generator outputs a control clock signal. The data strobe output unit outputs a data strobe signal. The data strobe signal generator and the semiconductor memory device having the same according to the present invention generate a data strobe signal based on an adjustable preamble value, thereby ensuring the stabilized data output operation of a high-speed memory device.

Abstract: A semiconductor memory device includes at least one data transmission block including data I/O pads arranged in a major-axis side of the semiconductor memory device; a command and address transmission block including address and command input pads arranged in at least one minor-axis side of the semiconductor memory device; a global line block, arranged in a center of the semiconductor memory device, for transmitting inputted command and address; and at least one bank area, arranged between the global line block and the data transmission block, each bank area containing plural data I/O blocks located in a side of the data transmission block and plural control blocks located in a side of the global line block.

Abstract: A semiconductor memory device including a global IO line with a low-amplitude driving voltage signal applied thereto. In the device, a first driver converts a data signal of a first voltage level from a memory cell to a second voltage level in response to a read control signal, and outputs it to a global IO line. A first level shifter converts the data signal of the second voltage level from the line back to the first voltage level, and outputs it to a data output terminal. A second driver converts an external data signal of a first voltage level from a data input terminal to a second voltage level, and outputs it to a global IO line. A second level shifter converts the external data signal of the second voltage level from the line back to the first voltage level and outputs it to a write driver.

Abstract: A semiconductor memory device includes at least one data transmission block including data I/O pads arranged in a major-axis side of the semiconductor memory device; a command and address transmission block including address and command input pads arranged in at least one minor-axis side of the semiconductor memory device; a global line block, arranged in a center of the semiconductor memory device, for transmitting inputted command and address; and at least one bank area, arranged between the global line block and the data transmission block, each bank area containing plural data I/O blocks located in a side of the data transmission block and plural control blocks located in a side of the global line block.

Abstract: Disclosed is a semiconductor memory device including a global IO line with a low-amplitude driving voltage signal applied thereto. In the device, a first driver converts a data signal of a first voltage level from a memory cell to a second voltage level in response to a read control signal, and outputs it to a global IO line. A first level shifter converts the data signal of the second voltage level from the line back to the first voltage level, and outputs it to a data output terminal. A second driver converts an external data signal of a first voltage level from a data input terminal to a second voltage level, and outputs it to a global IO line. A second level shifter converts the external data signal of the second voltage level from the line back to the first voltage level and outputs it to a write driver.